JPH07297160A - Cleaning equipment for substrate - Google Patents

Cleaning equipment for substrate

Info

Publication number
JPH07297160A
JPH07297160A JP8878194A JP8878194A JPH07297160A JP H07297160 A JPH07297160 A JP H07297160A JP 8878194 A JP8878194 A JP 8878194A JP 8878194 A JP8878194 A JP 8878194A JP H07297160 A JPH07297160 A JP H07297160A
Authority
JP
Japan
Prior art keywords
substrate
cleaning liquid
cleaning
slit
shaped
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP8878194A
Other languages
Japanese (ja)
Other versions
JP3397884B2 (en
Inventor
Kazuo Kise
一夫 木瀬
Eiji Okuno
英治 奥野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP08878194A priority Critical patent/JP3397884B2/en
Publication of JPH07297160A publication Critical patent/JPH07297160A/en
Application granted granted Critical
Publication of JP3397884B2 publication Critical patent/JP3397884B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Landscapes

  • Preparing Plates And Mask In Photomechanical Process (AREA)
  • Cleaning By Liquid Or Steam (AREA)
  • Cleaning Or Drying Semiconductors (AREA)

Abstract

PURPOSE:To suppress uneven cleaning while reducing the consumption of cleaning liquid. CONSTITUTION:The cleaning equipment for substrate comprises a rotary table 2 for holding a substrate 1 horizontally, and a mobile cleaning liquid feeding section 3. The mobile cleaning liquid feeding section 3 comprises a nozzle part 20 movable horizontally with respect to the rotary table 2, wherein the nozzle part 20 is provided with a slit extending perpendicularly to the moving direction. The nozzle par 20 feeds a cleaning liquid to the surface of the substrate while moving in the horizontal direction.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、基板洗浄装置、特に基
板表面の洗浄処理を行う基板洗浄装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a substrate cleaning apparatus, and more particularly to a substrate cleaning apparatus for cleaning the surface of a substrate.

【0002】[0002]

【従来の技術】半導体ウエハ、液晶用ガラス角型基板、
カラーフィルタ用基板等の基板の表面に純水等の洗浄液
を供給して基板表面の洗浄処理を行うために基板洗浄装
置が用いられる。従来の基板洗浄装置は、基板を水平に
保持するとともに回転可能なスピンチャックと、スピン
チャック外周側の固定位置から洗浄液を噴出するキャピ
ラリー型のノズルとを有している。ここでは、スピンチ
ャックを回転させながらノズルから基板表面に洗浄液を
噴出し、基板表面の洗浄を行っている。
2. Description of the Related Art Semiconductor wafers, glass rectangular substrates for liquid crystals,
2. Description of the Related Art A substrate cleaning apparatus is used to supply a cleaning liquid such as pure water to the surface of a substrate such as a color filter substrate to clean the substrate surface. A conventional substrate cleaning apparatus has a spin chuck that holds a substrate horizontally and is rotatable, and a capillary type nozzle that ejects a cleaning liquid from a fixed position on the outer peripheral side of the spin chuck. Here, the cleaning liquid is jetted from the nozzle onto the substrate surface while rotating the spin chuck to clean the substrate surface.

【0003】また、洗浄液を供給するための可動ノズル
を設け、この可動ノズルによって回転する基板の中心部
に洗浄液を供給し、洗浄液を外周側に拡散させて基板表
面を洗浄する装置も提案されている。
An apparatus has also been proposed in which a movable nozzle for supplying a cleaning liquid is provided, the cleaning liquid is supplied to the center of a substrate rotated by the movable nozzle, and the cleaning liquid is diffused to the outer peripheral side to clean the substrate surface. There is.

