JPH07108449A - Device for removing foreign matter on filter base - Google Patents

Device for removing foreign matter on filter base

Info

Publication number
JPH07108449A
JPH07108449A JP27492393A JP27492393A JPH07108449A JP H07108449 A JPH07108449 A JP H07108449A JP 27492393 A JP27492393 A JP 27492393A JP 27492393 A JP27492393 A JP 27492393A JP H07108449 A JPH07108449 A JP H07108449A
Authority
JP
Japan
Prior art keywords
foreign matter
tape
filter substrate
polishing tape
matter removing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP27492393A
Other languages
Japanese (ja)
Inventor
Nobukazu Hosogai
信和 細貝
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sanshin Co Ltd
Original Assignee
Sanshin Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sanshin Co Ltd filed Critical Sanshin Co Ltd
Priority to JP27492393A priority Critical patent/JPH07108449A/en
Publication of JPH07108449A publication Critical patent/JPH07108449A/en
Pending legal-status Critical Current

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  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)

Abstract

PURPOSE:To prevent loss of substrate smoothness by floating and pressurizing the abrasive tape of a foreign matter removing part by means of an air blasting part and by partially polishing a filter base by means of the continuously transferred abrasive tape to remove a foreign matter on the filter base. CONSTITUTION:In removing a foreign matter M on the surface of the filter layer of a filter base W, the filter base W is mounted on a mounting base 11 for adsorption and fixture. The mounting base 11 is moved in the right and left, and the back and forth directions through a moving mechanism by means of a position controlling part, using a foreign matter position detecting signal from foreign matter detecting means. The foreign matter removing part 30 of a tape transfer mechanism is faced the foreign matter M. Next, a vertically moving base 14 is lowered, using the actuation of a motor for vertical movement while continuously transferring an abrasive tape T in the right and left directions on the mounting base 11 by means of the tape transfer mechanism. Air flow blasted from the nozzle 38 of an air blasting part forms a floated and pressurized state. The foreign matter removing part 30 consisting of the abrasive tape T is pressed against the foreign matter on the filter base W to locally polish and remove the foreign matter.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は例えばカラー液晶パネル
の構成要素としてのカラーフィルタ基板の異物除去に用
いられるフィルタ基板異物除去装置に関するものであ
る。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a filter substrate foreign substance removing apparatus used for removing foreign substances from a color filter substrate as a component of a color liquid crystal panel, for example.

【0002】[0002]

【従来の技術】一般に、例えばカラーフィルタ基板W
は、図10に示すように、厚さ1mm程度の四角板状の
青板ガラス等からなるガラス基板G上に水溶性高分子材
料及び染料からなるR・G・Bの各フィルタ層Fがそれ
ぞれの画素に対応して並び、必要に応じて各フィルタ層
F間に例えば金属薄膜をエッチングしたクロムブラック
からなる遮光層Sとしてのブラックマトリックスが設け
られ、その上にはアクリル、エポキシ樹脂等からなる保
護膜Pとしてのオーバーコート層が設けられ、さらに透
明導電膜DとしてのITO(Indiumu Tin
Oxide)膜が重ねられて形成されている。
2. Description of the Related Art Generally, for example, a color filter substrate W
As shown in FIG. 10, each of the R, G, and B filter layers F made of a water-soluble polymer material and a dye is provided on a glass substrate G made of blue plate glass having a square plate shape with a thickness of about 1 mm. A black matrix as a light-shielding layer S made of chrome black obtained by etching a metal thin film, for example, is provided between the filter layers F arranged corresponding to the pixels, and a protection made of acryl, epoxy resin, or the like is provided thereon. An overcoat layer is provided as the film P, and ITO (Indium Tin) as the transparent conductive film D is further provided.
Oxide) films are formed in a stacked manner.

