JPH0710492Y2 - Wafer reversing sticker - Google Patents

Wafer reversing sticker

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Publication number
JPH0710492Y2
JPH0710492Y2 JP1991007967U JP796791U JPH0710492Y2 JP H0710492 Y2 JPH0710492 Y2 JP H0710492Y2 JP 1991007967 U JP1991007967 U JP 1991007967U JP 796791 U JP796791 U JP 796791U JP H0710492 Y2 JPH0710492 Y2 JP H0710492Y2
Authority
JP
Japan
Prior art keywords
wafer
chuck
pad
reversing
sticking
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1991007967U
Other languages
Japanese (ja)
Other versions
JPH0496843U (en
Inventor
木 静 雄 鈴
Original Assignee
株式会社エンヤシステム
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社エンヤシステム filed Critical 株式会社エンヤシステム
Priority to JP1991007967U priority Critical patent/JPH0710492Y2/en
Publication of JPH0496843U publication Critical patent/JPH0496843U/ja
Application granted granted Critical
Publication of JPH0710492Y2 publication Critical patent/JPH0710492Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】[Detailed description of the device]

【0001】[0001]

【産業上の利用分野】本考案は、ウエ−ハを平滑に研磨
するためウエ−ハを支持する貼付板にウエ−ハを接着す
るウエ−ハ反転貼付装置に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wafer reversing sticking apparatus for sticking a wafer to a sticking plate that supports the wafer in order to polish the wafer smoothly.

【0002】[0002]

【従来の技術】半導体製造において、ウエ−ハの表面を
研磨するため接着剤によって研磨機の貼付板にウエ−ハ
を接着することが行われている。この場合、接着剤の層
が不均一に形成されていると、研磨する面にその影響が
生じてウエ−ハを平坦に、高精度に研磨することができ
ない。また、上記の貼付作業を手作業で行ったりしてい
る。
2. Description of the Related Art In the manufacture of semiconductors, in order to polish the surface of a wafer, the wafer is adhered to a sticking plate of a polishing machine with an adhesive. In this case, if the adhesive layer is formed nonuniformly, the surface to be polished is affected, and the wafer cannot be polished flat and highly accurately. Also, the above-mentioned pasting work is performed manually.

【0003】出願人は、上記のような実情に鑑み、接着
剤をスピンコ−タ−でウエ−ハの表面に薄く塗布し、こ
れを反転して貼付板上に次々と連続的に接着する方法及
び装置を提案した。図4は、その方法を示し、ウエ−ハ
(1)は、受取装置(2)の保持部(3)を昇降させて
水平状態で搬送手段(4)上に載置され、該搬送手段を
横移動することによりスピンチャック手段(5)の上方
に搬送される。該スピンチャック手段(5)の保持部
(6)は上昇して該ウエ−ハ(1)を接着剤塗布装置
(7)内に搬入して回転し、有機溶剤に希釈されてノズ
ル(8)から滴下する接着剤をウエ−ハの表面に薄く塗
布する。該ウエ−ハ(1)は、上記スピンチャック手段
(5)の保持部(6)が降下することにより上記搬送手
段(4)上に再び載置される。
In view of the above-mentioned circumstances, the applicant has applied a method in which an adhesive is applied thinly on the surface of a wafer with a spin coater, and the adhesive is inverted to continuously adhere the adhesive onto a sticking plate. And proposed the device. FIG. 4 shows the method, in which the wafer (1) is placed on the transfer means (4) in a horizontal state by raising and lowering the holding part (3) of the receiving device (2). By moving laterally, it is conveyed above the spin chuck means (5). The holding part (6) of the spin chuck means (5) rises to carry the wafer (1) into the adhesive coating device (7) and rotate, diluted with an organic solvent and nozzle (8). The adhesive that is dripped from is applied thinly on the surface of the wafer. The wafer (1) is placed again on the transfer means (4) by lowering the holding part (6) of the spin chuck means (5).

