CN204989244U - Detection device - Google Patents
Detection device Download PDFInfo
- Publication number
- CN204989244U CN204989244U CN201520638567.1U CN201520638567U CN204989244U CN 204989244 U CN204989244 U CN 204989244U CN 201520638567 U CN201520638567 U CN 201520638567U CN 204989244 U CN204989244 U CN 204989244U
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- CN
- China
- Prior art keywords
- connector
- wiring substrate
- probe
- testing fixture
- mounting table
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The utility model provides a detection device, it is the device that the wiring substrate of connector was taken in the inspection, can restrain the connector and dispose in the position from the specific locations skew. Detection device possesses: carry and put platform (11), put wiring substrate (1) of taking the connector in its year, take wiring substrate (1) of connector to have wiring substrate (2) and install in connector (3) of wiring substrate (2), align member (20), it fixes a position connector (3), and head (30), it has probe (32) with the terminal of connector (3) contact.
Description
Technical field
The utility model relates to the testing fixture wiring substrate of Belt connector being carried out to electric checking.
Background technology
Wiring substrate is provided with various connector.As the one of connector being installed on wiring substrate, the direction (mainly vertical with surface direction) intersected from the surface (face that connector is installed) relative to wiring substrate is had to be inserted into the connector of the portion of terminal of other substrate or the type of connector.As the testing fixture checked the wiring substrate of Belt connector of the connector being provided with the type, the testing fixture that known such as patent documentation 1 is recorded.This testing fixture makes the termination contact of probe and connector.In order to make the termination contact of probe and connector, the wiring substrate of Belt connector is located relative to the head with probe.
Be described with reference to the location of Fig. 6 and Fig. 7 to the wiring substrate 100 of Belt connector.Testing fixture 110 possesses: mounting table 111, and it is placed the wiring substrate 100 of Belt connector; Register pin 120, the wiring substrate 100 of Belt connector is located by it; And head 130, it has the probe 132 contacted with the terminal 105 of connector 103.Head 130 is configured at assigned position relative to mounting table 111, can closely be located at mounting table 111 relative to connector 103.The wiring substrate 100 of Belt connector is located by register pin 120 in the mode utilizing the movement of head 130 and make probe 132 contact with connector 103.Particularly, the ora terminalis 101 of the wiring substrate 100 of Belt connector contacts with register pin 120, and the wiring substrate 100 of Belt connector is located relative to head 130.
Prior art document
Patent documentation
Patent documentation 1:(Japan) JP 2005-283218 publication
But even if located by the wiring substrate 100 of Belt connector, also connector 103 is not located in assigned position sometimes.Such as, when the size of the ora terminalis 101 from the end face of connector 103 to wiring substrate 102 departs from setting range, connector 103 offsets from assigned position.In addition, as shown in Figure 7, when the ora terminalis 101 of the wiring substrate 100 making Belt connector contacts with register pin 120, if wiring substrate 102 bends, then connector 103 offsets from assigned position.Like this, when connector 103 offsets from assigned position, probe 132 can not contact with the terminal 105 of connector 103, or can not carry out accurate electric checking.
Utility model content
Therefore, provide a kind of testing fixture, it is the device of the wiring substrate checking Belt connector, and connector can be suppressed to be configured at the position offset from assigned position.
Testing fixture involved by the utility model possesses: mounting table, the wiring substrate of its mounting Belt connector, and the wiring substrate of described Belt connector has wiring substrate and is installed on the connector of described wiring substrate; Align member, described connector is located by it; And head, it has the probe with the termination contact of described connector.
According to above-mentioned testing fixture, connector can be suppressed to be configured at the position offset from assigned position.
Accompanying drawing explanation
Fig. 1 is the vertical view of the testing fixture involved by the 1st embodiment.
Fig. 2 be along the A-A line of Fig. 1 the 1st embodiment involved by the sectional view of testing fixture.
Fig. 3 be along the B-B line of Fig. 1 the 1st embodiment involved by the sectional view of testing fixture.
Fig. 4 is the vertical view of the testing fixture involved by the 2nd embodiment.
Fig. 5 be along the C-C line of Fig. 4 the 2nd embodiment involved by the sectional view of testing fixture.
Fig. 6 is the vertical view of existing testing fixture.
Fig. 7 is the sectional view of the existing testing fixture of D-D line along Fig. 6.