【0003】ところでこれらカラーフィルタ基板Wに
は、分光特性、耐熱性、耐薬品性等の要求特性と並び異
物、異常突起がなく平滑であることが強く要求されてお
り、即ち、上記保護膜Pの表面、透明導電膜Dの表面や
フィルタ層Fの表面にごみや手垢、髪の毛又は溶剤や金
属の付着、その他の異常突起を含む異物は各特性を著し
く損なう要因となるため、可能な限り除去しなければな
らないとされている。
By the way, these color filter substrates W are strongly required to be smooth without foreign matter and abnormal protrusions, along with required characteristics such as spectral characteristics, heat resistance and chemical resistance. Foreign substances including dust, hand dust, hair or solvent or metal adhesion, and other abnormal protrusions on the surface of the transparent conductive film D, the surface of the transparent conductive film D, and the surface of the filter layer F significantly impair the characteristics, and thus are removed as much as possible. It has to be done.

【0004】従来、この種のカラーフィルタ基板におい
ては、セラミックスや半導体で行われている回転モード
で全面研磨し、フィルタ層Fの汚れ、異物除去、フィル
タ層の存在による保護膜P上の凹凸の平坦化、ITO膜
上の汚れ、異物除去をなす構造のものが知られている。
Conventionally, in this type of color filter substrate, the entire surface is polished in a rotation mode which is performed for ceramics or semiconductors to remove dirt and foreign matter on the filter layer F, and unevenness on the protective film P due to the presence of the filter layer. It is known to have a structure for flattening, removing stains on the ITO film, and removing foreign substances.

【0005】[0005]

【発明が解決しようとする課題】しかしながら上記回転
モードによる構造の場合、フィルタ層Fの材料は硬度が
低いためフィルタ層Fの端部にチッピングが生じ易いこ
とや遮光層Sとフィルタ層Fの硬度差により遮光層S位
置が掘り込まれる現象が生じ易いことからフィルタ層F
の表面の平滑化が損なわれ、ひいては保護膜Pの表面の
平滑化並びに透明導電膜D上の平滑化に影響を及ぼすこ
とがあり、最適な研磨条件を見いだすことが非常に困難
であり、このため異物の除去が困難であるという不都合
を有している。
However, in the case of the structure based on the above rotation mode, since the material of the filter layer F has low hardness, chipping easily occurs at the end of the filter layer F and the hardness of the light shielding layer S and the filter layer F. Since the phenomenon in which the position of the light-shielding layer S is dug out easily occurs due to the difference, the filter layer F
Of the protective film P and the smoothing of the transparent conductive film D may be affected, and it is very difficult to find optimum polishing conditions. Therefore, it has a disadvantage that it is difficult to remove foreign matter.

【0006】[0006]

【課題を解決するための手段】本発明はこのような課題
を解決することを目的とするもので、第一の発明のフィ
ルタ基板異物除去装置は、液晶パネル等に用いられるフ
ィルタ基板を載置可能な載置台と、該載置台の上方にて
研磨テープを連続移送させると共に該研磨テープを折返
案内して形成された異物除去部をもつテープ移送機構
と、該異物除去部の研磨テープを浮圧動可能な空気噴射
部と、該載置台を前後及び左右方向に移動させる移動機
構と、該載置台をフィルタ基板上に存在する異物に該異
物除去部が対向する位置に移動制御する位置制御部とを
具備したことを特徴とするものである。
An object of the present invention is to solve such a problem, and a filter substrate foreign matter removing apparatus of the first invention mounts a filter substrate used for a liquid crystal panel or the like. A possible mounting table, a tape transfer mechanism having a foreign matter removing section formed by continuously transporting the polishing tape above the mounting table and guiding the polishing tape back, and a polishing tape in the foreign matter removing section. A pressure-controllable air jetting unit, a moving mechanism for moving the mounting table in the front-back and left-right directions, and a position control for controlling the movement of the mounting table to a position where the foreign matter removing unit faces foreign matter existing on the filter substrate. And a section.