【0004】上記搬送手段が横移動する鎖線で示す位置
に対応して、反転貼付装置(9)を設けてある。該反転
貼付装置(9)は、反転ア−ム(10)の先端にチャック(1
1)を有し、該反転ア−ム(10)が矢印(12)のように回転す
るとき、上記搬送手段から上記ウエ−ハを受取り、貼付
板(13)の上面に接着する。該貼付板(13)は、所定温度に
加熱されており、適宜周囲にも加熱手段(14)が設けられ
ていて、上記接着剤中の有機溶剤の蒸発を促進し、接着
剤が固化して早く接着作用を奏するようにしている。ま
た、上記貼付板(13)の上方にはスタンプ手段(15)を設け
てあり、貼付板(13)に接着されたウエ−ハ(1)を貼付
板(13)に押圧する。その後、該貼付板(13)は、割出手
段(16)で所定角度回転し次々とウエ−ハを接着する。複
数枚のウエ−ハを接着したら、該貼付板(13)は割出手段
から次工程へ搬送され、上面の複数のウエ−ハを一緒
に、一様にプレスして接着剤層を均厚にした後、冷却さ
れる。
A reversing sticking device (9) is provided at a position indicated by a chain line in which the transport means moves laterally. The reversing sticking device (9) has a chuck (1) at the tip of the reversing arm (10).
1) and when the reversing arm (10) rotates as shown by an arrow (12), it receives the wafer from the transfer means and adheres it to the upper surface of the sticking plate (13). The sticking plate (13) is heated to a predetermined temperature, and a heating means (14) is appropriately provided around the sticking plate (13) to accelerate evaporation of the organic solvent in the adhesive and to solidify the adhesive. I try to play an adhesive action quickly. Further, a stamp means (15) is provided above the sticking plate (13), and the wafer (1) adhered to the sticking plate (13) is pressed against the sticking plate (13). Then, the sticking plate (13) is rotated by a predetermined angle by the indexing means (16) to bond the wafers one after another. After adhering a plurality of wafers, the sticking plate (13) is conveyed from the indexing means to the next step, and the plurality of wafers on the upper surface are uniformly pressed together to make the adhesive layer uniform. And then cooled.

【0005】[0005]

【考案の解決課題】上記方法中、反転貼付装置(9)に
おいて、反転ア−ム(10)は、図5に示すように、真空吸
着式チャック(11)の支軸(17)を軸受(18)に摺動可能に嵌
挿し、複数のばね(19)・・・でア−ム(10)から離れる方
向へ付勢してあり、貼付板(13)にウエ−ハを接着すると
き、該チャック(11)が緩衝作用をもってウエ−ハを押圧
するようにしてある。上記ばね(19)の強さは、調節ねじ
(20)・・・で調整可能になっているが、この調整は微妙
であり、チャック(11)が斜めになったりすることがあ
る。そのため、チャックによりウエ−ハを貼付板(13)に
均一に押圧することができなくなったり、上記チャック
の支軸(17)と軸受(18)が擦れて微細なごみを発生する。
このようなダストパ−ティクルは、本来クリ−ン乃至超
クリ−ンでなければならない貼付部周辺を汚染し、貼付
板の表面等に付着し、高精度の平坦度を得られない原因
となる。
In the above-mentioned method, in the reversing sticking device (9), the reversing arm (10) supports the support shaft (17) of the vacuum suction chuck (11) as shown in FIG. 18) is slidably inserted and biased in the direction away from the arm (10) by a plurality of springs (19) ... When bonding the wafer to the sticking plate (13), The chuck (11) has a cushioning function to press the wafer. The strength of the spring (19) is
Although it can be adjusted with (20) ..., this adjustment is delicate and the chuck (11) may become slanted. Therefore, the wafer cannot be pressed uniformly against the attachment plate (13) by the chuck, or the support shaft (17) and the bearing (18) of the chuck rub against each other to generate fine dust.
Such dust particles contaminate the periphery of the sticking part, which should originally be clean or super-clean, and adhere to the surface of the sticking plate or the like, which causes the failure to obtain highly accurate flatness.

