JPH0744866A - Defect inspection device for optical disk - Google Patents

Abstract

PURPOSE:To provide a defect inspection device for an optical disk capable of specifying the generated part of the defect while eliminating the influence of the out of tracking. CONSTITUTION:In a defect inspection device for an optical disk, the information read out from an optical disk 2 by an optical pickup part 1 is made to be an electric signal in a signal processing part 3. A decoding address A2 is obtained from the electric signal from a signal processing part 3. The decoding address A2 is compared with the updated address A1 of an address update holding part 5 in an address comparing part 6. When the both are equal, the address comparing part 6 sends an operation command Sa to a defect inspection part 7. The defect inspection device for an optical disk is provided with a storage means 8a for the off-area of outer tracking and a storage means 8b for the off-area of inner tracking. When the address comparing part 6 compares the decoding address A2 with the updated address A1 and both are not equal, these are stored in the different areas of the storage means 8a or the storage means 8b depending upon the size relation between the updated address A1 and the decoding address A2.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical disc defect inspection apparatus for reading and inspecting information stored on an optical disc.

2. Description of the Related Art Conventionally, an optical disk defect inspection apparatus of this type has been proposed as an apparatus for detecting a defect in a data portion of an optical disk having an address. The optical disk is irradiated with laser light to reflect light from the optical disk. Is detected by the optical pickup unit, the address is decoded from the detected signal, an operation command is given to the defect inspection unit, and the defect inspection of the data unit is performed.

In such an optical disc defect inspection apparatus,
At the time of decoding the address, only the defect inspection of the data part is performed, and the continuity of the address itself is not checked. The fact that the addresses are not continuous means that the tracking error has occurred, and it means that the presence or absence of the tracking error has not been checked. If the above-mentioned tracking error occurs during the defect inspection, the defect inspection may be performed twice, and in addition, an uninspected portion may occur or an erroneous value may be mixed in the defect data. There was

Therefore, in order to solve the above-mentioned inconvenience, for example, an optical disk defect inspection apparatus disclosed in Japanese Patent Laid-Open No. 4-368628 has been proposed. Figure 10
It is a block diagram showing a configuration of an optical disc defect inspection device described in the above publication. In FIG. 10, the optical disc defect inspection apparatus includes, for example, an optical pickup unit 101, a signal processing unit 103, which reads information from an optical disc 102,
The address decoding unit 104, the address update holding unit 105, the address comparison unit 106, and the defect inspection unit 107. The address update holding unit 105 includes a next address register 105a and a reset unit 105b.

According to such an optical disk defect inspection apparatus, the optical disk 102 is irradiated with laser light from the optical pickup section 101, and the reflected light is reflected by the optical pickup section 101.
Detect with. Output signal S from the optical pickup unit 101
The signal a is photoelectrically converted by the signal processing unit 103. The output signal of the signal processing unit 103 is input to the address decoding unit 104 and the defect inspection unit 107. The value of the address A ₂ decoded by the address decoding unit 104 is supplied to the address comparison unit 106 and the defect inspection unit 107. Further, the next address register 105 a of the address update holding unit 105 holds the next update address A _{1 and} gives the held update address A ₁ to the address comparison unit 106. In addition,
The value of the next address register 105a is set to the inspection start address by the reset unit 105b at the start of the inspection. The defect inspection unit 107 executes the defect inspection of the data portion of the optical disc 102 according to the operation command from the address comparison unit 106.

During the data defect inspection, the address comparison unit 1
Reference numeral 06 compares the decoded address A ₂ decoded by the address decoding unit 104 with the update address A ₁ stored in the next address register 105a. At this time, A
_{When 1} = A ₂ , the defect inspecting unit 107 is instructed to perform the operation command Sb.
And an update command Sc to the next address register 105a to change the value of A ₁ . As a result, the defect inspection can be performed while checking the continuity of the actually decoded decoded address A ₂ . Further, when A ₁ ≠ A ₂ , as shown in FIG. 11, A ₂ → A _0, and
Since the continuity of the decrypted decrypted addresses A ₂ is lost, it is determined that the tracking is off.

