JP3202426B2 - Optical disk defect inspection device - Google Patents

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical disk defect inspection apparatus for reading and inspecting information stored on an optical disk.

2. Description of the Related Art Conventionally, as an optical disk defect inspection apparatus of this type, an apparatus for detecting a defect in a data portion of an optical disk having an address has been proposed. The optical disk is irradiated with laser light and reflected light from the optical disk. Is detected by the optical pickup unit, the address is decoded from the detected signal, an operation command is given to the defect inspection unit, and the data unit is inspected for defects.

In such an optical disk defect inspection apparatus,
When the address is decoded, only the data portion is inspected for defects, and the continuity of the address itself is not checked. The fact that the addresses are not continuous means that tracking has been lost, and that the presence or absence of tracking has not been checked. As described above, if the above-described tracking error occurs during the defect inspection, there is a possibility that the defect inspection is performed twice, and additionally, an uninspected portion is generated, or an erroneous value is mixed in the defect data. There was.

In order to solve the above-mentioned inconvenience, an optical disk defect inspection apparatus described in, for example, Japanese Patent Application Laid-Open No. 4-368628 has been proposed. FIG.
FIG. 1 is a block diagram illustrating a configuration of an optical disk defect inspection device described in the above publication. In FIG. 10, an optical disk defect inspection apparatus includes, for example, an optical pickup unit 101 for reading information from an optical disk 102, a signal processing unit 103,
It comprises an address decoding unit 104, an address update holding unit 105, an address comparison unit 106, and a defect inspection unit 107. The address update holding unit 105 includes a next address register 105a and a reset unit 105b.

According to such an optical disk defect inspection apparatus, an optical disk 102 is irradiated with laser light from an optical pickup unit 101, and the reflected light is applied to the optical pickup unit 101.
To detect. Output signal S from optical pickup unit 101
a is photoelectrically converted by the signal processing unit 103. The output signal of the signal processing unit 103 is input to the address decoding unit 104 and the defect inspection unit 107. The value of the address A _2, which are decoded by address decode unit 104 is supplied to the address comparator unit 106 and the defect inspection unit 107. The next address register 105 a of the address update holding unit 105 holds the next update address A _{1, and} gives the held update address A ₁ to the address comparison unit 106. In addition,
The value of the next address register 105a is set to the test start address by the reset unit 105b at the start of the test. The defect inspection unit 107 performs a defect inspection of the data portion of the optical disc 102 according to an operation command from the address comparison unit 106.

During a data defect inspection, the address comparing unit 1
06 compares the decrypted address A ₂ which are decoded by address decode unit 104, an update address A ₁ stored in the next address register 105a. At this time, A
₁ = in the case of A _2, the operation command Sb to the defect inspection unit 107
Together give, changing the value of A ₁ giving update command Sc to the next address register 105a. Thus, it is possible to actually check while defect inspecting decrypted continuity decryption address A _2. If A ₁ ≠ A ₂ , then A ₂ → A ₀ as shown in FIG.
Since continuity of the decoded decodes the address A ₂ is eliminated is determined that the tracking is deviated.

FIG. 12 is a block diagram showing another example of the optical disk defect inspection apparatus described in the above publication. In this optical disc defect inspection apparatus, an address memory 108 is added to the apparatus shown in FIG.
06 according to a result of comparing the update address A ₁ and decodes the address A _2, the address A ₃ obtained by calculating from the update address A ₁ or decryption address A ₂ was set to be stored in the address memory 108 Things. This is a result of comparing the value of the update addresses A ₁ and decodes the address A _2, when A ₁ = A ₂ performs device similarly to the defect inspection of Figure 10. However, when A ₁ ≠ A ₂ , the address comparing unit 106 determines whether the update address A ₁ or the decryption address A
Performs an operation with respect to _2, the address memory 1 the value of the result of the address A ₃ as an address tracking is deviated
08 is stored.