【0006】本考案の目的は、上記のようなウエ−ハ反
転貼付装置において、ウエ−ハを均一に貼付板に接着で
きると共にダストパ−ティクルを発生しないようにした
ウエ−ハ反転貼付装置を提供することである。
An object of the present invention is to provide a wafer reversing sticking apparatus as described above, which is capable of uniformly adhering a wafer to a sticking plate and preventing dust particles from being generated. It is to be.

【0007】[0007]

【課題解決の手段】本考案によれば、接着剤を表面に塗
布したウエ−ハをチャックで支持し反転して貼付板に接
着するウエ−ハ反転貼付装置において、反転ア−ムの先
端にウエ−ハを保持するチャック手段を設け該チャック
手段と上記ア−ムの間に中空のパッドを形成し、該パッ
ド内に加圧流体を導入して該パッド内を定圧に保つよう
加圧手段を具備したウエ−ハ反転貼付装置が提供され、
上記目的が達成される。
According to the present invention, in a wafer reversing sticking device for supporting a wafer having an adhesive applied on its surface by a chuck, reversing it and adhering it to a sticking plate, the tip of the reversing arm is A chuck means for holding a wafer is provided, a hollow pad is formed between the chuck means and the arm, and a pressurizing fluid is introduced into the pad to maintain a constant pressure in the pad. A wafer reversing sticking device equipped with
The above object is achieved.

【0008】[0008]

【作用】反転ア−ムの先端に設けられたチャック手段
は、加圧手段によって膨らまされ定圧に加圧されたパッ
ドにより全体が弾発的に均質に支承され、ウエ−ハを貼
付板に均一に接着でき、また従来のような軸受部を有し
ないので、ダストパ−ティクルの発生もみられない。
The chuck means provided at the tip of the reversing arm is elastically and uniformly supported entirely by the pad which is inflated by the pressure means and pressurized to a constant pressure, and the wafer is evenly attached to the sticking plate. Since it can be adhered to the substrate and does not have a conventional bearing portion, dust particles are not generated.

【0009】[0009]

【実施例】以下実施例と共に説明する。図1,図2を参
照し、装置本体(21)は、ガイド杆(22)に案内されてシリ
ンダ(23)により矢印(24)方向へ移動する横移動枠(25)
と、該横移動枠(25)上に設けられ、ガイド杆(26)に案内
されてシリンダ(27)により矢印(28)方向に移動する縦移
動枠(29)を具備し、該縦移動枠(29)にはモ−タ、エアア
クチュエータ等の回転手段(30)により回転するよう軸支
(31)された反転ア−ム(32)が設けられている。なお、上
記装置本体(21)全体を昇降させることもできる。
EXAMPLES Examples will be described below. Referring to FIG. 1 and FIG. 2, the apparatus main body (21) is guided by a guide rod (22) and is moved by a cylinder (23) in a direction of an arrow (24).
And a vertical moving frame (29) provided on the horizontal moving frame (25) and guided by a guide rod (26) to move in the direction of the arrow (28) by a cylinder (27). (29) has a shaft support so that it can be rotated by rotating means (30) such as a motor and an air actuator.
An inverted arm (32) which is (31) is provided. The entire device body (21) can be raised and lowered.

【0010】上記反転ア−ム(32)の先端には取付板(33)
をボルト(34)で固着してあり、該取付板(33)にチャック
手段を設けてあるが、取付板(33)を形成せずに上記ア−
ム(32)に直接該チャック手段を設けることもできる。
該チャック手段は、セラミック材料で成形されたチャッ
クヘッド(35)と、該チャックヘッド(35)の上面が真空吸
着作用を奏するよう該ヘッド(35)の軸部(36)に形成した
通孔(37)と別に設けた真空源(図示略)を連結する接続
パイプ(38)等を具備しているが、その他適宜のチャック
方式を採用することもできる。
A mounting plate (33) is attached to the tip of the reversing arm (32).
Are secured with bolts (34) and chuck means are provided on the mounting plate (33), but the mounting plate (33) is not formed and
The chuck means may be provided directly on the frame (32).
The chuck means is a chuck head (35) formed of a ceramic material, and a through hole (36) formed in the shaft portion (36) of the head (35) so that the upper surface of the chuck head (35) exerts a vacuum suction action. Although a connecting pipe (38) for connecting a vacuum source (not shown) provided separately from 37) is provided, other suitable chucking method can be adopted.

