JPH07191315A - Liquid crystal display device - Google Patents
Liquid crystal display deviceInfo
- Publication number
- JPH07191315A JPH07191315A JP5330726A JP33072693A JPH07191315A JP H07191315 A JPH07191315 A JP H07191315A JP 5330726 A JP5330726 A JP 5330726A JP 33072693 A JP33072693 A JP 33072693A JP H07191315 A JPH07191315 A JP H07191315A
- Authority
- JP
- Japan
- Prior art keywords
- liquid crystal
- substrate
- display device
- crystal display
- sealing material
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は対向基板間の液晶セルの
厚さの測定を高精度かつ再現性よく行う部材を備えた液
晶表示装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a liquid crystal display device having a member for measuring the thickness of a liquid crystal cell between opposed substrates with high accuracy and reproducibility.
【0002】[0002]
【従来の技術】液晶材料のセルの厚さを測定するには、
主に光学的方法が用いられている。その中で、従来から
多く使用されているのがリタデーション方法である。こ
のリタデーション方法は、液晶の有する誘電異方性を利
用し、入射光の偏光面の回転度を求めて、厚さを測定す
るものである。また、液晶をはさむ一対の、基板間でそ
れぞれ反射光の干渉波の強度をさまざまな波長で測定す
る光干渉方法も従来から良く使用されている。この方法
は、前記一対の相対向する基板の構造が単純な場合に
は、きれいな干渉縞が得られ、液晶セルの厚さを正確に
求めることができる。2. Description of the Related Art To measure the thickness of a cell of liquid crystal material,
Optical methods are mainly used. Among them, the retardation method has been widely used conventionally. This retardation method utilizes the dielectric anisotropy of liquid crystal to determine the degree of rotation of the plane of polarization of incident light and measure the thickness. In addition, an optical interference method has also been conventionally widely used in which the intensity of the interference wave of reflected light is measured between a pair of substrates sandwiching a liquid crystal at various wavelengths. According to this method, when the structure of the pair of substrates facing each other is simple, clear interference fringes can be obtained, and the thickness of the liquid crystal cell can be accurately obtained.
【0003】[0003]
【発明が解決しようとしている課題】しかし、リタデー
ション方法は、液晶の誘電異方性を利用するので、液晶
注入以前では、液晶セル厚を測定できない。また信頼性
試験などで前記液晶の誘電異方率Δεが変化するような
場合には、前記液晶セル厚の見積りに誤差が生じる。ま
た、光干渉方法について、一対の相対向する基板の一方
の前記対向基板上に前記液晶を駆動する薄膜トランジス
タ等を形成する場合には、前記対向基板上には透明、不
透明な各種薄膜が積層形成されるため、前記干渉特性は
図5に示したような複雑なものとなり、前記液晶セル厚
の計算は事実上不可能となってしまう。However, since the retardation method utilizes the dielectric anisotropy of the liquid crystal, the liquid crystal cell thickness cannot be measured before the liquid crystal is injected. Further, when the dielectric anisotropy Δε of the liquid crystal changes due to a reliability test or the like, an error occurs in the estimation of the liquid crystal cell thickness. Regarding the optical interference method, when a thin film transistor or the like for driving the liquid crystal is formed on one of the pair of opposing substrates, the transparent substrate and various opaque thin films are laminated on the opposing substrate. Therefore, the interference characteristic becomes complicated as shown in FIG. 5, and calculation of the liquid crystal cell thickness becomes practically impossible.
【0004】[0004]
【課題を解決するための手段および作用】本発明者は、
以上の様な課題を鑑み鋭意努力した結果、以下の知見を
得た。つまり、液晶材料セル厚を測定するために、光干
渉方法を用い、光強度を液晶材料を充填している部分で
はなく、シール材の外側で測定する。この方法を用いる
と液晶材料を注入する前でも後でも、正確に液晶セル厚
を求めることができる。Means and Actions for Solving the Problems
As a result of earnest efforts in view of the above problems, the following findings were obtained. That is, in order to measure the thickness of the liquid crystal material cell, the light interference method is used, and the light intensity is measured not on the portion filled with the liquid crystal material but on the outside of the sealing material. By using this method, the liquid crystal cell thickness can be accurately obtained before or after the liquid crystal material is injected.
