JPH0723682Y2 - Stylus of thickness gauge - Google Patents

Description

[Detailed description of the device]

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe of a plate thickness measuring instrument for measuring the thickness of a thin plate material such as a multilayer printed circuit board.

[0002]

2. Description of the Related Art As a conventional technique, as shown in FIG.
A spindle 3 connected to the measuring unit 2 is urged downward from the stem 4 and a probe 5 having a spherical lower surface, that is, a contact portion 5a, is fixed to the lower end of the spindle 3. There was a point contact type plate thickness measuring instrument 1. Also, FIG.
As shown in FIG.
There was a surface contact type plate thickness measuring instrument 1 in which a disc-shaped measuring element 6 formed on a flat surface was fixed. Then, as shown in FIG. 4, a plate W made of a multilayer printed circuit board is formed on the table 7.
And set the plate thickness measuring instrument 1 to a predetermined value, and contact the contact portion 5a (6a) of the probe 5 (6) with the upper surface of the plate W to measure the amount of rise of the probe 5. The thickness of the plate W is measured by detecting it in the part 2. Alternatively, as shown in FIG. 5, the contact portion 6a (5a) of the probe 6 (5)
Thus, the thickness of the plate material W is measured by holding both sides of the plate material W. In FIG. 4, numeral 8 indicates the plate material W on the table 7.
It is a clamp that presses against.

[0003]

In the former case, since the contact portion 5a of the probe 5 makes point contact with the plate material W, the surface becomes uneven due to the presence of the wiring pattern in the inner layer portion like a multilayer printed circuit board. When it is desired to measure the thickness of the convex portion of the plate material W, the contact portion 5a contacts the uneven portion of the plate material W indefinitely, and the plate thickness of the convex portion is specified. There was a drawback that it could not be measured.
Further, in the latter case, since the tracing stylus 6 is fixed to the spindle 3, as shown in FIG.
If there is a slight slanted portion, the contact portion 6a hits one side and there is a drawback that the measurement accuracy cannot be obtained. It is an object of the present invention to obtain a new gauge head for a plate thickness measuring instrument that solves the above drawbacks.

[0004]

In order to achieve the above-mentioned object, the present invention is configured as follows. That is,
A spindle for operating the measuring unit is urged to project from the stem toward the front, and a fixed measuring element having a spherical front end is provided integrally with the spindle, and the rear surface has a radius of curvature of the front end of the fixed measuring element. Is provided with a movable measuring element having a concave surface with a slightly larger radius of curvature and a front surface formed with a flat surface, and a cylindrical guide is protruded forward and fixed to the spindle, and the movable measuring element is fixed to the guide. The front surface of the movable measuring element is rotatably fitted and locked, and the concave surface of the movable measuring element is fitted to the front end portion of the fixed measuring element.

[0005]

Since the present invention is configured as described above, the front surface of the movable measuring element comes into surface contact with the plate material, and if there is an uneven portion on the surface of the plate material, the front surface will contact only the convex portion of the plate material. become. Further, when the front surface of the movable probe contacts a slight slope formed on the plate material, the movable probe rotates around the front end of the fixed probe, and evenly contacts the entire surface of the slope. Will be done.

[0006]

DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIG. In the drawings, FIG. 1 is a front view showing an embodiment of the present invention, FIG. 2 is an enlarged sectional view of an essential part thereof, and FIG. 3 is an enlarged sectional view of an essential part showing a use state. In FIG. 1, reference numeral 10 denotes a dial gauge type plate thickness measuring instrument, in which a stem 12 is projectingly fixed to a case of a measuring unit 11, and a spindle 1 is attached to the stem 12.
3 is slidably inserted. The spindle 13 has its upper end gear-coupled to the measuring unit 11 and is pressed downward by a spring (not shown) installed in the measuring unit 11 so that its lower portion is projected downward (forward) from the stem 12. As shown in FIG. 2, the lower end (front end) of the spindle 13 is urged.
The fixed measuring element 14 having a spherical surface 14a is fixed.

A cap-shaped movable measuring element 15 made of a stainless material is attached to the lower portion of the fixed measuring element 14. This movable probe 15 has an upper surface (rear surface) as shown in FIG.
A concave surface 15a having a radius of curvature slightly larger than that of the lower end 14a is formed on the lower surface (front surface), that is, the contact surface 15.
b is formed as a flat surface, and a flange portion 15c that spreads radially outward is formed on the outer peripheral portion of the concave surface 15a. The movable measuring element 15 has its concave surface 15a fitted to the lower end 14a of the fixed measuring element 14 and is rotatably supported by a cylindrical guide 17 fixed to the spindle 13.

