JPH06258373A - Conduction inspection device for connector housing terminal - Google Patents
Conduction inspection device for connector housing terminalInfo
- Publication number
- JPH06258373A JPH06258373A JP5049180A JP4918093A JPH06258373A JP H06258373 A JPH06258373 A JP H06258373A JP 5049180 A JP5049180 A JP 5049180A JP 4918093 A JP4918093 A JP 4918093A JP H06258373 A JPH06258373 A JP H06258373A
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- connector
- inspection
- hole
- probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Manufacturing Of Electrical Connectors (AREA)
Abstract
Description
【０００１】[0001]
【産業上の利用分野】本発明は、コネクタに収容した端
子が設定した配列に装着されているか否か及び電線間の
ジョイントのつながりが設定した通りになっているか否
かを検査する導通検査装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a continuity inspection device for inspecting whether or not terminals accommodated in a connector are mounted in a set arrangement and whether or not the connection of joints between electric wires is as set. Regarding
【０００２】[0002]
【従来の技術】電線に接続した端子をコネクタに収容し
て組み立てた後、上記した導通検査を行う必要がある。
即ち、図６(Ａ)に示す配列で端子〜をコネクタ１に
収容すべきところを、図６(Ｂ)に示すように誤った配列
になっていないか、また、図７(Ａ)に示すように回路Ｎ
o.１とＮo.２、Ｎo.３とＮo.４をジョイントすべきとこ
ろを、図７(Ｂ)に示すように誤って回路Ｎo.１とＮo.
４、Ｎo.２とＮo.３がジョイントされていないかを検査
する必要がある。2. Description of the Related Art It is necessary to carry out the above-mentioned continuity test after housing a terminal connected to an electric wire in a connector and assembling it.
That is, in the arrangement shown in FIG. 6 (A), where the terminals 1 to 3 are to be accommodated in the connector 1 is not in an incorrect arrangement as shown in FIG. 6 (B), or is shown in FIG. 7 (A). Circuit N
As shown in FIG. 7 (B), the positions where the No. 1 and No. 2 and No. 3 and No. 4 should be jointed are erroneously illustrated.
4. It is necessary to check whether No. 2 and No. 3 are not jointed.
【０００３】従来、この種の導通検査装置としては図４
及び図５に示すように、検査すべきコネクタ１に、検査
用コネクタ２を矢印の方向から嵌め込んで、検査用コネ
クタ２の検査プローブ３を、コネクタ１の端子４の電気
接触部４aに差し込んで導通検査を行っている。Conventionally, as a continuity inspection device of this type, FIG.
Further, as shown in FIG. 5, the inspection connector 2 is fitted into the connector 1 to be inspected from the direction of the arrow, and the inspection probe 3 of the inspection connector 2 is inserted into the electrical contact portion 4a of the terminal 4 of the connector 1. Conducting a continuity test at.
【０００４】[0004]
【発明が解決しようとする課題】しかしながら、前記検
査プローブ３を用いる場合、検査プローブ３の先端を同
一水平位置に保持することは困難で、そのため、同一水
平位置に配列された端子４の電気接触部４aに差し込む
時、検査プローブ３により電気接触部４aに変形を生じ
させる可能性がある。また、端子４の電気接触部４aに
金メッキを施している場合、検査プローブ３の差し込み
で金メッキが剥がれて電気特性が低下するという不具合
がある。However, when the inspection probe 3 is used, it is difficult to hold the tip of the inspection probe 3 in the same horizontal position. Therefore, the electrical contact of the terminals 4 arranged in the same horizontal position is made. When inserted into the portion 4a, the inspection probe 3 may deform the electrical contact portion 4a. Further, when the electrical contact portion 4a of the terminal 4 is plated with gold, there is a problem that the gold plating is peeled off when the inspection probe 3 is inserted and the electrical characteristics are deteriorated.
【０００５】また、検査プローブ３のサイズが端子４の
サイズと合わない場合には、実際に嵌合する相手方の端
子を収容したコネクタを用いて、導通検査を行う必要が
あり、その場合には、１セットずつ嵌合する必要があ
り、非常に手数がかかる問題がある。If the size of the inspection probe 3 does not match the size of the terminal 4, it is necessary to conduct a continuity test using a connector that accommodates the mating terminal that is actually fitted. In that case. Since it is necessary to fit each set one by one, there is a problem that it is very troublesome.