【0005】図1は本発明の液晶表示装置の断面図であ
る。1は薄膜トランジスタ等のスイッチング素子を含む
半導体基板であり、2は配線に使用する金属膜であり、
3は保護絶縁膜であり、5はシール材であり、7は透明
な対向基板である。2の金属膜と3の保護絶縁膜でボン
ディングパッド構造4を構成する。1の半導体基板と5
のシール材と7の透明な対向基板で液晶材料セルを構成
し、そのセルの中に液晶材料を充填する。透明な対向基
板7は、シール材の外側部分にもはみ出し、ボンディン
グパッド構造4の上方にまで伸びている。液晶材料セル
内の保護絶縁膜3の表面と金属膜2の表面は同じ平面上
にある。FIG. 1 is a sectional view of a liquid crystal display device of the present invention. 1 is a semiconductor substrate including switching elements such as thin film transistors, 2 is a metal film used for wiring,
3 is a protective insulating film, 5 is a sealing material, and 7 is a transparent counter substrate. The bonding pad structure 4 is composed of the metal film 2 and the protective insulating film 3. 1 semiconductor substrate and 5
A liquid crystal material cell is constituted by the sealing material of 7 and the transparent counter substrate of 7, and the liquid crystal material is filled in the cell. The transparent counter substrate 7 also extends to the outside of the sealing material and extends above the bonding pad structure 4. The surface of the protective insulating film 3 and the surface of the metal film 2 in the liquid crystal material cell are on the same plane.
【0006】本発明は、基板に垂直な方向に単色光を照
射し、透明な対向基板7の下方面での反射光と金属膜で
の反射光との光干渉強度を測定し、対向基板7と金属膜
2の間の距離を算出し、その距離を液晶セルの厚さとす
るものである。According to the present invention, monochromatic light is irradiated in a direction perpendicular to the substrate, the optical interference intensity between the light reflected on the lower surface of the transparent counter substrate 7 and the light reflected on the metal film is measured, and the counter substrate 7 is measured. The distance between and the metal film 2 is calculated, and the distance is used as the thickness of the liquid crystal cell.
【0007】図3は、本発明の液晶表示装置の平面図で
ある。反射膜となるボンディングパッド構造4は、液晶
材料セルの対向基板間の距離の均一性を確認するため
に、複数個設けた方が良い。FIG. 3 is a plan view of the liquid crystal display device of the present invention. It is preferable to provide a plurality of bonding pad structures 4 serving as reflective films in order to confirm the uniformity of the distance between the opposing substrates of the liquid crystal material cell.
【0008】また、ボンディングパッド構造をシール材
が丁度折れ曲がる部分のシール材の近接する位置に配置
すれば、前記構造の大きさは大略100μm角であるの
で、前記液晶セルの余分な面積を消費することも無くス
ペースを有効利用できる。複数個設けるボンディングパ
ッド構造の一部の上方を、透明対向基板で覆わなけれ
ば、前記構造を反射光強度を測定する上で、リファレン
ス用として利用できる。Further, if the bonding pad structure is arranged at a position close to the sealing material at the portion where the sealing material is just bent, the size of the structure is about 100 μm square, so that the extra area of the liquid crystal cell is consumed. You can use the space effectively. If the upper part of a plurality of bonding pad structures is not covered with a transparent counter substrate, the structure can be used as a reference for measuring the intensity of reflected light.
【0009】また、金属膜2をシール材5の下部に設け
ても良い。Further, the metal film 2 may be provided below the sealing material 5.
【0010】つまり本発明は、スイッチング素子を設け
た第1の基板と前記第1の基板に対向する第2の基板と
前記第1および第2の基板間に配したシール材とを用い
て構成したセルに液晶材料を充填する液晶表示装置にお
いて、可視光線や赤外線に対する反射板を、前記第2の
基板に対向する第1の基板の表面上で、前記シール材の
外側に設けることを特徴とする液晶表示装置である。That is, the present invention is configured by using a first substrate provided with a switching element, a second substrate facing the first substrate, and a sealing material arranged between the first and second substrates. In a liquid crystal display device in which a liquid crystal material is filled in the cell, a reflection plate for visible light and infrared rays is provided on the surface of the first substrate facing the second substrate and outside the sealing material. It is a liquid crystal display device.
