JPH065614Y2 - Component transport mechanism for automatic chip component visual inspection machine - Google Patents

Component transport mechanism for automatic chip component visual inspection machine

Info

Publication number
JPH065614Y2
JPH065614Y2 JP1987161772U JP16177287U JPH065614Y2 JP H065614 Y2 JPH065614 Y2 JP H065614Y2 JP 1987161772 U JP1987161772 U JP 1987161772U JP 16177287 U JP16177287 U JP 16177287U JP H065614 Y2 JPH065614 Y2 JP H065614Y2
Authority
JP
Japan
Prior art keywords
component
chip
air jet
inspection machine
concave
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1987161772U
Other languages
Japanese (ja)
Other versions
JPH0166061U (en
Inventor
亨 水野
保彦 北島
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
TDK Corp
Original Assignee
TDK Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP1987161772U priority Critical patent/JPH065614Y2/en
Priority to KR1019890002517A priority patent/KR0122739B1/en
Publication of JPH0166061U publication Critical patent/JPH0166061U/ja
Application granted granted Critical
Publication of JPH065614Y2 publication Critical patent/JPH065614Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Description

【考案の詳細な説明】 (産業上の利用分野) 本考案は、チップコンデンサ、コイル等のコア部品その
他LC複合部品等のチップ状部品の外観を検査する光学
外観検査装置に関し、特に前記検査装置における部品搬
送機構に関する。
DETAILED DESCRIPTION OF THE INVENTION (Industrial field of application) The present invention relates to an optical appearance inspection apparatus for inspecting the appearance of chip-shaped parts such as core parts such as chip capacitors and coils and other LC composite parts. The component transfer mechanism in.

(従来技術) この種の電子部品は、長さや厚み等の外形不良や部品各
部の寸法誤差、その他欠け、割れ等があると、これが特
性に影響し、また部品実装上も不都合を生じるため、製
造工程の途中あるいは最終工程で特性値検査に加えて外
観による検査を行う必要がある。
(Prior Art) In this type of electronic component, if there is an external defect such as length or thickness, dimensional error of each part of the component, other chipping, cracking, etc., this will affect the characteristics and cause inconvenience in mounting the component. In addition to the characteristic value inspection, it is necessary to perform an inspection by appearance during the manufacturing process or in the final process.

従来、チップ部品の外観検査は、肉眼あるいは拡大レン
ズを用いた目視検査であって、部品を光学照射しその画
像処理により自動的に良、不良を選別することは行われ
ていない。
Conventionally, a visual inspection of a chip component is a visual inspection using a naked eye or a magnifying lens, and a component is optically irradiated and image processing is not performed to automatically select good or defective.

(考案が解決しようとする問題点) 従来の肉眼による外観検査は、感覚的な要素が多く、検
査基準の定量化が難しく、個人差により検査後の品質の
ばらつきが出やすい。また、チップ部品をラインに沿っ
て連続的に送りつつその途中の各工程で所要の処理を行
い、順次完成品にしていく量産製造ラインでは、搬送中
に部品を1個づつ拡大レンズ等で目視検査することは困
難で、搬送部品を一時ラインから外して或る数量ごとに
一箇所に集めて目視外観検査を行わなければならない。
特にチップコンデンサやLC複合部品のような量産品の
場合は多数の検査要員が必要でコスト高となってしま
う。
(Problems to be Solved by the Invention) Conventional visual appearance inspection has many sensory elements, it is difficult to quantify the inspection standard, and variations in quality after inspection easily occur due to individual differences. Also, in a mass production line where chip parts are continuously fed along the line and the required processing is performed in each step in the process, and in the mass production line, parts are checked one by one with a magnifying lens etc. during transportation. It is difficult to inspect, and it is necessary to remove the conveyed parts from the temporary line and collect them in a certain quantity in one place for visual appearance inspection.
Particularly in the case of mass-produced products such as chip capacitors and LC composite parts, a large number of inspection personnel are required, resulting in high cost.