【０００６】さらに、図４に示す検査用コネクタ２を用
いる場合、全てのコネクタの形状と適合した検査用コネ
クタを設ける必要があり、多大の手間とコストとがかか
る問題がある。Further, when the inspection connector 2 shown in FIG. 4 is used, it is necessary to provide an inspection connector that conforms to the shape of all the connectors, which causes a great deal of trouble and cost.
【０００７】本発明は上記問題を解決するためになされ
たもので、端子の変形や電気特性の低下等が無いと共
に、端子のサイズに関係なく検査が出来るようにするこ
とを目的としている。The present invention has been made to solve the above problems, and an object thereof is to prevent deformation of terminals and deterioration of electrical characteristics, and to enable inspection regardless of the size of terminals.
【０００８】[0008]
【課題を解決するための手段】上記問題を解決するため
に、本発明は、端子挿入方向と直交する方向から端子収
容室に開口する貫通穴をコネクタに穿設する一方、上記
貫通穴の外面開口から端子収容室内に差し込んで、端子
収容室内に収容している端子に、弾性接触させる検査プ
ローブを備えていることを特徴とするコネクタ収容端子
の導通検査装置を提供するものである。In order to solve the above problems, the present invention provides a connector with a through hole that opens into a terminal accommodating chamber in a direction orthogonal to the terminal insertion direction, while the outer surface of the through hole is formed. (EN) A continuity inspection device for a connector accommodating terminal, which is equipped with an inspection probe that is inserted into the terminal accommodating chamber through an opening and elastically contacts a terminal accommodated in the terminal accommodating chamber.
【０００９】上記コネクタに穿設する貫通穴は、検査プ
ローブが上記端子の電気接触部以外の部分に弾性接触す
るように、位置決めしている。例えば、上記貫通穴をコ
ネクタの端子収容室の上面、下面あるいは側面に開口さ
せ、該貫通穴から挿入される検査プローブが圧着端子の
バレル部あるいは圧接端子のリーフ部に接触する構成と
している。The through hole formed in the connector is positioned so that the inspection probe elastically contacts the portion of the terminal other than the electrical contact portion. For example, the through hole is opened in the upper surface, the lower surface or the side surface of the terminal accommodating chamber of the connector, and the inspection probe inserted through the through hole comes into contact with the barrel portion of the crimp terminal or the leaf portion of the pressure contact terminal.
【００１０】上記検査プローブはＬ字形状で、複数の検
査プローブを検査ヘッドより櫛歯形状に突出させ、各検
査プローブの折れ曲がった先端部が端子と接触して停止
する位置に応じて検査ヘッド側支持部を支点として変位
可能としている。上記各検査プローブの先端部がコネク
タの上面、側面あるいは下面に並列に穿設された上記貫
通穴の開口より挿入して端子と接触するようにしてい
る。The above-mentioned inspection probe is L-shaped, and a plurality of inspection probes are made to protrude from the inspection head in a comb-teeth shape, and the bent tip of each inspection probe comes into contact with the terminal and stops depending on the position where the inspection head is located. Displacement is possible with the support as a fulcrum. The tip portion of each inspection probe is inserted through the opening of the through hole formed in parallel on the upper surface, side surface or lower surface of the connector so as to come into contact with the terminal.
【００１１】[0011]
【作用】上記構成としているため、検査プローブをコネ
クタの貫通穴から内部に差し込んで、コネクタに収容し
た端子に弾性接触させて、端子の導通チェックを行うこ
とが出来る。With the above construction, the inspection probe can be inserted into the connector through the through hole and elastically contacted with the terminal accommodated in the connector to check the continuity of the terminal.
【００１２】上記導通検査装置では、従来のように検査
プローブを端子の電気接触部に差し込まないので、端子
の電気接触部が変形することが無いと共に、金メッキが
剥がれないので、電気特性が低下することも無い。In the above-mentioned continuity inspection device, since the inspection probe is not inserted into the electric contact portion of the terminal as in the conventional case, the electric contact portion of the terminal is not deformed and the gold plating is not peeled off, so that the electric characteristics are deteriorated. There is no such thing.
【００１３】[0013]
【実施例】以下、本発明を図示の実施例により詳細に説
明する。図２に示すように、端子４は、電気接触部４a
と、電線５の端部を圧着する電線圧着部４b(芯線バレル
部４b−１および被覆バレル部４b−２)とで構成されて
いる。該端子４は、図１にも示すように、コネクタ１１
に並列に設けられた端子収容室(以下、 収容室と略す)に
所定の個数(図１の例では４個)が収容されて、各収容室
のランス(具体的に図示せず。)で係止されている。The present invention will be described in detail below with reference to the embodiments shown in the drawings. As shown in FIG. 2, the terminal 4 has an electrical contact portion 4a.
