JPH0675061B2 - Soldering inspection method - Google Patents

Soldering inspection method

Info

Publication number
JPH0675061B2
JPH0675061B2 JP524488A JP524488A JPH0675061B2 JP H0675061 B2 JPH0675061 B2 JP H0675061B2 JP 524488 A JP524488 A JP 524488A JP 524488 A JP524488 A JP 524488A JP H0675061 B2 JPH0675061 B2 JP H0675061B2
Authority
JP
Japan
Prior art keywords
alloy layer
soldering
inspection method
magnetic
connection portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP524488A
Other languages
Japanese (ja)
Other versions
JPH01180448A (en
Inventor
喜久次 宮崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP524488A priority Critical patent/JPH0675061B2/en
Publication of JPH01180448A publication Critical patent/JPH01180448A/en
Publication of JPH0675061B2 publication Critical patent/JPH0675061B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は半田付検査方法に関する。The present invention relates to a soldering inspection method.

〔従来の技術〕[Conventional technology]

従来の技術としては、例えば、特公昭60-8707号公報に
示されているような半田付検査方法がある。
As a conventional technique, for example, there is a soldering inspection method disclosed in Japanese Patent Publication No. 60-8707.

従来の半田付検査方法は、凸レンズにより円錐形に絞っ
た光を半田付面に照射する手段と、半田付面を上方より
撮像する手段とを含んで構成される。
The conventional soldering inspection method is configured to include means for irradiating the soldering surface with light conically focused by a convex lens, and means for imaging the soldering surface from above.

次に従来の半田付検査方法について図面を参照して詳細
に説明する。
Next, a conventional soldering inspection method will be described in detail with reference to the drawings.

第3図は従来の一例を示す模式図、第4図(a)〜
(c)は第3図に示す半田付検査方法の作用を示す斜視
図である。
FIG. 3 is a schematic view showing an example of the conventional art, and FIG.
FIG. 4C is a perspective view showing the operation of the soldering inspection method shown in FIG.

光源101からの光aは投影レンズ104により集光され投影
光bとして折り代えしミラー105で反射されプリント基
板106上の半田面102に投影される。
The light a from the light source 101 is condensed by the projection lens 104, folded as projection light b, reflected by the mirror 105, and projected onto the solder surface 102 on the printed circuit board 106.

このとき、半田付が正常であれば、カメラ103には円図
形cが観測され、半田にくぼみがあれば欠損図形d1とし
て、また半田が少ない状態であれば小面積図形d2として
観測され、撮像図形の形状により半田付の良否が判定さ
れる。
At this time, if the soldering is normal, a circular figure c is observed on the camera 103, if there is a dent in the solder, it is observed as a defective figure d 1 , and if there is little solder, it is observed as a small area figure d 2. The quality of soldering is determined by the shape of the imaged figure.

〔発明が解決しようとする問題点〕[Problems to be solved by the invention]

上述した従来の半田付検査方法は、半田付部の外形形状
のみから半田付の良否判定をしているために、半田付部
の接続強度を知ることができず、不良品を良品としたり
良品を不良品とする誤検出をすることがあるという欠点
があった。
In the above-described conventional soldering inspection method, since the quality of soldering is determined only from the outer shape of the soldered portion, it is not possible to know the connection strength of the soldered portion, and the defective product can be regarded as a good product. However, there is a drawback that it may be erroneously detected as a defective product.

〔問題点を解決するための手段〕[Means for solving problems]

本発明の半田付検査方法は、半田付接続部を冷却する手
段と、接続部の冷却により前記半田付接続部の第1の合
金層の磁気変態を起した上で前記第1の合金層の磁気特
性を測定する手段と、さらなる冷却により前記半田付接
続部の第2の合金層の磁気変態を起した上で前記第2の
合金層の磁気特性を測定する手段と、半田付良否を判定
するための一定のしきい値をもち前記磁気特性を前記し
きい値と比較して良否判定する手段とを含んで構成され
る。
The soldering inspection method of the present invention comprises a means for cooling the soldered connection portion, and a magnetic transformation of the first alloy layer of the soldered connection portion caused by cooling of the connection portion, and then the first alloy layer of the first alloy layer. Means for measuring magnetic characteristics, means for measuring magnetic characteristics of the second alloy layer after magnetic transformation of the second alloy layer of the soldered connection portion by further cooling, and determination of solderability And a means for judging acceptability by comparing the magnetic characteristic with the threshold value.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明す
る。
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示す模式図、第2図は合金
層の磁気変態を示すグラフである。
FIG. 1 is a schematic diagram showing an embodiment of the present invention, and FIG. 2 is a graph showing magnetic transformation of an alloy layer.

電極1およびボデイ2からなるチップ抵抗がプリント基
板5のマウント用パッド4の上に半田付されている。
A chip resistor composed of the electrode 1 and the body 2 is soldered on the mounting pad 4 of the printed circuit board 5.

半田部分3の中には、数μmの厚さからなるチップ部品
の電極1と半田との合金層6および半田とマウント用パ
ッド4との合金層7ができている。ただし、半田付が正
常でなければ、この合金層6,7はできないか、できてい
ても合金層の量は少ない。
In the solder portion 3, an alloy layer 6 of the electrode 1 of the chip component and the solder and a alloy layer 7 of the solder and the mounting pad 4 having a thickness of several μm are formed. However, if soldering is not normal, the alloy layers 6 and 7 cannot be formed, or even if they are formed, the amount of the alloy layers is small.

電極1およびマウント用パッド4は共に銅系合金の非磁
性体で作られているが、半田付の際に、多少の添加物を
半田中に混入してあるため、半田部分3のなかに磁気変
態点を持った合金層6,7が生成される。
Both the electrode 1 and the mounting pad 4 are made of a non-magnetic material of a copper-based alloy. However, since some additives are mixed in the solder during soldering, it is possible that the solder portion 3 is magnetic. Alloy layers 6 and 7 having a transformation point are generated.