Description of reference numerals
1: the wiring substrate of Belt connector
2: wiring substrate
2a: surface
3: connector
3a: installed surface
3b: joint face
4: supporting seat
5: terminal
10: testing fixture
11: mounting table
11a: mounting surface
12: pin
13: hinge
20: align member
20a: press surface
21: through hole
22: pin-and-hole
30: head
31: retaining member
32: probe
33: matrix
34: elastic component
41: holding section
42: inserting hole
100: the wiring substrate of Belt connector
101: ora terminalis
102: wiring substrate
103: connector
105: terminal
110: testing fixture
111: mounting table
120: register pin
130: head
132: probe
D: clearance distance
DY: above-below direction
LX: line.
Embodiment
[explanation of embodiment of the present utility model]
Enumerate embodiment of the present utility model to be at first described.
(1) testing fixture involved by embodiment possesses: possess: mounting table, the wiring substrate of its mounting Belt connector, and the wiring substrate of described Belt connector has wiring substrate and is installed on the connector of described wiring substrate; Align member, described connector is located by it; And head, it has the probe with the termination contact of described connector.
According to above-mentioned formation, connector is not utilize the location of wiring substrate indirectly to be located, but connector utilizes align member directly to be located, and connector therefore can be suppressed to be configured at the position offset from assigned position.
(2) in above-mentioned testing fixture, described align member has the through hole of being located by described connector for making described connector insert, and clips described wiring substrate ordinatedly with described mounting table.
According to this formation, connector utilizes the through hole of align member to be located.In addition, effect below is also had.When wiring substrate is not by pressure, wiring substrate flexure sometimes.When the termination contact of probe and connector under the state bent at wiring substrate like this, the pressing due to probe makes the position of wiring substrate offset, and the contact position being thus connected the probe in device moves, and terminal is formed contact vestige.In this respect, in the above-described configuration, wiring substrate is clipped by align member and mounting table, and wiring substrate is difficult to position skew occurs, and therefore can suppress the formation contacting vestige described above.
(3) in above-mentioned testing fixture, the retaining member of the described probe of the maintenance of described head is provided with holding section, described align member is provided with the engaged part of described holding section engaging, when described holding section and the engaging of described engaged part, described probe with and described termination contact corresponding to described probe.
According to this formation, utilize the engaging of holding section and engaged part, head is located relative to connector, and probe can contact with the terminal that probe is mapped.Thus, probe can be suppressed not contact with the terminal that this probe is mapped.
(4) in above-mentioned testing fixture, described head has the matrix supporting described retaining member, described retaining member is can be supported by described matrix relative to the mode of the described matrix movement of described head, or described align member is can be supported by by described mounting table relative to the mode of described mounting table movement.
According to this formation, the engaging of holding section and engaged part becomes smooth.
(5) in above-mentioned testing fixture, described mounting table is provided with pin or the frame of the allocation position of the wiring substrate specifying described Belt connector.
According to this formation, the wiring substrate of Belt connector is configured at assigned position in mounting table and becomes simple.
[details of the embodiment of the application's utility model]
About the testing fixture involved by embodiment, reference accompanying drawing is while illustrate its concrete example below.In addition, the utility model is not limited to these and illustrates, but is illustrated by claim, and intention comprises all changes in the meaning and this claim that are equal to claim.
Be described with reference to Fig. 1, Fig. 2 and Fig. 3 wiring substrate 1 to the Belt connector utilizing testing fixture to check.
The wiring substrate 1 of Belt connector possesses wiring substrate 2 and is installed on the connector 3 of wiring substrate 2.
Wiring substrate 2 utilizes flexible parent metal to form.Flexible parent metal is made up of the lid member of the base material of such as polyimide, distribution and the polyimide that covers distribution.
The parts that connector 3 is connected with connector 3 are (hereinafter referred to as " link ".) terminal be connected with the wired electric of wiring substrate 2.
The connector 3 being installed on the wiring substrate 1 of Belt connector has structure below.
Connector 3 possesses the multiple terminals 5 being arranged in prescribed distance and the supporting seat (holder) 4 keeping terminal 5.Connector 3 has the joint face 3b of the installed surface 3a relative with wiring substrate 2 and the side contrary with installed surface 3a.So-called joint face 3b represents the face of the portion of terminal contact of link.One end of terminal 5 is configured at installed surface 3a side, is connected with the distribution of wiring substrate 2.The pars intermedia of terminal 5 is configured at joint face 3b, with the termination contact of link.The pars intermedia of terminal 5 configures abreast relative to the surperficial 2a of wiring substrate 2.The part that the probe 32 that the pars intermedia of terminal 5 becomes testing fixture 10 in the inspection of the wiring substrate 1 of Belt connector is touched.Connector 3 has the structure of assembly connection parts from the direction (such as vertical direction) intersected with joint face 3b.