[0007]

However, the above-described optical disk defect inspection apparatus has an advantage that it can detect the occurrence of tracking loss, but the occurrence of tracking loss is outside or inside. There is a disadvantage that it cannot be determined. In addition, there is a defect that the defect data is affected by the tracking error. SUMMARY OF THE INVENTION It is an object of the present invention to provide an optical disk defect inspection apparatus which solves the above-mentioned drawbacks, can identify a portion where a tracking error has occurred, and eliminates the influence of the tracking error on defect data.

[0008]

In order to achieve the above object, according to the present invention, information read from an optical disk by an optical pickup unit is converted into an electric signal by a signal processing unit.
In addition, a decoded address is obtained based on the electric signal from the signal processing unit, and the decoded address is compared with the updated address of the address update holding unit by the address comparing unit. When both are equal, an operation command is issued to the defect inspection unit. In the optical disc defect inspection apparatus, a storage means having two different areas is provided, and the address comparing section compares the update address with the decryption address when the update address and the decryption address are not equal. An address obtained by calculating from the address can be stored in a different area of the storage means.

According to another aspect of the present invention, information read from an optical disk by an optical pickup unit is converted into an electric signal by a signal processing unit, and a decoding address is determined based on the electric signal from the signal processing unit. In the optical disc defect inspection apparatus, the decoded address and the update address of the address update holding unit are compared by an address comparison unit, and when both are equal, an operation command is issued to the defect inspection unit.
When the storage means is provided and the address comparison unit compares the update address with the decryption address and finds that they are not equal, the address comparison unit obtains an identification flag that differs depending on the magnitude of the update address and the decryption address from the update address or the decryption address. It is characterized in that it is added to the address value and stored in the storage means.

In order to achieve the above object, the invention according to claim 3 provides an optical pickup unit for converting information read from an optical disk into an electric signal by a signal processing unit and decoding the information based on the electric signal from the signal processing unit. In the optical disc defect inspection apparatus, the decoded address and the update address of the address update holding unit are compared by an address comparison unit, and when both are equal, an operation command is issued to the defect inspection unit.
Providing storage means having two different areas,
Data deletion means, wherein the data deletion means can mutually refer to data in the defect inspection unit and data in different areas of the storage means, and can store addresses or areas stored in different areas of the storage means. Is configured to be able to delete the defect data corresponding to the data from the data in the defect inspection unit.

According to a fourth aspect of the present invention, information read from an optical disk by an optical pickup unit is converted into an electric signal by a signal processing unit, and a decoding address is decoded based on the electric signal from the signal processing unit. In the optical disc defect inspection apparatus, the decoded address and the update address of the address update holding unit are compared by an address comparison unit, and when both are equal, an operation command is issued to the defect inspection unit.
A storage unit is provided, and a data deletion unit is provided. The data deletion unit can refer to the data in the storage unit and the data in the defect inspection unit based on the identifier, and the address or the address stored in the storage unit. It is characterized in that the defect data corresponding to the area can be deleted from inside the defect inspection unit.

[0012]

According to the first aspect of the present invention, the information read from the optical disk by the optical pickup unit is converted into an electric signal by the signal processing unit, and a decoding address is obtained based on the electric signal from the signal processing unit. The address comparing unit compares the update address of the address update holding unit with the updated address. The address comparison unit compares the updated address with the decrypted address and compares the updated address or the decrypted address with each other. Can be stored respectively. With these data, it is immediately apparent whether the tracking error is outside or inside.

According to the second aspect of the present invention, when the update address is not equal to the decryption address, the address comparison unit obtains an identification flag that differs depending on the magnitude of the update address and the decryption address from the update address or the decryption address. It is stored in the storage means in addition to the value of the assigned address. Based on these flags, it is immediately apparent whether the tracking error is outside or inside. According to the third aspect of the present invention, the data deletion unit can mutually refer to the data of the defect inspection unit and the data in different areas of the storage unit.
In addition, defect data corresponding to addresses or areas stored in different areas of the storage means can be deleted from data in the defect inspection unit.