上述の問題を解決するために本考案者等は、チップ部品
を間欠的に一定方向に送りつつその途中で斜光照明およ
び透過照明によってチップ部品の光像をテレビカメラで
とらえ、そのビデオ信号を画像処理し、部品の外観を自
動検査する方法および装置を提案した。この方法により
目視検査要員が不要になるとともに、判定レベルのばら
つきがなくなり、また高速画像処理によって生産性も向
上した。本考案はこの自動外観検査装置に用いられるチ
ップ部品搬送機構を提供するものである。
In order to solve the above-mentioned problems, the inventors of the present invention intermittently send a chip component in a fixed direction, capture an optical image of the chip component with a television camera by oblique illumination and transmitted illumination on the way, and display the video signal as an image. A method and apparatus for processing and automatically inspecting the appearance of parts have been proposed. This method eliminates the need for visual inspection personnel, eliminates variations in determination levels, and improves productivity by high-speed image processing. The present invention provides a chip component transfer mechanism used in this automatic visual inspection apparatus.

(問題点を解決するための手段) 本考案によるチップ部品搬送機構は、チップ部品を搬送
路に沿って走行させ、この走行途中で前記搬送路上に設
けた斜光・透過照明装置およびテレビカメラでチップ部
品の外観を検査する自動外観検査機において、部品投入
端から部品排出端まで伸長した透明な搬送路と、前記搬
送路に沿って形成されかつ鋭利なエッジを有する透明な
凹形部品通過溝と、前記凹形部品通過溝の溝内部に開口
した複数個の部品搬送用エアジェットノズルと、部品搬
送方向に離隔して前記搬送路の上部付近に設けられかつ
該搬送路に対して垂直に前記凹形部品通過溝に出入りす
る一対の部品分離ピンと、前記一対の部品分離ピンの間
の前記搬送路に開口した部品分離用エアジェットノズル
とを有し、前記凹形部品通過溝のエッジ精度を少くとも
前記テレビカメラの分解能以下の精度としたものであ
る。
(Means for Solving the Problems) A chip component transfer mechanism according to the present invention allows a chip component to travel along a transfer path, and in the course of this travel, a chip in a diagonal light / transmissive illumination device and a television camera provided on the transfer path. In an automatic visual inspection machine for inspecting the appearance of parts, a transparent conveying path extending from a component input end to a component discharging end, and a transparent concave component passage groove formed along the conveying path and having a sharp edge. A plurality of component-conveying air jet nozzles opening inside the concave component passage groove, and a plurality of component-conveying air jet nozzles provided in the vicinity of an upper portion of the convey path and separated from each other in the component convey direction and perpendicular to the convey path. An edge of the concave component passage groove having a pair of component separation pins that move in and out of the concave component passage groove, and a component separation air jet nozzle that is opened in the transport path between the pair of component separation pins. The precision is at least less than the resolution of the television camera.

(実施例) 次に、本考案を、図面を参照して実施例につき説明す
る。
(Example) Next, this invention is demonstrated about an Example with reference to drawings.

第1図は本考案の部品搬送機構を有するチップ部品外観
検査機の実施例の概略的な側面図であり、第2図は第1
図の矢視F方向からみたチップ部品搬送路の拡大正面図
である。検査機本体10の上側前面に、この実施例では
水平面に対してほぼ45°に傾斜したチップ搬送路4が
形成され、該搬送路の上端にチップフィーダ5が設けら
れている。搬送路4上にはチップ分離機構部6、表面側
検査部7a、裏面側検査部7b、計数機構部8、および
選別機構部9が設けられている。
FIG. 1 is a schematic side view of an embodiment of a chip component appearance inspection machine having a component transfer mechanism of the present invention, and FIG.
It is an enlarged front view of the chip component conveyance path seen from the arrow F direction of the figure. In this embodiment, on the upper front surface of the inspection machine body 10, a chip conveying path 4 is formed which is inclined at about 45 ° with respect to the horizontal plane, and a chip feeder 5 is provided at the upper end of the conveying path. A chip separation mechanism section 6, a front surface side inspection section 7a, a back surface side inspection section 7b, a counting mechanism section 8 and a sorting mechanism section 9 are provided on the transport path 4.