The guide 17 has a locking portion 17a bent in the axial direction at the lower end of a main body formed in a cylindrical shape, and an elastic body 18 made of a cushion rubber formed in the cylindrical shape inside thereof and the movable portion. Place the tracing stylus 15 vertically and fit it
The movable measuring element 15 engages the lower surface of the flange portion 15c with the upper surface of the locking portion 17a of the guide 17, and the elastic body 18 places the lower end thereof on the upper surface of the flange portion 15c. Then, the upper end of the guide 17 is fitted to the lower end of the spindle 13, and the upper end of the elastic body 18 is brought into contact with the lower surface of the spindle 13 with a predetermined pressure so that the elastic body 18
An initial elastic force is applied to, and in this state, the upper end of the guide 17 is fixed to the spindle 13 with a set screw 19. The elastic force of the elastic body 18 is made smaller than the elastic force of the spring that presses the spindle 13 downward. In addition, the movable measuring element 15 is slightly depressed downward from the lower end of the fixed measuring element 14 in a state where the movable measuring element 15 is pressed against the locking portion 17a of the guide 17 by the elastic body 18.

As shown in FIG. 3, two plate material measuring devices 10 are vertically opposed to each other, and the upper and lower surfaces of the plate material W are held by the respective plate material measuring devices 10 via a movable measuring element 15.
Then, the contact surface 15b of the movable measuring element 15 comes into surface contact with the upper and lower surfaces of the plate material W, and each movable measuring element 15 is moved by the plate material W in the separating direction to compress the elastic body 18 to form the concave surface 15a. Contacts the lower surface 14a of the fixed measuring element 14 and moves each spindle 13 in the separating direction via the fixed measuring element 14. As a result, the measuring unit 11 operates to measure the thickness of the plate W. In the measuring unit 11, the distance between the contact surface 15b of the movable measuring element 15 and the lower surface 14a of the fixed measuring element 14 is adjusted (stored) in advance as a non-measurement dimension. The measuring unit 11 described above may be a capacitance type.

According to the above embodiment, the movable measuring element 15
Since the contact surface 15b of the surface contact the plate W,
5b comes into contact with only the convex portion of the plate material W with respect to the plate material W having an uneven portion on the surface. Further, when the contact surface 15b of the movable probe 15 comes into contact with a slight slope (distorted portion) generated on the plate material W, the movable probe 15 is centered on the lower end 14a of the fixed probe 14. It rotates and comes into uniform contact with the entire surface of the slope.

[0011]

As is apparent from the above description, according to the present invention, it is possible to easily measure the thickness of the convex portion of the plate material having the irregular portion on the surface, and the distortion is generated. Even if the plate material is worn, it has an effect that it can be accurately measured.

[Brief description of drawings]

FIG. 1 is a front view showing an embodiment of the present invention.

FIG. 2 is an enlarged cross-sectional view of a main part of FIG.

FIG. 3 is an enlarged sectional view of an essential part showing a usage state.

FIG. 4 is a front view showing a conventional example.

FIG. 5 is a front view of a main part showing another example of the related art.

[Explanation of Codes] 10 Plate Thickness Measuring Instrument 11 Measuring Section 12 Stem 13 Spindle 14 Fixed Contact 14a Front End 15 Movable Measuring Point 15a Concave 15b Contact Surface (Front) 15c Flange 17 Guide 17a Engagement 18 Elastic 19 Set Screw W plate material

Claims (1)

[Scope of utility model registration request] 1. A spindle for operating a measuring unit is urged so as to project from a stem toward the front, and a fixed measuring element having a spherical front end is integrally provided on the spindle, and a rear surface of the fixed measuring element is provided. A movable gauge head having a concave surface with a radius of curvature slightly larger than that of the front end and a front surface formed with a flat surface is provided, and a cylindrical guide is fixed to the spindle by projecting it forward. A plate thickness characterized in that the front surface of the movable measuring element projects forward and is rotatably fitted and locked, and the concave surface of the movable measuring element is fitted to the front end portion of the fixed measuring element. Stylus of measuring instrument.