According to the fourth aspect of the present invention, the data deletion means can mutually refer to the data in the storage means and the data in the defect inspection unit based on the identifier, and store the data or the address in the address or area stored in the storage means. The corresponding defect data can be deleted from inside the defect inspection unit.

[0015]

DESCRIPTION OF THE PREFERRED EMBODIMENTS The present invention will be described below with reference to the illustrated embodiments. FIG. 1 is a block diagram showing a first embodiment of an optical disk defect inspection apparatus according to the present invention. In FIG. 1, the optical disk defect inspection apparatus is roughly divided into an optical pickup unit 1, a signal processing unit 3, an address decoding unit 4,
An address update holding unit 5, an address comparison unit 6, a defect inspection unit 7, an outside tracking off area storage unit 8a,
And an inner tracking off address storage means 8b. The address update holding unit 5 includes a next address register 5
a and a reset unit 5b. More specifically, the optical pickup unit 1 is connected to the signal processing unit 3 so that information of the optical disc 2 is input from the optical pickup unit 1. The signal processing unit 3 is configured so as to photoelectrically convert the information. The output unit of the signal processing unit 3 is connected to the address decoding unit 4 and the defect inspection unit 7.

The address update holding unit 5 is a circuit that can update and hold the next address value. The output of the address update holding unit 5 is connected to the address comparing unit 6. The output of the address decoding unit 4 is connected to another input of the address comparison unit 6. The address comparing unit 6 is a circuit for comparing the updated address A ₁ and the decryption address A _2. Each output of the address comparison unit 6 is sent to the defect inspection unit 7
It is connected to the outer tracking off area storage means 8a, the inner tracking off address storage means 8b, and the next address register 5a and the reset section 5b of the address update holding section 5. Thus, the output signal Sb defect inspection unit 7 from the address comparing unit 6, the calculation address A ₃ is outside the tracking out area storage unit 8a, the inner tracking off address storage unit 8b, updates the command Sc next address register 5a The reset address output signal Sd is supplied to the reset unit 5b.

The operation of the first embodiment configured as described above will be described with reference to FIG. The optical disk 2 is irradiated with laser light from the optical pickup unit 1, and the reflected light is detected by the optical pickup unit 1. The output signal Sa from the optical pickup unit 1 is photoelectrically converted by the signal processing unit 3. Signal processing unit 3
Are input to the address decoding unit 4 and the defect inspection unit 7. Address A ₂ decrypted by address decryption unit 4
Is supplied to the address comparison unit 6 and the defect inspection unit 7. In addition, the next address register 5a of the address update preserving unit 5 holds the next coming update addresses A _1,
Providing updates address A ₁ thereof held by the address comparator 6. The value of the next address register 5a is set to the test start address by the reset unit 5b at the start of the test. The defect inspection unit 7 performs a defect inspection of the data part of the optical disc 2 according to the operation command Sb from the address comparison unit 6.

[0018] a defect during inspection of the data unit, the address comparing unit 6 compares the decrypted address A ₂ which are decoded by address decode unit 4, an update address A ₁ stored in the next address register 5a. At this time, when A ₁ = A ₂ , the operation command Sb is given to the defect inspection unit 7 and the update command Sc is given to the next address register 5a. Thus, it is possible to actually check while defect inspecting decrypted continuity decryption address A _2. here,
When the address comparison unit 6 determines that A ₁ ≠ A ₂ , the address comparison unit 6 checks the magnitude of the update address A ₁ and the decryption address A _2, and if A ₁ <A ₂ , obtains the value based on these. Operation address A ₃ ((A ₁ -1), (A ₂ −
1)) is stored as the out-of-tracking area in the outer out-of-tracking area storage means 8a.