【0011】上記チャック手段のヘッド(35)と上記ア−
ム(32)の取付板(33)の間には、中空のパッド(39)を設け
てある。該パッド(39)は、シリコンゴム材料等の耐熱性
を有する弾性材料で、図3に示すように略ド−ナツ状に
形成され、下面が開口した断面略C字状に作られてい
る。そして、保持板(40)を該開口部から差し込み、下縁
(41)を上記取付板(33)との間に挟着し、ボルト(42)で保
持板(40)を取付板(33)に固着する。
The head (35) of the chuck means and the arm
A hollow pad (39) is provided between the mounting plates (33) of the frame (32). The pad (39) is made of a heat-resistant elastic material such as a silicone rubber material, is formed in a substantially donut shape as shown in FIG. 3, and is formed in a substantially C-shaped cross-section with an open lower surface. Then, insert the holding plate (40) through the opening,
The (41) is sandwiched between the mounting plate (33) and the holding plate (40) is fixed to the mounting plate (33) with bolts (42).

【0012】なお、上記パッド(39)の上面には、上記チ
ャックヘッド(35)の下面の係合孔(43)に嵌入して横移
動を防止するよう係合突起(44)を設けてあり、また係合
突起(44)間には、ヘッド(35)の下面を支承するよう支持
突条(45)を形成してある。
An engaging projection (44) is provided on the upper surface of the pad (39) so as to be fitted in an engaging hole (43) in the lower surface of the chuck head (35) to prevent lateral movement. Further, between the engaging protrusions (44), a supporting protrusion (45) is formed so as to support the lower surface of the head (35).

【0013】上記チャックヘッド(35)の軸部(36)は、上
記パッド(39)の中央の孔(46)に挿通し、シリコンゴム材
料等の耐熱性を有する弾性材料で作った保持リング(47)
を外周に嵌着し、該保持リング(47)を上記パッド(39)の
下縁に当接し、ストップリング(48)を掛止めることによ
り弾発的に変位可能に取付けられている。
The shaft portion (36) of the chuck head (35) is inserted through the central hole (46) of the pad (39) and is made of a heat-resistant elastic material such as a silicone rubber material. 47)
Is attached to the outer periphery, the holding ring (47) is brought into contact with the lower edge of the pad (39), and the stop ring (48) is hooked to elastically displace.

【0014】上記パッド(39)内に加圧流体を導入し、該
パッド内を定圧に保つよう加圧手段を設けてある。図に
示す加圧手段は、N2 ガス,エア等の流体(気体)を加
圧流体供給源(図示略)から流体ストップバルブ(49)、
精密レギュレタ−(50)により約0.01〜1Kg/cm2 程度の
圧力に調整してパッド内に供給する回路を具備してい
る。なお、シリコンゴム材料等の耐熱性を有する弾性材
料で作った上記回路の端末の接続パイプ(51)は、上記パ
ッドの保持板(40)に取付けたステンレスパイプ等の連結
パイプ(52)に接続されている。
Pressurizing fluid is introduced into the pad (39) to maintain a constant pressure in the pad. The pressurizing means shown in the figure supplies a fluid (gas) such as N 2 gas or air from a pressurizing fluid supply source (not shown) to a fluid stop valve (49),
It is equipped with a circuit which adjusts the pressure to about 0.01 to 1 kg / cm 2 by a precision regulator (50) and supplies it to the inside of the pad. The connection pipe (51) of the end of the circuit made of a heat-resistant elastic material such as silicon rubber material is connected to the connection pipe (52) such as a stainless pipe attached to the holding plate (40) of the pad. Has been done.

