JPH07235558A - Due bonding method of led chip to lead frame - Google Patents

Due bonding method of led chip to lead frame

Info

Publication number
JPH07235558A
JPH07235558A JP2267294A JP2267294A JPH07235558A JP H07235558 A JPH07235558 A JP H07235558A JP 2267294 A JP2267294 A JP 2267294A JP 2267294 A JP2267294 A JP 2267294A JP H07235558 A JPH07235558 A JP H07235558A
Authority
JP
Japan
Prior art keywords
lead frame
led chip
die
bonding
adhesive
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2267294A
Other languages
Japanese (ja)
Other versions
JP2947047B2 (en
Inventor
Motokazu Yamada
元量 山田
Shuji Nakamura
修二 中村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nichia Chemical Industries Ltd
Original Assignee
Nichia Chemical Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nichia Chemical Industries Ltd filed Critical Nichia Chemical Industries Ltd
Priority to JP6022672A priority Critical patent/JP2947047B2/en
Publication of JPH07235558A publication Critical patent/JPH07235558A/en
Application granted granted Critical
Publication of JP2947047B2 publication Critical patent/JP2947047B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/49Structure, shape, material or disposition of the wire connectors after the connecting process of a plurality of wire connectors
    • H01L2224/491Disposition
    • H01L2224/49105Connecting at different heights
    • H01L2224/49107Connecting at different heights on the semiconductor or solid-state body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device

Abstract

PURPOSE:To provide a quick and accurate die bonding method wherein chip deviation is not generated when an LED chip is bonded to a lead frame. CONSTITUTION:In a method for die-bonding an LED chip 3, which is formed by laminating a gallium nitride based compound semiconductor layer 2 on the surface of a sapphire substrate 1, to a lead frame 10 via adhesive agent 4, resin which is cured by ultraviolet rays irradiation is used as the adhesive agent 4.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、LEDチップをリード
フレームに接着剤を介してダイボンドする方法に係り、
特にサファイア基板表面に窒化ガリウム系化合物半導体
(InXAlYGa1-X-YN、0≦X≦1、0≦Y≦1)層
が積層されてなるLEDチップをリードフレームにダイ
ボンドする方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of die-bonding an LED chip to a lead frame via an adhesive,
In particular, the present invention relates to a method of die-bonding an LED chip in which a gallium nitride-based compound semiconductor (In X Al Y Ga 1-XY N, 0 ≦ X ≦ 1, 0 ≦ Y ≦ 1) layer is laminated on the surface of a sapphire substrate to a lead frame.

【0002】[0002]

【従来の技術】窒化ガリウム系化合物半導体はサファイ
ア、ZnO、SiC等の基板の表面に積層されてLED
チップとされることが知られている。特に、現在実用化
されて市販されている光度1cdの青色LEDはサファ
イアを基板とし、図1に示す構造を有している。図1は
この青色LEDの構造を示す模式断面図であり、サファ
イア基板1の上に窒化ガリウム系化合物半導体層2が積
層されてなるLEDチップ3がリードフレーム10に接
着剤4を介してダイボンドされていることを示してい
る。
2. Description of the Related Art A gallium nitride-based compound semiconductor is laminated on the surface of a substrate of sapphire, ZnO, SiC or the like to form an LED.
It is known to be a chip. In particular, a blue LED having a luminous intensity of 1 cd, which has been put into practical use and is commercially available, has sapphire as a substrate and has a structure shown in FIG. FIG. 1 is a schematic cross-sectional view showing the structure of this blue LED. An LED chip 3 in which a gallium nitride-based compound semiconductor layer 2 is laminated on a sapphire substrate 1 is die-bonded to a lead frame 10 via an adhesive 4. It indicates that

【0003】LEDチップ3をリードフレーム10にダ
イボンドするには、通常ダイボンダーと呼ばれる自動機
器が使用される。ダイボンダーは、ウェーハの状態でチ
ップ状にされたLEDチップを一つずつピックアップ
し、そのLEDチップを所定の位置に固定されたリード
フレーム10のカップ内に載置することにより、LED
チップとリードフレームとを接着する装置である。なお
カップ内には予め接着剤4がディスペンサにより注入さ
れている。
To die bond the LED chip 3 to the lead frame 10, an automatic device called a die bonder is usually used. The die bonder picks up LED chips, which are formed into chips in the state of a wafer, one by one, and places the LED chips in a cup of a lead frame 10 fixed at a predetermined position, thereby forming an LED.
This is a device for bonding a chip and a lead frame. Note that the adhesive 4 is previously injected into the cup by a dispenser.