【0004】[0004]

【発明が解決しようとする課題】従来のキャピラリー型
の噴出ノズルを用いた基板洗浄装置では、洗浄液の供給
範囲が狭いので、基板表面全体に洗浄液を供給するため
には複数のノズルが必要となる。このため配管等の装置
構成が複雑となる。また、固定された噴出ノズルから洗
浄液を供給する場合には、洗浄液の吐出圧力を強くする
必要があり、このため基板表面上で洗浄液のはねかえり
が生じ、洗浄液の消費量が多くなるとともに、洗浄液が
当たる部分と当たらない部分とで洗浄むらが生じる。さ
らに従来の洗浄装置では、洗浄液が基板表面に急激に供
給されるために表面に形成された膜との間で急激な化学
変化が生じる場合があり、膜に悪影響を与える場合があ
る。
In the conventional substrate cleaning apparatus using the ejection nozzle of the capillary type, since the supply range of the cleaning liquid is narrow, a plurality of nozzles are required to supply the cleaning liquid to the entire surface of the substrate. . This complicates the device configuration such as piping. Further, when supplying the cleaning liquid from the fixed ejection nozzle, it is necessary to increase the discharge pressure of the cleaning liquid, which causes the cleaning liquid to bounce on the surface of the substrate, increasing the consumption of the cleaning liquid and increasing the amount of the cleaning liquid. Washing unevenness occurs between the contact part and the non-contact part. Further, in the conventional cleaning apparatus, since the cleaning liquid is rapidly supplied to the surface of the substrate, a rapid chemical change may occur between the cleaning liquid and the film formed on the surface, which may adversely affect the film.

【0005】本発明の目的は、基板保持部に保持された
基板の表面に洗浄液を供給してその洗浄を行う基板洗浄
装置において、基板表面における洗浄液の跳ね返りによ
る洗浄むらを減少させることにある。本発明のさらなる
目的は、前記基板洗浄装置において、洗浄液の消費量を
従来装置に比べて減少させることが可能な基板洗浄装置
を提供することにある。
An object of the present invention is to reduce uneven cleaning due to splashing of the cleaning liquid on the surface of the substrate in a substrate cleaning apparatus that supplies the cleaning liquid to the surface of the substrate held by the substrate holder to clean the surface. A further object of the present invention is to provide a substrate cleaning apparatus capable of reducing the consumption of cleaning liquid in the substrate cleaning apparatus as compared with the conventional apparatus.

【0006】[0006]

【課題を解決するための手段】本発明に係る基板洗浄装
置は基板表面の洗浄処理を行う装置であり、基板を水平
に保持する基板保持部と、洗浄液供給手段とを備えてい
る。洗浄液供給手段は、基板保持部に対して水平方向に
相対移動自在であり、相対移動方向と交差する方向に延
びるスリット状洗浄液吐出部を有し、スリット状洗浄液
吐出部を基板保持部に対して水平方向に相対移動させな
がらスリット状洗浄液吐出部から基板表面に洗浄液を供
給する手段である。
A substrate cleaning apparatus according to the present invention is an apparatus for cleaning the surface of a substrate, and is provided with a substrate holding section for horizontally holding the substrate and a cleaning liquid supply means. The cleaning liquid supply unit is movable in the horizontal direction relative to the substrate holding unit, has a slit-shaped cleaning liquid ejection unit extending in a direction intersecting the relative movement direction, and the slit-shaped cleaning liquid ejection unit with respect to the substrate holding unit. It is a means for supplying the cleaning liquid to the substrate surface from the slit-shaped cleaning liquid discharger while relatively moving in the horizontal direction.

【0007】基板保持部の外周側に固定配置され、洗浄
液を噴出供給する洗浄液噴出ノズルと、基板保持部を回
転させるための回転機構とをさらに備えているのが好ま
しい。洗浄液供給手段は、洗浄液の供給量を制御するた
めの流量制御弁を有しているのが好ましい。
It is preferable to further include a cleaning liquid jet nozzle fixedly arranged on the outer peripheral side of the substrate holding portion for jetting the cleaning liquid, and a rotating mechanism for rotating the substrate holding portion. The cleaning liquid supply means preferably has a flow rate control valve for controlling the supply amount of the cleaning liquid.

