JPH0736298Y2 - 測定用電源 - Google Patents
測定用電源Info
- Publication number
- JPH0736298Y2 JPH0736298Y2 JP1989007890U JP789089U JPH0736298Y2 JP H0736298 Y2 JPH0736298 Y2 JP H0736298Y2 JP 1989007890 U JP1989007890 U JP 1989007890U JP 789089 U JP789089 U JP 789089U JP H0736298 Y2 JPH0736298 Y2 JP H0736298Y2
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- drain
- drain voltage
- power supply
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005259 measurement Methods 0.000 title description 7
- 230000005669 field effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- TVZRAEYQIKYCPH-UHFFFAOYSA-N 3-(trimethylsilyl)propane-1-sulfonic acid Chemical compound C[Si](C)(C)CCCS(O)(=O)=O TVZRAEYQIKYCPH-UHFFFAOYSA-N 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989007890U JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1989007890U JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0299374U JPH0299374U (enrdf_load_html_response) | 1990-08-08 |
JPH0736298Y2 true JPH0736298Y2 (ja) | 1995-08-16 |
Family
ID=31213293
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1989007890U Expired - Fee Related JPH0736298Y2 (ja) | 1989-01-26 | 1989-01-26 | 測定用電源 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0736298Y2 (enrdf_load_html_response) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2529086B2 (ja) * | 1993-11-29 | 1996-08-28 | 株式会社穂高電子技術研究所 | 耐圧試験装置 |
TWI316607B (en) * | 2003-05-21 | 2009-11-01 | Advantest Corp | Electric source device, test device and power supply voltage stabilizer |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5824870A (ja) * | 1981-08-05 | 1983-02-14 | Nec Corp | 半導体素子試験装置 |
-
1989
- 1989-01-26 JP JP1989007890U patent/JPH0736298Y2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPH0299374U (enrdf_load_html_response) | 1990-08-08 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US5079456A (en) | Current monitoring and/or regulation for sense FET's | |
US7443645B2 (en) | Overcurrent detecting device | |
US5004970A (en) | Device and a process for detecting current flow in a MOS transistor | |
US4820968A (en) | Compensated current sensing circuit | |
US5343382A (en) | Adaptive current control | |
US4827207A (en) | Linear load current measurement circuit | |
US5397934A (en) | Apparatus and method for adjusting the threshold voltage of MOS transistors | |
US4893211A (en) | Method and circuit for providing adjustable control of short circuit current through a semiconductor device | |
EP0743529B1 (en) | Method and corresponding circuit for detecting an open load | |
EP1762853A2 (en) | Device and method for determining a load current | |
KR20060043008A (ko) | 전압 조정기 및 그의 제조 방법 | |
US5986441A (en) | Circuit configuration for capturing the load current of a power semiconductor component with a load on the source side | |
US6377053B1 (en) | Device for detecting short-circuits | |
JP3515695B2 (ja) | 誘導負荷の電流をスイッチング制御するための回路装置 | |
JP4245567B2 (ja) | 過電流検出装置 | |
JPH0736298Y2 (ja) | 測定用電源 | |
US20170363662A1 (en) | Method and circuitry for measuring current | |
US6954043B2 (en) | Power window driving apparatus | |
KR20230065718A (ko) | 프리휠링 다이오드 오픈 고장 진단 시스템 및 오픈 고장 진단 방법 | |
JP2927847B2 (ja) | 半導体装置 | |
JPS62211563A (ja) | 電流検出装置 | |
KR102775237B1 (ko) | 하프 브릿지 회로의 단선 진단 장치 및 단선 진단 방법 | |
JP2836382B2 (ja) | 直流電源 | |
KR970046674A (ko) | 솔레노이드 밸브의 페일 감지장치 | |
JP2590326Y2 (ja) | トランジスタ試験装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
LAPS | Cancellation because of no payment of annual fees |