JPH07123168B2 - Photoelectric element - Google Patents

Photoelectric element

Info

Publication number
JPH07123168B2
JPH07123168B2 JP61147197A JP14719786A JPH07123168B2 JP H07123168 B2 JPH07123168 B2 JP H07123168B2 JP 61147197 A JP61147197 A JP 61147197A JP 14719786 A JP14719786 A JP 14719786A JP H07123168 B2 JPH07123168 B2 JP H07123168B2
Authority
JP
Japan
Prior art keywords
doped
layer
doping
photodegradation
ppm
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP61147197A
Other languages
Japanese (ja)
Other versions
JPS634686A (en
Inventor
孝二 森
英一 太田
浩幸 堀口
克彦 谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP61147197A priority Critical patent/JPH07123168B2/en
Publication of JPS634686A publication Critical patent/JPS634686A/en
Publication of JPH07123168B2 publication Critical patent/JPH07123168B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

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  • Photovoltaic Devices (AREA)
  • Light Receiving Elements (AREA)

Description

【発明の詳細な説明】 (技術分野) 本発明は、光電素子に関し、特に、複写機、ファクシミ
リ装置等における画像読取のための、アモルファスシリ
コン層を光導電層とする光読取素子に関するものであ
る。
Description: TECHNICAL FIELD The present invention relates to a photoelectric element, and more particularly to an optical reading element having an amorphous silicon layer as a photoconductive layer for image reading in a copying machine, a facsimile machine or the like. .

(従来技術) 従来、感光体や、太陽電池の光電変換層としてのアモル
ファスシリコン(以下a-Siと記す)層には0.1〜100ppm
のボロン(B)がドープされている。そのドープ量の最
適値は、それぞれのデバイスの光電特性、劣化特性から
決定される。Bのドーピングによりa-Si層の高抵抗化が
図られ、その結果、光電特性が向上し、かつ劣化の防止
につながる。
(Prior Art) Conventionally, 0.1 to 100 ppm is present in a photoconductor or an amorphous silicon (hereinafter referred to as a-Si) layer as a photoelectric conversion layer of a solar cell.
Boron (B) is doped. The optimum value of the doping amount is determined from the photoelectric characteristics and deterioration characteristics of each device. By doping B, the resistance of the a-Si layer is increased, and as a result, photoelectric characteristics are improved and deterioration is prevented.

しかしながら、本発明の主対象である光導電型光読取素
子においては、上記Bのドープ量は適用できない。それ
は光照射時の抵抗値が高すぎて光電流を正しく信号とし
て検出できないからである。一方、ノンドープのa-Si
は、その構造物性が示す特徴から、光が照射されると高
抵抗化する、即ち半劣化を起こすという欠点がある。こ
の光劣化現像の原因の一つは、a-Si模形成時に膜中に入
り込むH2O,O2,N2等の影響があげられる。膜中におい
て、(OH)基、あるいはO,N原子がSi原子と結合する
と、第3図に示したように、ダングリングボンド(不対
電子対)が生成されるためと思われる。Bのドーピング
は、上記不純物によるダングリングボンドの生成を抑制
しようとするものであり、これを一般にコンペンセイシ
ョンと呼んでいる。第4図はこの様子を示している。B
のドープ量があまり多いとp型の伝導を示し、それに適
する電極がほとんどない点で問題となる。
However, in the photoconductive type optical reading element which is the main object of the present invention, the above doping amount of B cannot be applied. This is because the resistance value during light irradiation is too high to correctly detect the photocurrent as a signal. On the other hand, undoped a-Si
Has a drawback that it has a high resistance when exposed to light, that is, causes half-deterioration due to the characteristics of its structural properties. One of the causes of this photodegradation development is the influence of H 2 O, O 2 , N 2 and the like that enter the film during a-Si pattern formation. It is considered that when the (OH) group or O, N atom is bonded to the Si atom in the film, a dangling bond (unpaired electron pair) is generated as shown in FIG. The doping of B is intended to suppress the generation of dangling bonds due to the above-mentioned impurities, and this is generally called compensation. FIG. 4 shows this situation. B
If the doping amount is too large, p-type conduction is exhibited, and there is almost no suitable electrode, which is a problem.

