JPH065650Y2 - Ic試験用恒温槽 - Google Patents
Ic試験用恒温槽Info
- Publication number
- JPH065650Y2 JPH065650Y2 JP7898487U JP7898487U JPH065650Y2 JP H065650 Y2 JPH065650 Y2 JP H065650Y2 JP 7898487 U JP7898487 U JP 7898487U JP 7898487 U JP7898487 U JP 7898487U JP H065650 Y2 JPH065650 Y2 JP H065650Y2
- Authority
- JP
- Japan
- Prior art keywords
- carry
- rail
- port
- storage
- rails
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7898487U JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用恒温槽 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP7898487U JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用恒温槽 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63187078U JPS63187078U (enrdf_load_stackoverflow) | 1988-11-30 |
| JPH065650Y2 true JPH065650Y2 (ja) | 1994-02-09 |
Family
ID=30928428
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP7898487U Expired - Lifetime JPH065650Y2 (ja) | 1987-05-25 | 1987-05-25 | Ic試験用恒温槽 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH065650Y2 (enrdf_load_stackoverflow) |
-
1987
- 1987-05-25 JP JP7898487U patent/JPH065650Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63187078U (enrdf_load_stackoverflow) | 1988-11-30 |
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