On the other hand, in the address comparing section 6, A ₁ ≠ A
_When it is determined as ₂ , the address comparing unit 6 checks the magnitude of the update address A ₁ and the decryption address A _2, and A ₁ > A ₂
In the case of, the operation address A ₃ ((A ₁ −
1)) is stored as an off-tracking address in the inner off-tracking address storage means 8b. FIG.
FIG. 6 is a block diagram showing a second embodiment of the present invention. In the second embodiment, the address comparing unit 6 of the first embodiment is modified, and the storage unit 8 is provided in place of the outer tracking off area storage unit 8a and the inner tracking off address storage unit 8b. That is, the address comparing unit 6
Compares the update address A ₁ with the decryption address A ₂ ,
When it is determined that A ₁演算 A ₂ , the flag F can be added to the operation address A ₃ . The storage means 8 is obtained to allow store operations address A ₃ by adding a flag F.

The operation of the second embodiment will be described. Figure 3 is an explanatory view showing a state where the store operation address A ₃ of the second embodiment is obtained by operating in the storage means 8.
In the second embodiment described above, A
_When it is determined that ₁ ≠ A ₂ , the address comparing unit 6 checks the magnitude of the update address A ₁ and the decryption address A _2, and finds A ₁
<For A _2, as shown in FIG. 3, the arithmetic address A ₃ obtained based on these addresses _{((A 1 -1), (} A 2 -
1)) by adding the flag F ₁ with respect to, a first storage data, it is stored in the storage means 8. Next, when the address comparing unit 6 is determined to A ₁ ≠ A _2, examine the magnitude of the address comparator 6 and the update address A ₁ and decodes the address A _2, the case of A _1> A _2, 3 As shown in
The operation address A ₃ ((A ₁ ′) obtained based on these addresses
-1)) to adding a flag F _2, as a second stored data, stored in the storage unit 8.

Further, A ₁ ≠ A
If it is determined ₂ and checks the size of the address comparator 6 and the update address A ₁ and decodes the address A _2, A ₁ <A ₂
In the case of, as shown in FIG. 3, the operation address A ₃ ((A ₁ ″ −1), (A ₂ ″ −1)) obtained based on these addresses
Adding a flag F ₁ with respect to, as a third stored data, are stored in the storage means 8. The above operation is sequentially repeated during the defect inspection.

FIG. 4 is a block diagram showing a third embodiment. In the third embodiment, a data deleting means 9 is added to the first embodiment. That is, in the third embodiment, the data deletion means 9 can mutually refer to the contents of the outer tracking out-of-track area storage means 8a, the inner tracking out-of-track address storage means 8b, and the defect inspection unit 7, and the outer tracking out If there is defect data having a common area or address in the out-of-area storage unit 8a and the in-tracking out-of-track address storage unit 8b, the data can be deleted from the defect inspection unit 7. Since the other components do not change, the same reference numerals are given and the description of the components is omitted.

The operation of the third embodiment will be described with reference to FIGS. FIG. 5 is an explanatory diagram for explaining the operation of the third embodiment. FIG. 5A shows a defect occurrence address and defect information stored in the defect inspection unit 7, and FIG. FIG. 5 shows the data type stored in the outer tracking-off area storage means 8a, and FIG. 5C shows the data type stored in the inner tracking-off address storage means 8b. FIG. 6 is a flowchart for explaining the third embodiment. In the third embodiment, as shown in FIG. 5 (a), the defect inspection means 7 includes defect occurrence addresses DA, DA ',.
D ',... Are sequentially made possible. Also,
The outer tracking off-region storage means 8a stores the information shown in FIG.
(B), the outer track out generation region _{(OA 1 -1, OA 2 -1} ), (OA 1 '-1, O
A ₂ '-1),... Are stored. Similarly, as shown in FIG. 5 (c), the inner tracking-off address (IA-
1), (IA'-1),... Are stored.

When the defect inspection (step 200) is completed, the data deleting means 9 includes the outer tracking off area storage means 8a and the inner tracking off address storing means 8
b and the data stored in the defect inspection unit 7 are mutually referred to.
Here, the data deletion means 9 (step 20 when the data within the outer track off area storage unit 8a (for example, OA ₂ -1 from OA ₁ -1) is stored
1; Y), the outer track off area of the address indicated by the stored data (address OA from OA ₁ -1 ₂ -
Defect data having 1) as a defect occurrence address is deleted from inside the defect inspection unit 7 (step 202), and the process proceeds to the next step.