FIG. 12 is a block diagram showing another example of the optical disc defect inspection apparatus described in the above publication. In this optical disc defect inspection apparatus, the address memory 108 is added to the apparatus of FIG.
In accordance with the result of comparison between the update address A ₁ and the decryption address A _{2 in} 06, the address A ₃ calculated from the update address A ₁ or the decryption address A ₂ is stored in the address memory 108. It is a thing. This is a result of comparing the value of the update addresses A ₁ and decodes the address A _2, when A ₁ = A ₂ performs device similarly to the defect inspection of Figure 10. However, when A ₁ ≠ A ₂ , the address comparison unit 106 determines that the update address A ₁ or the decoding address A
_The operation is performed on _{2 and} the value of the resulting address A ₃ is used as the address out of tracking to address memory 1
It is stored in 08.

[0007]

However, although the optical disc defect inspection apparatus described above has an advantage of being able to detect the occurrence of the tracking error, the occurrence of the tracking error is caused on the outside or inside. There was a drawback that it could not be determined. Further, there is a drawback that the defect data is affected by the tracking error. SUMMARY OF THE INVENTION It is an object of the present invention to solve the above-mentioned drawbacks, to provide an optical disk defect inspection apparatus capable of identifying the occurrence portion of tracking error and eliminating the influence of tracking error on defect data.

[0008]

In order to achieve the above object, the invention according to claim 1 makes the information read from the optical disk by the optical pickup section into an electric signal by the signal processing section,
In addition, the decoded address is obtained based on the electric signal from the signal processing unit, and the decoded address and the update address of the address update holding unit are compared by the address comparison unit, and when the two are equal, an operation command is issued to the defect inspection unit. In the optical disc defect inspection apparatus, a storage unit having two different areas is provided, and when the address comparison unit compares the update address and the decoding address and they are not equal to each other, the update address or the decoding address is decoded depending on the magnitude relationship between the update address and the decoding address. It is characterized in that the address obtained by calculation from the address can be stored in different areas of the storage means.

In order to achieve the above object, the invention according to claim 2 makes the information read from the optical disk by the optical pickup section into an electric signal in the signal processing section, and decodes the address based on the electric signal from the signal processing section. In the optical disk defect inspection device, which obtains the decryption address and the update address of the address update holding unit are compared by the address comparison unit, and when the both are equal, an operation command is issued to the defect inspection unit,
Storage means is provided, and when the address comparison unit compares the update address and the decoded address and they are not equal, an identification flag that differs depending on the size of the updated address and the decoded address is calculated from the updated address or the decoded address. It is characterized in that it is added to the value of the address and stored in the storage means.

In order to achieve the above-mentioned object, the invention described in claim 3 makes the information read from the optical disc by the optical pickup section into an electric signal in the signal processing section, and decodes the address based on the electric signal from the signal processing section. In the optical disk defect inspection device, which obtains the decryption address and the update address of the address update holding unit are compared by the address comparison unit, and when the both are equal, an operation command is issued to the defect inspection unit,
While providing a storage means having two different areas,
Data deleting means is provided, and the data deleting means can mutually refer to the data of the defect inspection unit and the data in the different areas of the storing means, and the address or area stored in the different areas of the storing means. The defect data corresponding to is deleted from the data in the defect inspection unit.

In order to achieve the above object, the invention according to a fourth aspect is such that the information read out from the optical disk by the optical pickup section is converted into an electric signal by the signal processing section, and the decoding address is based on the electric signal from the signal processing section. In the optical disk defect inspection device, which obtains the decryption address and the update address of the address update holding unit are compared by the address comparison unit, and when the both are equal, an operation command is issued to the defect inspection unit,
In addition to providing the storage means, the data deleting means is provided, and the data deleting means can refer to the data in the storing means and the data in the defect inspecting section based on the identifier, and the address stored in the storing means or It is characterized in that the defect data corresponding to the area can be deleted from the inside of the defect inspection unit.

[0012]

According to the present invention, the information read out from the optical disk by the optical pickup section is converted into an electric signal by the signal processing section, and a decoding address is obtained based on the electric signal from the signal processing section. The address update unit compares the updated address in the address update holding unit, and issues an operation command to the defect inspection unit when the two are the same. Further, the address comparison unit compares the update address and the decryption address and, when they are not equal to each other, an address obtained by operating the update address or the decryption address according to the magnitude relationship between the update address and the decryption address is stored in different areas of the storage means. Can be stored in each. With these data, it is possible to immediately know whether the tracking is outside or inside.