【0007】また第二の発明のフィルタ基板異物除去装
置は、液晶パネル等に用いられるフィルタ基板を載置可
能な載置台と、該載置台の上方にて研磨テープを連続移
送させると共に該研磨テープを折返案内して形成された
異物除去部をもつテープ移送機構と、該異物除去部の研
磨テープを浮圧動可能な空気噴射部と、該テープ移送機
構を前後及び左右方向に移動させる移動機構と、該テー
プ移送機構をフィルタ基板上に存在する異物に該異物除
去部が対向する位置に移動制御する位置制御部とを具備
したことを特徴とするフィルタ基板異物除去装置もので
ある。
The filter substrate foreign matter removing device according to the second aspect of the present invention comprises a mounting table on which a filter substrate used for a liquid crystal panel or the like can be mounted, and the polishing tape is continuously transferred above the mounting table and the polishing tape. Tape transfer mechanism having a foreign matter removing portion formed by folding back and guiding the air, an air jetting portion capable of floating pressure the polishing tape of the foreign matter removing portion, and a moving mechanism for moving the tape transporting mechanism back and forth and left and right. And a position control unit that controls the movement of the tape transfer mechanism to a position where the foreign matter removing unit faces the foreign matter present on the filter substrate.

【0008】[0008]

【作用】液晶パネルに用いられるフィルタ基板を載置台
上に載置し、フィルタ基板上に存在する異物の位置に応
じて位置制御部により載置台又はテープ移送機構は左右
及び前後に移動して位置制御され、異物除去部は異物に
対向し、異物除去部の研磨テープは空気噴射部により浮
圧され、テープ移送機構により連続移送される研磨テー
プによってフィルター基板は部分的に研磨されてフィル
タ基板上の異物は浮圧動状態の研磨テープによって除去
されることになる。
The filter substrate used for the liquid crystal panel is mounted on the mounting table, and the mounting table or the tape transfer mechanism is moved left and right and front and back by the position control section according to the position of the foreign matter existing on the filter substrate. Controlled, the foreign matter removing unit faces the foreign matter, the polishing tape of the foreign matter removing unit is floated by the air jetting unit, and the filter substrate is partially polished by the polishing tape continuously transferred by the tape transfer mechanism to be on the filter substrate. The foreign matter is removed by the polishing tape in a floating pressure state.

【0009】[0009]

【実施例】図1乃至図9は本発明の実施例を示し、1は
機台、2は移動機構であって、この場合機台1上に摺動
部3により前後方向に移動自在に前後スライド台4を配
設し、この前後スライド台4を前後移動用モータ5及び
ボールネジ機構6により移動可能に設け、この前後スラ
イド台4上に摺動部7により左右方向に移動自在に左右
スライド台8を配設し、この左右スライド台8を左右移
動用モータ9及びボールネジ機構10により移動可能に
設け、この左右スライド台8上に図外の吸着固定機構等
によりフィルタ基板Wを位置決め状態で固定載置可能な
載置台11を配設して構成している。
1 to 9 show an embodiment of the present invention, in which 1 is a machine base, 2 is a moving mechanism, and in this case, a sliding portion 3 is mounted on the machine base 1 so as to be movable back and forth in the front-rear direction. A slide base 4 is provided, and the front and rear slide base 4 is movably provided by a front and rear movement motor 5 and a ball screw mechanism 6, and a left and right slide base is freely movable on the front and rear slide base 4 by a sliding portion 7. 8 is provided, and the left and right slide bases 8 are movably provided by a left and right moving motor 9 and a ball screw mechanism 10. The filter substrate W is fixed on the left and right slide bases 8 by a suction fixing mechanism (not shown) in a positioned state. A mounting table 11 that can be mounted is arranged.