上記のことから、a-Si層を光導電層とする光読取素子に
おいては、0.1〜100ppmのBドープ量では所要の特性が
得られず、また、ノンドープでは光劣化が大きいという
問題があった。
From the above, in the optical reading element using the a-Si layer as the photoconductive layer, the required characteristics cannot be obtained with a B-doping amount of 0.1 to 100 ppm, and there is a problem that photodegradation is large in the non-doping. .

(発明の目的) 本発明は、上記従来技術の問題点を解決するもので、光
導電層の抵抗値をあまり高めることなく、従って所要の
光電流が得られ、しかも光劣化が軽減された光導電型の
光電素子、中でも光読取素子を提供するものである。
(Object of the Invention) The present invention solves the above-mentioned problems of the prior art. Therefore, a photocurrent can be obtained without increasing the resistance value of the photoconductive layer, and the photodegradation is reduced. The present invention provides a photoelectric conversion element of a conductive type, especially an optical reading element.

(発明の構成) 上記目的を達成するために、本発明は、活性層としての
a-Si層に、(1013〜1015)/cm3の範囲でボロンをドープ
するものである。
(Structure of the Invention) In order to achieve the above object, the present invention provides an active layer
The a-Si layer is doped with boron in the range of (10 13 to 10 15 ) / cm 3 .

第1図は、Bのドープ量と光電流との関係を示したもの
で、この図からBドープ量は、B2H6/SiH4(ppm)で、10
-1〜10-3ppmが適当である。特に10-2〜10-3ppmの範囲で
は電流値もノンドープの場合と比べて見劣りせず、好ま
しい。なおこのときの成膜条件は、SiH4の流量;10scc
m、パワー;10W、圧力;0.1Torr、B2H6/H2;ドーピング条
件により流量変化、基板温度;300℃である。B2H6/SiH4
(ppm)の流量に対して実際膜中にドープされたBの量
をSIMSで評価した結果を第2図に示す。これから、10-1
〜10-3ppmのB2H6/SiH4に対して膜中にドープされたBの
量は、(1015〜1013)/cm3に対応し、好ましいBドープ
量は(1014〜1013)/cm3であるといえる。
FIG. 1 shows the relationship between the B doping amount and the photocurrent. From this figure, the B doping amount is B 2 H 6 / SiH 4 (ppm),
-1 to 10 -3 ppm is suitable. In particular, in the range of 10 -2 to 10 -3 ppm, the current value is not inferior to that in the non-doped case, which is preferable. The film formation conditions at this time were as follows: SiH 4 flow rate: 10 scc
m, power; 10 W, pressure; 0.1 Torr, B 2 H 6 / H 2 ; flow rate change depending on doping conditions, substrate temperature; 300 ° C. B 2 H 6 / SiH 4
FIG. 2 shows the results of SIMS evaluation of the amount of B actually doped in the film with respect to the flow rate (ppm). From now on, 10 -1
The amount of B doped in the film with respect to B 2 H 6 / SiH 4 of ˜10 −3 ppm corresponds to (10 15 to 10 13 ) / cm 3 , and the preferable B doping amount is (10 14 to It can be said that it is 10 13 ) / cm 3 .

この微量ドープされたBは、a-Si膜の光劣化の低減に大
きな役割を果たす。1013/cm3程度のBのドープサンプル
と従来のノンドープサンプルとの光劣化を比較すると、
第5図に示したように、ドープサンプルの方が残存率が
高い(光劣化が小さい)ことが判る。なおこの場合、光
照射はグリーン光源(λ=550nm)による連続照射であ
る。
The lightly doped B plays a major role in reducing photodegradation of the a-Si film. Comparing the photo-deterioration between a B-doped sample of about 10 13 / cm 3 and a conventional non-doped sample,
As shown in FIG. 5, it can be seen that the doped sample has a higher residual rate (smaller photodegradation). In this case, the light irradiation is continuous irradiation by a green light source (λ = 550 nm).