【0008】基板が角型の場合は、スリット状洗浄液吐
出部は、このスリットが延びる方向の基板の辺の長さと
略同じ長さを有しているのが好ましい。スリット状洗浄
液吐出部は、基板保持部に対して相対的に接近、離反自
在であるのが好ましい。
When the substrate has a rectangular shape, it is preferable that the slit-shaped cleaning liquid discharger has a length substantially the same as the length of the side of the substrate in the direction in which the slit extends. It is preferable that the slit-shaped cleaning liquid ejecting section is relatively movable toward and away from the substrate holding section.

【0009】[0009]

【作用】本発明に係る基板洗浄装置では、洗浄液供給手
段が基板保持部に対して水平方向に相対移動しながら、
基板表面に対してスリット状洗浄液吐出部から処理液を
供給する。洗浄液は、相対移動方向と交差する方向に延
びるように設けられたスリット状の吐出部から供給され
る。
In the substrate cleaning apparatus according to the present invention, while the cleaning liquid supply means moves horizontally relative to the substrate holding portion,
The processing liquid is supplied to the substrate surface from the slit-shaped cleaning liquid discharger. The cleaning liquid is supplied from a slit-shaped discharge portion provided so as to extend in a direction intersecting the relative movement direction.

【0010】ここでは、洗浄液供給手段が基板に対して
相対的に移動しながらスリット状洗浄液吐出部を介して
基板表面に洗浄液を供給するので、従来の噴出ノズルか
ら洗浄液を供給する場合に比較して基板表面に対して均
一に洗浄液を供給することが可能となり、洗浄むらが少
なくなる。また、スリット状の吐出部を介して洗浄液を
供給するので、洗浄液の量を少なくできる。さらに、噴
出ノズルによる供給に比較して流量の制御を行いやす
い。
Here, since the cleaning liquid supply means supplies the cleaning liquid to the surface of the substrate through the slit-shaped cleaning liquid ejecting portion while moving relative to the substrate, compared with the conventional case where the cleaning liquid is supplied from the jet nozzle. As a result, the cleaning liquid can be uniformly supplied to the substrate surface, and uneven cleaning is reduced. Moreover, since the cleaning liquid is supplied through the slit-shaped ejection portion, the amount of the cleaning liquid can be reduced. Furthermore, it is easier to control the flow rate as compared with the supply by the ejection nozzle.

【0011】前記基板保持部の外周側に固定配置され洗
浄液を噴出供給する洗浄液噴出ノズルと、基板保持部を
回転させるための回転機構とをさらに備えた場合には、
スリット状洗浄液吐出部から供給される洗浄液によって
緩やかな洗浄を行った後に従来通りの噴出ノズルによる
洗浄によって短時間に基板表面の洗浄を行える。洗浄液
供給手段が、洗浄液の供給量を制御するための流量制御
弁をさらに有している場合には、流量制御することによ
って、緩やかな洗浄と急激な洗浄とを1つの装置で行え
る。また、流量をより正確に制御できる。
In the case where a cleaning liquid jet nozzle fixedly arranged on the outer peripheral side of the substrate holding portion for jetting the cleaning liquid and a rotating mechanism for rotating the substrate holding portion are further provided,
The substrate surface can be cleaned in a short time by the conventional cleaning with the jet nozzle after the cleaning is gently performed by the cleaning liquid supplied from the slit-shaped cleaning liquid ejection unit. When the cleaning liquid supply means further has a flow rate control valve for controlling the supply amount of the cleaning liquid, by controlling the flow rate, gentle cleaning and rapid cleaning can be performed by one device. In addition, the flow rate can be controlled more accurately.

【0012】基板が角型の場合は、スリット状洗浄液吐
出部を、このスリットが延びる方向の基板の辺の長さと
ほぼ同じ長さとした場合には、1度の走査(相対移動)
で基板表面の前面を洗浄できる。スリット状洗浄液吐出
部を基板保持部に対して相対的に接近、離反自在とした
場合には、洗浄中における基板表面の反応速度を制御で
きる。
When the substrate has a rectangular shape, the slit-shaped cleaning liquid ejecting portion has a length substantially equal to the length of the side of the substrate in the direction in which the slit extends, and the scanning is performed once (relative movement).
The front surface of the substrate surface can be cleaned with. When the slit-shaped cleaning liquid discharger can be moved closer to and away from the substrate holder, the reaction speed of the substrate surface during cleaning can be controlled.