【0015】上記回路には、デジタルプレッシャ−スイ
ッチ(53)を設けてあり、上記パッド(39)が破裂したり、
接続パイプが外れたりしてパッド(39)の内圧が急減した
とき、その圧力ダウンを検知して上記加圧流体の導入を
停止し、同時に図4に示す装置全体をストップさせるよ
うにしている。
The circuit is provided with a digital pressure switch (53), which may cause the pad (39) to burst or
When the internal pressure of the pad (39) suddenly decreases due to disconnection of the connecting pipe, the pressure drop is detected and the introduction of the pressurized fluid is stopped, and at the same time, the entire apparatus shown in FIG. 4 is stopped.

【0016】また、貼付板の表面にダストパ−ティクル
が付着しないよう上記反転貼付装置をクリ−ン乃至超ク
リ−ン状態において使用する場合は、該装置の近くに周
囲のダストパ−ティクルをカウントするダストカウンタ
(図示略)を設け、上記加圧流体が噴出したりして該カ
ウンタが所定数のダストをカウントしたら、その時点で
上記回路の適所に設けた電磁弁(図示略)を制御し、加
圧流体の導入を停止すると共に装置全体を停止するよう
に上記回路を構成することもできる。
When the above-mentioned reversing sticking device is used in a clean or super-clean state so that dust particles do not adhere to the surface of the sticking plate, the surrounding dust particles are counted near the device. A dust counter (not shown) is provided, and when the pressurized fluid is ejected or the counter counts a predetermined number of dusts, a solenoid valve (not shown) provided at an appropriate position of the circuit is controlled at that time, It is also possible to configure the circuit so that the introduction of the pressurized fluid is stopped and the entire device is stopped.

【0017】而して、図4に示すようにして表面に接着
剤を塗布したウエ−ハ(1)は、上記ウエ−ハ反転貼付
装置の反転ア−ム(32)を矢印(28)方向へ上昇させると上
記チャック手段に保持され、該反転ア−ム(32)が矢印(5
4)方向に回転することにより反転され、貼付板(13)上に
載置される。上記チャック手段は、中空のパッド(39)に
より弾発的に反転ア−ムに取付けられているので、ウエ
−ハ(1)は割れたり、損傷することなく貼付板(13)に
接着される。
Thus, as shown in FIG. 4, the wafer (1) whose surface is coated with the adhesive has the reversing arm (32) of the above-mentioned wafer reversing sticking device in the direction of the arrow (28). When the reversing arm (32) is raised by the arrow (5
It is inverted by rotating in the 4) direction and placed on the sticking plate (13). Since the chuck means is elastically attached to the reversing arm by the hollow pad (39), the wafer (1) is bonded to the attaching plate (13) without cracking or damage. .

【0018】[0018]

【発明の効果】本考案は上記のように構成され、加圧流
体で加圧された中空のパッド及び弾性的な保持リング
介してチャック手段のチャックヘッドを弾性的に変位可
に反転アームに支持するようにしたから、該チャック
手段はウエーハを貼付板に貼付ける際に該貼付板に対し
傾斜したりしないで反転アームに沿って平均した弾発
力で支持され、したがってウエーハを均一に接着するこ
とができ、またチャックヘッドの軸部に弾性的な保持リ
ングを嵌着して該ヘッドの軸部をアームに取付けるよう
にしたので、上記チャックヘッドが移動しても上記反転
アームとの間に摺動部が存在しないようにでき、そのた
め摺動に伴うダストパーティクルの発生もなく、貼付部
周辺の汚染を防止することができ、ウエーハと貼付板の
間にダストを挟着しないように貼付けることができる。
The present invention is constructed as described above, and the chuck head of the chuck means can be elastically displaced through the hollow pad and the elastic holding ring which are pressurized by the pressurized fluid.
Since the supporting means is supported by the reversing arm, the chuck means can be attached to the sticking plate when the wafer is stuck to the sticking plate.
It is supported by an average elastic force along the reversing arm without tilting and tilting, so that the wafer can be evenly adhered and an elastic holding lever can be attached to the shaft of the chuck head.
The shaft of the head to the arm
Therefore, even if the chuck head moves , there can be no sliding portion between the chuck head and the reversing arm.
Therefore, dust particles are not generated due to sliding, and the sticking part
It can prevent contamination of the surrounding area , and
It can be attached so that dust is not sandwiched between them.

