JPH07211934A - Semiconductor light emitting element array and its manufacture - Google Patents

Semiconductor light emitting element array and its manufacture

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Publication number
JPH07211934A
JPH07211934A JP1600994A JP1600994A JPH07211934A JP H07211934 A JPH07211934 A JP H07211934A JP 1600994 A JP1600994 A JP 1600994A JP 1600994 A JP1600994 A JP 1600994A JP H07211934 A JPH07211934 A JP H07211934A
Authority
JP
Japan
Prior art keywords
light emitting
semiconductor light
layer
etching
electrode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1600994A
Other languages
Japanese (ja)
Inventor
Migaku Katayama
琢 片山
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Victor Company of Japan Ltd
Original Assignee
Victor Company of Japan Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Victor Company of Japan Ltd filed Critical Victor Company of Japan Ltd
Priority to JP1600994A priority Critical patent/JPH07211934A/en
Publication of JPH07211934A publication Critical patent/JPH07211934A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To provide a semiconductor light emitting element array which can be improved in luminance and density by making the micro fabrication of its upper surface easier. CONSTITUTION:A reflecting layer 3, n-type clad layer 4, active layer 5, and p-type clad layer 6 are successively formed on a substrate 2 and a plurality of light emitting sections 7 arranged in a row are formed of etched grooves 8 having a narrower depth than the opening. Layers 9 are grown in the grooves 8 and a passivation film 11 is formed on the layers 9. Electrodes 10 are provided above the light emitting sections 7 and another electrode 13 is provided on the lower surface of the substrate 2. In addition, wiring electrodes 12 connected to the sections 7 are formed on the passivation film 11.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体発光素子、特に
上面を平坦化した半導体発光素子アレイ及びその製造方
法に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a semiconductor light emitting device, and more particularly to a semiconductor light emitting device array having a flat upper surface and a method for manufacturing the same.

【0002】[0002]

【従来の技術】近年、光プリンタ用光源として、あるい
は光を用いた情報処理用素子として半導体発光素子を高
密度に集積した発光ダイオードアレイ等の開発が進めら
れている。発光素子の集積方法として、基板上に形成さ
れたp−nヘテロ接合構造あるいは2重ヘテロ構造を、
必要な部分をエッチング除去してメサ構造にする方法、
また、不純物拡散により夫々の発光ドットを分離する方
法等がある。発光材料としては、例えばGaAsPに不
純物拡散を施したホモ接合や、それより高輝度が期待で
きるAlGaAs二重ヘテロ接合が使用されている。こ
れらの半導体発光素子アレイに要求される仕様として
は、高密度化と高輝度化があげられるが、高密度化を進
めることによって当然のことながら各ドットの発光面積
は小さくなり、高輝度を得ることは困難となる。
2. Description of the Related Art In recent years, a light emitting diode array in which semiconductor light emitting elements are integrated at high density has been developed as a light source for an optical printer or an information processing element using light. As a method of integrating light emitting devices, a pn heterojunction structure or a double heterostructure formed on a substrate is used.
A method of etching away the necessary part to make a mesa structure,
Further, there is a method of separating each light emitting dot by diffusion of impurities. As a light emitting material, for example, a homojunction obtained by diffusing impurities in GaAsP or an AlGaAs double heterojunction which can be expected to have higher brightness is used. The specifications required for these semiconductor light emitting element arrays include high density and high brightness. However, as the density increases, the light emitting area of each dot naturally becomes small and high brightness is obtained. Things will be difficult.

【0003】[0003]

【発明が解決しようとする課題】ところで、不純物拡散
による発光部分離したホモ接合の発光ダイオードアレイ
では、平坦な結晶面に不純物拡散を施すことによりドッ
トを分離し、いわゆるプレ−ナ構造をとることができる
ため平坦面での微細加工が可能である。しかし、高密度
に発光素子を集積するために、各発光素子間の距離は少
なくとも20μm以下にする必要があり、この距離を達
成するには、拡散深さを10μm程度以下にコントロ−
ルする必要があり、従来の拡散工程で再現性良くこれを
達成するのは困難であるという問題があった。又、キャ
リアの注入効率が低く、発光輝度も比較的低いという問
題もあった。
By the way, in a homojunction light-emitting diode array in which light-emitting portions are separated by impurity diffusion, dots are separated by performing impurity diffusion on a flat crystal plane to form a so-called planar structure. Therefore, fine processing on a flat surface is possible. However, in order to integrate the light emitting elements at a high density, the distance between the light emitting elements needs to be at least 20 μm or less. To achieve this distance, the diffusion depth is controlled to about 10 μm or less.
There is a problem that it is difficult to achieve this with good reproducibility in the conventional diffusion process. There is also a problem that the carrier injection efficiency is low and the emission brightness is relatively low.