【0013】[0013]

【実施例】図1及び図2は本発明の一実施例による基板
洗浄装置を示している。図において、基板洗浄装置は、
角型基板1を載置して保持する基板保持手段としての回
転台2と、移動洗浄液供給部3と、固定洗浄液供給部4
とを備えている。回転台2の径方向外周はカバー10で
覆われており、カバー10のさらに外方は外周カバー1
1で覆われている。また回転台2の下方には廃液回収ケ
ース12が設けられている。
1 and 2 show a substrate cleaning apparatus according to an embodiment of the present invention. In the figure, the substrate cleaning device is
A rotary table 2 as a substrate holding means for mounting and holding the rectangular substrate 1, a moving cleaning liquid supply unit 3, and a fixed cleaning liquid supply unit 4
It has and. The outer circumference of the rotary table 2 in the radial direction is covered with a cover 10, and the outer circumference of the cover 10 is further outside.
Covered with 1. A waste liquid collection case 12 is provided below the turntable 2.

【0014】回転台2は、鉛直方向の軸芯P周りに回転
可能であり、その上面には上方に突出する複数の支持ピ
ン13が設けられている。また回転台2の上面には、角
型基板1の四隅に対応してそれぞれ1対の位置決めピン
14が設けられている。回転台2の下方にはモータ15
が設けられており、その出力軸16が取付部材17を介
して回転台2に連結されている。移動洗浄液供給部3
は、ノズル部20と、ノズル部20を支持する横支持部
材21及び縦支持部材22と、ノズル部20を昇降させ
るための上下駆動機構23(図4参照)と、水平方向に
移動させるための水平駆動機構24と、ノズル部20に
洗浄液を供給するための洗浄液供給系25(図3参照)
とを有している。
The turntable 2 is rotatable about a vertical axis P, and a plurality of support pins 13 projecting upward are provided on the upper surface of the turntable 2. A pair of positioning pins 14 are provided on the upper surface of the turntable 2 so as to correspond to the four corners of the rectangular substrate 1. A motor 15 is provided below the turntable 2.
Is provided, and its output shaft 16 is connected to the rotary base 2 via a mounting member 17. Mobile cleaning liquid supply unit 3
Is a nozzle unit 20, a horizontal support member 21 and a vertical support member 22 that support the nozzle unit 20, an up-and-down drive mechanism 23 (see FIG. 4) for raising and lowering the nozzle unit 20, and a horizontal movement member. A horizontal drive mechanism 24 and a cleaning liquid supply system 25 for supplying the cleaning liquid to the nozzle portion 20 (see FIG. 3).
And have.

【0015】ノズル部20は、図3に示すように、倒立
家型であり、下面には角型基板1の短辺に沿って延びる
スリット20aを有している。また内部には縦方向に供
給通路20bが形成されており、その下端にはスリット
20aに連通している。ノズル部20及びそのスリット
20aは図2で示すように、基板1の短辺よりも若干長
く形成されている。横支持部材21はノズル部20の両
側方に設けられており、縦支持部材22は横支持部材2
1の両端部から下方に延びて設けられている。上下駆動
機構23は、図4に示すように、横支持部材21の一端
側に設けられており、横支持部材21の先端に固定され
たラック26と、このラック26に噛み合うピニオン2
7とを有している。ピニオン27は、モータ28の出力
軸29に固定されている。水平駆動機構24は、水平方
向に延びるボールねじ30と、ボールねじ30を駆動す
るためのモータ31とを有している。ボールねじ30に
は、縦支持部材22の下端に設けられたナット(図示せ
ず)が噛み合っている。またボールねじ30と対向する
側には、ボールねじ30と平行にガイド部材32が配置
されている。
As shown in FIG. 3, the nozzle portion 20 is of an inverted house type, and has a slit 20a extending along the short side of the rectangular substrate 1 on the lower surface. Further, a supply passage 20b is formed inside in the vertical direction, and the lower end thereof communicates with the slit 20a. As shown in FIG. 2, the nozzle portion 20 and its slit 20a are formed to be slightly longer than the short side of the substrate 1. The horizontal support members 21 are provided on both sides of the nozzle portion 20, and the vertical support members 22 are the horizontal support members 2.
1 is provided so as to extend downward from both ends. As shown in FIG. 4, the vertical drive mechanism 23 is provided on one end side of the horizontal support member 21, and has a rack 26 fixed to the tip of the horizontal support member 21 and a pinion 2 that meshes with the rack 26.
7 and 7. The pinion 27 is fixed to the output shaft 29 of the motor 28. The horizontal drive mechanism 24 includes a ball screw 30 extending in the horizontal direction and a motor 31 for driving the ball screw 30. A nut (not shown) provided at the lower end of the vertical support member 22 meshes with the ball screw 30. A guide member 32 is arranged parallel to the ball screw 30 on the side facing the ball screw 30.