本実施例の搬送路4は、検査機本体10の上端から最下
方の選別機構部9まで延在しており、被検査部品の通過
部が強化ガラス等の透明または半透明部材で形成され、
その中央に、第3図、第4図に示す如く、搬送方向に沿
ってのびる凹溝11が形成されている。この凹溝11
は、少くとも表裏面側検査部のテレビカメラの視野内に
おいては鋭利なエッジ11aを有するように構成されて
いる。具体的には第4図に示すように、カメラの視野内
の部位では、搬送路全長にのびる平坦な金属製ベース2
7に丸孔が穿けられ、この丸孔に円形ガラス28が嵌
合、固着され、さらにその上側に鋭利なエッジをもつ一
対の隔置されたサイドガラス29が設置されて凹溝11
が形成されている。凹溝11は透明な蓋板12で蓋閉さ
れている。なおテレビカメラおよび斜光・透過照明部
(検査部)以外の箇所では、凹溝11の構成部材つまり
側板および蓋板は前記のサイドガラス等のような透明部
材で形成する必要はなく、静電気の発生防止等を考慮し
て金属板で構成してもよい。チップフィーダ5から供給
されたチップコンデンサ等の被検査部品1はこの搬送路
4の凹溝11に沿って、該凹溝に開口した部品搬送用エ
アジェットノズルからの噴出エアの流れ(エアジェッ
ト)により搬送される。以下このエアジェットによる搬
送動作を説明する。
The conveyance path 4 of the present embodiment extends from the upper end of the inspection machine body 10 to the lowermost sorting mechanism section 9, and the passing portion of the inspected component is formed of a transparent or translucent member such as tempered glass.
At the center thereof, as shown in FIGS. 3 and 4, a concave groove 11 extending along the carrying direction is formed. This groove 11
Is configured to have a sharp edge 11a at least in the visual field of the television camera of the front and back side inspection section. Specifically, as shown in FIG. 4, a flat metal base 2 extending over the entire length of the transport path is provided at a site within the field of view of the camera.
7 is provided with a circular hole, a circular glass 28 is fitted and fixed in the circular hole, and a pair of spaced side glasses 29 having a sharp edge is installed on the upper side thereof to form the concave groove 11
Are formed. The groove 11 is closed by a transparent lid plate 12. It should be noted that, except for the TV camera and the oblique light / transmissive illumination section (inspection section), the constituent members of the concave groove 11, that is, the side plate and the lid plate do not need to be formed of a transparent member such as the side glass described above, so that static electricity can be prevented. A metal plate may be used in consideration of the above. The inspected component 1 such as a chip condenser supplied from the chip feeder 5 flows along the concave groove 11 of the conveying path 4 and is a flow of air (air jet) ejected from an air jet nozzle for conveying a component opened in the concave groove. Is transported by. The carrying operation by this air jet will be described below.

第5図は第4図のV−V線に沿った断面図、即ち部品搬
送用エアジェットノズルの開口位置における搬送路凹溝
部分の縦断面図である。凹溝11の上面は強化ガラス等
の透明または半透明部材の蓋板12で蓋閉されている
が、エアジェットが導入される部分の蓋板12には、凹
溝底面に対して15°以下の、具体的な例としては約8
°の角度をもつ部品搬送用エアジェットノズル13が形
成されており、このエアジェットノズルから凹溝11内
へエアジェット15が噴出する。このエアジェットのた
めに、凹溝11内はエアジェットノズル13の開口位置
より上流側(符号Uで示す)で部品吸引作用が生じ、ま
た該ノズルの開口より下流側(符号Dで示す)で部品押
し出しの作用が生じる。凹溝11内の部品1はしたがっ
てノズル位置より上流側では前記吸引作用で搬送され、
ノズル位置を通過するとエアジェットに押されて搬送さ
れる。なお、エアジェットノズルは蓋板12に設けずに
凹溝11の底面側に設けてもよい。
FIG. 5 is a cross-sectional view taken along the line VV of FIG. 4, that is, a vertical cross-sectional view of the conveying path concave groove portion at the opening position of the component conveying air jet nozzle. The upper surface of the groove 11 is covered with a cover plate 12 made of a transparent or semi-transparent material such as tempered glass, but the cover plate 12 in which the air jet is introduced has a surface angle of 15 ° or less with respect to the bottom surface of the groove. As a concrete example, about 8
An air jet nozzle 13 for conveying parts having an angle of ° is formed, and an air jet 15 is ejected from the air jet nozzle into the groove 11. Due to this air jet, a component suction action occurs in the concave groove 11 on the upstream side (indicated by symbol U) of the opening position of the air jet nozzle 13, and on the downstream side (indicated by symbol D) of the nozzle opening. The action of pushing out parts occurs. Therefore, the component 1 in the groove 11 is conveyed by the suction action on the upstream side of the nozzle position,
When it passes the nozzle position, it is pushed by the air jet and conveyed. The air jet nozzle may be provided on the bottom surface side of the concave groove 11 instead of being provided on the cover plate 12.

