JPH0739232Y2 - Lid for sealing electronic components - Google Patents

Lid for sealing electronic components

Info

Publication number
JPH0739232Y2
JPH0739232Y2 JP1992080272U JP8027292U JPH0739232Y2 JP H0739232 Y2 JPH0739232 Y2 JP H0739232Y2 JP 1992080272 U JP1992080272 U JP 1992080272U JP 8027292 U JP8027292 U JP 8027292U JP H0739232 Y2 JPH0739232 Y2 JP H0739232Y2
Authority
JP
Japan
Prior art keywords
adhesive
lid
lid member
electronic component
present
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1992080272U
Other languages
Japanese (ja)
Other versions
JPH0641145U (en
Inventor
武志 島
紳二 佐藤
雅之 土田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tomoegawa Co Ltd
Original Assignee
Tomoegawa Paper Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tomoegawa Paper Co Ltd filed Critical Tomoegawa Paper Co Ltd
Priority to JP1992080272U priority Critical patent/JPH0739232Y2/en
Publication of JPH0641145U publication Critical patent/JPH0641145U/en
Application granted granted Critical
Publication of JPH0739232Y2 publication Critical patent/JPH0739232Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Solid State Image Pick-Up Elements (AREA)

Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】本考案は、CCD(Charge Coupl
ed Device )やMOS(酸化金属半導体)等の固体撮像
素子の電子部品素子を容器に収納し、封止する際に用い
られる透光性キャップガラス等の電子部品素子封止用蓋
材に関する。
[Industrial application] This invention is a CCD (Charge Coupl
ED Device), MOS (Metal Oxide Semiconductor), and the like, and a lid member for sealing electronic component elements such as translucent cap glass used when housing and sealing electronic component elements such as solid-state imaging devices.

【0002】[0002]

【従来の技術】従来より半導体素子、特に、固体撮像素
子などを凹部形状を持ったパッケージ本体に実装した
後、その機能に応じた材質の蓋材(ガラス、セラミッ
ク、金属等)を接着剤を介して接合し封止する方法が用
いられている。
2. Description of the Related Art Conventionally, after mounting a semiconductor element, particularly a solid-state image pickup element, etc. on a package body having a concave shape, a lid material (glass, ceramic, metal, etc.) of a material suitable for the function is attached with an adhesive. A method of joining and sealing through is used.

【0003】図3は、前記封止方法が適用された固体撮
像装置の一例の断面図であって、表面にフィルター5が
貼り付けられた固体撮像素子1が、ダイアタッチ剤2に
よりセラミックパッケージ9に貼り付けられている。セ
ラミックパッケージ9には、固体撮像素子1と外部回路
とを電気的に接続するリードフレーム8が低融点ガラス
3によって固定されており、そしてリードフレーム8と
の固体撮像素子1とが金ワイヤー4によって接続されて
いる。セラミックパッケージ9の開口部には、透過性の
キャップガラスからなる蓋材6が接着剤7によって接着
され、固体撮像素子1が内部に収納、封止されている。
FIG. 3 is a cross-sectional view of an example of a solid-state image pickup device to which the above-mentioned sealing method is applied. In the solid-state image pickup device 1 having a filter 5 attached to the surface thereof, a ceramic package 9 is formed by a die attach agent 2. Pasted on. A lead frame 8 for electrically connecting the solid-state imaging device 1 and an external circuit is fixed to the ceramic package 9 by a low melting point glass 3, and the lead frame 8 and the solid-state imaging device 1 are connected by a gold wire 4. It is connected. A lid member 6 made of a transparent cap glass is adhered to the opening of the ceramic package 9 with an adhesive 7 so that the solid-state imaging device 1 is housed and sealed inside.

【0004】上記のような固体撮像装置においては、例
えば、特開昭58−164380号、同59−1815
79号公報に示されているとおり、予め低融点ガラスや
エポキシ系の有機系接着剤を塗布したキャップガラスを
セラミックパッケージの開口部を塞ぐように設置し、そ
のまま或いはクリップ等で加圧しながら加熱して接着剤
を溶かし、セラミックパッケージとキャップガラスとを
接着している。
In the solid-state image pickup device as described above, for example, JP-A-58-164380 and 59-1815.
As disclosed in Japanese Patent Publication No. 79, a cap glass coated with a low-melting glass or an epoxy-based organic adhesive in advance is installed so as to close the opening of the ceramic package and heated as it is or while applying pressure with a clip or the like. To melt the adhesive and bond the ceramic package and the cap glass.