And an electric wire crimping portion 4b (core wire barrel portion 4b-1 and coating barrel portion 4b-2) for crimping the end portion of the electric wire 5. The terminal 4 has a connector 11 as shown in FIG.
A predetermined number (four in the example of FIG. 1) are accommodated in the terminal accommodating chambers (hereinafter abbreviated as accommodating chambers) provided in parallel with each other, and the lances (not specifically shown) of the respective accommodating chambers. It is locked.
【００１４】上記コネクタ１１の上壁１１aには、上記
各収容室に収容された端子４の側部、例えば電線圧着部
４bの芯線バレル部４b−１に対向する位置に一端が開口
すると共に、 他端が上面に開口する貫通穴１１b,…,１
１bを穿設している。One end of the upper wall 11a of the connector 11 is opened at a position facing the side portion of the terminal 4 housed in each housing chamber, for example, the core wire barrel portion 4b-1 of the wire crimping portion 4b. Through-holes 11b, ..., 1 whose other end opens on the upper surface
1b is drilled.
【００１５】一方、導通検査器１２の検査ヘッド１２a
には、上記コネクタ１１の各貫通穴１１bに対応して、
逆Ｌ字状に折曲させた検査プローブ１２b,…,１２bを櫛
歯状に取付けている。該各プローブ１２bの基部は検査
ヘッド１２aに固定されて、導通検査器１２に電線１３
で接続されている。また、各プローブ１２bの先端部(自
由端)１２cは、上記コネクタ１１の各貫通穴１１bの外
面開口から内部に差し込んだ時、図３(Ａ)に示すよう
に、各端子４の電線圧着部４bに上方から接触する長さ
に設定されている。なお、図３(Ｂ)に示すように、電線
５は２本束ねのものであってもよい。On the other hand, the inspection head 12a of the continuity inspection device 12
Corresponding to each through hole 11b of the connector 11,
The inspection probes 12b, ..., 12b bent in an inverted L shape are attached in a comb shape. The base portion of each probe 12b is fixed to the inspection head 12a, and the continuity inspection device 12 is connected to the electric wire 13
Connected by. Further, the tip portion (free end) 12c of each probe 12b is inserted into the inside of the through hole 11b of the connector 11 through the outer surface opening thereof, as shown in FIG. The length is set so as to contact 4b from above. As shown in FIG. 3B, the electric wire 5 may be a bundle of two wires.
【００１６】上記各検査プローブ１２bは、ばね性を有
する細幅の金属板を折り曲げて形成し、先端部１２cが
端子４の電線圧着部４bと接触する位置に応じて上下変
位して、電線圧着部４bに弾性接触して、電気的接触を
安定させるようにしている。Each of the inspection probes 12b is formed by bending a thin metal plate having a spring property, and is vertically displaced according to the position where the tip portion 12c contacts the wire crimping portion 4b of the terminal 4 to crimp the wire. The portion 4b is elastically contacted to stabilize the electrical contact.
【００１７】上記構成としているため、図２に示すよう
に、検査ヘッド１２aをコネクタ１１の上方のa位置から
b位置に前進移動させた後、c位置に下降移動させる。こ
の検査ヘッド１２aの下降移動に伴って、各検査プロー
ブ１２bがコネクタ１１の各貫通穴１１bから内部に差し
込まれ、コネクタ１１に収容した各端子４の電線圧着部
４bに上方からそれぞれ弾性接触するので、導通検査器
１２により、端子４が電線５と導通しているか否かを検
査することができる。Due to the above structure, as shown in FIG. 2, the inspection head 12a is moved from the position a above the connector 11 from the position a.
After moving forward to position b, move it down to position c. With the downward movement of the inspection head 12a, the inspection probes 12b are inserted into the through holes 11b of the connector 11 and elastically contact the wire crimping portions 4b of the terminals 4 accommodated in the connector 11 from above. With the continuity tester 12, it is possible to test whether or not the terminal 4 is in continuity with the electric wire 5.