【0010】12はテープ移送機構であって、この場合
機台1の後部に機体13を立設し、機体13の前部に上
下移動台14を摺動部15により上下動作可能に設け、
この上下移動台14を上下させる上下動用モータ16及
びボールネジ機構17を設け、上下移動台14の左右側
部にポリエステルフィルム、メタル、クロス等の基材に
酸化アルミニュウム、酸化クロム、シリコンカーバイ
ド、ダイヤモンド等の所定粒度の研磨粒子をコーティン
グ又は結合してなる幅約5ないし10mm程度の研磨テ
ープTの実巻リール18及び巻取リール19を軸着し、
この実巻リール18を繰出回転させる繰出用モータ20
を設け、かつ巻取ローラ21を巻取回転させる巻取用モ
ータ22を設け、巻取用モータ22によりベルト23を
介して巻取リール19を巻取回転させ、上下移動台14
にテンション機構24を配設し、テンション機構24の
進退動作可能なプランジャ25にテンションローラ26
を取付け、実巻リール18から引き出した研磨テープT
をローラー27、テンションローラー26、ローラ2
8、ローラ29を介して異物除去部30により折り返し
案内し、ローラ31、ローラ32を介して巻取ローラ2
1と挟着ローラ33との間を経て巻取リール19に巻回
し、実巻リール18及び巻取リール19を回転させなが
ら巻取ローラ21により研磨テープTを一方向に連続移
送させるように構成している。
Reference numeral 12 denotes a tape transfer mechanism. In this case, a machine body 13 is erected on the rear portion of the machine body 1, and a vertical moving table 14 is provided on the front portion of the machine body 13 so as to be vertically movable by a sliding portion 15.
A vertical movement motor 16 and a ball screw mechanism 17 for moving the vertical moving table 14 up and down are provided, and aluminum oxide, chrome oxide, silicon carbide, diamond, etc. are formed on the left and right side portions of the vertical moving table 14 as a base material such as polyester film, metal and cloth. The actual winding reel 18 and the take-up reel 19 of the polishing tape T having a width of about 5 to 10 mm formed by coating or binding the polishing particles of
A feeding motor 20 for feeding and rotating the actual winding reel 18.
And a winding motor 22 for winding and rotating the winding roller 21. The winding motor 22 winds and rotates the winding reel 19 via the belt 23 to move the vertical moving table 14
The tension mechanism 24 is disposed on the plunger 25, and the tension roller 26 is attached to the plunger 25 capable of moving the tension mechanism 24 forward and backward.
Attached, and the polishing tape T pulled out from the actual reel 18
The roller 27, tension roller 26, roller 2
8. The foreign matter removing section 30 guides the sheet back through the roller 29, and the take-up roller 2 through the roller 31 and the roller 32.
The winding tape 19 is wound around the take-up reel 19 through the space between the winding roller 1 and the sandwiching roller 33, and the polishing tape 21 is continuously transferred in one direction by the take-up roller 21 while rotating the actual winding reel 18 and the take-up reel 19. is doing.

【0011】この場合異物除去部30は、上記上下移動
台14の中央部下部に取付部材34を取付け、取付部材
34に案内ガイド35を取付けと共に案内ガイド35の
両側面に横振防止ガイド36を設け、研磨テープTを案
内ガイド35により略横U状に折り返して研磨テープT
からなる異物除去部30を形成している。
In this case, the foreign matter removing unit 30 mounts a mounting member 34 on the lower central portion of the vertical moving table 14, mounts a guide guide 35 on the mounting member 34, and a lateral vibration prevention guide 36 on both side surfaces of the guide guide 35. Provided, the polishing tape T is folded back into a substantially horizontal U shape by the guide guide 35, and
The foreign matter removing portion 30 is formed.

【0012】37は空気噴射部であって、上記案内ガイ
ド35にノズル穴38を有するノズル体39を取付け、
取付部材34に接続継手40を取付け、接続継手40に
圧力調節弁及び流路切替弁を介して図外の空圧源に接続
し、ノズル穴38より圧縮空気Pを噴射し、研磨テープ
Tを浮圧動状態にするように構成したものである。
Reference numeral 37 is an air injection portion, and a nozzle body 39 having a nozzle hole 38 is attached to the guide guide 35.
The connection joint 40 is attached to the attachment member 34, the connection joint 40 is connected to an air pressure source (not shown) through a pressure control valve and a flow path switching valve, compressed air P is jetted from the nozzle hole 38, and the polishing tape T is attached. It is configured to be in a floating pressure state.