【0004】一方、エッチングによる発光部分離した2
重ヘテロ接合の発光ダイオードアレイでは、MOCVD
法やMBE法によって膜厚を制御して微細なエッチング
が可能であり、キャリアの注入効率が非常に高く、材料
も微分量子効率の高いAlGaAs等を採用することが
可能なため大幅な輝度の向上を期待できる。しかし、エ
ッチングによる溝が形成されるため段差を乗り越えてパ
ターン配線することが必要となり、特に微細パターンを
再現性よく得ることは極めて困難であるという問題があ
った。
On the other hand, the two light-emitting parts separated by etching
MOCVD for heavy heterojunction light emitting diode arrays
Method and MBE method can control the film thickness to perform fine etching, carrier injection efficiency is very high, and AlGaAs or the like with high differential quantum efficiency can be used as a material, which significantly improves the brightness. Can be expected. However, since a groove is formed by etching, it is necessary to overcome the step and perform pattern wiring, and it is extremely difficult to obtain a fine pattern with good reproducibility.

【0005】そこで本発明は、上記問題点を解決すべ
く、上面での微細加工を容易にし、高輝度、高密度化を
実現する半導体発光素子アレイを提供することを目的と
する。
In order to solve the above problems, it is an object of the present invention to provide a semiconductor light emitting device array which facilitates fine processing on the upper surface and realizes high brightness and high density.

【0006】[0006]

【課題を解決するための手段】本発明の半導体発光素子
アレイは、基板上に成長したエピタキシャル層のp−n
接合面がエッチング溝により複数個の発光部に分離され
てなる半導体発光素子アレイにおいて、前記エッチング
溝の全側面が順テーパーとなったエッチング溝を形成
し、前記エッチング溝を埋め込んでエピタキシャル成長
層を形成し、前記発光部上部に電極を形成し、前記エピ
タキシャル成長層上面及び前記電極を除くエピタキシャ
ル層上面に光を透過するパシベーション膜を形成して上
面を平坦化し、金属配線を前記電極に接続して前記パシ
ベーション膜上に形成したことにより前述の目的を達成
するものである。
A semiconductor light emitting device array according to the present invention comprises a p-n epitaxial layer grown on a substrate.
In a semiconductor light emitting device array in which a bonding surface is separated into a plurality of light emitting portions by etching grooves, an etching groove in which all side surfaces of the etching groove are forward tapered is formed and an epitaxial growth layer is formed by filling the etching groove. Then, an electrode is formed on the light emitting portion, a passivation film that transmits light is formed on the upper surface of the epitaxial growth layer and the upper surface of the epitaxial layer excluding the electrode to planarize the upper surface, and a metal wiring is connected to the electrode to By forming it on the passivation film, the above-mentioned object is achieved.

【0007】また、上述のような半導体発光素子アレイ
の製造方法であって、全側面が順テーパーとなった前記
エッチング溝を硫酸燐酸混合系のエッチャントを用いて
形成し、前記エッチング溝を完全に埋め込んで前記エピ
タキシャル成長層をエピタキシャル成長させることによ
り前述の目的を達成するものである。
Further, in the method for manufacturing a semiconductor light emitting device array as described above, the etching groove having a forward tapered surface on all sides is formed by using a sulfuric acid / phosphoric acid mixed etchant, and the etching groove is completely formed. By embedding and epitaxially growing the epitaxial growth layer, the above-mentioned object is achieved.