【0004】LEDチップをダイボンドする際、一般に
接着剤には銀ペーストのように導電性を有し熱硬化性の
材料が使用される。なぜなら、従来のLEDチップはG
aAs、GaAlAs、GaP、GaAsP等の緑色〜
赤外を発光する半導体材料よりなり、これらの半導体材
料からなるLEDチップはいずれも半導体基板の表面に
積層されている。従って半導体基板側から電極をとるた
めに、銀ペーストのような導電性を有して十分な接着力
がある材料が選択されるからである。しかし、サファイ
アのような絶縁性基板の上に積層される窒化ガリウム系
化合物半導体LEDチップは、図1のようにサファイア
基板1とリードフレーム10とを接着する場合、導電性
材料を用いる必要がない。従って現在、図1の構造の青
色LEDでは接着剤4として、熱硬化性エポキシ樹脂の
ような絶縁材料が使用されている。また、熱硬化性材料
は加熱により接着剤内部まで均一に硬化できるために好
んで用いられる。
When the LED chip is die-bonded, a conductive and thermosetting material such as silver paste is generally used as the adhesive. Because the conventional LED chip is G
Green of aAs, GaAlAs, GaP, GaAsP, etc.
LED chips made of semiconductor materials that emit infrared light are laminated on the surface of a semiconductor substrate. Therefore, in order to take the electrode from the semiconductor substrate side, a material having conductivity and sufficient adhesive force, such as silver paste, is selected. However, the gallium nitride-based compound semiconductor LED chip stacked on the insulating substrate such as sapphire does not need to use a conductive material when the sapphire substrate 1 and the lead frame 10 are bonded together as shown in FIG. . Therefore, at present, an insulating material such as a thermosetting epoxy resin is used as the adhesive 4 in the blue LED having the structure shown in FIG. Further, a thermosetting material is preferably used because it can be uniformly cured inside the adhesive by heating.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、通常の
熱硬化性材料は1時間程で硬化するものが多く(例えば
銀ペーストは150℃前後で1時間、熱硬化型のエポキ
シであれば120℃前後で1時間程で硬化する。)、そ
の粘性が加熱により変化するため、ダイボンド後、硬化
中にチップが所定の位置からずれるという問題がある。
チップの位置がずれると、次の工程で電極にワイヤーボ
ンドする際、ワイヤーボンド位置がずれたり、また最後
に樹脂で全体をモールドする際に光軸がずれてしまい製
品不良の原因となる。
However, many ordinary thermosetting materials cure in about 1 hour (for example, silver paste is around 150 ° C. for 1 hour, and thermosetting epoxy is around 120 ° C.). However, there is a problem that the chip shifts from a predetermined position during curing after die bonding because the viscosity changes due to heating.
If the position of the chip shifts, the wire bond position shifts when wire-bonding to the electrode in the next step, or the optical axis shifts when the whole is finally molded with resin, which causes a product defect.

【0006】接着剤を迅速に硬化させLEDチップをリ
ードフレームにダイボンドできれば、上記問題は解決さ
れる。したがって本発明の目的とするところは、LED
チップをリードフレームにダイボンドするにあたり、チ
ップのズレがなく、迅速にかつ正確にダイボンドする方
法を提供することにある。
If the adhesive can be rapidly cured and the LED chip can be die-bonded to the lead frame, the above problems can be solved. Therefore, the object of the present invention is to provide an LED
It is an object of the present invention to provide a method for quickly and accurately die-bonding a chip to a lead frame without die displacement.

【0007】[0007]

【課題を解決するための手段】我々はLEDチップをリ
ードフレームにダイボンドするにあたり、窒化ガリウム
系化合物半導体LEDチップ特有の性質を利用すること
により、前記問題が解決できることを見いだし本発明を
成すに至った。即ち、本発明のLEDチップのリードフ
レームへのダイボンド方法は、サファイア基板表面に窒
化ガリウム系化合物半導体層が積層されてなるLEDチ
ップをリードフレームに接着剤を介してダイボンドする
方法において、前記接着剤に、紫外線照射により硬化す
る透明な樹脂(以下、紫外線硬化樹脂という。)を使用
することを特徴とする。
We have found that the above problems can be solved by utilizing the properties peculiar to gallium nitride-based compound semiconductor LED chips in die-bonding the LED chips to the lead frame, and completed the present invention. It was That is, the method of die-bonding the LED chip to the lead frame of the present invention is a method of die-bonding an LED chip, in which a gallium nitride-based compound semiconductor layer is laminated on the surface of a sapphire substrate, to the lead frame via an adhesive, wherein the adhesive In addition, a transparent resin (hereinafter, referred to as an ultraviolet curable resin) that is cured by irradiation with ultraviolet rays is used.