【0011】このとき、前記反射板を金属あるいは金属
化合物で構成するのが望ましい。At this time, it is preferable that the reflector is made of a metal or a metal compound.
【0012】またこのとき、前記反射板を前記第1の基
板に設けたボンディングパッドとして使用しても良い。At this time, the reflecting plate may be used as a bonding pad provided on the first substrate.
【0013】さらにこのとき、前記反射板を前記シール
材が折れ曲がる部分で前記シール材に近接した外側に設
けて構成するのが望ましい。Further, at this time, it is preferable that the reflection plate is provided outside the portion close to the sealing material at the bending portion of the sealing material.
【0014】さらにこのとき、前記反射板を前記シール
材の下方に設けて構成しても良い。Further, at this time, the reflection plate may be provided below the sealing material.
【0015】さらにこのとき、前記反射板を複数個設け
て構成しても良い。Further, at this time, a plurality of the reflection plates may be provided.
【0016】さらにこのとき、複数の前記反射板のう
ち、少なくとも一つの反射板を、前記第1の基板に垂直
な方向に沿って見て、前記第2の基板と重ならない位置
に設け、他の反射板が重なる位置に設けて構成しても良
い。Further, at this time, at least one of the plurality of reflectors is provided at a position where it does not overlap the second substrate when viewed along a direction perpendicular to the first substrate, and the like. The reflectors may be provided at a position where they overlap.
【0017】本発明を実施することによって、対向基板
間の液晶セルの厚さが、両基板の貼合せ以後の工程で測
定可能となり、しかもその値は注入する液晶に依存しな
い直接的な値が得られる。さらにプロセスの際ボンディ
ングパッドを作製するのと同時に反射板を作製するので
安価に作製できる。By carrying out the present invention, the thickness of the liquid crystal cell between the opposing substrates can be measured in the steps after the bonding of both substrates, and the value is a direct value which does not depend on the injected liquid crystal. can get. Further, since the reflector is produced at the same time when the bonding pad is produced during the process, the production cost can be reduced.
【0018】[0018]
(実施例1)図1の液晶表示装置の断面図を用いて第1
の実施例の説明をする。(Embodiment 1) A first embodiment using the cross-sectional view of the liquid crystal display device of FIG.
The embodiment will be described.
【0019】モノクロメータ等を用いて、まず透明基板
7側から波長の既知な光を入射し、反射して来る光の強
度を測定する。前記金属膜2はほとんどの波長の光を全
反射するので、前記波長−反射強度特性(干渉特性、図
2)から液晶セルの厚さを求めることができる。First, using a monochromator or the like, light with a known wavelength is made incident from the transparent substrate 7 side, and the intensity of the reflected light is measured. Since the metal film 2 totally reflects light of almost all wavelengths, the thickness of the liquid crystal cell can be obtained from the wavelength-reflection intensity characteristic (interference characteristic, FIG. 2).
【0020】対向基板間の距離をdとすると、反射強度
が強い波長λpeakは次式Assuming that the distance between opposed substrates is d, the wavelength λ peak at which the reflection intensity is strong is
【0021】[0021]
【外1】 で表され、反射強度が弱い波長λvalley は次式[Outer 1] The wavelength λ valley with weak reflection intensity is
【0022】[0022]
【外2】 で表わされる関係にある。この関係からdを求めること
が出来る。前記ギャップ量は大略4μmであるので使用
する光は赤外線または可視光が望ましい。[Outside 2] There is a relationship represented by. From this relationship, d can be obtained. Since the gap amount is approximately 4 μm, the light used is preferably infrared light or visible light.
