JPH07294607A - Driver circuit for semiconductor testing apparatus - Google Patents

Abstract

PURPOSE:To speed up a driver circuit for semiconductor testing apparatus which can suppress a steady-state current by a function of a circuit detecting a transition time of an output voltage of a diode bridge circuit and allow a driver current to flow with a necessary timing by a current-increasing/decreasing circuit. CONSTITUTION:Detecting circuits 1 and 2 are provided to detect a transition time of an output voltage VP7 of a diode bridge circuit. Current of a rise current source is increased and a fall current is decreased at the rise time by a current-increasing/decreasing circuit 3 consisting of a resistance RX1, a diode DX11, a transistor QX12 and a transistor QX13. At the fall time, a current of a fall current source is increased and a rise current is decreased by a current-increasing/decreasing circuit 4.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a driver circuit capable of coping with high speed in a semiconductor testing device.

[0002]

2. Description of the Related Art A driver circuit for a semiconductor test apparatus has a limitation on the circuit which cannot be speeded up. It has been necessary to increase the current of the driver circuit to increase the speed, but if the current of the conventional driver circuit is increased, the circuit may be destroyed due to an increase in power consumption. A conventional driver circuit for semiconductor test equipment is shown in FIG. In order to speed up the output of the driver for the semiconductor test equipment such as VLSI, the current source I11.5, the current source I12 / 11, the current source I21.
12. The current source I22.6 must be made large, and there is a limit to the speedup due to the power limitation of the driver circuit.

[0003]

[Problems to be Solved by the Invention] This has the following drawbacks. In order to speed up the driver circuit for semiconductor test equipment, the current of the driver circuit must be increased,
The speed could not be increased due to the limitation on the circuit. It was not possible to speed up just by changing the circuit wiring and circuit constants.
In order to speed up the driver circuit for semiconductor test equipment,
If the method of increasing the circuit power is used, the current of the circuit becomes large, so that the heat radiation of the circuit becomes a serious problem, and the heat radiation of the circuit cannot be caught up by the air cooling, and it is necessary to devise a cooling method. When the current of the circuit becomes large in order to increase the speed of the driver circuit for the semiconductor test device, the semiconductor test device itself is changed to a large current system, so that the entire device becomes abnormally large and the economic effect is impaired.

[0004]

Means for solving the problems of the present invention are as follows. (A) Detection circuits 1 and C2 comprising C1 and QX11 for detecting the transition time of the output voltage VP7 of the diode bridge circuit. Detection circuit 2 consisting of QX21
(A) When rising, increase the current of the rising current source and decrease the falling current, RX
A current increasing / decreasing circuit 3 including 1, DX11, QX12, and QX13 is provided to increase the current of the current source for falling and decrease the current for rising at the time of RX.
A driver circuit for a semiconductor test apparatus, which is provided with a current adjusting circuit 4 composed of 2, DX21, QX22, and QX23 and configured as described above.

[0005]

Next, the operation of the present invention will be described. The circuit 1 for detecting the transition time of the output voltage VP7 of the diode bridge circuit.
The detection circuit 2 detects the transition time of the output voltage VP7. In the current adjusting circuit 3, the current of the current source for rising is increased and the current for the falling is reduced at the rising time, and the current increasing / decreasing circuit 4 increases the current of the current source for the falling at the time of falling to increase the current for the rising. The transition time is efficiently and speedily increased by the action of reducing the current.

[0006]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENT An electric circuit according to an embodiment of the present invention is shown in FIG.
Shown in. (1) Detection circuit 1 including capacitor C1 and transistor QX11, and capacitor C2 and transistor QX2
In the detection circuit 2 composed of 1, the transition time of the output voltage VP7 of the diode bridge circuit is detected. For example,
At the time of rising, C1 and QX11 detect the rising part and change to the change of the current IC1. At the time of the fall, C2 and QX21 detect the fall portion and change the change of the current IC2. The change of the current IC1 is given by the following equation = (δVp / δ
t) × C1 The change of the current IC2 is given by the following equation = (δVp / δ
t) × C2 (2) The current increasing / decreasing circuit 3 including the resistor RX1, the diode DX11, the transistor QX12, and the transistor QX13 increases the current of the rising current source and decreases the falling current at the time of rising. Also, the resistance R
X2, the diode DX21, the transistor QX22, the circuit of the current adjusting circuit 4 consisting of the transistor QX23,
At the time of falling, the current of the current source for falling is increased and the current for rising is decreased. Therefore, the transition time was efficiently used, and the target driver circuit could be speeded up even without passing a large current. For example, when increasing the current at the rising portion, the current Ip1 is given by the following equation. [VF (DX11) + VRX1-VBE (QX12)]
/ R11 = [VF (DX11) -VBE (QX12)
+ RX1 (I11 + (δVp / δt) X C1] / R
11 (3) FIG. 2 shows the voltage change of the output voltage VP.7 of the diode bridge, the current change of the IC1.8 and the change of the steady current I1.9, and the change of the current increase / decrease IP1.10.

[0007]

Since the present invention is constructed as described above, it has the following effects. (1) In order to increase the speed of the driver circuit for semiconductor test equipment, the circuit currents I11.5, I22.6, etc. must be increased, which is different from the conventional technology in which the speed cannot be increased due to the limitation of the circuit power. . In the present invention, the steady current I1.9 is placed at the normal point and the output voltage VP7 of the diode bridge circuit is set.
By detecting the transition time of the output voltage VP7, the function of the current increasing / decreasing circuit that supplies the driver current at the transition time of the output voltage VP7 at the rising and falling edges is
It has become possible to speed up the driver circuit without constantly flowing a large steady current. (2) A driver for semiconductor test equipment that is small in size, high in performance, and highly economical because there is no problem of heat dissipation in the circuit because the steady current does not have to be constantly passed in order to speed up the driver circuit. It became possible to provide a circuit.

[Brief description of drawings]

FIG. 1 is an electric circuit diagram according to an embodiment of the present invention.

FIG. 2 is a diagram showing changes in voltage and current according to an embodiment of the present invention.

FIG. 3 is an electric circuit diagram according to an embodiment of the prior art.

[Explanation of symbols]

 1 detection circuit 2 detection circuit 3 current increase / decrease circuit 4 current increase / decrease circuit 5 current source of I11 6 current source of I22 7 output voltage of diode bridge VP 8 detection current of capacitor C1 IC1 9 steady current I1 10 rising current IP1 11 of I12 Current source 12 I21 current source

Claims (1)

[Claims] 1. An output voltage V of a diode bridge circuit.
A detection circuit (1) including a capacitor C1 and a transistor QX11 for detecting the transition time of P (7) and a detection circuit (2) including a capacitor C2 and a transistor QX21 are provided. The current for increasing and decreasing the current for falling, resistor RX1, diode DX11, transistor QX12, transistor Q
A current increasing / decreasing circuit (3) including X13 is provided, and at the time of falling, the current of the current source for falling is increased and the current of rising is decreased, the resistor RX2, the diode DX21, the transistor QX22, the transistor Q.
A driver circuit for a semiconductor test device, comprising a current increasing / decreasing circuit (4) including X23 and having the above-mentioned configuration.