【0008】[0008]

【実施例】図1は本発明の半導体発光素子アレイの一実
施例である発光ダイオードアレイの構造を示す断面図で
ある。図2は図1の断面に垂直でA−A線を通る断面図
である。図3は本発明の半導体発光素子アレイの製造方
法の一実施例の発光ダイオードの製造工程を示す図であ
る。図1及び図2において、発光ダイオードアレイ1
は、基板2上に、反射層3,n型クラッド層4,活性層
5,p型クラッド層6が積層されており、発光部7はエ
ッチング溝8上に埋め込み成長された埋め込み成長層9
により電気的に分離されている。発光部7上部には電極
10が、クラッド層6上面及び埋め込み成長層9上面に
はパシベーション膜11が形成され、電極10に接続し
て、パシベーション膜11上面に配線電極12が形成さ
れている。又、基板下面には電極13が形成されてい
る。
1 is a sectional view showing the structure of a light emitting diode array which is an embodiment of a semiconductor light emitting element array of the present invention. FIG. 2 is a sectional view perpendicular to the section of FIG. 1 and taken along the line AA. FIG. 3 is a diagram showing a manufacturing process of a light emitting diode of an embodiment of a method for manufacturing a semiconductor light emitting device array of the present invention. 1 and 2, the light emitting diode array 1 is shown.
Is a reflective layer 3, an n-type clad layer 4, an active layer 5, and a p-type clad layer 6 are stacked on the substrate 2, and the light emitting portion 7 is embedded and grown on the etching groove 8 by a buried growth layer 9.
Are electrically separated by. An electrode 10 is formed on the upper portion of the light emitting portion 7, a passivation film 11 is formed on the upper surfaces of the cladding layer 6 and the buried growth layer 9, and a wiring electrode 12 is formed on the upper surface of the passivation film 11 so as to be connected to the electrode 10. An electrode 13 is formed on the lower surface of the substrate.

【0009】以下、発光ダイオードアレイ1の製造工程
について説明する。まず、図3(a)において、n型G
aAs基板2上に、多層反射層3、n型AlGaAsク
ラッド層4、p型AlGaAs活性層5、p型AlGa
Asクラッド層6を順次積層する。
The manufacturing process of the light emitting diode array 1 will be described below. First, in FIG. 3A, n-type G
On the aAs substrate 2, the multilayer reflective layer 3, the n-type AlGaAs cladding layer 4, the p-type AlGaAs active layer 5, and the p-type AlGa are formed.
The As clad layer 6 is sequentially laminated.

【0010】次に、同図(b)において、フォトリソ工
程を経てSiN又はSiO2 をエッチングマスク14と
してエッチングを行い、アレイ方向に一列に並んだ複数
個の発光部7に分離する。ここで、多層反射層3は、多
層の半導体結晶層からなり、活性層5から基板2側に発
光された光を、反射させて基板2による光の吸収をなく
し外部へ取り出すものである。又、エッチャントは例え
ばH3 P04 /H2 S04 /H2 2 系のものが使用さ
れることにより、あらゆる面方位に対して順テーパーで
エッチングが行われ、全側面が順テーパーとなったエッ
チング溝8が形成される。
Next, in FIG. 1B, a photolithography process is performed and etching is performed using SiN or SiO 2 as an etching mask 14 to separate into a plurality of light emitting portions 7 arranged in a line in the array direction. Here, the multilayer reflective layer 3 is composed of a multilayer semiconductor crystal layer, and reflects the light emitted from the active layer 5 to the substrate 2 side to eliminate the absorption of the light by the substrate 2 and take it out. Further, the etchant used is, for example, a H 3 P0 4 / H 2 S0 4 / H 2 0 2 system, so that etching is performed with a forward taper for all plane orientations, and all side surfaces are forward tapered. The etching groove 8 is formed.

【0011】次に、同図(c)において、前述のエッチ
ングマスク14はそのままエピマスクとして用いて、M
OCVD法により、エッチング溝8を埋め込むようにn
型AlGaAsをエピタキシャル成長させて埋め込み成
長層9を形成する。ここで、エッチング溝8の全側面は
順テーパーとなっているため、埋め込み成長層9は、ほ
ぼ均一で平坦に成長される。
Next, in FIG. 3C, the above-mentioned etching mask 14 is used as it is as an epi mask, and M
N is formed by the OCVD method so as to fill the etching groove 8.
Type AlGaAs is epitaxially grown to form a buried growth layer 9. Here, since all the side surfaces of the etching groove 8 are forward tapered, the buried growth layer 9 is grown substantially uniformly and flatly.

