JPH0581608U - Stylus of thickness gauge - Google Patents

Abstract

(57) [Summary] [Purpose] Easily and accurately measure the thickness of the convex portion of a plate material that has irregularities on the surface. [Structure] A spindle for operating the measuring unit is urged to project from the stem toward the front, a fixed measuring element having a spherical front end is integrally provided on the spindle, and a rear surface of the fixed measuring element has a front end. A movable gauge head having a concave surface with a radius of curvature slightly larger than the radius of curvature and a front surface formed into a flat surface is provided, and a cylindrical guide is projected forwardly and fixed to the spindle, and the movable guide is moved to the guide. The front of the gauge head is projected forward and fitted and locked in a rotatable manner.
The concave surface of the movable probe is fitted to the front end of the fixed probe.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a gauge of a plate thickness measuring instrument for measuring the thickness of a thin plate material such as a multilayer printed circuit board.

[0002]

[Prior Art]

 As a conventional technique, as shown in FIG. 4, the spindle 3 connected to the measuring unit 2 is urged downward from the stem 4 so that the lower surface, that is, the contact portion 5a, is spherical at the lower end portion of the spindle 3. There was a point contact type plate thickness measuring instrument 1 in which the tracing stylus 5 formed on the above was fixed. Further, as shown in FIG. 5, there is a surface contact type plate thickness measuring instrument 1 in which a disc-shaped probe 6 having a contact portion 6a formed on a flat surface is fixed to the lower end portion of the spindle 3. .. Then, as shown in FIG. 4, a plate material W made of a multilayer printed circuit board is placed on the table 7, the plate thickness measuring instrument 1 is set to a predetermined value, and the contact portion 5a (6a) of the probe 5 (6) is set. ) Is brought into contact with the upper surface of the plate material W, and the amount of rise of the probe 5 is detected by the measuring unit 2 to measure the thickness of the plate material W. Alternatively, as shown in FIG. 5, both sides of the plate W are held by the contact portions 6a (5a) of the probe 6 (5) to measure the thickness of the plate W. In FIG. 4, reference numeral 8 is a clamp that presses the plate material W against the table 7.

[0003]

[Problems to be solved by the device]

 In the former case, since the contact portion 5a of the probe 5 makes point contact with the plate W, the surface of the plate W is uneven due to the presence of the wiring pattern of the inner layer like a multilayer printed substrate. When it is desired to measure the thickness of the convex portion of W, the contact portion 5a contacts the irregular portion of the plate material W in an unspecified manner, and the thickness of the convex portion cannot be specified and measured. was there. Further, in the latter case, since the tracing stylus 6 is fixed to the spindle 3, as shown in FIG. 5, when there is a slight inclination portion of the plate material W due to distortion or the like, the contact portion 6a hits one side. However, there was a drawback that the measurement accuracy could not be obtained. The purpose of the present invention is to obtain a probe for a new plate thickness measuring instrument that solves the above-mentioned drawbacks.

[0004]

[Means for Solving the Problems]

 The present invention is configured as follows to achieve the above object. That is, the spindle for operating the measuring unit is biased toward the front by protruding the stem from the spindle, the fixed measuring element having a spherical front end is integrally provided on the spindle, and the rear surface is the front end of the fixed measuring element. A movable probe with a concave surface with a radius of curvature slightly larger than the radius of curvature and a flat front surface is provided, and a cylindrical guide is fixed to the spindle by projecting it forward. The front surface of the measuring element is projected forward to be rotatably fitted and locked, and the concave surface of the movable measuring element is fitted to the front end portion of the fixed measuring element.

[0005]

[Action]

 Since the present invention is configured as described above, the front surface of the movable measuring element comes into surface contact with the plate material, and if the surface of the plate material has irregularities, the front surface comes into contact only with the convex portions of the plate material. Further, when the front surface of the movable measuring element comes into contact with a slight inclined surface generated on the plate material, the movable measuring element rotates around the front end of the fixed measuring element and is evenly distributed over the entire inclined surface. You will come into contact.

[0006]

【Example】

 An embodiment of the present invention will be described below with reference to FIG. In the drawings, FIG. 1 is a front view showing an embodiment of the present invention, FIG. 2 is an enlarged sectional view of an essential part thereof, and FIG. 3 is an enlarged sectional view of an essential part showing a use state. In FIG. 1, reference numeral 10 denotes a dial gauge type plate thickness measuring device, in which a stem 12 is fixed to a case of a measuring unit 11 so as to project therefrom, and a spindle 13 is slidably fitted into the stem 12. The spindle 13 has its upper end gear-connected to the measuring unit 11, and is pressed downward by a spring (not shown) installed in the measuring unit 11 so that the lower portion thereof projects downward (forward) from the stem 12. As shown in FIG. 2, a stationary probe 14 having a spherical lower end (front end) 14a is fixed to the lower end of the spindle 13 as shown in FIG.