According to the second aspect of the invention, the address comparison unit obtains, from the update address or the decryption address, an identification flag that differs depending on the size of the update address and the decryption address when the update address and the decryption address are not equal. It is added to the value of the assigned address and stored in the storage means. Based on these flags, it is possible to immediately recognize whether the tracking error is outside or inside. In the invention according to claim 3, the data deleting means can mutually refer to the data of the defect inspection section and the data in the different areas of the storing means.
In addition, the defective data corresponding to the address or the area stored in the different areas of the storage means can be deleted from the data in the defect inspection unit.

According to the fourth aspect of the invention, the data deleting means can mutually refer to the data in the storing means and the data in the defect inspecting section based on the identifier, and use the address or area stored in the storing means. Corresponding defect data can be deleted from the inside of the defect inspection unit.

[0015]

The present invention will be described below with reference to the illustrated embodiments. FIG. 1 is a block diagram showing a first embodiment of the optical disc defect inspection apparatus of the present invention. In FIG. 1, the optical disc defect inspection apparatus is roughly classified into an optical pickup unit 1, a signal processing unit 3, an address decoding unit 4, and
An address update holding unit 5, an address comparison unit 6, a defect inspection unit 7, an outer tracking off-region storage unit 8a,
An inner tracking off-address storage means 8b is provided. The address update holding unit 5 uses the next address register 5
a and a reset unit 5b. Further, in more detail, the optical pickup unit 1 is connected to the signal processing unit 3, and the information of the optical disc 2 is input from the optical pickup unit 1. The signal processing unit 3 is circuit-configured to photoelectrically convert the information. The output section of the signal processing section 3 is connected to the address decoding section 4 and the defect inspection section 7.

The address update holding unit 5 is a circuit capable of updating and holding the next address value. The output of the address update holding unit 5 is connected to the address comparison unit 6. The output unit of the address decoding unit 4 is connected to the other input unit of the address comparison unit 6. The address comparison unit 6 is a circuit that compares the updated address A ₁ and the decoded address A ₂ . Each output of the address comparison unit 6 is connected to the defect inspection unit 7 and
It is connected to the outer tracking off area storage means 8a, the inner tracking off address storage means 8b, the next address register 5a of the address update holding section 5, and the reset section 5b. As a result, the output signal Sb from the address comparison unit 6 is sent to the defect inspection unit 7, the calculated address A ₃ is sent to the outer tracking off-region storage means 8a and the inner tracking off-address storage means 8b, and the update command Sc is sent to the next address register 5a. Further, the reset address output signal Sd is supplied to the reset section 5b.

The operation of the first embodiment thus constructed will be described with reference to FIG. The optical pickup unit 1 irradiates the optical disc 2 with laser light, and the reflected light is detected by the optical pickup unit 1. The output signal Sa from the optical pickup unit 1 is photoelectrically converted by the signal processing unit 3. Signal processing unit 3
The output signal of is input to the address decoding unit 4 and the defect inspection unit 7. Address A ₂ decoded by the address decoding unit 4
The value of is supplied to the address comparison unit 6 and the defect inspection unit 7. The next address register 5a of the address update holding unit 5 holds the next update address A ₁ ,
The held update address A ₁ is given to the address comparison unit 6. The value of the next address register 5a is set to the inspection start address by the reset unit 5b at the start of the inspection. The defect inspection unit 7 executes the defect inspection of the data portion of the optical disc 2 according to the operation command Sb from the address comparison unit 6.

During the defect inspection of the data section, the address comparison section 6 compares the decoded address A ₂ decoded by the address decoding section 4 with the updated address A ₁ stored in the next address register 5a. At this time, when A ₁ = A ₂ , the operation command Sb is given to the defect inspection section 7 and the update command Sc is given to the next address register 5a. As a result, the defect inspection can be performed while checking the continuity of the actually decoded decoded address A ₂ . here,
When the address comparison unit 6 determines that A ₁ ≠ A ₂ , the address comparison unit 6 checks the magnitude of the update address A ₁ and the decoding address A _2, and if A ₁ <A ₂ , obtains them based on these. operational address _{A 3 ((A 1 -1)} , (A 2 -
1)) is stored as an out-of-tracking area in the outer tracking-outside area storage unit 8a.