【0012】その後、同図(d)において、マスク14
を剥離してp型クラッド層6上面及び埋め込み成長層9
上面全体に、気相成長法などにより酸化膜又は窒化膜の
パシベーション膜11を形成し、その発光部7上部に穴
をあけて電極10を蒸着法などにより形成する。又、電
極13を基板下面に、配線用電極12を発光部7上部の
電極10と接続してパシベーション膜11上面に夫々形
成する。
Thereafter, as shown in FIG.
By peeling off the upper surface of the p-type cladding layer 6 and the buried growth layer 9
A passivation film 11 of an oxide film or a nitride film is formed on the entire upper surface by a vapor phase growth method or the like, a hole is formed in the upper portion of the light emitting portion 7, and an electrode 10 is formed by a vapor deposition method or the like. Further, the electrode 13 is formed on the lower surface of the substrate and the wiring electrode 12 is formed on the upper surface of the passivation film 11 by connecting to the electrode 10 on the light emitting portion 7.

【0013】以上説明したように発光ダイオードアレイ
1によれば、発光効率の高い2重ヘテロ構造によって発
光部7は形成され、高輝度であると共に、発光部7を分
離するエッチング溝8を埋め込むような埋め込み成長層
9が形成され、上面全体にはパシベーション膜11が形
成され、上面が平坦化されているので、パターン配線等
上面での微細加工を容易にすることができる。又、微細
加工が容易となれば、より高密度に発光部7を集積する
ことができる。
As described above, according to the light emitting diode array 1, the light emitting portion 7 is formed by the double hetero structure having high light emitting efficiency, has high brightness, and the etching groove 8 for separating the light emitting portion 7 is embedded. Since the embedded growth layer 9 is formed, the passivation film 11 is formed on the entire upper surface, and the upper surface is planarized, fine processing on the upper surface such as pattern wiring can be facilitated. Further, if fine processing is facilitated, the light emitting portions 7 can be integrated with higher density.

【0014】又、半導体層以外の例えば樹脂等で、エッ
チング溝を埋め込んだものに比しては、結晶成長工程に
おいて一貫して作製可能であり、更に他の半導体層と熱
膨脹係数が一致しているので、歩留まり向上、信頼性向
上等の効果がある。
Further, compared with a semiconductor layer other than the semiconductor layer, for example, in which the etching groove is filled, it can be manufactured more consistently in the crystal growth process, and the thermal expansion coefficient is the same as that of other semiconductor layers. Therefore, there are effects such as improvement in yield and improvement in reliability.

【0015】又、発光ダイオードアレイ1の製造方法に
よれば、H3 P04 /H2 S04 /H2 2 系のエチャ
ントを使用するので、あらゆる面方位に対して順テーパ
ーでエッチングが行われ、全側面が順テーパーとなった
エッチング溝8を形成することができる。従って、良好
に埋め込み成長層9を成長させることができる。
Further, according to the method for manufacturing the light emitting diode array 1, since the H 3 P0 4 / H 2 S0 4 / H 2 0 2 system etchant is used, etching is performed with a forward taper for all plane orientations. It is possible to form the etching groove 8 in which all side surfaces are forward tapered. Therefore, the buried growth layer 9 can be grown well.

【0016】[0016]

【発明の効果】以上説明したように本発明の半導体発光
素子アレイによれば、発光効率の高い2重ヘテロ構造に
よって発光部は形成され、発光部を分離するエッチング
溝を埋め込むような埋め込み成長層が形成され、更に、
埋め込み成長層上面にパシベーション膜が形成され、上
面が平坦化されているので、上面での微細加工を容易に
し、高輝度、高密度化を実現することができる。
As described above, according to the semiconductor light emitting device array of the present invention, the light emitting portion is formed by the double hetero structure having high light emitting efficiency, and the buried growth layer is formed so as to fill the etching groove for separating the light emitting portion. Is formed, and
Since the passivation film is formed on the upper surface of the buried growth layer and the upper surface is flattened, fine processing on the upper surface can be facilitated, and high brightness and high density can be realized.

【0017】又、本発明の半導体発光素子アレイの製造
方法によれば、硫酸燐酸混合系のエッチャントを使用す
るので、あらゆる面方位に対して順テーパーでエッチン
グが行われ、全側面が順テーパーのエッチング溝を形成
することができる。従って、良好に埋め込み成長層を成
長させることができる。
Further, according to the method for manufacturing a semiconductor light emitting element array of the present invention, since the sulfuric acid / phosphoric acid mixed etchant is used, etching is performed with a forward taper for all plane orientations, and all side surfaces have a forward taper. Etching grooves can be formed. Therefore, the buried growth layer can be grown well.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の半導体発光素子アレイの一実施例であ
る発光ダイオードアレイの構造を示す断面図である。
FIG. 1 is a cross-sectional view showing a structure of a light emitting diode array which is an embodiment of a semiconductor light emitting element array of the present invention.