【0013】41は位置制御部であって、マイクロコン
ピュータ等により構成され、上記移動機構2の前後移動
用モータ5及び左右移動用モータ9に接続されるととも
に異物検出手段42に接続され、例えばCCDカメラ等
によりフィルター基板W上の異物Mを検出し、その位置
を原点Oに対するX・Yの座標として位置検出し、この
座標に対応して位置制御部41に位置検出信号を入力
し、位置検出信号に応じてモータ5及びモータ9の回転
量を制御し、載置台11をフィルタ基板W上に存在する
異物Mに異物除去部30が対向する位置に移動制御する
ように構成されている。
Reference numeral 41 denotes a position control section, which is composed of a microcomputer or the like, is connected to the forward / backward moving motor 5 and the left / right moving motor 9 of the moving mechanism 2 and is also connected to the foreign matter detecting means 42, for example, a CCD. The foreign matter M on the filter substrate W is detected by a camera or the like, the position is detected as the X and Y coordinates with respect to the origin O, and a position detection signal is input to the position control unit 41 corresponding to these coordinates to detect the position. The rotation amounts of the motor 5 and the motor 9 are controlled according to the signal, and the mounting table 11 is controlled to move to a position where the foreign matter removing unit 30 faces the foreign matter M existing on the filter substrate W.

【0014】この実施例は上記構成であるから、フィル
タ層Fの表面、保護膜Pの表面又は透明導電膜D上の異
物M(異常突起を含む)を除去するに際し、このフィル
タ基板Wを載置台11上に載置し、図外の吸着固定機構
等により固定し、載置台11を異物検出手段42からの
異物位置検出信号よって位置制御部41により移動機構
2を左右及び前後にX・Yの移動制御し、これにより載
置台11を移動させてテープ移送機構12の異物除去部
30を異物Mに対向させ、この状態でテープ移送機構1
2により研磨テープTを載置台11の左右方向に連続移
送させ、上下動用モータ16の作動により上下移動台1
4を下降させることになる。
Since this embodiment has the above-mentioned structure, when removing the foreign matter M (including abnormal protrusions) on the surface of the filter layer F, the surface of the protective film P or the transparent conductive film D, the filter substrate W is mounted. It is placed on the table 11 and fixed by a suction fixing mechanism or the like (not shown), and the table 11 is moved to the left and right and back and forth by the position controller 41 in response to a foreign object position detection signal from the foreign object detection means 42. The movement of the mounting table 11 is controlled so that the foreign matter removing unit 30 of the tape transport mechanism 12 faces the foreign matter M. In this state, the tape transport mechanism 1 is moved.
2, the polishing tape T is continuously transferred in the left-right direction of the mounting table 11, and the vertical movement motor 16 is operated to operate the vertical movement table 1.
4 will be lowered.

【0015】この際、空気噴射部37のノズル穴38か
ら所定圧力の空気が噴射され、研磨テープTは浮圧動状
態となっており、上下移動台14の下降により研磨テー
プTからなる異物除去部30はフィルタ基板W上の異物
Wに圧縮空気Pの背圧を伴って圧接され、局部的に異物
Wを研磨除去することができ、その異物Mが除去された
ら、続いて他の異物Mに異物除去部が対向するように位
置制御部41は移動機構2を移動制御し、順次異物の除
去が行われることになる。
At this time, air of a predetermined pressure is jetted from the nozzle hole 38 of the air jetting part 37, the polishing tape T is in a floating pressure state, and the foreign matter composed of the polishing tape T is removed by lowering the vertical moving table 14. The portion 30 is pressed against the foreign matter W on the filter substrate W with the back pressure of the compressed air P to locally polish and remove the foreign matter W. After the foreign matter M is removed, other foreign matter M is subsequently removed. The position control unit 41 controls the movement of the moving mechanism 2 so that the foreign matter removing units face each other, and the foreign substances are sequentially removed.