A movable cap 15 having a cap shape made of a stainless material is attached to the lower part of the fixed probe 14. As shown in FIG. 2, the movable probe 15 has a concave surface 15a having a radius of curvature slightly larger than the radius of curvature of the lower end 14a on the upper surface (rear surface) and a flat surface on the lower surface (front surface), that is, the contact surface 15b. And a flange portion 15c that spreads outward in the radial direction is formed on the outer peripheral portion of the concave surface 15a. The movable probe 15 has its concave surface 15a fitted to the lower end 14a of the stationary probe 14 and is rotatably supported by a cylindrical guide 17 fixed to the spindle 13.

The guide 17 has a locking portion 17a that bends in the axial direction at the lower end of a main body formed in a cylindrical shape, and an elastic body 18 made of a cushion rubber formed in the cylindrical shape inside and the movable portion. The stylus 15 is placed vertically and fitted, the movable stylus 15 engages the lower surface of the flange portion 15c with the upper surface of the locking portion 17a of the guide 17, and the elastic body 18 has its lower end at the flange portion. Place on top of 15c. Then, the upper end of the guide 17 is fitted to the lower end of the spindle 13, and the upper end of the elastic body 18 is brought into contact with the lower surface of the spindle 13 with a predetermined pressure to apply an initial elastic force to the elastic body 18. Then, in this state, the upper end of the guide 17 is fixed to the spindle 13 with the set screw 19. The elastic force of the elastic body 18 is made smaller than the elastic force of the spring that presses the spindle 13 downward. In addition, the movable measuring element 15 is separated from the lower end of the fixed measuring element 14 slightly below the concave portion 15a thereof in a state of being pressed against the locking portion 17a of the guide 17 by the elastic body 18.

Then, as shown in FIG. 3, two plate material measuring devices 10 are vertically opposed to each other, and the upper and lower surfaces of the plate material W are held by the respective plate material measuring devices 10 via the movable measuring element 15. Then, the contact surface 15b of the movable measuring element 15 makes surface contact with the upper and lower surfaces of the plate material W, and at the same time, the movable measuring element 15 is moved by the plate material W in the separating direction to compress the elastic body 18. The concave surface 15a comes into contact with the lower surface 14a of the fixed measuring element 14 to move each spindle 13 in the separating direction via the fixed measuring element 14. As a result, the measuring unit 11 operates to measure the thickness of the plate material W. In the measuring unit 11, the distance between the contact surface 15b of the movable measuring element 15 and the lower surface 14a of the fixed measuring element 14 is adjusted (stored) in advance as a non-measurement dimension. The measuring unit 11 described above may be a capacitance type.

According to the above-mentioned embodiment, since the contact surface 15b of the movable measuring element 15 is in surface contact with the plate material W, the contact surface 15b is different from the plate material W having the uneven portion on the surface. Only the convex parts will come into contact. When the contact surface 15b of the movable measuring element 15 comes into contact with a slight slope (distorted portion) generated on the plate material W, the movable measuring element 15 is centered on the lower end 14a of the fixed measuring element 14. It rotates and contacts the entire surface of the slope evenly.

[0011]

[Effect of the device]

 As is clear from the above description, according to the present invention, it is possible to easily measure the thickness of the convex portion of the plate member having the uneven portion on the surface, and at the same time, the plate member having the distortion is generated. Even in this case, it is possible to measure accurately.

[Brief description of drawings]

FIG. 1 is a front view showing an embodiment of the present invention.

FIG. 2 is an enlarged sectional view of a main part of FIG.

FIG. 3 is an enlarged sectional view of an essential part showing a usage state.

FIG. 4 is a front view showing a conventional example.

FIG. 5 is a front view of a main part of another example of the related art.

[Explanation of symbols]

 10 Plate Thickness Measuring Instrument 11 Measuring Section 12 Stem 13 Spindle 14 Fixed Contact 14a Front End 15 Movable Measuring Point 15a Concave 15b Contact Surface (Front) 15c Flange 17 Guide 17a Locking 18 Elastic Body 19 Set Screw W Plate

Claims (1)

[Scope of utility model registration request] 1. A spindle for operating a measuring unit is urged so as to project from a stem toward the front, and a fixed measuring element having a spherical front end is integrally provided on the spindle, and a rear surface of the fixed measuring element is provided. A movable gauge head having a concave surface with a curvature radius slightly larger than that of the front end and a front surface formed with a flat surface is provided, and a cylindrical guide is fixed to the spindle by projecting it forward. A plate thickness characterized in that the front surface of the movable measuring element projects forward and is rotatably fitted and locked, and the concave surface of the movable measuring element is fitted to the front end portion of the fixed measuring element. Stylus of measuring instrument.