チップフィーダ5からの部品供給部に続き、適当な搬送
方向距離Sをおいて設けられた分離機構部6は、第6図
(a)〜(c)に示すように、搬送路4に対して垂直に
上昇、下降して前記凹溝11内に出入りする一対のクッ
ションを有した分離ピン14,16が設けられ、凹溝1
1内を連続して滑落してきた部品を1個づつ所定の間隔
に分離して次段の検査部7a,7bへ送り出すようにな
っている。一対の分離ピン14,16の中間位置で搬送
路4の凹溝11には、部品分離用エアジェットノズル1
7が該凹溝の底面に対して垂直に開口しており、前記分
離ピンと連動した所定のタイミングで部品分離用エアが
吹き出すようになっている。まず第6図(a)の段階で
はチップフィーダ側分離ピン14が上昇、検査部側分離
ピン16が下降することにより、該分離ピン16より上
方(チップフィーダ側)にあるチップ部品1が隙間なく
搬送路4にためられる。次にフィーダ側分離ピン14が
下降してその先端でチップ部品1を押さえ付け、これに
より該分離ピン14位置の部品1が固定される(第6図
(b))。次に第6図(c)のように検査部分側離ピン
16が上昇し、同時に前記部品分離用エアジェットノズ
ル17からエアが吹き出すことにより、分離ピン16に
せき止められていた先端の1個の部品が下方へ滑走し、
部品の分離がなされる。その後、再び分離ピン16の下
降、分離ピン14の上昇で第6図(a)の状態に戻り、
このサイクルを繰り返してチップ部品が所定の間隔で1
個1個後段の検査部へ送られる。以上からも分るよう
に、分離ピン14,16の間隔Tは適用する部品1個の
長さ以上でかつ2個の長さ以下の間隔に設定される。部
品分離用エアジェットノズル17は部品搬送路4の凹溝
11および隣接部品との間で密着(静電気等による)し
て走行不能となって部品供給の歯抜けが生じるのを防止
するためのものである。なお、第5図で説明した部品搬
送を目的としたエアジェットノズル13は、部品の移動
と停止の間、具体的には前記分離機構部6と裏面側検査
部7bとの間、表面側および裏面側検査部7a,7bの
中間位置、表面側検査部7aと計数機構部8の中間位置
に設けられ、また同様に搬送を目的とした補助エアジェ
ットノズル19が分離機構部6の上方Sの区間に設けら
れる(第2図参照)。
The separation mechanism unit 6 provided at a suitable distance S in the transport direction following the component supply unit from the chip feeder 5 is connected to the transport path 4 as shown in FIGS. 6 (a) to 6 (c). Separation pins 14 and 16 having a pair of cushions that vertically move up and down and enter and leave the groove 11 are provided.
The parts that have continuously slid in 1 are separated one by one at a predetermined interval and sent to the inspection parts 7a, 7b of the next stage. The air jet nozzle 1 for component separation is provided in the concave groove 11 of the conveyance path 4 at an intermediate position between the pair of separation pins 14 and 16.
7 is opened perpendicularly to the bottom surface of the concave groove, and component separation air is blown out at a predetermined timing linked with the separation pin. First, at the stage of FIG. 6 (a), the chip feeder-side separation pin 14 rises and the inspection unit-side separation pin 16 descends, so that the chip component 1 above the separation pin 16 (chip feeder side) does not have a gap. It is stored in the transport path 4. Next, the feeder-side separation pin 14 descends and presses the chip component 1 with its tip, thereby fixing the component 1 at the position of the separation pin 14 (FIG. 6 (b)). Next, as shown in FIG. 6 (c), the inspection part side separation pin 16 rises, and at the same time, air is blown out from the component separation air jet nozzle 17, so that one of the tips held by the separation pin 16 is stopped. Parts slide down,
The parts are separated. After that, the separation pin 16 descends again and the separation pin 14 rises to return to the state of FIG. 6 (a),
By repeating this cycle, the chip parts are
Each piece is sent to the inspection section at the subsequent stage. As can be seen from the above, the distance T between the separating pins 14 and 16 is set to be equal to or more than the length of one component to be applied and equal to or less than the length of two components. The component-separating air jet nozzle 17 prevents contact between the concave groove 11 of the component transport path 4 and the adjacent component (due to static electricity or the like) to prevent traveling, resulting in missing of component supply teeth. Is. The air jet nozzle 13 for the purpose of carrying the parts described in FIG. 5 has the air jet nozzle 13 for moving and stopping the parts, specifically, between the separating mechanism part 6 and the back surface side inspection part 7b, on the front surface side and An auxiliary air jet nozzle 19 provided at an intermediate position between the back surface side inspection units 7a and 7b and an intermediate position between the front surface side inspection unit 7a and the counting mechanism unit 8 is similarly provided above the separation mechanism unit 6 above the separation mechanism unit 6. It is provided in the section (see FIG. 2).