On the other hand, in the address comparison unit 6, A ₁ ≠ A
_When it is determined that the address is ₂ , the address comparison unit 6 checks the magnitude of the update address A ₁ and the decoding address A _2, and A ₁ > A ₂
In the case of, the operation address A ₃ ((A ₁ −
1)) is stored as an out-of-tracking address in the inner out-of-tracking address storage means 8b. Figure 2
It is a block diagram which shows the 2nd Example of this invention. In the second embodiment, the address comparing unit 6 of the first embodiment is modified, and the storage means 8 is provided instead of the outer tracking off-region storage means 8a and the inner tracking off-address storage means 8b. That is, the address comparison unit 6
Compares the updated address A ₁ with the decoded address A ₂ ,
The flag F can be added to the arithmetic address A ₃ when it is determined that A ₁ ≠ A ₂ . The storage means 8 can store the operation address A ₃ to which the flag F is added.

The operation of the second embodiment will be described. FIG. 3 is an explanatory diagram showing a state in which the operation address A ₃ obtained by the operation of the second embodiment is stored in the storage means 8.
In the second embodiment described above, the address comparison unit 6
_When it is determined that ₁ ≠ A ₂ , the address comparison unit 6 checks the size of the update address A ₁ and the decoding address A ₂ to determine A ₁
<For A _2, as shown in FIG. 3, the arithmetic address A ₃ obtained based on these addresses _{((A 1 -1), (} A 2 -
The flag F ₁ is added to 1)) and stored in the storage means 8 as the first stored data. Next, when the address comparison unit 6 determines that A ₁ ≠ A ₂ , the address comparison unit 6 checks the magnitude of the update address A ₁ and the decoding address A _2, and when A ₁ > A ₂ , FIG. As shown in
Operation address A ₃ ((A ₁ ′ obtained based on these addresses
The flag F ₂ is added to -1)) and stored in the storage means 8 as the second stored data.

Furthermore, in the address comparison unit 6, A ₁ ≠ A
If it is determined to be ₂ , the address comparison unit 6 checks the magnitude of the update address A ₁ and the decoding address A _2, and A ₁ <A ₂
In the case of, as shown in FIG. 3, the operation address A ₃ ((A ₁ ″ −1), (A ₂ ″ −1)) obtained based on these addresses
The flag F ₁ is added to the above and stored in the storage means 8 as the third stored data. The above operation is sequentially repeated during the defect inspection.

FIG. 4 is a block diagram showing a third embodiment. In the third embodiment, the data deleting means 9 is added to the first embodiment. That is, in the third embodiment, the data deleting means 9 can mutually refer to the contents of the outer tracking off-track area storage means 8a, the inner tracking off-track address storage means 8b, and the defect inspection section 7, and the outer tracking If there is defective data having a common area or address in the outlying area storage means 8a and the inner tracking outlying address storage means 8b, the data can be deleted from the defect inspection section 7. Since the other configurations are not changed, the same reference numerals are given and the description of the configurations is omitted.

The operation of the third embodiment will be described with reference to FIGS. 4 and 5. FIG. 5 is an explanatory diagram for explaining the operation of the third embodiment. FIG. 5A shows a defect occurrence address and defect information stored in the defect inspection unit 7, and FIG. 5 shows the data format stored in the outer tracking off-track area storage means 8a, and FIG. 5C shows the data format stored in the inner tracking off-track address storage means 8b. FIG. 6 is a flowchart for explaining the third embodiment. In the above-described third embodiment, the defect inspection means 7 has the defect occurrence addresses DA, DA ', ... And the defect information D, as shown in FIG.
Defect data consisting of D ′, ... Also,
The outer tracking out-of-track area storage means 8a has a structure shown in FIG.
(B), the outer track out generation region _{(OA 1 -1, OA 2 -1} ), (OA 1 '-1, O
A ₂ '-1), ... are stored. Similarly, as shown in FIG. 5C, the inner tracking off address storage means 8b stores the inner tracking off address (IA-).
1), (IA'-1), ... Are stored.