【0008】紫外線光源としては、高圧水銀ランプ、キ
セノンランプ、ブラックライト等の紫外線領域に発光す
る光源を用いることができ、使用する紫外線硬化樹脂の
硬化波長に合わせて適宜光源を選択することが可能であ
る。
As the ultraviolet light source, a light source which emits light in the ultraviolet region such as a high pressure mercury lamp, a xenon lamp or a black light can be used, and the light source can be appropriately selected according to the curing wavelength of the ultraviolet curing resin used. Is.

【0009】また、紫外線硬化樹脂はその硬化速度が紫
外線を照射してから10分以内、さらに好ましくは5分
以内で硬化するものを選択することが好ましい。10分
より多くかかると、チップの位置ずれが発生しやすい傾
向にあるからである。紫外線硬化樹脂の硬化速度は、そ
の樹脂の性質または光源の光強度により調整でき、光源
の光強度を調整するには紫外光を石英ガラス、バリウム
ガラス等のレンズで集光したり、反射板を用いて集光す
ることにより調整できる。一例を挙げると、365nm
を発する高圧水銀ランプを用い、40W/cm2の照射条
件で10分以内に硬化するアクリル系、エポキシ系の樹
脂を用いることができる。
Further, it is preferable to select an ultraviolet curable resin which has a curing speed within 10 minutes, more preferably within 5 minutes after the irradiation of ultraviolet rays. This is because if it takes more than 10 minutes, the displacement of the chip tends to occur. The curing speed of the UV curable resin can be adjusted by the property of the resin or the light intensity of the light source.To adjust the light intensity of the light source, the ultraviolet light is condensed with a lens such as quartz glass or barium glass, or a reflector is used. It can be adjusted by using and condensing. For example, 365nm
It is possible to use an acrylic resin or an epoxy resin that cures within 10 minutes under the irradiation condition of 40 W / cm 2 by using a high pressure mercury lamp that emits.

【0010】さらに使用する紫外線硬化樹脂は透明な樹
脂を使用することが好ましい。なぜなら、図1に示すよ
うにLEDチップをダイボンドすると、窒化ガリウム系
化合物半導体2の発光はサファイア基板1を通る。接着
剤4が透明な紫外線硬化樹脂であると、その発光は紫外
線硬化樹脂を透過してリードフレーム10のカップ面に
達し、カップ面で反射させることができるのでLEDチ
ップの外部量子効率が向上するからである。なお本発明
において、透明とは必ずしも無色透明を意味するもので
はなく、染料、顔料を添加して窒化ガリウム系化合物半
導体の発光を透過できるように透光性にしたもの、また
は紫外線照射により多少変色して透光性となっているも
のも含むものとする。
Further, it is preferable to use a transparent resin as the ultraviolet curable resin used. This is because when the LED chip is die-bonded as shown in FIG. 1, the gallium nitride-based compound semiconductor 2 emits light through the sapphire substrate 1. When the adhesive 4 is a transparent UV curable resin, its light emission can be transmitted through the UV curable resin, reach the cup surface of the lead frame 10, and be reflected by the cup surface, so that the external quantum efficiency of the LED chip is improved. Because. In the present invention, the term “transparent” does not necessarily mean colorless and transparent, but a dye or pigment is added to make it translucent so that the light emission of the gallium nitride-based compound semiconductor can be transmitted, or it is slightly discolored by ultraviolet irradiation. It also includes those that are translucent.