【0005】該接着剤は、当初無機系のものが主体であ
ったが、熱処理温度の低い有機系の接着剤が使用される
ことが多くなった。
Initially, the adhesive was mainly an inorganic adhesive, but an organic adhesive having a low heat treatment temperature is often used.

【0006】このような製法においては、パッケ−ジ本
体及び蓋部の熱膨張率と有機系接着剤の熱膨張率が大き
く異なるため次のような問題が生じていた。
In such a manufacturing method, since the thermal expansion coefficient of the package body and the lid portion is greatly different from that of the organic adhesive, the following problems occur.

【0007】即ち、封止用接着剤は加熱直後から室温ま
で冷却される間に等方向に収縮しようとする。このと
き、接着剤の熱膨張率はパッケ−ジ本体及び蓋部材に比
べて大きいため、蓋材と接着剤、または、パッケージ本
体と接着剤との接着面に膨張率の差による応力が働き、
剥離が生じた。
That is, the sealing adhesive tends to shrink in the same direction immediately after being heated and while being cooled to room temperature. At this time, since the coefficient of thermal expansion of the adhesive is larger than that of the package body and the lid member, stress due to the difference in the coefficient of expansion acts on the adhesive surface between the lid material and the adhesive, or the package body and the adhesive,
Peeling occurred.

【0008】特に最近パッケージの小型化に伴いパッケ
ージ本体と蓋材とのシール幅(接着幅)が必然的に狭く
なり、従って蓋材と接着剤層との界面に前記熱膨張率の
差に起因する応力が集中しやすくなるため剥離の防止が
大きな課題となっていた。
Particularly, with the recent miniaturization of the package, the seal width (bonding width) between the package body and the lid material is inevitably narrowed, and therefore, due to the difference in the coefficient of thermal expansion at the interface between the lid material and the adhesive layer. Since the stress to be applied tends to concentrate, prevention of peeling has been a major issue.

【0009】[0009]

【考案が解決しようとする課題】本考案は、上記従来の
技術に鑑み、電子部品用パッケージを封止する際に生じ
ていた蓋材と接着剤またはパッケージ本体と接着剤との
界面での剥離の問題を、蓋材の面取りの寸法にて解決す
ることを目的とする。
DISCLOSURE OF THE INVENTION In view of the above-mentioned conventional technique, the present invention is a peeling at an interface between a lid material and an adhesive agent or a package body and an adhesive agent, which is generated when an electronic component package is sealed. It is an object of the present invention to solve the above problem by the chamfering dimension of the lid material.

【0010】[0010]

【課題を解決するための手段】本考案は、電子部品素子
をパッケージに収納して有機系接着剤を介して封止する
厚さ0.3〜2.0mmのガラスからなる蓋材であっ
て、該蓋材の少なくとも接着剤への隣接面の周縁部に面
取りがなされ、かつ該面取りを構成する前記隣接面から
の距離Aおよび蓋材の側面からの距離Bが0.05〜
0.20mmの寸法を有することを特徴とする電子部品
素子封止用蓋材に関する。
SUMMARY OF THE INVENTION The present invention is a lid member made of glass having a thickness of 0.3 to 2.0 mm for housing electronic component elements in a package and sealing them with an organic adhesive. A chamfer is made on at least the peripheral portion of the surface of the lid material adjacent to the adhesive, and the distance A from the adjacent surface and the distance B from the side surface of the lid material that constitute the chamfer are 0.05 to.
The present invention relates to a lid member for sealing electronic component elements, which has a dimension of 0.20 mm.

【0011】以下、図面にもとづき本考案を詳述する。The present invention will be described below in detail with reference to the drawings.

【0012】図1(a)および(b)は本考案の蓋材の
断面図の1例であり、本考案はガラスキャップからなる
蓋材6の接着剤7への隣接面10の周縁部Xに面取りが
なされ、かつ該面取りを構成する前記隣接面10からの
距離Aと側面11からの距離Bが0.05〜0.2mm
の寸法にて面取りされている。
FIGS. 1 (a) and 1 (b) are examples of a sectional view of a lid member of the present invention, and the present invention shows a peripheral portion X of a surface 10 of a lid member 6 made of a glass cap adjacent to an adhesive 7. Is chamfered, and the distance A from the adjacent surface 10 and the distance B from the side surface 11 constituting the chamfer are 0.05 to 0.2 mm.
Is chamfered in the dimensions.