When the defect inspection (step 200) is completed, the data erasing means 9 has the outer tracking off area storage means 8a and the inner tracking off address storage means 8
b and the data stored in the defect inspection unit 7 are referred to each other.
Here, the data deleting means 9 detects the data (for example, OA ₁ -1 to OA ₂ -1) stored in the outer tracking out-of-track area storage means 8a (step 20).
1; Y), the outer track off area of the address indicated by the stored data (address OA from OA ₁ -1 ₂ -
Defect data having 1) as a defect occurrence address is deleted from the inside of the defect inspection unit 7 (step 202), and the process proceeds to the next step.

If there is no data in the outer tracking out-of-tracking area storage means 8a (step 201; N), the data deleting means 9 proceeds to step 203 without doing anything. Next, the data deleting means 9 judges whether there is data in the inner tracking off-address storage means 8b (step 203), and if there is data (step 203;
Y), the relevant data (for example, (I
Defect data having A-1) as a defect occurrence address)
Is deleted (step 204) and the process proceeds to the next step. If there is no data (step 203; N),
Go to step 205. After these operations are completed, what remains in the defect inspection unit 7 is correct defect data that is not affected by the tracking error. (Step 20
5).

FIG. 7 is a block diagram showing the fourth embodiment. In the fourth embodiment, the data deleting means 9 is added to the second embodiment. In the third embodiment, the data deleting means 9 can mutually refer to the contents of the storage means 8 and the defect inspection section 7, and the area or address common to the storage means 8 in the defect inspection section 7 can be referred to. If there is defect data having the above, the data can be deleted from the defect inspection unit 7. Since the other configurations are not changed, the same reference numerals are given and the description of the configurations is omitted.

The operation of the fourth embodiment will be described based on FIG. 7 and with reference to FIGS. 8 and 9. FIG. 8A is an explanatory diagram showing an example of data stored in the defect inspection unit 7. FIG. 8B is an explanatory diagram showing an example of data stored in the storage unit 8. FIG. 9 is a flow chart for explaining the operation of the fourth embodiment. In the fourth embodiment, as shown in FIG. 8A, the defect inspecting means 7 has defect occurrence addresses DA, DA ', ... And defect information D ,.
Defect data consisting of D ′, ... Are sequentially stored. Also,
In the storage means 8, as shown in FIG.
₁ and Address _{OA 1 -1, OA 2 -1,} F 2 and address IA ₁ -1, ... and are sequentially stored.

When the defect inspection (step 300) is completed, the data deleting means 9 mutually refers to the storage data of the storage means 8 and the defect inspection section 7. When there is the identification flag F ₁ in the storage means 8 (step 301; Y), the data deleting means 9 outputs outer tracking off area data (for example, OA ₁ -1, OA ₂ -1) following the identification flag F _1. )
In indicated by the address (e.g., OA ₂ from OA ₁ -1 -
Defect data having 1) as a defect occurrence address is deleted from the defect inspection unit 7 (step 302) and the process proceeds to the next step. If there is no identification flag F ₁ (step 301; N), the process proceeds to step 303 without performing any processing.

Next, the data deleting means 9 receives the identification flag F ₂ in the storage means 8 (step 303;
Y), the defect data having the inner tracking off address (for example, IA-1) following the flag F ₂ in the storage means 8 as the defect occurrence address is deleted from the defect inspection section 7 (step 304), and the next step is executed. move on. If the identification flag F ₁ does not exist in the storage means 8 (step 303; N), step 30 is performed without any processing.
Go to 5. As described above, in the fourth embodiment, when the data is stored in the storage means 8, the identification flag F of the stored data indicates the off-tracking area or the address, and the area indicated by the stored data or The stored data having the same defect occurrence address as the address is deleted from 7. What remains in the defect inspection section 7 after these operations is correct defect data (step 3).
05).

[0030]

According to the first aspect of the present invention, since the outer tracking off area and the inner tracking off address are stored in different storage means, the outer and inner tracking off locations can be determined from the stored data. The data shown can be easily and surely extracted. Claim 2
In the described invention, the outer tracking off-track area and the inner tracking off-track are added to the calculation address by different identification flags and stored in the storage means. It is possible to easily distinguish the data shown.