【0011】[0011]

【作用】本発明が窒化ガリウム系化合物半導体LEDチ
ップの特有の性質を利用していることを次に述べる。従
来、LEDは青色発光のものが実現されておらず、赤外
〜緑色までしか得られていなかった。その従来のLED
は前にも述べたようにGaAs、GaP、GaAsP等
の半導体材料からなり、これら半導体材料はバンドギャ
ップエネルギーの関係から、紫外線を透過せず吸収して
しまう。例えば赤、赤外LEDに利用されているGaA
sは1.4eV、緑色LEDに利用されているGaPは
2.3eVのバンドギャップエネルギーを有する。しか
もそれらの半導体が積層される基板にはGaAsまたは
GaPが用いられている。つまり、紫外線を吸収材料が
半導体材料として使用されているため、接着剤に紫外線
で硬化する材料を使用しても、紫外線が接着剤にまで到
達しないので、全く接着剤の効果が得られない。また基
板側から電極を取り出す必要性から、紫外線照射で硬化
する導電性の材料はほとんどない。
Next, it will be described that the present invention utilizes the unique property of the gallium nitride compound semiconductor LED chip. Conventionally, LEDs that emit blue light have not been realized, and only LEDs from infrared to green have been obtained. The conventional LED
As described above, the semiconductor material is made of GaAs, GaP, GaAsP or the like, and these semiconductor materials absorb the ultraviolet ray without transmitting it due to the band gap energy. For example, GaA used for red and infrared LEDs
s has a bandgap energy of 1.4 eV, and GaP used for a green LED has a bandgap energy of 2.3 eV. Moreover, GaAs or GaP is used for the substrate on which these semiconductors are laminated. That is, since an ultraviolet absorbing material is used as a semiconductor material, even if a material that cures with ultraviolet rays is used for the adhesive, the ultraviolet rays do not reach the adhesive, so that no adhesive effect can be obtained. In addition, since it is necessary to take out the electrode from the substrate side, there is almost no conductive material that is cured by ultraviolet irradiation.

【0012】ところが、窒化ガリウム系化合物半導体
(GaNは3.4eV)は紫外線をほとんど透過する材
料であり、基板であるサファイアも紫外線を透過する。
しかも実際の窒化ガリウム系化合物半導体LEDチップ
は窒化ガリウム系化合物半導体層の厚さが多くとも10
μm以下であり、サファイア基板は少なくとも50μm
以上の厚さを有している。つまり紫外線照射しても、窒
化ガリウム系化合物半導体層の厚さが薄いので、紫外線
がほとんど吸収されずにサファイア基板を透過すること
ができる。従って、紫外線を接着剤全体に照射できるの
で、紫外線硬化樹脂を窒化ガリウム系化合物半導体LE
Dチップに限って使用することができる。そして紫外線
硬化樹脂は迅速に硬化するので、ダイボンド時にチップ
の位置ずれが発生するのを防止することができる。
However, the gallium nitride-based compound semiconductor (3.4 eV for GaN) is a material that transmits almost all ultraviolet rays, and sapphire, which is the substrate, also transmits ultraviolet rays.
Moreover, in an actual gallium nitride-based compound semiconductor LED chip, the thickness of the gallium nitride-based compound semiconductor layer is at most 10
μm or less, and the sapphire substrate is at least 50 μm
It has the above thickness. That is, even when irradiated with ultraviolet rays, the thickness of the gallium nitride-based compound semiconductor layer is thin, and therefore ultraviolet rays can be transmitted through the sapphire substrate with almost no absorption. Therefore, since the entire adhesive can be irradiated with ultraviolet rays, the ultraviolet curable resin is applied to the gallium nitride compound semiconductor LE.
Only the D chip can be used. Further, since the ultraviolet curable resin cures quickly, it is possible to prevent the displacement of the chip from occurring during die bonding.

【0013】さらに、窒化ガリウム系化合物半導体LE
Dはサファイアという絶縁性基板を用いており接着剤が
導電性である必要がないので、多くの紫外線硬化樹脂を
選択できるという利点を有する。
Further, gallium nitride-based compound semiconductor LE
Since D uses an insulating substrate called sapphire and the adhesive does not need to be conductive, it has an advantage that many ultraviolet curable resins can be selected.

【0014】[0014]

【実施例】2インチφのサファイア基板上に少なくとも
n型とp型の窒化ガリウム系化合物半導体層が積層さ
れ、その半導体層の同一面側に正電極と負電極とが形成
されたウェーハを用意する。そのウェーハのサファイア
基板面を粘着フィルムに貼付した後、500μm角のL
EDチップに細断する。細断後、ウェーハを粘着フィル
ムごとダイボンダーの所定のテーブル位置にセットす
る。
EXAMPLE A wafer is prepared in which at least n-type and p-type gallium nitride compound semiconductor layers are stacked on a 2-inch φ sapphire substrate, and a positive electrode and a negative electrode are formed on the same surface side of the semiconductor layers. To do. After sticking the sapphire substrate surface of the wafer to an adhesive film, L of 500 μm square
Shred into ED chips. After shredding, the wafer together with the adhesive film is set at a predetermined table position on the die bonder.