【0023】(実施例2)本発明の他の実施例として、
ボンディングパッド構造を構成する金属膜の反射特性を
更に良く知るために、前記液晶セルに存在する外部引出
用のボンディングパッドを使用して、前記金属膜の反射
特性を得ることも考えられる。(Embodiment 2) As another embodiment of the present invention,
In order to better understand the reflection characteristics of the metal film forming the bonding pad structure, it is possible to obtain the reflection characteristics of the metal film by using a bonding pad for external extraction existing in the liquid crystal cell.
【0024】前記ボンディングパッドはワイヤボンディ
ングを行い、外部に電気的経路を引出すために、前記パ
ッド上方にはボンディングに邪魔となる透明基板が存在
しないのが普通である。従って前記パッド上には対向透
明基板が存在せず、光の干渉は生じない。従って前記パ
ッドを構成する金属膜の純粋な反射特性(λ−I0)が
得られる。この金属膜の反射特性と、前記液晶セルギャ
ップの反射特性(λ−I)との比、λ−I/I0を調べ
ることによって、より正確にλpeak、λvalley、従って
dを求めることが出来るようになる。また、このような
補正を行うことによって、例えば前記パッド上に数百Å
程度の厚さで存在する液晶配向膜の影響で軽くすること
も可能である。Since the bonding pad is wire-bonded and an electric path is drawn out to the outside, there is usually no transparent substrate above the pad which interferes with the bonding. Therefore, there is no opposing transparent substrate on the pad, and no light interference occurs. Therefore, the pure reflection characteristic (λ-I0) of the metal film forming the pad can be obtained. By examining the ratio of the reflection characteristic of this metal film to the reflection characteristic (λ-I) of the liquid crystal cell gap, λ-I / I0, λ peak , λ valley , and therefore d can be obtained more accurately. Like Also, by performing such a correction, for example, several hundred Å on the pad.
It is also possible to reduce the weight due to the influence of the liquid crystal alignment film that exists with a certain thickness.
【0025】また本発明は、前記ギャップの干渉特性を
調べるためには何もボンディングパッド構造に限ること
はなく、前記他方の基板の表面近傍が光を充分反射する
膜でありさえすれば良い。従って、その材質は金属、金
属酸化物、その他、他方の基板上に形成される各種膜材
質のいずれかで良い。The present invention is not limited to the bonding pad structure for investigating the interference characteristics of the gap, and it is sufficient that the vicinity of the surface of the other substrate is a film that sufficiently reflects light. Therefore, the material thereof may be any of metal, metal oxide, and various film materials formed on the other substrate.
【0026】また、前記ギャップ量の制御性を高めるた
めに、前記ギャップを測定するための光を反射する部分
と同一の構造上にシールを形成して、前記シール材中に
存在するスペーサの押潰状態を直接モニタリングするこ
とも考えられる(図4)。これによってシール材形成状
態を調べることが出来るので、両基板間の距離を均一に
保ちながらシール材を形成できる。In order to improve the controllability of the gap amount, a seal is formed on the same structure as the light-reflecting portion for measuring the gap, and a spacer existing in the sealing material is pushed. It is also possible to directly monitor the crushed state (Fig. 4). As a result, the state of forming the seal material can be checked, so that the seal material can be formed while keeping the distance between both substrates uniform.
【0027】また当然のことながら、前記光を反射する
部分と、前記シール材とが連続した構造であっても良
い。Further, as a matter of course, a structure in which the light-reflecting portion and the sealing material are continuous may be used.
【0028】[0028]
【発明の効果】本発明によれば、簡単な構造を設けるこ
とによって、液晶セルの厚さを高精度に測定できる。現
在得られている測定精度は±0.02μm程度である。
前記測定方法は注入する液晶に依存しない直接的な方法
であり、ボンディングパッド等の液晶セル構築に必要不
可欠な構造を流用し、しかも液晶セルの余白面積に配置
することによって、製造に要するコストは一切上昇しな
い。According to the present invention, the thickness of the liquid crystal cell can be measured with high accuracy by providing a simple structure. The currently obtained measurement accuracy is about ± 0.02 μm.
The measurement method is a direct method that does not depend on the liquid crystal to be injected, and the structure essential for building a liquid crystal cell such as a bonding pad is diverted, and by arranging it in the blank area of the liquid crystal cell, the cost required for manufacturing is reduced. It does not rise at all.