表面側検査部7a、裏面側検査部7bには、斜光照明と
透過照明を組み合わせた斜光・透過照明装置およびテレ
ビカメラ装置が搬送路4をはさんで設けられ、画像処理
部により部品表面、裏面の外観検査がなされる。各検査
部には、第3図に示すように、前記分離機構部から1個
づつ滑走してきたチップ部品1を光学中心位置に一時停
止させるためのシャッタ20およびシャッタ確認センタ
18(第2図)が設けられている。このシャッタ20は
強化ガラスまたは鏡面仕上げのステンレス板等で構成さ
れる。ステンレス板の場合はその鏡面により照射光が全
反射し、画像上でこれが白く写り、チップ外観判別に影
響を与えないようになっている。また前述した凹溝11
のエッジ11aは、第3図、第4図で説明したテレビカ
メラの視野内の部分では、少くともテレビカメラ装置の
分解能(例えば約2/100mm)以下のエッジ精度を有
しており、これによって画像に凹溝のエッジのすじが出
ないようにしてある。
The front surface side inspection unit 7a and the back surface side inspection unit 7b are provided with an oblique light / transmissive illumination device and a TV camera device, which are a combination of oblique light illumination and transmissive illumination, across the conveyance path 4. The visual inspection of is done. As shown in FIG. 3, each inspection unit has a shutter 20 and a shutter confirmation center 18 (FIG. 2) for temporarily stopping the chip components 1 sliding one by one from the separating mechanism unit to the optical center position. Is provided. The shutter 20 is made of tempered glass, a mirror-finished stainless plate, or the like. In the case of a stainless plate, the irradiation light is totally reflected by its mirror surface, which appears white in the image, and does not affect the chip appearance determination. Further, the above-mentioned concave groove 11
The edge 11a has an edge accuracy of at least less than the resolution (for example, about 2/100 mm) of the TV camera device in the portion within the field of view of the TV camera described with reference to FIGS. The edges of the groove are not shown in the image.

チップ部品表裏面の光学検査後、例えば光電検出器およ
び可動ストッパピンから成る部品計数機構部8を経て最
下段の選別機構部9で良品、不良、検査不能(RI)の
3分類がなされる。選別機構部9では搬送路4は中央の
良品排出路22とその両側のRI排出路23、不良品排
出路24の3通路に分けられ、この通路を切り換えるた
めの一対のゲートプレート25,26が回転可能に設け
られている。前記画像処理部からの信号により、計数機
構部8と協働してソレノイドのON、OFFの動作で前
記3通路の切り換えが行われる。なお、第2図でゲート
プレート25,26が実線位置にある場合は良品排出路
22が開となっており、ゲート25が破線位置に倒れた
ときRI排出路23のみが開となって搬送路4と連通す
る。不良品排出路24が開のときはゲートプレート26
がRI排出路23側へ倒れ、他の排出路22,23は閉
となる。
After the optical inspection of the front and back surfaces of the chip component, for example, a component counting mechanism 8 including a photoelectric detector and a movable stopper pin, and a sorting mechanism 9 at the lowermost stage classify the product into non-defective products, defective products, and uninspectable products (RI). In the sorting mechanism section 9, the conveyance path 4 is divided into three passages, that is, a non-defective product discharge passage 22 in the center, an RI discharge passage 23 on both sides thereof, and a defective product discharge passage 24, and a pair of gate plates 25 and 26 for switching these passages are provided. It is rotatably installed. A signal from the image processing unit cooperates with the counting mechanism unit 8 to switch the three passages by turning the solenoid on and off. In FIG. 2, when the gate plates 25 and 26 are in the solid line position, the non-defective product discharge path 22 is open, and when the gate 25 falls to the broken line position, only the RI discharge path 23 is open and the transport path. Communicate with 4. When the defective product discharge path 24 is open, the gate plate 26
Falls toward the RI discharge path 23, and the other discharge paths 22 and 23 are closed.

