JPH07111176A - Connector inspection jig - Google Patents

Abstract

PURPOSE:To perform the function inspection of a board or the like effectively while recognizing a connector mounting condition without decreasing a mounting density in the condition where a connector is mounted on the base board or the like. CONSTITUTION:A base member 1 and a joint member 3 are connected to each other by first plate springs 2A, 2B, and a joint member 3 and a probe holder 5 are connected to each other by second plate springs 4A, 4B. The first plate spring has flexiblity in an X-axis direction, and the second plate spring has flexibility in a Y-axis direction. A probe 6 connected to a cable 7 is fixed on a probe holder. Even when a mounting position of a connector 10 on a board 9 is deflected a little in the X-axis and/or the Y-axis direction, the probe holder 5 can be moved in the X-axis and/or the Y-axis direction by guide parts 51, 81 only by moving the jig straight down in a Z-axis direction, thereby a contact 6a of the probe 6 can be brought into contact with a terminal part 10a of the connector 10.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an inspection jig for inspecting an electrical function of a board or the like with a connector mounted on the board or the like, and particularly to a board or the like positioned within a certain error range. The present invention relates to an inspection jig configured to absorb a positional error of a connector and to allow a contact of the inspection jig to accurately contact an exposed terminal portion of the connector.

[0002]

2. Description of the Related Art Conventionally, as a first method for inspecting the function of a board or the like in a state where a connector is mounted, the first method is to connect a connector and another function board or the like through another connector. A functional test was being performed. Also,
As the second method, a method has been adopted in which a test pad is provided around the connector, and a contact is pressed against the test pad to perform the test.

[0003]

However, in the first method, the substrate or the like cannot be inspected by itself,
As a result, the number of man-hours required for inspection increases, and the inspection process becomes complicated. In addition, the second method has a drawback in that the mounting density is lowered due to the provision of the inspection pad, and the mounting state of the connector itself cannot be confirmed.

In view of the above-mentioned problems of the prior art, therefore, the technical problem of the present invention is to efficiently check the function of the circuit board and the like in a state where the connector is mounted on the circuit board and to reduce the mounting density. Moreover, it is to provide an inspection jig capable of performing an inspection while confirming the mounting state of the connector.

[0005]

According to the present invention, in a connector inspection jig for electrically inspecting a connector in a mounted state, it is necessary to electrically connect the exposed terminals of the connector with each other. A plurality of inspection contacts insulated from each other, and a guide mechanism for bringing the inspection contacts into contact with the terminal portion and guiding the relative positions of the inspection contacts and the connector. A connector inspection jig is obtained.

According to the present invention, in the connector inspection jig, the base member that receives a conveying force and the inspection contact are connected via a biaxial compliance mechanism. A jig is obtained.

According to the present invention, in the connector,
A connector inspection jig is obtained in which each of the biaxial compliance mechanisms has two leaf springs parallel to each other.

[0008]

According to the present invention having the above-mentioned structure, even if the connector mounted on the board or the like is positioned with an error in the X-axis direction and / or the Y-axis direction, the jig is simply lowered in the Z-axis direction, The contact of the jig can be pressed accurately against the terminal of the connector.

[0009]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Next, an embodiment of the present invention will be described with reference to the accompanying drawings. FIG. 1 is a perspective view showing a connector inspection jig according to an embodiment of the present invention, and FIG. 2 is a front view showing an operating state. In the following description, the up-down direction is called the Z-axis direction, the front-back direction is called the X-axis direction, and the left-right direction is called the Y-axis direction.

As shown in FIGS. 1 and 2, on opposite side surfaces of the base member 1 having a rectangular parallelepiped shape on which the long sides are formed, a first plate extending downward in parallel with these side surfaces is formed. Spring 2
The upper ends of A and 2B are fixed by screws S1. These first leaf springs 2A and 2B form a compliance mechanism. The lower ends of the first leaf springs 2A and 2B are fixed by screws S2 to the outer wall surfaces of the central projecting portion on the front and back surfaces (the surface orthogonal to the X axis) of the joint member 3 having a horizontal cross section. There is. This first leaf spring 2
A and 2B have elasticity in the plate thickness direction, and the base member 1
When the joint member 3 is moved in the opposite directions relative to the X-axis direction which is the plate thickness direction of the leaf springs 2A and 2B, the joint member 3 is bent. In other words, when the base member 1 is in the fixed position, the joint member 3 moves to the leaf spring 2
It is possible to bend A and 2B and move them in the X-axis direction.

The upper ends of the second leaf springs 4A and 4B are fixed to both side surfaces of the joint member 3 (surfaces orthogonal to the Y-axis direction) by screws S3. The lower ends 4A and 4B of the second leaf spring are provided with screws S on both side surfaces of the probe holder 5.
It is fixed by 4. This second leaf spring 4A, 4
B also has elasticity in the plate thickness direction, and when the joint member 3 and the probe holder 5 are moved in the directions relatively opposite to each other in the Y-axis direction, the second plate springs 4A and 4B are moved as shown in FIG. It is configured to bend. That is, the probe holder 5 is movable in the Y direction around the joint member 3.