【0016】従って、フィルター基板Wの全面を研磨す
るのではなく、異物Mが存在する特定の部分のみ研磨テ
ープTにより除去でき、異物Mが存在していないその他
の部分に極力影響を与えずに、その異物Mが存在する部
分のみの研磨により異物Mを除去することができ、この
ため研磨テープTによる良好な除去作用を得ることがで
き、しかも研磨テープTの種類選択によって良好な除去
を行うことができ、かつ空気噴射部37のノズル穴38
から所定圧力の空気が噴射されて研磨テープTは浮圧動
状態となっているため、研磨テープTからなる異物除去
部30はフィルタ基板W上の異物Wに圧縮空気Pの背圧
を伴って圧接し、このため研磨テープTは柔らかな状態
で異物Mに圧接することになり、高さ5μm〜20μ
m、概略直径20μm〜80μm程度の微小突起状から
なる異物Mであっても良好に局部的に研磨除去すること
ができ、それだけ良好な異物除去が可能となるとともに
除去作業能率を向上することができる。
Therefore, instead of polishing the entire surface of the filter substrate W, only a specific portion where the foreign matter M is present can be removed by the polishing tape T, and the other portion where the foreign matter M is not present is not affected as much as possible. The foreign matter M can be removed by polishing only the portion in which the foreign matter M is present. Therefore, a good removing action by the polishing tape T can be obtained, and the removal can be performed well by selecting the type of the polishing tape T. And the nozzle hole 38 of the air injection part 37
Since the polishing tape T is in a floating state by injecting air of a predetermined pressure from the foreign matter removing section 30 made of the polishing tape T, the foreign matter W on the filter substrate W is accompanied by a back pressure of the compressed air P. Since the polishing tape T is pressed against the foreign matter M in a soft state, the height is 5 μm to 20 μm.
m, even the foreign matter M having a fine projection shape with a diameter of about 20 μm to 80 μm can be locally polished and removed satisfactorily, and thus the foreign matter can be removed as well and the removal work efficiency can be improved. it can.

【0017】尚、本発明は他のフィルタ基板、例えば白
黒のフィルタ基盤の研磨加工にも適用でき、また移動機
構、テープ移送機構、テープ揺振機構等の構造は上記実
施例に限られるものではなく、適宜変更して設計される
ものである。また上記実施例では、透明導電膜D上の異
物を除去するが、透明導電膜Dを形成する前の段階では
保護膜Pの表面の異物を、フィルタ層Fを形成する前の
段階においては、遮光層Sとしてのブラックマトリック
ス表面の異物を除去することもできる。
The present invention can also be applied to polishing of other filter substrates, for example, a black and white filter substrate, and the structure of the moving mechanism, the tape transfer mechanism, the tape oscillating mechanism, etc. is not limited to the above-mentioned embodiment. Instead, it is designed by appropriately changing it. Further, in the above-mentioned embodiment, the foreign matter on the transparent conductive film D is removed, but the foreign matter on the surface of the protective film P is formed before the transparent conductive film D is formed, and the foreign matter on the surface of the protective film P is formed before the transparent conductive film D is formed. It is also possible to remove foreign matter on the surface of the black matrix as the light shielding layer S.

【0018】また上記実施例では、載置台11を左右及
び前後に移動させ、フィルタ基板W上に存在する異物M
と異物除去部30とを対向させる構造を採用している
が、これとは逆に、テープ移送機構12を前後及び左右
方向に移動させる移動機構に構成し、テープ移送機構1
2をこの移動機構により左右及び前後に移動させ、これ
により異物Mと異物除去部30とを対向させる構造を採
用しても同様である。
Further, in the above embodiment, the mounting table 11 is moved to the left and right and back and forth, and the foreign matter M existing on the filter substrate W is moved.
The foreign matter removing unit 30 and the foreign matter removing unit 30 are opposed to each other. On the contrary, the tape transporting mechanism 12 is configured as a moving mechanism that moves the tape transporting mechanism 12 back and forth and left and right.
The same applies to a structure in which the foreign matter M and the foreign matter removing unit 30 are opposed to each other by moving 2 to the left and right and back and forth by this moving mechanism.

【0019】また、上記実施例にテープ揺振機構を組み
込み、研磨テープTを研磨テープTの移送方向に揺振運
動させ、異物Mを研磨テープTの研磨作用及び研磨テー
プTの揺振運動によって除去する構造とすることもでき
る。
In addition, a tape oscillating mechanism is incorporated in the above embodiment, the polishing tape T is oscillated in the transport direction of the polishing tape T, and the foreign matter M is moved by the polishing action of the polishing tape T and the oscillation motion of the polishing tape T. It is also possible to have a structure for removing.

【0020】また、空気噴射部37のノズル穴38の形
状は、例えば丸穴に限らず、スリット状の四角形穴等適
宜変更して設計され、また空気圧力も適宜選定されるも
のである。
Further, the shape of the nozzle hole 38 of the air injection portion 37 is not limited to, for example, a round hole, but may be designed by appropriately changing a slit-like square hole, and the air pressure may be appropriately selected.