【0029】また前記構造を複数設けることによって前
記ギャップ量の分布を知ることが可能となり、シール材
形製工程の管理も可能である。Further, by providing a plurality of the structures, it is possible to know the distribution of the gap amount, and it is possible to control the sealing material forming process.
【図1】本発明の一実施例の断面図。FIG. 1 is a sectional view of an embodiment of the present invention.
【図2】本発明の光干渉特性を示す図。FIG. 2 is a diagram showing optical interference characteristics of the present invention.
【図3】本発明の一実施例の平面図。FIG. 3 is a plan view of an embodiment of the present invention.
【図4】本発明の他の実施例の断面図。FIG. 4 is a sectional view of another embodiment of the present invention.
【図5】従来例の光干渉特性を示す図。FIG. 5 is a diagram showing optical interference characteristics of a conventional example.
1、41 基板 2、42 金属膜 3、43 保護膜 4 構造 5、45 シール材 6、46 液晶 7、47 透明基板 1, 41 Substrate 2, 42 Metal film 3, 43 Protective film 4 Structure 5, 45 Sealing material 6, 46 Liquid crystal 7, 47 Transparent substrate
Claims (7)
前記第1の基板に対向する第2の基板と前記第1および
第2の基板間に配したシール材とを用いて構成したセル
に液晶材料を充填する液晶表示装置において、 可視光線や赤外線に対する反射板を、前記第2の基板に
対向する第1の基板表面上で、前記シール材の外側に設
けることを特徴とする液晶表示装置。1. A cell formed by using a first substrate provided with a switching element, a second substrate facing the first substrate, and a sealing material arranged between the first and second substrates. A liquid crystal display device filled with a liquid crystal material, characterized in that a reflector for visible light and infrared rays is provided on the surface of the first substrate facing the second substrate and outside the sealing material. .
構成する請求項1に記載の液晶表示装置。2. The liquid crystal display device according to claim 1, wherein the reflector is made of a metal or a metal compound.
ンディングパッドとして使用する請求項1および2に記
載の液晶表示装置。3. The liquid crystal display device according to claim 1, wherein the reflection plate is used as a bonding pad provided on the first substrate.
部分で前記シール材に近接する外側に設けて構成する請
求項1乃至3に記載の液晶表示装置。4. The liquid crystal display device according to claim 1, wherein the reflection plate is provided outside a portion where the sealing material is bent and is close to the sealing material.
て構成する請求項1乃至4に記載の液晶表示装置。5. The liquid crystal display device according to claim 1, wherein the reflection plate is provided below the sealing material.
項1乃至5に記載の液晶表示装置。6. The liquid crystal display device according to claim 1, wherein the liquid crystal display device comprises a plurality of the reflection plates.
つの反射板を、前記第1の基板に垂直な方向に沿って見
て、前記第2の基板と重ならない位置に設け、他の反射
板が重なる位置に設けて構成する請求項6に記載の液晶
表示装置。7. At least one of the plurality of reflectors is provided at a position where it does not overlap the second substrate when viewed along a direction perpendicular to the first substrate, and another reflector is provided. The liquid crystal display device according to claim 6, wherein the liquid crystal display device is provided at a position where the plates overlap.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5330726A JPH07191315A (en) | 1993-12-27 | 1993-12-27 | Liquid crystal display device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP5330726A JPH07191315A (en) | 1993-12-27 | 1993-12-27 | Liquid crystal display device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH07191315A true JPH07191315A (en) | 1995-07-28 |
Family
ID=18235878
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP5330726A Withdrawn JPH07191315A (en) | 1993-12-27 | 1993-12-27 | Liquid crystal display device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH07191315A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11344312A (en) * | 1998-06-01 | 1999-12-14 | Jasco Corp | Liquid crystal cell gap measuring method and its equipment |
-
1993
- 1993-12-27 JP JP5330726A patent/JPH07191315A/en not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH11344312A (en) * | 1998-06-01 | 1999-12-14 | Jasco Corp | Liquid crystal cell gap measuring method and its equipment |
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