【0015】一方、底部径1mmφのカップを有するリ
ードフレームを用意し、このリードフレームを同じくダ
イボンダーの所定の位置にセットする。またリードフレ
ームのカップ内に接着剤を注入するため、ダイボンダー
に付随しているディスペンサ内には、エポキシ系の紫外
線硬化型樹脂を充填する。なお、この樹脂には365n
m波長、40W/cm2の紫外線照射条件で1分以内に硬
化する性質を有しているものを使用した。
On the other hand, a lead frame having a cup with a bottom diameter of 1 mmφ is prepared, and this lead frame is similarly set at a predetermined position of the die bonder. Further, since the adhesive is injected into the cup of the lead frame, the dispenser attached to the die bonder is filled with an epoxy ultraviolet curing resin. Note that this resin has 365n
A material having a property of being cured within 1 minute under an ultraviolet irradiation condition of m wavelength and 40 W / cm 2 was used.

【0016】次にダイボンダーを作動させ、LEDチッ
プをリードフレームのカップ内にダイボンドする。ダイ
ボンド後、LEDチップが載置されたリードフレームを
ダイボンダーから取り外し、別に設けられた高圧水銀ラ
ンプ室内に移送し、光出力50W/cm2、波長365n
mでチップ上方から60秒間照射し、接着剤を硬化させ
る。
Next, the die bonder is operated to die bond the LED chip into the cup of the lead frame. After die-bonding, the lead frame on which the LED chip was mounted was removed from the die bonder and transferred into a separately provided high-pressure mercury lamp chamber, light output 50 W / cm 2 , wavelength 365 n.
The adhesive is cured by irradiating the chip from above the chip for 60 seconds.

【0017】以上のようにして、2インチφのウェーハ
から1万5千個のダイボンドされたLEDチップを得た
後、窒化ガリウム系化合物半導体層に形成された正、負
両方の電極に、ワイヤーボンダーを用いてワイヤーボン
ディングしたところ、ワイヤーボンダーの電極認識不良
により、ワイヤーボンディングされなかったものは、わ
ずか1個であった。
As described above, after obtaining 15,000 die-bonded LED chips from a 2-inch diameter wafer, wires were applied to both the positive and negative electrodes formed on the gallium nitride compound semiconductor layer. When wire bonding was performed using a bonder, only one was not wire-bonded due to poor electrode recognition of the wire bonder.

【0018】[比較例]実施例1においてディスペンサ
ーに、従来の120℃、1時間で硬化する熱硬化性樹脂
を充填する他は同様にして、1万5千個のLEDチップ
をリードフレームのカップ内にダイボンドする。ダイボ
ンド後、熱硬化性樹脂を硬化させるため、LEDチップ
が載置されたリードフレームを120℃のオーブンで1
時間加熱する。その後、同様にして電極にワイヤーボン
ドしたところ、20個が電極認識不良によりワイヤボン
ディングされていなかった。
[Comparative Example] In the same manner as in Example 1 except that the dispenser was filled with the conventional thermosetting resin that cures at 120 ° C. for 1 hour, 15,000 LED chips were formed in the lead frame cup. Die bond inside. After die bonding, in order to cure the thermosetting resin, the lead frame on which the LED chip is mounted is placed in an oven at 120 ° C for 1 hour.
Heat for hours. After that, when wire-bonding was similarly performed on the electrodes, 20 pieces were not wire-bonded due to defective electrode recognition.

【0019】[0019]

【発明の効果】以上説明したように、本発明の方法によ
ると、LEDチップが迅速にリードフレームにダイボン
ドできるので、LEDチップが所定の位置からずれるこ
とがない。従ってダイボンド後に実施されるワイヤーボ
ンド工程、樹脂モールドによるLEDチップの封止工程
等においても、正確にチップがダイボンドされているの
で歩留が向上する。またダイボンド工程においても、接
着剤の硬化時間を短縮できる。
As described above, according to the method of the present invention, the LED chip can be quickly die-bonded to the lead frame, so that the LED chip is not displaced from the predetermined position. Therefore, even in the wire bonding process performed after die bonding, the LED chip sealing process by resin molding, and the like, the chips are accurately die bonded, so that the yield is improved. Further, also in the die bonding process, the curing time of the adhesive can be shortened.