(考案の効果) 以上説明したように本考案によれば、チップコンデンサ
等のチップ部品を透明な凹溝付きの搬送路上に沿ってエ
アジェットによって滑走せしめ、しかも1個づつ光学検
査部を通過し、画像処理部の判別信号を用いて選別機構
により自動的に良、不良を振り分けるようにしたので、
高速かつ正確な自動外観選別がなされる。搬送路に対す
る部品の摩擦、静電気発生等による部品付着はエアジェ
ット搬送を用いることにより防止され、スムーズに被検
査部品の投入、搬送ができる。実施例のように搬送路を
傾斜形とした場合は、部品の自重滑走をエアジェット搬
送に加えて補助的に利用でき、保守性、稼動安定性が向
上する。機構全体もきわめてシンプルで、誤動作が少な
く、従来の目視検査による非能率、検査レベルのバラツ
キ等の問題が解消されるといった種々の効果が得られ
る。
(Effect of the Invention) As described above, according to the present invention, chip components such as a chip condenser are slid by an air jet along a transparent conveying path having a concave groove, and each one passes through an optical inspection section. By using the discrimination signal of the image processing unit, the sorting mechanism automatically sorts good and bad.
Fast and accurate automatic appearance selection. Adhesion of parts to the transfer path due to friction of the parts and generation of static electricity is prevented by using air jet transfer, and the parts to be inspected can be smoothly introduced and transferred. When the transport path is inclined as in the embodiment, the component's own weight sliding can be used as an auxiliary in addition to the air jet transport, and the maintainability and operation stability are improved. The entire mechanism is also extremely simple, there are few malfunctions, and various effects such as the problems of inefficiency and inspection level variation caused by conventional visual inspection can be solved.

【図面の簡単な説明】[Brief description of drawings]

第1図は本考案の1実施例による自動外観検査・選別機
の部分的な側面図、第2図は第1図の矢視F方向からみ
たチップ部品搬送路の拡大正面図、第3図は本考案に係
る搬送路の検査部におけるシャッタ機構の正面図、第4
図は第3図のIV−IV線に沿った拡大断面図、第5図は第
4図のV−V線に沿った断面図で部品搬送用エアジェッ
トノズル部分における搬送路凹溝部を示した縦断面図、
第6図(a)〜(c)は部品分離機構部を分離ピンの動
作順序にしたがって示した側面断面図である。 1…チップ部品、4…搬送路、 5…チップフィーダ、6…部品分離機構部、 7a,7b…検査部、8…計数機構部、 9…選別機構部、10…検査機本体、 11…凹溝、11a…エッジ、12…蓋板、 20…シャッタ、29…サイドガラス、 28…円形ガラス。
FIG. 1 is a partial side view of an automatic visual inspection / sorting machine according to an embodiment of the present invention, FIG. 2 is an enlarged front view of a chip part conveying path as seen from the direction of arrow F in FIG. 1, and FIG. FIG. 4 is a front view of the shutter mechanism in the inspection section of the transport path according to the present invention, FIG.
FIG. 5 is an enlarged sectional view taken along line IV-IV in FIG. 3, and FIG. 5 is a sectional view taken along line VV in FIG. Longitudinal section,
6 (a) to 6 (c) are side sectional views showing the component separating mechanism in the order of operation of the separating pins. DESCRIPTION OF SYMBOLS 1 ... Chip parts, 4 ... Conveyance path, 5 ... Chip feeder, 6 ... Component separation mechanism part, 7a, 7b ... Inspection part, 8 ... Counting mechanism part, 9 ... Sorting mechanism part, 10 ... Inspection machine main body, 11 ... Recessed Groove, 11a ... Edge, 12 ... Lid plate, 20 ... Shutter, 29 ... Side glass, 28 ... Circular glass.