【0013】その際、蓋材の厚さTは0.3〜2.0m
mであることが必要であり、また、蓋材の縦と横の寸法
は5〜60mm×5〜60mmのものが本考案に適用さ
れる。蓋材の厚さが0.3mm以下であると、蓋材の強
度が低くなり実用上問題が生じ、また、蓋材の厚さが
2.0mm以上であると、パッケージの容積が厚くなり
すぎて装置の小型化の支障となり、光透過率が低下して
鮮明な画像が得られにくくなるという問題を生じる。
At this time, the thickness T of the lid member is 0.3 to 2.0 m.
It is necessary that the length is m, and the length and width of the lid member are 5 to 60 mm × 5 to 60 mm, which is applied to the present invention. When the thickness of the lid material is 0.3 mm or less, the strength of the lid material becomes low, which causes a problem in practical use, and when the thickness of the lid material is 2.0 mm or more, the package volume becomes too thick. As a result, there is a problem in that the size of the device is hindered, the light transmittance is lowered, and it becomes difficult to obtain a clear image.

【0014】そして、本考案の蓋材のもう一方の面であ
る、接着剤に非接触の面の周縁部Yの面取り寸法は0.
05〜0.2mmの範囲内である必要はかならずしもな
いが、前記周縁部Xの面取り作業時等による欠けを防止
するために所望の寸法にて面取りすることが好ましい。
The chamfered dimension of the peripheral portion Y of the other surface of the lid member of the present invention which is not in contact with the adhesive is 0.
It is not absolutely necessary that the thickness is in the range of 05 to 0.2 mm, but it is preferable to chamfer the peripheral portion X at a desired size in order to prevent chipping due to chamfering work or the like.

【0015】また、本考案でいう接着剤と隣接する面の
周縁部Xの形状は前記図1(a)のように角型でもよい
し、図1(b)に示す丸味を帯びたものでもよいし、特
に形状は限定されない。
The shape of the peripheral portion X of the surface adjacent to the adhesive according to the present invention may be rectangular as shown in FIG. 1 (a) or may be rounded as shown in FIG. 1 (b). However, the shape is not particularly limited.

【0016】また、本考案でいう周縁部Xとは、図2で
示した本考案の蓋材6の平面図において4つの稜に対応
した周縁部X1〜X4の全てを含むものである。さらに、
また、本考案でいうAとBは同一寸法でもよく、異なっ
ていてもよい。
Further, the peripheral portion X in the present invention is intended to include all four peripheral portions X 1 to X 4 which corresponds to the edge in a plan view of the lid 6 of the present invention shown in FIG. further,
In the present invention, A and B may have the same size or may have different sizes.

【0017】本考案において周縁部Xの面取り寸法A、
Bが0.05mm以下の場合は、周縁部Xの欠けが発生
しやすく、また、0.20mm以上であると、蓋材と接
着剤との間に剥離を生じ本考案の目的を達することがで
きない。
In the present invention, the chamfering dimension A of the peripheral portion X,
When B is 0.05 mm or less, chipping of the peripheral portion X is likely to occur, and when B is 0.20 mm or more, peeling occurs between the lid material and the adhesive, and the object of the present invention can be achieved. Can not.

【0018】また、本考案の蓋材は、図2でいう平面か
らみた4隅のコーナー部Zの欠けを防止するため該コー
ナー部Zに対し、C0.2〜C1.0(JISZ831
7の製図における寸法記入法に準ずる)の面取り(コー
ナーカット)を施すことが好ましい。
Further, the lid member of the present invention is designed to prevent the corner portions Z of the four corners viewed from the plane shown in FIG. 2 from being chipped, so that C0.2 to C1.0 (JISZ831) is applied to the corner portions Z.
It is preferable to chamfer (corner cut) according to the dimensioning method in the drawing of No. 7.

【0019】本考案の電子部品素子とは、固体撮像素
子、メモリ、マイクロプロセッサ、マイクロコントロー
ラ、リニアIC、ASIC(APPLICATION SPECIFIC I
C) 、ディスクリート、ハイブリッドIC、水晶振動
子、レーザーピックアップ等であり、特に、固体撮像素
子を封止するものに好適に適用される。
The electronic component element of the present invention is a solid-state image sensor, memory, microprocessor, microcontroller, linear IC, ASIC (APPLICATION SPECIFIC I).
C) is a discrete IC, a hybrid IC, a crystal oscillator, a laser pickup, and the like, and is particularly preferably applied to one that seals a solid-state image sensor.