【0016】このような構成により、ノズル部20は、
上下駆動機構23によって基板1に対して接近、離反自
在であり、また水平駆動機構24によって基板1の長辺
方向に移動させることが可能である。洗浄液供給系25
は、図3に示すように、ノズル部20内の供給通路20
bに連結されている。またこの洗浄液供給系25は、流
量制御弁33と流量計34とが設けられている。
With this structure, the nozzle portion 20 is
The vertical drive mechanism 23 can move toward and away from the substrate 1, and the horizontal drive mechanism 24 can move the substrate 1 in the long side direction. Cleaning liquid supply system 25
Is, as shown in FIG.
connected to b. Further, the cleaning liquid supply system 25 is provided with a flow control valve 33 and a flow meter 34.

【0017】固定洗浄液供給部4は、外周カバー11の
内部の複数個所に設けられた噴出ノズル40を有してい
る。複数の噴出ノズル40はそれぞれ回転台2の回転軸
芯Pに向けて配設されている。これらの噴出ノズル40
には洗浄液供給系25が接続されている。次に洗浄動作
について説明する。
The fixed cleaning liquid supply section 4 has ejection nozzles 40 provided at a plurality of locations inside the outer peripheral cover 11. The plurality of ejection nozzles 40 are arranged toward the rotary shaft core P of the rotary base 2, respectively. These ejection nozzles 40
A cleaning liquid supply system 25 is connected to. Next, the cleaning operation will be described.

【0018】まず基板1を回転台2上の所定位置に載置
し、位置決めピン14によって位置決め保持する。次に
上下駆動機構23を駆動させてノズル部20と基板1と
の間隔を調整する。次に流量制御弁33によって洗浄液
の流量を調節しながら洗浄液を供給し、これと同時に水
平駆動機構24を駆動してノズル部20を水平方向に移
動させる。これにより、ノズル部20のスリット20a
から供給される洗浄液によって基板表面の全面が洗浄さ
れる。なお、この移動洗浄液供給部3によって洗浄する
場合には、回転台2の回転は停止させておく。
First, the substrate 1 is placed at a predetermined position on the turntable 2 and positioned and held by the positioning pins 14. Next, the vertical drive mechanism 23 is driven to adjust the distance between the nozzle unit 20 and the substrate 1. Next, the cleaning liquid is supplied while the flow rate of the cleaning liquid is adjusted by the flow control valve 33, and at the same time, the horizontal drive mechanism 24 is driven to move the nozzle portion 20 in the horizontal direction. Thereby, the slit 20a of the nozzle unit 20
The entire surface of the substrate is cleaned with the cleaning liquid supplied from When cleaning is performed by the moving cleaning liquid supply unit 3, the rotation of the rotary table 2 is stopped.