Claims (2)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】チップ部品を搬送路に沿って走行させ、こ
の走行途中で前記搬送路上に設けた斜光・透過照明装置
およびテレビカメラでチップ部品の外観を検査する自動
外観検査機において、部品投入端から部品排出端まで伸
長した搬送路と、前記搬送路に沿って形成された凹形部
品通過溝と、前記凹形部品通過溝の溝内部に開口した複
数個の部品搬送用エアジェットノズルと、部品搬送方向
に離隔して前記搬送路の上部付近に設けられかつ該搬送
路に対して垂直に前記凹形部品通過溝に出入する一対の
部品分離ピンと、前記一対の部品分離ピンの間の前記搬
送路に開口した部品分離用エアジェットノズルとを有
し、前記凹形部品通過溝は、少くとも前記テレビカメラ
に対応する箇所では、透明部材でかつ鋭利なエッジを有
するように形成され、かつそのエッジ精度を少くとも前
記テレビカメラの分解能以下の精度としたことを特徴と
するチップ部品自動外観検査機の部品搬送機構。
1. An automatic appearance inspection machine for inspecting the appearance of a chip component with a oblique-light / transmissive illumination device and a television camera provided on the transportation route while the chip component is traveling along the transportation route. A conveyance path extending from an end to a part discharge end, a concave component passage groove formed along the conveyance passage, and a plurality of component-conveying air jet nozzles opened inside the groove of the concave component passage groove Between a pair of component separating pins that are provided in the vicinity of the upper part of the conveying path and are inserted into and out of the concave component passing groove perpendicular to the conveying path, and between the pair of component separating pins. An air jet nozzle for separating parts, which is opened in the conveyance path, and the concave part passage groove is formed of a transparent member and has a sharp edge at least at a position corresponding to the television camera. And parts conveying mechanism of the chip component automatic visual inspection machine, characterized in that the sub-resolution precision of the television camera at least the edge accuracy.
【請求項2】前記一対の部品分離ピンの間隔は、被搬送
物であるチップ部品の1個の長さ以上でかつ2個の長さ
以下の間隔に設定され、これらの分離ピンの交互動作で
連続した複数のチップ部品が1個づつ分離されて送出さ
れることを特徴とする実用新案登録請求の範囲第1項に
記載したチップ部品自動外観検査機の部品搬送機構。
2. The distance between the pair of component separation pins is set to be equal to or greater than one length and equal to or less than two lengths of a chip component that is an object to be conveyed, and the separation pins alternately operate. 2. A component transfer mechanism for an automatic chip component appearance inspection machine as set forth in claim 1, wherein a plurality of continuous chip components are separated and delivered one by one.
JP1987161772U 1987-08-28 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine Expired - Lifetime JPH065614Y2 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (en) 1987-10-22 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine
KR1019890002517A KR0122739B1 (en) 1987-08-28 1989-02-28 Method and measuring device for classification of chip-type component and checking of chip-type component's aspect by optical

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987161772U JPH065614Y2 (en) 1987-10-22 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine

Publications (2)

Publication Number Publication Date
JPH0166061U JPH0166061U (en) 1989-04-27
JPH065614Y2 true JPH065614Y2 (en) 1994-02-09

Family

ID=31445003

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987161772U Expired - Lifetime JPH065614Y2 (en) 1987-08-28 1987-10-22 Component transport mechanism for automatic chip component visual inspection machine

Country Status (1)

Country Link
JP (1) JPH065614Y2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002341407A (en) * 2001-05-15 2002-11-27 Shibuya Kogyo Co Ltd Device for photographing object to be inspected
CN113514755B (en) * 2021-06-11 2023-06-27 天津津航计算技术研究所 Automatic detection device and method for electrical properties of PCB (printed circuit board) surrounding frame

Also Published As

Publication number Publication date
JPH0166061U (en) 1989-04-27

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