【0020】本考案のパッケージとは、上述の電子部品
素子の封止用のもので、DIP(デュアル・イン・ライ
ン・パッケージ)、チップ・キャリア、PGA(ピン・
グリッド・アレイ)等が使用され、材質は、アルミナ、
窒化アルミ、酸化ベリリウム、炭化珪素等のセラミック
スやガラス等である。
The package of the present invention is for encapsulating the above-mentioned electronic component element, and includes DIP (dual in line package), chip carrier, PGA (pin package).
Grid / array) etc. are used, the material is alumina,
Examples thereof include ceramics such as aluminum nitride, beryllium oxide, and silicon carbide, and glass.

【0021】また、本考案の接着剤は、主として有機系
接着剤が使用され、例えばユリア樹脂接着剤、メラミン
樹脂接着剤、エポキシ樹脂接着剤、フェノール樹脂接着
剤、アクリル系接着剤、ポリエステル系接着剤、ポリウ
レタン系接着剤、シリコーン系接着剤、ポリイミド系接
着剤等の熱硬化性樹脂系接着剤や、酢酸ビニル樹脂接着
剤、エチレン・酢酸ビニル樹脂接着剤、アクリル樹脂接
着剤、シアノアクリレート系接着剤、塩化ビニル樹脂、
ポリアミド樹脂、ポリオレフィン樹脂、セルロース系樹
脂、飽和ポリエステル、ポリウレタン、嫌気性等の熱可
塑性樹脂系接着剤、更に、エラストマー系接着剤等が用
いられるが、これらは単独もしくは2種類以上を混合し
て使用可能である。
The adhesive of the present invention is mainly an organic adhesive, such as urea resin adhesive, melamine resin adhesive, epoxy resin adhesive, phenol resin adhesive, acrylic adhesive, polyester adhesive. Adhesives, polyurethane adhesives, silicone adhesives, polyimide adhesives and other thermosetting resin adhesives, vinyl acetate resin adhesives, ethylene / vinyl acetate resin adhesives, acrylic resin adhesives, cyanoacrylate adhesives Agent, vinyl chloride resin,
Polyamide resin, polyolefin resin, cellulosic resin, saturated polyester, polyurethane, anaerobic thermoplastic resin adhesive, and elastomer adhesive are used, and these are used alone or in combination of two or more. It is possible.

【0022】本考案の蓋材とは、ガラスが用いられる。Glass is used as the lid material of the present invention.

【0023】本考案の蓋材の面取り方法は、機械加工に
よる面取り、フッ酸等で蓋材を溶かして面取り部を形成
するケミカルエッチング、溶融等の方法があるが、いず
れの方法を用いてもよい。
The method for chamfering the lid material of the present invention includes methods such as chamfering by machining, chemical etching for melting the lid material with hydrofluoric acid or the like to form a chamfered portion, melting, and the like. Good.

【0024】[0024]

【実施例】 ・エポキシ樹脂(日本化薬社製 商品名;EOCN-1027) 100.0重量部 ・酸無水物 (日本化薬社製 商品名;カヤハ-ト゛MCD) 75.2重量部 ・シリカ (日本化学工業社製 商品名;シルスタ-) 120.0重量部 ・メチルエチルケトン 50.0重量部Example: Epoxy resin (Nippon Kayaku Co., Ltd., trade name; EOCN-1027) 100.0 parts by weight Acid anhydride (Nippon Kayaku Co., Ltd., trade name; Kayaha MCD) 75.2 parts by weight Silica (Nippon Kagaku Kogyo Co., Ltd., product name: Sylster) 120.0 parts by weight Methyl ethyl ketone 50.0 parts by weight