On the back side of the probe holder 5, vertically extending probes 6 are arranged in a line in the side direction (Y direction). At the upper end of the probe 6, an opening is formed for receiving the electric wire 7 connected to an inspection device (not shown) in the inserted state. Also, at the lower end of the probe 6, the electric wire 7
The contactor 6a electrically connected to is formed. The contactor 6a is pressed against the terminal portion 10a of the connector 10 mounted on the board 9 to inspect the connector and the board 9.

On both side surfaces of the probe holder 5, a connector guide 8 for abutting and positioning on both side surfaces of the connector 10.
A and 8B are provided. As shown in FIG. 1, a tapered guide portion 51 for guiding the connector 10 in the X-axis direction is formed in the front-rear direction on the bottom surface side of the probe holder 5. Also inside the connector guides 8A, 8B,
As shown in FIG. 2, a tapered guide portion 81 for guiding the connector 10 in the Y-axis direction is formed. These guide portions 51 and 81 form a connector guide mechanism. That is, when the jig according to the embodiment of the present invention is pressed against the connector 10 side at the time of inspection, these guide portions 51, 81
The connector 10 is accommodated in the connector accommodating portion defined by the probe holder 5 and the connector guides 8A and 8B while being guided by the contact 6a of the probe 6.
Can be brought into conductive contact with the corresponding terminal portion 10a of the connector 10.

Next, the operating state of the compliance mechanism in the jig according to the embodiment of the present invention will be described with reference to FIG. It is assumed that the connector 10 is positioned and attached, for example, with a deviation of δ1 (<δ2 (chamfering amount of the guide portion 81)) from the normal position in the Y-axis direction. In this case, the probe holder 5 is the second spring member 4
The jig is attached to the joint member 3 by A and 4B so that the jig can be moved by the guide portion 81 having a chamfering amount of δ2 formed in the connector guides 8A and 8B, which is a guide mechanism in the Y-axis direction. As it descends, both end faces of the connector 10 slide in the guide portion 81 and move in the Y-axis direction (leftward in the case shown in FIG. 2). And
Finally, as shown in FIG. 2, the probe holder 5 and the connector guides 8 </ b> A and 8 </ b> B are accommodated in the accommodating portion defined, and the contactor 6 a of the probe 6 can be pressed against the terminal portion 10 a of the connector 10.

In the above case, the case where the mounting position of the connector 10 on the board 9 is displaced in the Y-axis direction has been described. However, when the connector 10 is displaced in the X-axis direction which is perpendicular to the paper surface in FIG. The guide portions 51 formed on the front and rear sides of the probe holder 5 move the front and rear surfaces of the connector 10 in the X-axis direction while sliding on the guide portions 51 as the jig descends. That is, the joint member 3 is moved in the X-axis direction so that the connector 1 is inserted into the accommodating portion defined in the probe holder 5 and the connector guides 8A and 8B.
0 is accommodated and the contact 6a of the probe 6 is connected to the connector 10
It is pressed against the terminal part 10a.

In the above description, the probe holder 5 and the connector guides 8A and 8B are separately constructed and integrally connected, but the present invention is not limited to this. The probe holder 5 and the connector guides 8A and 8B may be integrally formed. That is, the probe holder 5 may have a shape structure that allows it to function as the connector guides 8A and 8B.

[0017]

As described above, according to the jig of the present invention, the probe holder holding the probe is arranged in the X-axis direction and in the Y-axis direction.
Since it is configured to be movable in the axial direction and the guide portion is formed on the probe holder and the connector guide for holding the connector at the time of inspection, the mounting position of the connector is slightly displaced in the X-axis direction and the Y-axis direction. However, by simply lowering the jig in the Z-axis direction, the contact of the probe can be reliably pressed against the terminal portion of the connector, and electrical inspection of the connector and the board on which the connector is mounted can be performed quickly and quickly. Can be done accurately. Further, in the present invention, the contact of the probe can be brought into contact with the terminal portion of the connector simply by lowering the inspection jig.
The inspection can be performed while checking the mounting state of the connector.

Moreover, when the jig of the present invention is used, it is not necessary to provide an inspection pad, and the mounting density of the connector can be improved.

Further, in the present invention, since the structure is extremely simple, the maintenance is easy, the manufacturing cost is low, and the demand for cost reduction can be met.

[Brief description of drawings]

FIG. 1 is an external perspective view showing a connector inspection jig according to an embodiment of the present invention.

FIG. 2 is a front view showing a connector inspection jig according to an embodiment of the present invention.

[Explanation of symbols]

 1 Base Member 2A, 2B First Leaf Spring 3 Joint Member 4A, 4B Second Leaf Spring 5 Probe Holder 6 Probe 7 Electric Wire 8A, 8B Connector Guide 9 Board 10 Connector

Claims (3)

[Claims] 1. A connector inspection jig for electrically inspecting a mounted connector, wherein a plurality of inspection contacts electrically contacting each other for contacting exposed terminal portions of the connector are provided. And a guide mechanism for bringing the inspection contactor into contact with the terminal portion and guiding the relative position of the inspection contactor and the connector. 2. The connector inspection jig according to claim 1, wherein a base member that receives a conveying force and the inspection contact are connected via a biaxial compliance mechanism. Jig. 3. The connector inspection jig according to claim 2, wherein each of the biaxial compliance mechanisms has two leaf springs that are parallel to each other.