【００１８】上記導通検査は、電線と接続した端子４を
コネクタ１に収容した後に、端子の配列チェックおよび
回路のジョイント・チェックのために行なわれる。該検
査では、検査プローブ１２bを、コネクタ１１の貫通穴
１１bから端子４の電線圧着部４bに弾性接触させるだけ
であり、従来のように、端子４の電気接触部４aに差し
込まないので、電気接触部４aが変形しない。また、電
気接触部４aに金メッキを施していても、金メッキが剥
がれないので、電気的特性が低下しない。The above continuity test is carried out for checking the arrangement of the terminals and the joint check of the circuit after the terminal 4 connected to the electric wire is housed in the connector 1. In the inspection, the inspection probe 12b is only elastically contacted with the wire crimping portion 4b of the terminal 4 from the through hole 11b of the connector 11, and is not inserted into the electric contact portion 4a of the terminal 4 as in the conventional case. The part 4a does not deform. Further, even if the electric contact portion 4a is gold-plated, the gold plating is not peeled off, so that the electrical characteristics are not deteriorated.
【００１９】さらに、検査プローブ１２bを、コネクタ
１１の貫通穴１１bから差し込んで端子４の電線圧着部
４bに弾性接触させさえすれば導通検査が行えるので、
検査プローブ１２bの部品精度や取付け(センタリング)
精度が低くてもよく、製造が容易になる。Further, since the inspection probe 12b can be inserted into the through hole 11b of the connector 11 and elastically contacted with the wire crimping portion 4b of the terminal 4, the continuity inspection can be performed.
Inspection probe 12b parts precision and mounting (centering)
The accuracy may be low and the manufacturing becomes easy.
【００２０】尚、検査プローブ１２bの先端部１２cで接
触させる端子４の位置は、電気接触部以外の部分であれ
ば、基板部、電線圧着部の被覆バレル部でもよく、ま
た、圧接端子であれば、リーフ部に接触させることが好
ましい。The position of the terminal 4 to be brought into contact with the tip portion 12c of the inspection probe 12b may be a portion other than the electrical contact portion, such as a substrate portion, a covered barrel portion of the wire crimping portion, or a pressure contact terminal. For example, it is preferable to contact the leaf portion.
【００２１】また、上記導通検査器１２を用いると、例
えば、上記端子を収容したコネクタを車両等に搭載した
後に、保守点検する場合にも用いることができ、コネク
タの貫通穴１１bに検査プローブ１２bを差し込むだけで
良い。Further, the use of the continuity tester 12 can be used, for example, in the case where the connector accommodating the terminals is mounted on a vehicle and then subjected to maintenance and inspection, and the inspection probe 12b is provided in the through hole 11b of the connector. Just plug in.
【００２２】[0022]
【発明の効果】以上の説明より明らかなように、本発明
のコネクタ収容端子の導通検査装置は、端子挿入方向と
直交する方向に開口するコネクタの貫通穴から検査プロ
ーブを端子収容室内に差し込んで、コネクタに収容した
端子の電気接触部以外の部分に弾性接触させることによ
り、端子の配列チェックおよび回路のジョイント・チェ
ックを行うことが出来る。したがって、従来のように検
査プローブを端子の電気接触部に差し込まないので、端
子が変形することが無いと共に、金メッキが剥がれ無い
ため、電気特性が低下することも無い。As is apparent from the above description, the continuity inspection device for a connector accommodating terminal of the present invention inserts the inspection probe into the terminal accommodating chamber through the through hole of the connector opened in the direction orthogonal to the terminal inserting direction. By making elastic contact with a portion other than the electrical contact portion of the terminal housed in the connector, the terminal arrangement check and the circuit joint check can be performed. Therefore, unlike the conventional case, the inspection probe is not inserted into the electrical contact portion of the terminal, the terminal is not deformed, and the gold plating is not peeled off, so that the electrical characteristics are not deteriorated.
【図１】 本発明の導通検査器の斜視図である。FIG. 1 is a perspective view of a continuity tester of the present invention.
【図２】 導通検査要領の側面図である。FIG. 2 is a side view of a continuity inspection procedure.
【図３】 (Ａ)(Ｂ)は検査プローブの接触状態の断面図
である。3A and 3B are cross-sectional views of a contact state of an inspection probe.
【図４】 従来の導通検査器の斜視図である。FIG. 4 is a perspective view of a conventional continuity tester.
【図５】 導通検査要領の側面図である。FIG. 5 is a side view of a continuity inspection procedure.
【図６】 導通検査事項を示し、(Ａ)は端子の正規配列
状態、(Ｂ)は誤った配列状態を示す概略図である。6A and 6B are schematic diagrams showing continuity inspection items, where FIG. 6A is a normal arrangement state of terminals and FIG. 6B is an incorrect arrangement state.