If there is no data in the out-of-tracking-off area storage means 8a (step 201; N), the data deletion means 9 goes to step 203 without doing anything. Next, the data deleting means 9 determines whether or not there is data in the inner tracking-off address storage means 8b (step 203).
Y), the data (for example, (I
Defect data having A-1) as a defect occurrence address)
Is deleted (step 204), and the process proceeds to the next step. If there is no data (step 203; N),
Move to step 205. After these operations are completed, what remains in the defect inspection unit 7 is correct defect data which is not affected by tracking error. (Step 20
5).

FIG. 7 is a block diagram showing a fourth embodiment. In the fourth embodiment, a data deleting means 9 is added to the second embodiment. In the third embodiment, the data deleting unit 9 can refer to the contents of the storage unit 8 and the defect inspection unit 7 mutually, and stores a common area or address in the defect inspection unit 7 with the storage unit 8. If there is defect data having the following, the data can be deleted from the defect inspection unit 7. Since the other components do not change, the same reference numerals are given and the description of the components is omitted.

The operation of the fourth embodiment will be described based on FIG. 7 with reference to FIGS. FIG. 8A is an explanatory diagram illustrating an example of data stored in the defect inspection unit 7. FIG. 8B is an explanatory diagram illustrating an example of data stored in the storage unit 8. FIG. 9 is a flowchart for explaining the operation of the fourth embodiment. In this fourth embodiment, as shown in FIG. 8 (a), the defect inspection means 7 includes defect occurrence addresses DA, DA ',.
D ',... Are sequentially stored. Also,
As shown in FIG. 8B, a flag F
₁ and Address _{OA 1 -1, OA 2 -1,} F 2 and address IA ₁ -1, ... and are sequentially stored.

When the defect inspection (step 300) is completed, the data deleting means 9 mutually refers to the data stored in the storage means 8 and the data stored in the defect inspection section 7. Data deleting means 9, when there is identification flag F ₁ in the storage unit 8 (step 301; Y), the outer track off area data following the identification flag F ₁ (for example, OA ₁ -1, OA ₂ -1 )
In indicated by the address (e.g., OA ₂ from OA ₁ -1 -
The defect data having 1) as the defect occurrence address is deleted from the defect inspection section 7 (step 302), and the process proceeds to the next step. Further, when there is no identification flag F ₁ (step 301; N), nothing goes to step 303 without performing the process.

Next, the data deleting unit 9, when there is identification flag F ₂ in the storage unit 8 (step 303;
Y), the storage means 8 in the flag F ₂ followed inward tracking off address (for example, delete IA-1) to the defect data having the defect address from the defect inspection unit 7 (step 304), the next step move on. Further, when there is no identification flag F ₁ in the storage unit 8 (step 303; N), step 30 without performing any processing
Go to 5. As described above, in the fourth embodiment, when data is stored in the storage means 8, the off-tracking area or address is indicated by the identification flag F of the stored data, and the area or the area indicated by the stored data is indicated. The storage data having the same defect occurrence address as the address is deleted from 7. What remains in the defect inspection unit 7 after these operations is correct defect data (step 3).
05).

[0030]

According to the first aspect of the present invention, since the outer tracking-off area and the inner tracking-off address are stored in separate storage means, the outer and inner tracking-off locations can be determined from the stored data. The indicated data can be easily and reliably distinguished and extracted. Claim 2
In the described invention, different identification flags for the outer tracking off area and the inner tracking off are added to the operation address and stored in the storage means, so that the outer and inner tracking off locations are determined from the stored data. The data shown can be easily distinguished.

According to the third aspect of the present invention, erroneous data due to tracking error is deleted from the defect data by the data deleting means, so that the effect of tracking error can be eliminated from the defect data. According to the fourth aspect of the present invention, the erroneous data due to the out-of-track is deleted from the defect data by the data deleting unit, so that the influence of the out-of-track from the defect data can be eliminated.