合金層6の常磁性から非磁性への変態温度T1と合金層7
の常磁性から非磁性への変態温度T2は一般に異る値をも
つ。
The paramagnetic to non-magnetic transformation temperature T 1 of the alloy layer 6 and the alloy layer 7
The paramagnetic to non-magnetic transformation temperature T 2 of is generally different.

冷却器11により温度を下げながら磁気センサ8で常磁性
磁化温度TA2,TB2非磁性磁化温度TA1,TB1の半田部3のそ
れぞれの磁化量MA2,MB2,MA1,MB1を測定すれば合金層6,7
の量Qa,Qbが計量可能となり、(1),(2)式で表す
ことができる。
While the temperature is lowered by the cooler 11, the magnetic sensors 8 use the paramagnetic magnetization temperatures TA 2 and TB 2 of the nonmagnetic magnetization temperatures TA 1 and TB 1 respectively to obtain the magnetization amounts MA 2 , MB 2 , MA 1 and MB 1 of the solder portion 3. If you measure the alloy layer 6,7
The quantities Qa and Qb can be measured, and can be expressed by equations (1) and (2).

Qa=k(MA2−MA1) …………(1) Qb=k(MB2−MB1) …………(2) ここでkは磁化常数を示す。 Qa = k (MA 2 -MA 1 ) ............ (1) Qb = k (MB 2 -MB 1) ............ (2) where k denotes the magnetization constant.

半田付の良否の判定は、磁気センサ8で測定した磁化量
を増幅器9で増幅し、判定器10で合金の量に変換した上
であらかじめ定められた値と比較され、生成量が多けれ
ば良品、少なければ不良として判定され出力端子12へ出
力される。
To judge the quality of soldering, the magnetization amount measured by the magnetic sensor 8 is amplified by the amplifier 9, converted into the amount of alloy by the judgment device 10, and then compared with a predetermined value. If the number is small, it is determined to be defective and output to the output terminal 12.

〔発明の効果〕〔The invention's effect〕

本発明の半田付検査方法は、良好な半田付の時にできる
電極と半田との合金量およびマウント用パッドと半田と
の合金量を磁化量として測定することにより、合金の量
を直接求めることができるため、半田付の良否判定が確
実にできるという効果がある。
In the soldering inspection method of the present invention, the amount of alloy can be directly obtained by measuring the amount of alloy between the electrode and the solder and the amount of alloy between the mounting pad and the solder, which can be obtained during good soldering, as the amount of magnetization. Therefore, there is an effect that the quality of soldering can be surely determined.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明の一実施例を示す模式図、第2図は合金
層の磁気変態を占すグラフ、第3図は従来の一例を示す
模式図、第4図は第3図における欠陥検出例を示す斜視
図である。 1……電極、2……ボディ、3……半田部、4……マウ
ント用パッド、5……プリント基板、6,7……合金層、
8……磁気センサ、9……増幅器、10……判定器、11…
…冷却器、12……出力端子。
FIG. 1 is a schematic view showing an embodiment of the present invention, FIG. 2 is a graph showing the magnetic transformation of an alloy layer, FIG. 3 is a schematic view showing an example of the prior art, and FIG. 4 is a defect in FIG. It is a perspective view showing a detection example. 1 ... Electrode, 2 ... Body, 3 ... Solder part, 4 ... Mounting pad, 5 ... Printed circuit board, 6,7 ... Alloy layer,
8 ... Magnetic sensor, 9 ... Amplifier, 10 ... Judgment device, 11 ...
… Cooler, 12 …… Output terminal.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】半田付接続部を冷却する手段と、接続部の
冷却により前記半田付接続部の第1の合金層の磁気変態
を起した上で前記第1の合金層の磁気特性を測定する手
段と、さらなる冷却により前記半田付接続部の第2の合
金層の磁気変態を起した上で前記第2の合金層の磁気特
性を測定する手段と、半田付良否を判定するための一定
のしきい値をもち前記磁気特性を前記しきい値と比較し
て良否判定する手段とを含むことを特徴とする半田付検
査方法。
1. A means for cooling a soldered connection portion, and a magnetic transformation of the first alloy layer of the soldered connection portion caused by cooling the connection portion, and then measuring a magnetic characteristic of the first alloy layer. Means for measuring the magnetic characteristics of the second alloy layer after magnetically transforming the second alloy layer of the soldered connection portion by further cooling, and a constant for determining the quality of soldering. And a means for judging acceptability by comparing the magnetic characteristic with the threshold value and the soldering inspection method.
JP524488A 1988-01-12 1988-01-12 Soldering inspection method Expired - Lifetime JPH0675061B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP524488A JPH0675061B2 (en) 1988-01-12 1988-01-12 Soldering inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP524488A JPH0675061B2 (en) 1988-01-12 1988-01-12 Soldering inspection method

Publications (2)

Publication Number Publication Date
JPH01180448A JPH01180448A (en) 1989-07-18
JPH0675061B2 true JPH0675061B2 (en) 1994-09-21

Family

ID=11605789

Family Applications (1)

Application Number Title Priority Date Filing Date
JP524488A Expired - Lifetime JPH0675061B2 (en) 1988-01-12 1988-01-12 Soldering inspection method

Country Status (1)

Country Link
JP (1) JPH0675061B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003142340A (en) 2001-11-01 2003-05-16 Nec Tokin Corp Electric double-layer capacitor and manufacturing method therefor

Also Published As

Publication number Publication date
JPH01180448A (en) 1989-07-18

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