【図７】 導通検査事項を示し、(Ａ)は回路の正規ジョ
イント状態、(Ｂ)は誤った回路のジョイント状態を示す
ものである。FIG. 7 shows continuity inspection items, where (A) shows a normal joint state of a circuit and (B) shows a joint state of an erroneous circuit.
４ 端子 ４a 電気接触部 ４b 電線圧着部 １１ コネクタ １１b 貫通穴 １２ 導通検査器 １２a 検査ヘッド １２b 検査プローブ 4 terminals 4a electrical contact part 4b electric wire crimping part 11 connector 11b through hole 12 continuity tester 12a inspection head 12b inspection probe
Claims (3)
容室に開口する貫通穴をコネクタに穿設する一方、 上記貫通穴の外面開口から端子収容室内に差し込んで、
端子収容室内に収容している端子に、弾性接触させる検
査プローブを備えていることを特徴とするコネクタ収容
端子の導通検査装置。1. A through hole that opens into the terminal accommodating chamber in a direction orthogonal to the terminal insertion direction is formed in the connector, and the connector is inserted into the terminal accommodating chamber through an outer surface opening of the through hole.
A connector accommodating terminal continuity inspecting device, comprising: an inspection probe for elastically contacting a terminal accommodated in a terminal accommodating chamber.
の電気接触部以外の部分に弾性接触するように、上記コ
ネクタに穿設する貫通穴の位置を設定している請求項１
記載の導通検査装置。2. The position of the through hole formed in the connector is set so that the tip portion of the inspection probe elastically contacts the portion other than the electrical contact portion of the terminal.
The continuity inspection device described.
面、下面あるいは側面に開口し、該貫通穴から挿入され
る検査プローブの先端部が圧着端子のバレル部あるいは
圧接端子のリーフ部に接触する構成としている前記請求
項のいずれか１項に記載の導通検査装置。3. The through hole opens on the upper surface, the lower surface or the side surface of the terminal accommodating chamber of the connector, and the tip portion of the inspection probe inserted from the through hole contacts the barrel portion of the crimp terminal or the leaf portion of the pressure contact terminal. The continuity inspection device according to claim 1, wherein the continuity inspection device has a configuration.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5049180A JPH06258373A (en) | 1993-03-10 | 1993-03-10 | Conduction inspection device for connector housing terminal |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5049180A JPH06258373A (en) | 1993-03-10 | 1993-03-10 | Conduction inspection device for connector housing terminal |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH06258373A true JPH06258373A (en) | 1994-09-16 |
Family
ID=12823856
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5049180A Withdrawn JPH06258373A (en) | 1993-03-10 | 1993-03-10 | Conduction inspection device for connector housing terminal |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH06258373A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100303536B1 (en) * | 1994-10-25 | 2001-12-01 | 김순택 | Highly integrated micro-connector and manufacturing method thereof |
| US6480005B2 (en) | 2000-02-10 | 2002-11-12 | Sumitomo Wiring Systems, Ltd. | Electrical connection testing device and an electrical connection testing method for terminal fittings accommodated in a connector |
| JP2015082465A (en) * | 2013-10-24 | 2015-04-27 | 住友電装株式会社 | Connector |
| JP2020176837A (en) * | 2019-04-15 | 2020-10-29 | 矢崎総業株式会社 | Connector continuity inspection tool |
-
1993
- 1993-03-10 JP JP5049180A patent/JPH06258373A/en not_active Withdrawn
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100303536B1 (en) * | 1994-10-25 | 2001-12-01 | 김순택 | Highly integrated micro-connector and manufacturing method thereof |
| US6480005B2 (en) | 2000-02-10 | 2002-11-12 | Sumitomo Wiring Systems, Ltd. | Electrical connection testing device and an electrical connection testing method for terminal fittings accommodated in a connector |
| JP2015082465A (en) * | 2013-10-24 | 2015-04-27 | 住友電装株式会社 | Connector |
| WO2015060101A1 (en) * | 2013-10-24 | 2015-04-30 | 住友電装株式会社 | Connector |
| JP2020176837A (en) * | 2019-04-15 | 2020-10-29 | 矢崎総業株式会社 | Connector continuity inspection tool |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A300 | Withdrawal of application because of no request for examination |
Free format text: JAPANESE INTERMEDIATE CODE: A300 Effective date: 20000530 |