[Brief description of the drawings]

FIG. 1 is a block diagram showing a first embodiment of an optical disk defect inspection apparatus according to the present invention.

FIG. 2 is a block diagram showing a second embodiment.

FIG. 3 is a diagram for explaining the second embodiment.

FIG. 4 is a block diagram showing a third embodiment.

FIG. 5 is a diagram for explaining a storage state according to the third embodiment.

FIG. 6 is a flowchart for explaining the operation of the third embodiment.

FIG. 7 is a block diagram showing a fourth embodiment.

FIG. 8 is an explanatory diagram for explaining the operation of the fourth embodiment.

FIG. 9 is a flowchart for explaining the operation of the fourth embodiment.

FIG. 10 is a block diagram showing a conventional optical disk defect inspection device.

FIG. 11 is an explanatory diagram for explaining the operation.

FIG. 12 is a block diagram showing another conventional optical disk defect inspection apparatus.

[Explanation of symbols]

 DESCRIPTION OF SYMBOLS 1 Optical pick-up part 2 Optical disk 3 Signal processing part 4 Address decoding part 5 Address update holding part 6 Address comparison part 7 Defect inspection part 8 Storage means 8a Outer tracking off area storage means 8b Inner tracking off address storage means 9 Data deletion means

──────────────────────────────────────────────────続 き Continued on the front page (58) Field surveyed (Int.Cl. ⁷ , DB name) G11B ^7/ 00-7/013

Claims (4)

(57) [Claims] The information read from an optical disc by an optical pickup unit is converted into an electric signal by a signal processing unit, and a decoding address is obtained based on the electric signal from the signal processing unit.
In the optical disc defect inspection device which compares the decrypted address with the update address of the address update holding unit by the address comparison unit and issues an operation command to the defect inspection unit when both are equal, a storage unit having two different areas is provided. The address comparing unit compares the update address with the decryption address and, when they are not equal, stores the update address or the address obtained from the decryption address in a different area of the storage unit according to the magnitude relationship between the update address and the decryption address. An optical disk defect inspection device, characterized in that: 2. The information read from an optical disc by an optical pickup unit is converted into an electric signal by a signal processing unit, and a decoding address is obtained based on the electric signal from the signal processing unit.
The decryption address and the update address of the address update holding unit are compared by an address comparison unit, and when both are equal, an optical disc defect inspection device that issues an operation command to the defect inspection unit is provided. When the update address is not equal to the decryption address, an identification flag that differs according to the magnitude of the update address and the decryption address is added to the value of the address obtained from the update address or the decryption address and stored in the storage unit. An optical disk defect inspection device, characterized in that: 3. A signal processing unit converts information read from an optical disk by an optical pickup unit into an electric signal, and obtains a decoding address based on the electric signal from the signal processing unit.
In the optical disc defect inspection apparatus which compares the decrypted address with the update address of the address update holding unit in the address comparison unit and issues an operation command to the defect inspection unit when both are equal, the storage means having two different areas is provided. Data deletion means, wherein the data deletion means can mutually refer to the data of the defect inspection unit and the data in different areas of the storage means,
An optical disk defect inspection apparatus, wherein defect data corresponding to an address or an area stored in a different area of the storage means can be deleted from the data in the defect inspection unit. 4. A signal processing unit converts information read from an optical disc by an optical pickup unit into an electric signal, and obtains a decoding address based on the electric signal from the signal processing unit.
In the optical disc defect inspection device which compares the decrypted address with the update address of the address update holding unit by the address comparison unit and issues an operation command to the defect inspection unit when both are equal, the storage unit is provided and the data deletion unit is provided. The data deletion unit can mutually refer to the data in the storage unit and the data in the defect inspection unit based on the identifier, and delete the defect data corresponding to the address or the area stored in the storage unit to the defect inspection unit. An optical disk defect inspection apparatus characterized in that it can be deleted from the inside.