【0025】上記の配合物をボールミルにて100rp
mで10分間攪拌して接着剤を作製し、該接着剤を、厚
さ7mm、寸法が10mm×10mmのガラス(旭ガラ
ス社製、商品名;AN)に対して表1に示すようにそれ
ぞれ面取りした本考案のキャップガラスからなる蓋材
(実施例1〜3)に、スクリーン印刷によりキャップガ
ラスの端面から内側に向かって1.5mmの幅で枠状に
塗布したのち加熱乾燥して半硬化状にし、これを電子部
品収納用パッケージの開口部に載置し、板バネにより2
kgの荷重を加えながらクリーンオーブンにて室温から
150℃まで30分で昇温し、150℃で2時間放置
後、4時間かけて室温まで徐冷した。その際、各実施例
とも20枚のキャップガラスを使用して接着および評価
をおこない、その結果を表1に示した。
100 ppm of the above compound in a ball mill
An adhesive was prepared by stirring at m for 10 minutes, and the adhesive was used as shown in Table 1 for a glass having a thickness of 7 mm and a size of 10 mm × 10 mm (Asahi Glass Co., Ltd., trade name; AN). The chamfered lid material (Examples 1 to 3) made of the cap glass of the present invention was applied in a frame shape with a width of 1.5 mm from the end surface of the cap glass to the inside by screen printing, and then dried by heating to be semi-cured. And place it in the opening of the electronic component storage package.
While applying a load of kg, the temperature was raised from room temperature to 150 ° C in 30 minutes in a clean oven, left at 150 ° C for 2 hours, and then gradually cooled to room temperature over 4 hours. At that time, 20 sheets of cap glass were used in each Example for adhesion and evaluation, and the results are shown in Table 1.

【0026】[0026]

【表1】 [Table 1]

【0027】比較例 蓋材の面取りの寸法を表2のように設定して比較用の蓋
材(比較例1〜2)を作製した他は実施例と同様にして
接着および評価を行った。その結果を表2に示す。
Comparative Example Adhesion and evaluation were carried out in the same manner as in the example except that the chamfered dimensions of the lid material were set as shown in Table 2 to produce lid materials for comparison (Comparative Examples 1 and 2). The results are shown in Table 2.

【0028】[0028]

【表2】 [Table 2]

【0029】評価は、実体顕微鏡(20倍)にて、接着
剤とキャップガラスの界面を全周観察し、20枚のキャ
ップガラスのうち剥離の認められたものの枚数を剥離発
生回数とした。
The evaluation was performed by observing the entire circumference of the interface between the adhesive and the cap glass with a stereoscopic microscope (20 times), and the number of pieces of the 20 pieces of cap glass where peeling was recognized was defined as the number of times peeling occurred.

【0030】さらに、実体顕微鏡(20倍)にて、キャ
ップガラスの界面を全集観察し、欠け(チッピング)の
発生についても評価し、これらについても20枚のキャ
ップガラスのうち欠けが発生した枚数をチッピング発生
回数とした。
Further, the entire interface of the cap glass was observed under a stereoscopic microscope (20 times) to evaluate the occurrence of chipping (chipping). The number of chipping occurrences was set.

【0031】表1および表2から明らかなとおり、本考
案を例用することにより剥離発生、チッピングの発生を
防止することがわかった。
As is clear from Tables 1 and 2, it was found that peeling and chipping were prevented by using the present invention as an example.

【0032】[0032]

【考案の効果】本考案により、電子部品素子を封止する
蓋材およびパッケージ本体と接着剤との間で剥離の生じ
ない良好な電子部品素子封止用蓋材が得られた。
According to the present invention, a good lid member for sealing electronic component elements and a good lid member for sealing electronic component elements in which peeling does not occur between the package body and the adhesive can be obtained.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案による断面図による蓋材の面取りの例FIG. 1 is an example of chamfering a lid material by a sectional view according to the present invention.

【図2】本考案の蓋材の平面図FIG. 2 is a plan view of the lid member of the present invention.

【図3】固体撮像装置の一例の断面図FIG. 3 is a sectional view of an example of a solid-state imaging device.