As the connector 3 possessing said structure, the connector (so-called Substrate-substrate connector) be connected with substrate by substrate can be enumerated.In addition, if this connector 3 (Substrate-substrate connector), both can be that intercalation part also can for socket.In addition, as other the connector possessing said structure, the portion of terminal being connected with substrate (one of link), the connector installed in the mode that joint face 3b is parallel with the surperficial 2a of wiring substrate 2 can be enumerated.These connectors 3 are (with reference to Fig. 1) rectangle when overlooking, and have 4 sides.
The termination width not circumscribed of connector 3.Testing fixture 10 for termination width and the less connector of terminal pitch particularly useful.This is because: termination width and terminal pitch less time, because the position of connector 3 offsets, can not accurately check.
[the 1st embodiment]
The testing fixture 10 seen figures.1.and.2 involved by explanation the 1st embodiment.
Testing fixture 10 possesses: mounting table 11, the wiring substrate 1 of its mounting Belt connector; Align member 20, connector 3 is located by it; And head 30, it has probe 32.Probe 32 contacts with the terminal 5 of connector 3.
Mounting table 11 is provided with pin 12, and pin 12 specifies the allocation position of the wiring substrate 1 of Belt connector.Pin 12, when the wiring substrate 1 of Belt connector is configured at assigned position, is installed on mounting table 11 in the mode that the ora terminalis of the wiring substrate 1 with Belt connector contacts.In addition, as the structure of the allocation position of the wiring substrate 1 of regulation Belt connector, pin 12 can be replaced and use frame.
Align member 20 is installed on mounting table 11 revolvably by hinge 13.In addition, the mounting structure of align member 20 is not limited thereto.Such as, also (direction that the press surface 20a of the align member 20 and mounting surface 11a of mounting table 11 abreast separate can be made relative to mounting table 11 at above-below direction DY to make align member 20.With reference to Fig. 2.) mode align member 20 is installed.
Align member 20 is configured to the board member clipping wiring substrate 2 with mounting table 11 ordinatedly.Particularly, align member 20 has the face (following is " press surface 20a ") contacted with the surperficial 2a of wiring substrate 2 (face of the side contrary with the face of mounting table 11 side).In addition, as shown in Figure 1, the pin-and-hole 22 that pin 12 is inserted also can be provided with in align member 20.
Align member 20 has the through hole 21 inserted by connector 3.Preferred through hole 21 has 4 inside surfaces with 4 of connector 3 contacts side surfaces.Clearance distance d when preferred connector 3 is inserted in through hole 21 between the side of connector 3 and the inside surface of through hole 21 (center of gravity of connector 3 and the center of through hole 21 consistent time this clearance distance d) than termination width 1/2 length little.
Head 30 has probe 32 and keeps the retaining member 31 of probe 32.Each terminal 5 of probe 32 and connector 3 accordingly person is arranged accordingly with the terminal 5 that should check.Head 30 can be installed relative to mounting table 11 movably by guide rail.Probe 32 contacts with the terminal 5 (terminal 5 be mapped in advance) of connector 3.
The effect of the testing fixture 10 involved by embodiment is described.
The wiring substrate 1 of Belt connector is located by pin 12.When wiring substrate 1 placing align member 20 for the Belt connector of being located by pin 12, wiring substrate 2 presses on mounting table 11 due to the load of align member 20.That is, wiring substrate 2 is clipped by mounting table 11 and align member 20.For this reason, the flexure of wiring substrate 2 is eliminated, and utilizes mounting table 11 and align member 20 to keep.
In addition, when the wiring substrate 1 placing align member 20 for Belt connector, connector 3 is inserted in the through hole 21 of align member 20.Now, the position of the wiring substrate 1 of Belt connector is adjusted, and connector 3 is positioned in the assigned position (connector assigned position) in mounting table 11.
As implied above, wiring substrate 2 utilizes mounting table 11 and align member 20 to keep, and connector 3 utilizes align member 20 to be located relative to mounting table 11.For this reason, even if wiring substrate 2 bends in the initial configuration of the wiring substrate 1 at Belt connector (configuration before being pressed by align member 20), even if or the wiring substrate 1 of Belt connector offsets from assigned position in the initial configuration of the wiring substrate 1 of Belt connector, connector 3 also can utilize align member 20 to be forcibly configured at assigned position (connector assigned position).Therefore, the probe 32 making head 30 close to head during mounting table 11 30 can be suppressed not contact with the terminal 5 (terminal 5 be mapped in advance) of connector 3.