【0019】ここでは、ノズル部20と基板表面との間
隔、洗浄液の流量及びノズル部20の移動スピードを調
整できるので、基板表面に塗布された薬液の種類に応じ
て洗浄状態を調節することができる。しかも基板表面の
全面に均一に洗浄液を供給でき、洗浄むらが少なくな
る。移動洗浄液供給部3による洗浄が終了した後は、ノ
ズル部20を基板1と対向する位置から退避させる。次
に回転台2を回転し、この状態で噴出ノズル40から洗
浄液を基板1の中心部に対して噴出する。基板1の中心
部に供給された洗浄液は遠心力によって外方に拡散し、
基板表面が洗浄される。
Here, since the distance between the nozzle portion 20 and the substrate surface, the flow rate of the cleaning liquid and the moving speed of the nozzle portion 20 can be adjusted, the cleaning state can be adjusted according to the type of the chemical liquid applied to the substrate surface. it can. Moreover, the cleaning liquid can be uniformly supplied to the entire surface of the substrate, and uneven cleaning can be reduced. After the cleaning by the moving cleaning liquid supply unit 3 is completed, the nozzle unit 20 is retracted from the position facing the substrate 1. Next, the turntable 2 is rotated, and in this state, the cleaning liquid is jetted from the jet nozzle 40 to the central portion of the substrate 1. The cleaning liquid supplied to the central portion of the substrate 1 diffuses outward due to centrifugal force,
The substrate surface is cleaned.

【0020】洗浄処理が終了した場合には、固定洗浄部
4からの洗浄液の供給を止め、回転台2の回転を継続す
る。これにより基板表面上の洗浄液は遠心力により振り
切られ、乾燥処理が行われる。 〔他の実施例〕 (a) 前記実施例では、固定洗浄液供給部4を設けた
が、移動洗浄液供給部3のみによって基板表面を洗浄す
るようにしてもよい。 (b) 固定洗浄液供給部4の代わりに可動ノズル型の
洗浄液供給部を設けてもよい。 (c) 前記実施例では移動洗浄液供給部3に供給する
洗浄液の供給系と、固定洗浄液供給部4に供給する洗浄
液の供給系とを同一としたが、それぞれ別の供給系を接
続して別の洗浄液を供給するようにしてもよい。 (d) 前記実施例ではノズル部20に単一の細長い開
口部からなるスリット20aが形成されていたが、本発
明はこれに限定されるものではなく、スリット20aの
代わりに、ノズル部20に多数の細孔がスリット状に配
列されてスリット状洗浄液吐出部を構成するもの、もし
くは多数の針状ノズルが配列されてスリット状洗浄液吐
出部を構成するものをも用いることができる。
When the cleaning process is completed, the supply of the cleaning liquid from the fixed cleaning unit 4 is stopped and the rotation of the rotary table 2 is continued. As a result, the cleaning liquid on the substrate surface is shaken off by the centrifugal force, and the drying process is performed. [Other Embodiments] (a) Although the fixed cleaning liquid supply unit 4 is provided in the above embodiment, the substrate surface may be cleaned only by the moving cleaning liquid supply unit 3. (B) Instead of the fixed cleaning liquid supply unit 4, a movable nozzle type cleaning liquid supply unit may be provided. (C) In the above embodiment, the supply system of the cleaning liquid to be supplied to the moving cleaning liquid supply unit 3 and the supply system of the cleaning liquid to be supplied to the fixed cleaning liquid supply unit 4 are the same. The cleaning liquid may be supplied. (D) In the above-described embodiment, the slit 20a formed of a single elongated opening was formed in the nozzle portion 20, but the present invention is not limited to this, and instead of the slit 20a, the nozzle portion 20 is formed. It is also possible to use a device in which a large number of pores are arranged in a slit shape to form a slit-shaped cleaning liquid discharge part, or a device in which a large number of needle nozzles are arranged to form a slit-shaped cleaning liquid discharge part.

【0021】[0021]

【発明の効果】以上のように本発明に係る基板洗浄装置
では、基板に対して相対的に移動するスリット状洗浄液
吐出部を介して基板表面に洗浄液を供給するので、従来
の噴出ノズルから洗浄液を供給する場合に比較して基板
表面に対して均一に洗浄液を供給することが可能とな
り、洗浄むらが少なくなる。また、スリット状の吐出部
を介して洗浄液を供給するので、洗浄液の消費量を少な
くできる。しかも洗浄液の量を制御しやすくなる。
As described above, in the substrate cleaning apparatus according to the present invention, the cleaning liquid is supplied to the surface of the substrate through the slit-shaped cleaning liquid ejecting section that moves relative to the substrate. It becomes possible to supply the cleaning liquid uniformly to the surface of the substrate as compared with the case where the cleaning liquid is supplied, and uneven cleaning is reduced. Further, since the cleaning liquid is supplied through the slit-shaped ejection portion, the consumption amount of the cleaning liquid can be reduced. Moreover, it becomes easy to control the amount of the cleaning liquid.