【図面の簡単な説明】[Brief description of drawings]

【図1】 窒化ガリウム系化合物半導体チップがリード
フレームにダイボンドされたLEDの構造を示す模式断
面図。
FIG. 1 is a schematic cross-sectional view showing the structure of an LED in which a gallium nitride compound semiconductor chip is die-bonded to a lead frame.

【符号の説明】[Explanation of symbols]

1・・・・・サファイア基板 2・・・・・窒化ガリウム系化合物半導体層 3・・・・・LEDチップ 4・・・・・接着剤 10・・・・・リードフレーム 1-Sapphire substrate 2--Gallium nitride compound semiconductor layer 3--LED chip 4--Adhesive 10-Lead frame

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 サファイア基板表面に窒化ガリウム系化
合物半導体層が積層されてなるLEDチップをリードフ
レームに接着剤を介してダイボンドする方法において、
前記接着剤に、紫外線照射により硬化する樹脂を使用す
ることを特徴とするLEDチップのリードフレームへの
ダイボンド方法。
1. A method of die-bonding an LED chip having a gallium nitride compound semiconductor layer laminated on a sapphire substrate surface to a lead frame via an adhesive,
A method of die-bonding an LED chip to a lead frame, characterized in that a resin that is cured by ultraviolet irradiation is used as the adhesive.
【請求項2】 前記樹脂は透明であることを特徴とする
請求項1に記載のLEDチップのリードフレームへのダ
イボンド方法。
2. The method of die-bonding an LED chip to a lead frame according to claim 1, wherein the resin is transparent.
JP6022672A 1994-02-21 1994-02-21 Die bonding method of LED chip to lead frame Expired - Fee Related JP2947047B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6022672A JP2947047B2 (en) 1994-02-21 1994-02-21 Die bonding method of LED chip to lead frame

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6022672A JP2947047B2 (en) 1994-02-21 1994-02-21 Die bonding method of LED chip to lead frame

Publications (2)

Publication Number Publication Date
JPH07235558A true JPH07235558A (en) 1995-09-05
JP2947047B2 JP2947047B2 (en) 1999-09-13

Family

ID=12089351

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6022672A Expired - Fee Related JP2947047B2 (en) 1994-02-21 1994-02-21 Die bonding method of LED chip to lead frame

Country Status (1)

Country Link
JP (1) JP2947047B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6310364B1 (en) 1998-08-03 2001-10-30 Toyoda Gosei Co., Ltd. Light-emitting apparatus
JP2002184911A (en) * 2000-12-15 2002-06-28 Nippon Inter Electronics Corp Resin sealed electronic component
JP2008544532A (en) * 2005-06-24 2008-12-04 ミュールバウアー アーゲー Method and apparatus for permanent connection of an integrated circuit to a substrate
JP2010103149A (en) * 2008-10-21 2010-05-06 Showa Denko Kk Light emitting member, light emitting device, electronic device, mechanical device, method of manufacturing the light emitting member, and method of manufacturing the light emitting device
JP2015185661A (en) * 2014-03-24 2015-10-22 スタンレー電気株式会社 semiconductor device

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6996150B1 (en) 1994-09-14 2006-02-07 Rohm Co., Ltd. Semiconductor light emitting device and manufacturing method therefor
JP4882476B2 (en) * 2006-04-17 2012-02-22 日亜化学工業株式会社 Semiconductor device and manufacturing method thereof

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6310364B1 (en) 1998-08-03 2001-10-30 Toyoda Gosei Co., Ltd. Light-emitting apparatus
JP2002184911A (en) * 2000-12-15 2002-06-28 Nippon Inter Electronics Corp Resin sealed electronic component
JP2008544532A (en) * 2005-06-24 2008-12-04 ミュールバウアー アーゲー Method and apparatus for permanent connection of an integrated circuit to a substrate
JP2010103149A (en) * 2008-10-21 2010-05-06 Showa Denko Kk Light emitting member, light emitting device, electronic device, mechanical device, method of manufacturing the light emitting member, and method of manufacturing the light emitting device
JP2015185661A (en) * 2014-03-24 2015-10-22 スタンレー電気株式会社 semiconductor device

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