【図2】図1の断面に垂直でA−A線を通る断面図であ
る。
FIG. 2 is a cross-sectional view perpendicular to the cross section of FIG. 1 and passing through line AA.

【図3】本発明の半導体発光素子アレイの一実施例であ
る発光ダイオードアレイの製造工程を示す図である。
FIG. 3 is a diagram showing a manufacturing process of a light emitting diode array which is an embodiment of the semiconductor light emitting device array of the present invention.

【符号の説明】[Explanation of symbols]

1 発光ダイオードアレイ 2 基板 5 活性層 7 発光部 8 エッチング溝 9 埋め込み成長層 10 電極 11 パシベーション膜 12 配線電極 13 電極 14 マスク 1 Light Emitting Diode Array 2 Substrate 5 Active Layer 7 Light Emitting Section 8 Etching Groove 9 Buried Growth Layer 10 Electrode 11 Passivation Film 12 Wiring Electrode 13 Electrode 14 Mask

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】基板上に成長したエピタキシャル層のp−
n接合面がエッチング溝により複数個の発光部に分離さ
れてなる半導体発光素子アレイにおいて、 前記エッチング溝の全側面が順テーパーとなったエッチ
ング溝を形成し、 前記エッチング溝を埋め込んでエピタキシャル成長層を
形成し、 前記発光部上部に電極を形成し、 前記エピタキシャル成長層上面及び前記電極を除くエピ
タキシャル層上面に光を透過するパシベーション膜を形
成して上面を平坦化し、 金属配線を前記電極に接続して前記パシベーション膜上
に形成したことを特徴とする半導体発光素子アレイ。
1. A p-type epitaxial layer grown on a substrate.
In a semiconductor light emitting device array in which an n-junction surface is separated into a plurality of light emitting portions by etching grooves, etching grooves are formed in which all side surfaces of the etching grooves are forward tapered, and the etching grooves are filled to form an epitaxial growth layer. Forming an electrode on the light emitting portion, forming a passivation film that transmits light on the upper surface of the epitaxial growth layer and the upper surface of the epitaxial layer excluding the electrode to planarize the upper surface, and connect the metal wiring to the electrode. A semiconductor light emitting device array formed on the passivation film.
【請求項2】請求項1記載の半導体発光素子アレイの製
造方法であって、 全側面が順テーパーとなった前記エッチング溝を硫酸燐
酸混合系のエッチャントを用いて形成し、 前記エッチング溝を完全に埋め込んで前記エピタキシャ
ル成長層をエピタキシャル成長させることを特徴とする
半導体発光素子アレイの製造方法。
2. The method for manufacturing a semiconductor light emitting device array according to claim 1, wherein the etching groove having a forward tapered surface on all sides is formed by using a sulfuric acid / phosphoric acid mixed etchant. A method for manufacturing a semiconductor light emitting device array, characterized in that the epitaxial growth layer is epitaxially grown by embedding in the substrate.
JP1600994A 1994-01-14 1994-01-14 Semiconductor light emitting element array and its manufacture Pending JPH07211934A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1600994A JPH07211934A (en) 1994-01-14 1994-01-14 Semiconductor light emitting element array and its manufacture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1600994A JPH07211934A (en) 1994-01-14 1994-01-14 Semiconductor light emitting element array and its manufacture

Publications (1)

Publication Number Publication Date
JPH07211934A true JPH07211934A (en) 1995-08-11

Family

ID=11904598

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1600994A Pending JPH07211934A (en) 1994-01-14 1994-01-14 Semiconductor light emitting element array and its manufacture

Country Status (1)

Country Link
JP (1) JPH07211934A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2645495A2 (en) 2012-03-30 2013-10-02 Fujitsu Limited Optical semiconductor device, light emitting device, optical transmitting device, and method of manufacturing optical semiconductor device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2645495A2 (en) 2012-03-30 2013-10-02 Fujitsu Limited Optical semiconductor device, light emitting device, optical transmitting device, and method of manufacturing optical semiconductor device
US9130352B2 (en) 2012-03-30 2015-09-08 Nec Corporation Optical semiconductor device, light emitting device, optical transmitting device, and method of manufacturing optical semiconductor device

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