In addition, when wiring substrate 2 is not by pressure, wiring substrate 2 bends sometimes.When under the state that such wiring substrate 2 bends, probe 32 contacts with the terminal 5 of connector 3, due to the pressing of probe 32, the position skew of wiring substrate 2, the contact position being thus connected the probe 32 in device 3 moves, and terminal 5 is formed contact vestige.In this respect, in the above-described configuration, wiring substrate 2 is clipped by align member 20 and mounting table 11, and wiring substrate 2 is difficult to position skew occurs, and therefore can suppress the formation contacting vestige described above.
The effect of testing fixture 10 is below described.
(1) testing fixture 10 possesses mounting table 11, the align member 20 of being located by connector 3 and the head 30 with probe 32.According to this formation, connector 3 is not utilize the location of wiring substrate 2 indirectly to be located, but connector 3 utilizes align member 20 directly to be located, and connector 3 therefore can be suppressed to be configured at the position offset from assigned position.
(2) in the present embodiment, align member 20 has the through hole 21 of being located by connector 3 for making connector 3 insert, and clips wiring substrate 2 ordinatedly with mounting table 11.According to this formation, connector 3 is located by the through hole 21 of align member 20.In addition, owing to clipping wiring substrate 2 by the cooperation of align member 20 and mounting table 11, therefore wiring substrate 2 is difficult to flexure.Thus, the contact vestige being formed with probe 32 on the terminal 5 of connector 3 can be suppressed.
(3) in the present embodiment, mounting table 11 is provided with pin 12 or the frame of the allocation position of the wiring substrate 1 of regulation Belt connector.
According to this formation, the wiring substrate 1 of Belt connector is configured at assigned position in mounting table 11 and becomes simple.
[the 2nd embodiment]
With reference to Fig. 4 and Fig. 5, the testing fixture 10 involved by the 2nd embodiment is described.
In addition, in this explanation, the formation different from the testing fixture 10 involved by the 1st embodiment is described.Same reference numerals is used to the formation identical with the testing fixture 10 involved by the 2nd embodiment.
Testing fixture 10 involved by 2nd embodiment aspect is below different from the testing fixture 10 involved by the 1st embodiment.That is, in the testing fixture 10 involved by the 2nd embodiment, the head positioning mechanism of being located by head 30 relative to align member 20 is possessed.Head positioning mechanism possesses: the 1st mechanism (structure of the retaining member 31 that can be supported by matrix 33 described later movably), and it can the retaining member 31 of supporting head part 30 movably; And the 2nd mechanism's (comprising the structure of holding section 41 described later and inserting hole 42), it makes head 30 and align member 20 engage.
In the testing fixture 10 involved by the 2nd embodiment, head 30 possesses: probe 32; Retaining member 31, it keeps probe 32; And matrix 33, it can support retaining member 31 movably.Retaining member 31 is installed on matrix 33 by elastic component 34.The upper surface (face of matrix 33 side) of retaining member 31 contacts with the lower surface (face of retaining member 31 side) of matrix 33.That is, retaining member 31 slides relative to matrix 33.In addition, retaining member 31 is provided with holding section 41.Holding section 41 is given prominence to towards align member 20.The cross sectional shape of holding section 41 (shape in the cross section that the line LX of the travel direction along holding section 41 when inserting in inserting hole 42 described later with holding section 41 is vertical) is such as circular.
Align member 20 is provided with the inserting hole 42 (engaged part) inserted holding section 41.The cross sectional shape of preferred inserting hole 42 is configured to identical with the cross sectional shape of holding section 41.When cross sectional shape in holding section 41 is circular, the cross sectional shape (shape in the cross section vertical with line LX) of inserting hole 42 is circular.
When the holding section 41 of head 30 and the inserting hole 42 of align member 20 engage, the mode that inserting hole 42 contacts with the terminal 5 (terminal 5 be mapped in advance) of connector 3 with the probe 32 of head 30 configures.
The effect of testing fixture 10 is described.