【0021】[0021]

【発明の効果】本発明は上述の如く、フィルタ層の表
面、保護膜の表面又は透明導電膜上の異物を除去するに
際し、このフィルタ基板を載置台上に載置し、位置制御
部により移動機構又はテープ移送機構を左右及び前後に
移動制御し、これにより研磨テープからなる異物除去部
を異物に対向させ、この状態でテープ移送機構により研
磨テープを連続移送させ、研磨テープからなる異物除去
部はフィルタ基板上の異物に局部的に圧接され、この局
部圧接により研磨テープの研磨作用により異物除去で
き、フィルター基板の全面を研磨するのではなく、異物
が存在する特定の部分のみ研磨テープにより除去でき、
異物が存在していないその他の部分に極力影響を与えず
に、その異物が存在する部分のみの研磨により異物を除
去することができ、このため研磨テープによる良好な除
去作用を得ることができ、しかも研磨テープの種類選択
によって良好な除去を行うことができ、更に空気噴射部
により研磨テープは浮圧動状態となっているため、研磨
テープからなる異物除去部はフィルタ基板上の異物に柔
らかな状態で圧接することになり、それだけ良好な異物
除去が可能となるとともに除去作業能率を向上すること
ができる。
As described above, the present invention mounts this filter substrate on the mounting table and moves it by the position controller when removing foreign matters on the surface of the filter layer, the surface of the protective film or the transparent conductive film. Mechanism or tape transfer mechanism is controlled to move to the left and right and back and forth, whereby the foreign matter removing unit made of the polishing tape is made to face the foreign matter, and in this state, the tape transporting mechanism continuously transfers the polishing tape, and the foreign matter removing unit made of the polishing tape. Is locally pressed against foreign matter on the filter substrate, and this local pressure contact allows the foreign matter to be removed by the polishing action of the polishing tape. Instead of polishing the entire surface of the filter substrate, only the specific portion where foreign matter is present is removed by the polishing tape. You can
The foreign matter can be removed by polishing only the portion where the foreign matter is present without affecting the other portions where the foreign matter is not present as much as possible, and thus a good removal action by the polishing tape can be obtained, Moreover, good removal can be performed by selecting the type of polishing tape, and since the polishing tape is in a floating state due to the air injection unit, the foreign matter removal unit made of the polishing tape is soft against foreign matter on the filter substrate. Since the pressure contact is made in the state, the foreign matter can be removed more favorably and the removal work efficiency can be improved.

【0022】以上、所期の目的を充分達成することがで
きる。
As described above, the intended purpose can be sufficiently achieved.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の実施例の全体正断面図である。FIG. 1 is an overall front sectional view of an embodiment of the present invention.

【図2】本発明の実施例の全体側断面図である。FIG. 2 is an overall side sectional view of an embodiment of the present invention.

【図3】本発明の実施例の全体平面図である。FIG. 3 is an overall plan view of an embodiment of the present invention.

【図4】本発明の実施例の部分正面図である。FIG. 4 is a partial front view of the embodiment of the present invention.

【図5】本発明の実施例の部分正面図である。FIG. 5 is a partial front view of the embodiment of the present invention.

【図6】本発明の実施例の部分側断面図である。FIG. 6 is a partial side sectional view of an embodiment of the present invention.

【図7】本発明の実施例の部分拡大断面図である。FIG. 7 is a partially enlarged sectional view of the embodiment of the present invention.

【図8】本発明の実施例のブロック図である。FIG. 8 is a block diagram of an embodiment of the present invention.

【図9】本発明の実施例の説明平面図である。FIG. 9 is an explanatory plan view of the embodiment of the present invention.

【図10】カラーフィルタ基板の説明断面図である。FIG. 10 is an explanatory cross-sectional view of a color filter substrate.