【符号の説明】[Explanation of symbols]

1 固体撮像素子 2 ダイアタッチ剤 3 低融点ガラス 4 金ワイヤー 5 フィルター 6 キャップガラスからなる蓋材 7 接着剤 8 リードフレーム 9 セラミックパッケージ 10 接着剤への隣接面 11 蓋材の側面 A 蓋材の接着剤への隣接面からの距離 B 蓋材の側面からの距離 X 蓋材の接着剤隣接面の周縁部 Y 蓋材の接着剤非隣接面の周縁部 Z 平面からみた4隅のコーナー部 T 蓋材の厚さ 1 Solid-state imaging device 2 Die attach agent 3 Low melting point glass 4 Gold wire 5 Filter 6 Cap glass lid 7 Adhesive 8 Lead frame 9 Ceramic package 10 Adjacent surface to adhesive 11 Side of lid A Adhesion of lid Distance from the adjacent surface to the agent B Distance from the side surface of the lid material X Edge of the adhesive material adjacent surface of the lid material Y Edge of the adhesive material non-adjacent surface of the lid material Z Corners at the four corners seen from the plane T Lid Material thickness

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 電子部品素子をパッケージに収納して
機系接着剤を介して封止する厚さ0.3〜2.0mmの
ガラスからなる蓋材であって、該蓋材の少なくとも接着
剤への隣接面の周縁部に面取りがなされ、かつ該面取り
を構成する前記隣接面からの距離Aおよび蓋材の側面か
らの距離Bが0.05〜0.20mmの寸法を有するこ
とを特徴とする電子部品素子封止用蓋材。
[Claim 1] housing the electronic component element in the package Yes
With a thickness of 0.3-2.0 mm, which is sealed via mechanical adhesive
A lid member made of glass , which is chamfered at least at a peripheral portion of a surface of the lid member adjacent to the adhesive, and a distance A from the adjacent surface constituting the chamfer and a distance B from a side surface of the lid member. Has a dimension of 0.05 to 0.20 mm, a lid member for encapsulating an electronic component element.
【請求項2】 電子部品素子が固体撮像素子である請求
項1の電子部品素子封止用蓋材。
2. The lid member for encapsulating an electronic component according to claim 1, wherein the electronic component is a solid-state image sensor.
JP1992080272U 1992-10-28 1992-10-28 Lid for sealing electronic components Expired - Lifetime JPH0739232Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1992080272U JPH0739232Y2 (en) 1992-10-28 1992-10-28 Lid for sealing electronic components

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1992080272U JPH0739232Y2 (en) 1992-10-28 1992-10-28 Lid for sealing electronic components

Publications (2)

Publication Number Publication Date
JPH0641145U JPH0641145U (en) 1994-05-31
JPH0739232Y2 true JPH0739232Y2 (en) 1995-09-06

Family

ID=13713654

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1992080272U Expired - Lifetime JPH0739232Y2 (en) 1992-10-28 1992-10-28 Lid for sealing electronic components

Country Status (1)

Country Link
JP (1) JPH0739232Y2 (en)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4637505B2 (en) * 2004-05-26 2011-02-23 京セラ株式会社 Magnetic sensor device
JP2011114838A (en) * 2009-11-30 2011-06-09 Kyocera Kinseki Corp Piezoelectric vibrator and piezoelectric oscillator
WO2017094502A1 (en) * 2015-11-30 2017-06-08 ソニー株式会社 Solid-state image capture device, method for manufacturing same, and electronic device

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5815260A (en) * 1981-07-21 1983-01-28 Denki Kagaku Kogyo Kk Sealing agent for semiconductor package
JPS6119386A (en) * 1984-07-05 1986-01-28 Daicel Chem Ind Ltd Screen printing method
JPH065718B2 (en) * 1985-02-13 1994-01-19 株式会社日立製作所 Solid-state imaging device
JPH066511Y2 (en) * 1985-12-03 1994-02-16 ソニー株式会社 Solid-state imaging device
JPS6329974A (en) * 1986-07-23 1988-02-08 Nec Corp Semiconductor device for ccd image sensor
JPS6333847A (en) * 1986-07-29 1988-02-13 Fuji Photo Film Co Ltd Glass capping method
JPS63116461A (en) * 1986-11-05 1988-05-20 Tomoegawa Paper Co Ltd Hermetic sealing for solid-state image pickup device
JPH0653586B2 (en) * 1990-03-08 1994-07-20 株式会社巴川製紙所 Method for processing cap glass for solid-state imaging device
JPH0453156A (en) * 1990-06-18 1992-02-20 Nippon Electric Glass Co Ltd Plate glass for ceramic package
JPH0613507A (en) * 1992-06-26 1994-01-21 Sumitomo Electric Ind Ltd Components for semiconductor sealing device
JPH0739232A (en) * 1993-07-28 1995-02-10 Kubota Corp Grass-dividing structure of combine

Also Published As

Publication number Publication date
JPH0641145U (en) 1994-05-31

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