(発明の効果) 以上説明したように、本発明によれば、光導電層として
のa-Si層に、(1013〜1015)/cm3の範囲でボロンをドー
プすることにより、必要な光電流を得ることができると
ともに、光劣化を軽減することができ、複写機やファク
シミリ装置等の実使用に十分適合する光読取素子を実現
することが可能となる。
(Effects of the Invention) As described above, according to the present invention, the a-Si layer as the photoconductive layer, necessary by doping boron in the range of (10 13 to 10 15 ) / cm 3 , A photocurrent can be obtained and photodegradation can be reduced, and an optical reading element that is sufficiently suitable for actual use in a copying machine, a facsimile machine, or the like can be realized.

【図面の簡単な説明】[Brief description of drawings]

第1図は、a-Si膜に対するBのドープ量(B2H6/SiH4pp
m)と光電流との関係を示す図、第2図は、B2H6/SiH
4(ppm)の流量に対する膜中にドープされるBの量を示
す図、第3図は、光劣化の原因の一つであるダングリン
グボンドを示す図、第4図は、Bドープの効果を示す
図、第5図は、Bドープサンプルとノンドープサンプル
の光劣化特性を示す図である。
Figure 1 shows the doping amount of B (B 2 H 6 / SiH 4 pp in the a-Si film).
m) and photocurrent, Fig. 2 shows B 2 H 6 / SiH
4 is a diagram showing the amount of B doped in the film with respect to the flow rate of 4 (ppm), FIG. 3 is a diagram showing a dangling bond which is one of the causes of photodegradation, and FIG. 4 is an effect of B doping. And FIG. 5 are diagrams showing the photodegradation characteristics of the B-doped sample and the non-doped sample.

───────────────────────────────────────────────────── フロントページの続き (72)発明者 谷 克彦 東京都大田区中馬込1丁目3番6号 株式 会社リコー内 (56)参考文献 特開 昭59−54275(JP,A) 特公 昭59−29157(JP,B2) ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Inventor Katsuhiko Tani 1-3-6 Nakamagome, Ota-ku, Tokyo Inside Ricoh Co., Ltd. (56) References JP 59-54275 (JP, A) JP 59 -29157 (JP, B2)

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】アモルファスシリコン層を活性層とする光
導電型の光電素子において、前記アモルファスシリコン
層は、ボロンが(1013〜1015)/cm3の範囲でドープされ
ていることを特徴とする光電素子。
1. A photoconductive photoelectric device using an amorphous silicon layer as an active layer, wherein the amorphous silicon layer is doped with boron in a range of (10 13 to 10 15 ) / cm 3. Photoelectric device that does.
【請求項2】ボロンが(1013〜1015)/cm3の範囲でドー
プされたアモルファスシリコン層を用いて光導電型読取
素子が構成されていることを特徴とする特許請求の範囲
第(1)項記載の光電素子。
2. A photoconductive reading element is constituted by using an amorphous silicon layer doped with boron in a range of (10 13 to 10 15 ) / cm 3 . The photoelectric device according to item 1).
JP61147197A 1986-06-25 1986-06-25 Photoelectric element Expired - Fee Related JPH07123168B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP61147197A JPH07123168B2 (en) 1986-06-25 1986-06-25 Photoelectric element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP61147197A JPH07123168B2 (en) 1986-06-25 1986-06-25 Photoelectric element

Publications (2)

Publication Number Publication Date
JPS634686A JPS634686A (en) 1988-01-09
JPH07123168B2 true JPH07123168B2 (en) 1995-12-25

Family

ID=15424751

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61147197A Expired - Fee Related JPH07123168B2 (en) 1986-06-25 1986-06-25 Photoelectric element

Country Status (1)

Country Link
JP (1) JPH07123168B2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5929157A (en) * 1982-08-11 1984-02-16 東レ・ダウコーニング・シリコーン株式会社 Silicone elastomer coated cloth and its manufacture
JPS5954275A (en) * 1982-09-22 1984-03-29 Sanyo Electric Co Ltd Photovoltaic device

Also Published As

Publication number Publication date
JPS634686A (en) 1988-01-09

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