【符号の説明】[Explanation of symbols]

W フィルタ基板 T 研磨テープ M 異物 2 移動機構 11 載置台 12 テープ移送機構 30 異物除去部 37 空気噴射部 41 位置制御部 W Filter Substrate T Polishing Tape M Foreign Material 2 Moving Mechanism 11 Mounting Table 12 Tape Transfer Mechanism 30 Foreign Material Removing Section 37 Air Ejecting Section 41 Position Control Section

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 液晶パネル等に用いられるフィルタ基板
を載置可能な載置台と、該載置台の上方にて研磨テープ
を連続移送させると共に該研磨テープを折返案内して形
成された異物除去部をもつテープ移送機構と、該異物除
去部の研磨テープを浮圧動可能な空気噴射部と、該載置
台を前後及び左右方向に移動させる移動機構と、該載置
台をフィルタ基板上に存在する異物に該異物除去部が対
向する位置に移動制御する位置制御部とを具備したこと
を特徴とするフィルタ基板異物除去装置。
1. A mounting table on which a filter substrate used for a liquid crystal panel or the like can be mounted, and a foreign matter removing unit formed by continuously transferring the polishing tape above the mounting table and guiding the polishing tape back. A tape transfer mechanism having an air jet unit, an air jetting unit capable of floating the polishing tape of the foreign matter removing unit, a moving mechanism for moving the mounting table in the front-back and left-right directions, and the mounting table on the filter substrate. A filter substrate foreign matter removing device comprising: a position control unit that controls movement of the foreign matter to a position where the foreign matter removing unit faces the foreign matter.
【請求項2】 液晶パネル等に用いられるフィルタ基板
を載置可能な載置台と、該載置台の上方にて研磨テープ
を連続移送させると共に該研磨テープを折返案内して形
成された異物除去部をもつテープ移送機構と、該異物除
去部の研磨テープを浮圧動可能な空気噴射部と、該テー
プ移送機構を前後及び左右方向に移動させる移動機構
と、該テープ移送機構をフィルタ基板上に存在する異物
に該異物除去部が対向する位置に移動制御する位置制御
部とを具備したことを特徴とするフィルタ基板異物除去
装置。
2. A mounting table on which a filter substrate used for a liquid crystal panel or the like can be mounted, and a foreign matter removing unit formed by continuously transferring the polishing tape above the mounting table and guiding the polishing tape back. A tape transport mechanism, an air jetting unit capable of floating the polishing tape of the foreign matter removing unit, a moving mechanism for moving the tape transport mechanism in the front-back and left-right directions, and the tape transport mechanism on the filter substrate. A filter substrate foreign matter removing device, comprising: a position control unit that controls the movement of existing foreign matter to a position where the foreign matter removing unit faces.
JP27492393A 1993-10-06 1993-10-06 Device for removing foreign matter on filter base Pending JPH07108449A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP27492393A JPH07108449A (en) 1993-10-06 1993-10-06 Device for removing foreign matter on filter base

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP27492393A JPH07108449A (en) 1993-10-06 1993-10-06 Device for removing foreign matter on filter base

Publications (1)

Publication Number Publication Date
JPH07108449A true JPH07108449A (en) 1995-04-25

Family

ID=17548431

Family Applications (1)

Application Number Title Priority Date Filing Date
JP27492393A Pending JPH07108449A (en) 1993-10-06 1993-10-06 Device for removing foreign matter on filter base

Country Status (1)

Country Link
JP (1) JPH07108449A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6415848B1 (en) 1999-04-07 2002-07-09 Ryobi Ltd. Metal mold arrangement for producing cylinder block

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01146659A (en) * 1987-11-30 1989-06-08 Toshiba Corp Grinding device
JPH048468A (en) * 1990-04-27 1992-01-13 Sanshin:Kk Work polisher
JPH05151565A (en) * 1991-11-29 1993-06-18 Fuji Electric Co Ltd Production of magnetic recording medium and substrate polishing device

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01146659A (en) * 1987-11-30 1989-06-08 Toshiba Corp Grinding device
JPH048468A (en) * 1990-04-27 1992-01-13 Sanshin:Kk Work polisher
JPH05151565A (en) * 1991-11-29 1993-06-18 Fuji Electric Co Ltd Production of magnetic recording medium and substrate polishing device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6415848B1 (en) 1999-04-07 2002-07-09 Ryobi Ltd. Metal mold arrangement for producing cylinder block

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