【図面の簡単な説明】[Brief description of drawings]

【図1】本考案の実施例を示し、主として反転ア−ムの
先端部の拡大断面図。
FIG. 1 shows an embodiment of the present invention, mainly an enlarged cross-sectional view of a tip portion of an inversion arm.

【図2】本考案のウエ−ハ反転貼付装置の側面図。FIG. 2 is a side view of the wafer reversing sticking apparatus of the present invention.

【図3】パッドの平面図。FIG. 3 is a plan view of a pad.

【図4】ウエ−ハを供給し、貼付板に順次貼付ける装置
の説明図。
FIG. 4 is an explanatory view of an apparatus that supplies wafers and sequentially attaches them to an attachment plate.

【図5】従来のウエ−ハ反転貼付装置の反転ア−ムの先
端部の拡大断面図。
FIG. 5 is an enlarged cross-sectional view of a tip portion of a reversing arm of a conventional wafer reversing / pasting device.

【符号の説明】[Explanation of symbols]

32 反転ア−ム 35 チャックヘッド 39 パッド 32 reverse arm 35 chuck head 39 pad

Claims (3)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】 接着剤を表面に塗布したウエーハをチャ
ックで支持し反転して貼付板に接着するウエーハ反転貼
付装置において、反転アームの先端にウエーハを保持す
るチャック手段を設け該チャック手段のチャックヘッド
と上記アームの間に中空のパッドを形成し、該パッド内
に加圧流体を導入し該パッド内を定圧に保つよう加圧手
段を設けると共に上記チャックヘッドの軸部に弾性材料
で作った保持リングを嵌着して該軸部を弾性的に変位可
能に上記アームに取付けたウエーハ反転貼付装置。
1. A adhesive wafer reversing attachment device to adhere to the pasted plate supporting inverts the applied wafer by a chuck to the surface of the chuck of the chuck means provided chucking means for holding the wafer on the tip of the inverted arms A hollow pad is formed between the head and the arm, and a pressurizing means is provided to introduce a pressurized fluid into the pad to keep the inside of the pad at a constant pressure, and at the same time, elastic force is applied to the shaft portion of the chuck head. material
A retaining ring made of can be fitted to elastically displace the shaft.
Wafer reversing sticking apparatus was attached only to the arm ability.
【請求項2】 上記加圧手段は、上記パッドの内圧が急
減したとき加圧流体の導入を停止する請求項1に記載の
ウエ−ハ反転貼付装置。
2. The wafer reversing sticking apparatus according to claim 1, wherein the pressurizing means stops the introduction of the pressurized fluid when the internal pressure of the pad suddenly decreases.
【請求項3】 上記加圧手段は、ダストパ−ティクルが
急増したとき加圧流体の導入を停止する請求項1又は2
に記載のウエ−ハ反転貼付装置。
3. The pressurizing means stops the introduction of the pressurized fluid when the dust particles rapidly increase.
The wafer reversal sticking device according to [4].
JP1991007967U 1991-01-30 1991-01-30 Wafer reversing sticker Expired - Lifetime JPH0710492Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1991007967U JPH0710492Y2 (en) 1991-01-30 1991-01-30 Wafer reversing sticker

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1991007967U JPH0710492Y2 (en) 1991-01-30 1991-01-30 Wafer reversing sticker

Publications (2)

Publication Number Publication Date
JPH0496843U JPH0496843U (en) 1992-08-21
JPH0710492Y2 true JPH0710492Y2 (en) 1995-03-08

Family

ID=31740080

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1991007967U Expired - Lifetime JPH0710492Y2 (en) 1991-01-30 1991-01-30 Wafer reversing sticker

Country Status (1)

Country Link
JP (1) JPH0710492Y2 (en)

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0268436U (en) * 1988-11-15 1990-05-24
JP2873314B2 (en) * 1989-03-30 1999-03-24 住友シチックス株式会社 Method and apparatus for polishing semiconductor substrate

Also Published As

Publication number Publication date
JPH0496843U (en) 1992-08-21

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