【0022】基板保持部の外周側に洗浄液噴出ノズルを
別に設け、基板保持部を回転させるための回転機構をさ
らに設けた場合には、スリット状洗浄液吐出部によって
緩やかな洗浄を行った後に噴出ノズルによる洗浄によっ
て短時間に基板表面の洗浄を行える。洗浄液供給手段が
洗浄液の供給量を制御するための流量制御弁をさらに有
している場合は、緩やかな洗浄と急激な洗浄とを1つの
洗浄液供給手段内で切り替えることができ、例えば現像
液をリンス処理する場合、最初は緩やかな洗浄を行って
基板表面の現像液を希釈しその後に急激な洗浄を行って
現像液を洗浄液によって置換することにより、いきなり
急激な置換を行う場合に発生するスカムなどの発生を防
止することができる。
In the case where a cleaning liquid ejection nozzle is separately provided on the outer peripheral side of the substrate holding portion and a rotation mechanism for rotating the substrate holding portion is further provided, the ejection nozzle is ejected after the cleaning is gently performed by the slit-shaped cleaning liquid ejection portion. The substrate surface can be cleaned in a short time by cleaning with. When the cleaning liquid supply means further has a flow rate control valve for controlling the supply amount of the cleaning liquid, gentle cleaning and abrupt cleaning can be switched within one cleaning liquid supply means. When rinsing, first perform a gentle cleaning to dilute the developing solution on the substrate surface, and then perform a rapid cleaning to replace the developing solution with the cleaning solution. It is possible to prevent such occurrence.

【0023】基板が角型の場合に、スリット状洗浄液吐
出部の長さを基板の辺の長さとほぼ同じにした場合に
は、1度の相対移動で基板全面を洗浄できる。スリット
状洗浄液吐出部を基板保持部に接近、離反自在とした場
合には、洗浄中における基板表面の反応速度を制御でき
る。
In the case where the substrate is rectangular, if the length of the slit-shaped cleaning liquid discharge portion is set to be substantially the same as the length of the side of the substrate, the entire surface of the substrate can be cleaned by one relative movement. When the slit-shaped cleaning liquid ejecting unit can freely move toward and away from the substrate holding unit, the reaction speed of the substrate surface during cleaning can be controlled.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例による基板洗浄装置の縦断面
概略構成図。
FIG. 1 is a schematic vertical cross-sectional configuration diagram of a substrate cleaning apparatus according to an embodiment of the present invention.

【図2】前記基板洗浄装置の平面図。FIG. 2 is a plan view of the substrate cleaning apparatus.

【図3】ノズル部及び洗浄液供給系の模式図。FIG. 3 is a schematic diagram of a nozzle unit and a cleaning liquid supply system.

【図4】ノズル部の上下駆動機構を示す縦断面概略構成
図。
FIG. 4 is a vertical cross-sectional schematic configuration diagram showing a vertical drive mechanism of a nozzle portion.

【符号の説明】[Explanation of symbols]

1 基板 2 回転台 3 移動洗浄液供給部 4 固定洗浄液供給部 15 モータ 20 ノズル部 20a スリット 23 上下駆動機構 24 水平駆動機構 25 洗浄液供給系 33 流量制御弁 40 噴出ノズル DESCRIPTION OF SYMBOLS 1 Substrate 2 Rotating table 3 Moving cleaning liquid supply unit 4 Fixed cleaning liquid supply unit 15 Motor 20 Nozzle unit 20a Slit 23 Vertical drive mechanism 24 Horizontal drive mechanism 25 Cleaning liquid supply system 33 Flow control valve 40 Jet nozzle

Claims (5)