According to the third aspect of the present invention, since the data deleting means deletes the erroneous data due to the tracking error from the defect data, it is possible to eliminate the influence of the tracking error from the defect data. According to the invention described in claim 4, since the data deleting unit deletes the erroneous data due to the tracking error from the defect data, it is possible to eliminate the influence of the tracking error from the defect data.

[Brief description of drawings]

FIG. 1 is a block diagram showing a first embodiment of an optical disc defect inspection apparatus of the present invention.

FIG. 2 is a block diagram showing the second embodiment.

FIG. 3 is a diagram for explaining the second embodiment.

FIG. 4 is a block diagram showing the third embodiment.

FIG. 5 is a diagram for explaining a storage state of the third embodiment.

FIG. 6 is a flowchart for explaining the operation of the third embodiment.

FIG. 7 is a block diagram showing the fourth embodiment.

FIG. 8 is an explanatory diagram for explaining the operation of the fourth embodiment.

FIG. 9 is a flowchart for explaining the operation of the fourth embodiment.

FIG. 10 is a block diagram showing a conventional optical disc defect inspection apparatus.

FIG. 11 is an explanatory diagram for explaining the same operation.

FIG. 12 is a block diagram showing another conventional optical disc defect inspection apparatus.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 optical pickup section 2 optical disk 3 signal processing section 4 address decoding section 5 address update holding section 6 address comparison section 7 defect inspection section 8 storage means 8a outer tracking off area storage means 8b inner tracking off address storage means 9 data deletion means

Claims (4)

[Claims] 1. A signal processing unit converts information read from an optical disc by an optical pickup unit into an electric signal, and a decoding address is obtained based on the electric signal from the signal processing unit.
In the optical disc defect inspection apparatus that compares the decoded address and the updated address of the address update holding unit in the address comparison unit and issues an operation command to the defect inspection unit when the two are the same, a storage unit having two different areas is provided, The address comparison unit may store the update address or the address obtained from the decoded address in different areas of the storage unit depending on the magnitude relationship between the updated address and the decoded address when the updated address and the decoded address are not equal to each other. An optical disk defect inspection apparatus characterized by the above. 2. A signal processing unit converts information read from an optical disc by an optical pickup unit into an electric signal, and a decoding address is obtained based on the electric signal from the signal processing unit.
In the optical disc defect inspection device that compares the decoded address and the updated address of the address update holding unit in the address comparison unit and issues an operation command to the defect inspection unit when the two are the same, a storage unit is provided, and the address comparison unit is When the update address and the decryption address are compared and not equal, an identification flag which differs depending on the size of the update address and the decryption address is added to the value of the address obtained from the update address or the decryption address and stored in the storage means. An optical disk defect inspection apparatus characterized by the above. 3. A signal processing unit converts information read from an optical disc by an optical pickup unit into an electric signal, and a decoding address is obtained based on the electric signal from the signal processing unit.
In the optical disc defect inspection apparatus which compares the decoded address and the updated address of the address update holding unit in the address comparison unit and issues an operation command to the defect inspection unit when the two are the same, the storage unit having two different areas is provided. A data deleting unit is provided, and the data deleting unit can mutually refer to the data of the defect inspection unit and the data in different areas of the storage unit,
An optical disk defect inspection device characterized in that defect data corresponding to addresses or areas stored in different areas of the storage means can be deleted from the data in the defect inspection section. 4. A signal processing unit converts information read from an optical disc by an optical pickup unit into an electric signal, and a decoding address is obtained based on the electric signal from the signal processing unit.
In the optical disc defect inspection apparatus which compares the decoded address with the update address of the address update holding unit by the address comparison unit and issues an operation command to the defect inspection unit when the two are equal, a storage unit and a data deletion unit are provided. The data deleting unit can mutually refer to the data in the storage unit and the data in the defect inspection unit based on the identifiers, and the defect data corresponding to the address or area stored in the storage unit can be stored in the defect inspection unit. An optical disk defect inspection device characterized in that it can be deleted from the inside.