When electric checking, the wiring substrate 1 of Belt connector is configured at mounting table 11, and align member 20 placing is in the wiring substrate 1 of Belt connector.Connector 3 is inserted in the through hole 21 of align member 20.For this reason, connector 3 is located in assigned position.In this condition, when head 30 declines (with mounting table 11 close to time), before probe 32 contacts with the terminal 5 of connector 3, holding section 41 is inserted in the inserting hole 42 of align member 20.When probe 32 offsets relative to the terminal 5 of connector 3, utilize the position of the engaging recoverable head 30 of holding section 41 and inserting hole 42, probe 32 is accurately located relative to the terminal 5 of connector 3.Thus, probe 32 can with the Width center of the terminal 5 of connector 3 or center near touch.It is particularly useful when the termination width being formed in connector 3 is like this less.
The effect of testing fixture 10 is described.
(1) in the present embodiment, the retaining member 31 of head 30 is provided with holding section 41.Align member 20 is provided with the inserting hole 42 (engaged part) that holding section 41 engages.Further, when holding section 41 and inserting hole 42 engage, probe 32 contacts with the terminal 5 of the connector 3 be mapped with probe 32.
According to this formation, utilize the engaging of holding section 41 and inserting hole 42 (engaged part), head 30 is located relative to connector 3, and probe 32 can contact with the terminal 5 that probe 32 is mapped.Thus, probe 32 can be suppressed not contact with the terminal 5 that this probe 32 is mapped.
In addition, the snap-fit relationship of holding section 41 and inserting hole 42 changes as follows.That is, the hole (holding section) as holding section can be provided with in retaining member 31.Further, in this case, the teat (engaged part) inserted in this hole can be provided with on align member 20.According to this formation, also the effect same with (1) of present embodiment can be obtained.
(2) in the present embodiment, retaining member 31 can be supported by the matrix 33 of head 30 movably.According to this formation, the engaging of holding section 41 and inserting hole 42 (engaged part) becomes smooth.In addition, also can replace this formation and be configured to align member 20 and can be supported by mounting table 11 movably.
[other embodiment]
This technology is not limited to above-mentioned embodiment.Below other embodiment is described.
The inspection of the wiring substrate 1 of the Belt connector that the testing fixture 10 involved by present embodiment utilizes flexible parent metal to form for wiring substrate 2, but this technology also can be used for the inspection of the wiring substrate 1 of the Belt connector that wiring substrate 2 utilizes rigid substrate to form.
utilizability in industry
Testing fixture 10 shown in embodiment is favourable when being used for the electric checking of wiring substrate 1 of Belt connector.
Claims (5)
1. a testing fixture, possesses: mounting table, the wiring substrate of its mounting Belt connector, and the wiring substrate of described Belt connector has wiring substrate and is installed on the connector of described wiring substrate; Align member, described connector is located by it; And head, it has the probe with the termination contact of described connector.
2. testing fixture according to claim 1, wherein,
Described align member has the through hole of being located by described connector for making described connector insert, and clips described wiring substrate ordinatedly with described mounting table.
3. according to testing fixture according to claim 1 or claim 2, wherein,
The retaining member of the described probe of the maintenance of described head is provided with holding section, described align member is provided with the engaged part of described holding section engaging,
When described holding section and the engaging of described engaged part, described probe with and described termination contact corresponding to described probe.
4. testing fixture according to claim 3, wherein,
Described head has the matrix supporting described retaining member,
Described retaining member is can be supported by described matrix relative to the mode of the described matrix movement of described head, or described align member is can be supported by by described mounting table relative to the mode of described mounting table movement.
5. testing fixture according to claim 1, wherein,
Described mounting table is provided with pin or the frame of the allocation position of the wiring substrate specifying described Belt connector.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520638567.1U CN204989244U (en) | 2015-08-21 | 2015-08-21 | Detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201520638567.1U CN204989244U (en) | 2015-08-21 | 2015-08-21 | Detection device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204989244U true CN204989244U (en) | 2016-01-20 |
Family
ID=55123601
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201520638567.1U Expired - Fee Related CN204989244U (en) | 2015-08-21 | 2015-08-21 | Detection device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204989244U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112018023A (en) * | 2019-05-31 | 2020-12-01 | 东京毅力科创株式会社 | Positioning device and positioning method |
-
2015
- 2015-08-21 CN CN201520638567.1U patent/CN204989244U/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112018023A (en) * | 2019-05-31 | 2020-12-01 | 东京毅力科创株式会社 | Positioning device and positioning method |
| CN112018023B (en) * | 2019-05-31 | 2024-03-22 | 东京毅力科创株式会社 | Positioning device and positioning method |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20160120 Termination date: 20200821 |