【特許請求の範囲】[Claims] 【請求項1】基板表面の洗浄処理を行う基板洗浄装置で
あって、 前記基板を水平に保持する基板保持部と、 前記基板保持部に対して水平方向に相対移動自在であ
り、前記相対移動方向と交差する方向に延びるスリット
状洗浄液吐出部を有し、前記スリット状洗浄液吐出部を
前記基板保持部に対して水平方向に相対移動させながら
前記スリット状洗浄液吐出部から前記基板表面に洗浄液
を供給する洗浄液供給手段と、を備えた基板洗浄装置。
1. A substrate cleaning apparatus for cleaning a surface of a substrate, comprising: a substrate holding section for holding the substrate horizontally; and a relative movement in a horizontal direction relative to the substrate holding section. A slit-shaped cleaning liquid discharge part extending in a direction intersecting the direction, and while moving the slit-shaped cleaning liquid discharge part in the horizontal direction relative to the substrate holding part, the cleaning liquid is discharged from the slit-shaped cleaning liquid discharge part onto the substrate surface. A substrate cleaning apparatus comprising: a cleaning liquid supply unit that supplies the cleaning liquid.
【請求項2】前記基板保持部の外周側に固定配置され、
洗浄液を噴出供給する洗浄液噴出ノズルと、 前記基板保持部を回転させるための回転機構とをさらに
備えている、請求項1に記載の基板洗浄装置。
2. A fixed arrangement is provided on the outer peripheral side of the substrate holding portion,
The substrate cleaning apparatus according to claim 1, further comprising a cleaning liquid ejection nozzle that ejects and supplies the cleaning liquid, and a rotating mechanism for rotating the substrate holding unit.
【請求項3】前記洗浄液供給手段は、洗浄液の供給量を
制御するための流量制御弁を有している、請求項1また
は2に記載の基板洗浄装置。
3. The substrate cleaning apparatus according to claim 1, wherein the cleaning liquid supply means has a flow rate control valve for controlling the supply amount of the cleaning liquid.
【請求項4】前記基板は角型であり、 前記スリット状洗浄液吐出部は、このスリットが延びる
方向の基板の辺の長さと略同じ長さを有している、請求
項1ないし3のいずれかに記載の基板洗浄装置。
4. The substrate according to claim 1, wherein the substrate has a rectangular shape, and the slit-shaped cleaning liquid ejecting portion has a length substantially equal to a length of a side of the substrate in a direction in which the slit extends. The substrate cleaning apparatus according to claim 1.
【請求項5】前記スリット状洗浄液吐出部は、前記基板
保持部に対して相対的に接近、離反自在である、請求項
1ないし4のいずれかに記載の基板洗浄装置。
5. The substrate cleaning apparatus according to claim 1, wherein the slit-shaped cleaning liquid discharger is relatively movable toward and away from the substrate holder.
JP08878194A 1994-04-26 1994-04-26 Substrate cleaning apparatus and substrate cleaning method Expired - Fee Related JP3397884B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP08878194A JP3397884B2 (en) 1994-04-26 1994-04-26 Substrate cleaning apparatus and substrate cleaning method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP08878194A JP3397884B2 (en) 1994-04-26 1994-04-26 Substrate cleaning apparatus and substrate cleaning method

Publications (2)

Publication Number Publication Date
JPH07297160A true JPH07297160A (en) 1995-11-10
JP3397884B2 JP3397884B2 (en) 2003-04-21

Family

ID=13952401

Family Applications (1)

Application Number Title Priority Date Filing Date
JP08878194A Expired - Fee Related JP3397884B2 (en) 1994-04-26 1994-04-26 Substrate cleaning apparatus and substrate cleaning method

Country Status (1)

Country Link
JP (1) JP3397884B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021157011A (en) * 2020-03-26 2021-10-07 シチズンファインデバイス株式会社 Method of manufacturing liquid crystal display panel

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2021157011A (en) * 2020-03-26 2021-10-07 シチズンファインデバイス株式会社 Method of manufacturing liquid crystal display panel

Also Published As

Publication number Publication date
JP3397884B2 (en) 2003-04-21

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