JPH0652291B2 - Method for determining the terminal insertion state of IC component on mounting board - Google Patents

Method for determining the terminal insertion state of IC component on mounting board

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Publication number
JPH0652291B2
JPH0652291B2 JP1104191A JP10419189A JPH0652291B2 JP H0652291 B2 JPH0652291 B2 JP H0652291B2 JP 1104191 A JP1104191 A JP 1104191A JP 10419189 A JP10419189 A JP 10419189A JP H0652291 B2 JPH0652291 B2 JP H0652291B2
Authority
JP
Japan
Prior art keywords
power supply
terminal
value
component
reference value
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1104191A
Other languages
Japanese (ja)
Other versions
JPH02281162A (en
Inventor
秋則 都築
善之 西城
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hioki EE Corp
Original Assignee
Hioki EE Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hioki EE Corp filed Critical Hioki EE Corp
Priority to JP1104191A priority Critical patent/JPH0652291B2/en
Publication of JPH02281162A publication Critical patent/JPH02281162A/en
Publication of JPH0652291B2 publication Critical patent/JPH0652291B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【発明の詳細な説明】 産業上の利用分野 本発明はプリント基板に実装したIC部品の端子の挿入
状態を判定する方法に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for determining an insertion state of a terminal of an IC component mounted on a printed board.

従来の技術 近年、IC部品を実装したプリント基板は小形化と量産
化に適するため、種々の電子装置に採用され、需要が著
しく増加している。しかし、その使用に際してはIC部
品の実装状態を常に厳しく検査する必要がある。何故な
ら、適正に実装されていないと、IC部品の単なる損傷
に止まらず、装置全体の破壊に至ったりするからであ
る。このため、IC部品の各端子をプリント基板のリー
ド穴に挿入し、半田付けして実装した後、その挿入状態
が正常か、誤りかを検査する。尤も、一般にIC部品は
その表裏を明確に区別できる形状となっており、電源端
子と接地端子とは対称の位置にある。従って、通常は電
源端子と接地端子とが逆に挿入されていないか検査すれ
ば済むことになる。
2. Description of the Related Art In recent years, a printed circuit board on which an IC component is mounted is suitable for miniaturization and mass production, so that it has been adopted in various electronic devices and the demand has increased remarkably. However, it is necessary to strictly inspect the mounting state of the IC component when using it. This is because if not properly mounted, the IC device is not only damaged but also the entire device is destroyed. Therefore, after each terminal of the IC component is inserted into the lead hole of the printed board and soldered and mounted, it is inspected whether the inserted state is normal or incorrect. However, in general, IC parts are shaped so that the front side and the back side thereof can be clearly distinguished, and the power supply terminal and the ground terminal are in symmetrical positions. Therefore, normally, it suffices to inspect whether the power supply terminal and the ground terminal are reversely inserted.

例えば、インサーキットテスタを用いる場合、一般には
IC部品に含まれるTTL回路等に付いている入力クラ
ンプダイオードやトランジスタのコレクタと接地間にあ
るサブストレートダイオード等の保護ダイオードが作る
電流路を利用し、プローブの接触によりIC部品の電源
端子又は接地端子と入力端子又は出力端子との間に定電
流源を与えて電流を流し、その端子間の電圧(電位差)
を測定して正常挿入か誤挿入(逆挿入)かを検査する。
即ち、正常挿入時の端子間電圧を先に測定して基準に
し、その基準電圧と対応する検査による測定電圧とを比
較して、両電圧の違いから誤挿入を検出する。ところ
が、プリント基板に実装されたIC部品の場合、測定に
はIC部品の端子につながっている他の回路が影響し、
正常挿入、誤挿入の電圧値に僅かの差、例えば数mVし
か差が発生しないことが多い。このため、インサーキッ
トテスタを用いても、実装基板におけるIC部品の端子
誤挿入を検出するのは容易でない。
For example, when using an in-circuit tester, a current path created by a protection diode such as an input clamp diode attached to a TTL circuit included in an IC component or a substrate diode between a collector of a transistor and ground is generally used, A constant current source is applied between the power supply terminal or ground terminal of the IC component and the input terminal or output terminal by the contact of the probe to flow a current, and the voltage (potential difference) between the terminals.
To check whether the insertion is normal or incorrect (reverse insertion).
That is, the voltage between terminals at the time of normal insertion is first measured and used as a reference, and the reference voltage is compared with the voltage measured by the corresponding test to detect erroneous insertion from the difference between the two voltages. However, in the case of IC components mounted on a printed circuit board, other circuits connected to the terminals of the IC components affect the measurement,
In many cases, there is a slight difference between the voltage values of normal insertion and erroneous insertion, for example, only a few mV. Therefore, even if the in-circuit tester is used, it is not easy to detect the incorrect terminal insertion of the IC component on the mounting board.

そこで、本出願人は先に昭和62年特許願第32759
8号として、検査の対象となるプリント基板に実装した
電源端子、接地端子、入力端子、及び出力端子を有する
IC部品に対し、両電源電圧の和はそのIC部品に含ま
れるダイオードの立ち上り電圧より大きいが、各電源電
圧単独ではその立ち上り電圧より小さくなる第1電源と
第2電源とを用い、第1電源電圧を電源端子と接地端子
とに印加し、第2電源電圧を電流計を介して電源端子又
は接地端子と入力端子又は出力端子とに印加し、電流計
の指示により実装基板上のIC部品の端子挿入状態を検
出し、その電流値と先に測定しておいた基準となる正常
挿入時の電流値とを比較し、正常挿入時と誤挿入時とで
電流値が大きく異なることを利用して正常挿入、誤挿入
を判定する方法を提示し、実施する場合には第2電源と
電流計を接続するランド(リード穴の周囲にあるパター
ン)を選び、正常挿入時に電流計が指示する測定値を大
きくし、誤挿入時には小さくほぼ零にすると好都合にな
る旨を述べた。
Therefore, the present applicant previously filed a patent application No. 32759 in 1987.
As for No. 8, for an IC component that has a power supply terminal, a ground terminal, an input terminal, and an output terminal mounted on the printed circuit board to be inspected, the sum of both power supply voltages is calculated from the rising voltage of the diode included in the IC component. A first power supply and a second power supply, which are large but each power supply voltage alone is smaller than its rising voltage, are used, the first power supply voltage is applied to the power supply terminal and the ground terminal, and the second power supply voltage is applied via an ammeter. It is applied to the power supply terminal or the ground terminal and the input terminal or the output terminal, the terminal insertion state of the IC component on the mounting board is detected by the instruction of the ammeter, and the current value and the normality which is the standard previously measured. The method of comparing the current value at the time of insertion with the current value at the time of normal insertion and the difference between the current value at the time of incorrect insertion and that at the time of incorrect insertion is presented. And ammeter connected Select command (pattern surrounding the lead holes), ammeter increases the measured value to be indicated, he said to the effect to be advantageously during erroneous insertion small to substantially zero in the normal insertion.

発明が解決しようとする課題 しかしながら、このように実装基板上のIC部品の端子
挿入状態を判定する際に、第2電源等を接続するランド
を限定しても、実際には誤挿入でも例外的に周囲回路の
影響等によりある程度電流が流れるものがあり、或いは
正常に挿入されていてもほとんど電流が流れなかったり
するために問題がある。なお、後者の場合には例外的に
IC部品の中に通常含むべき保護ダイオードを入れない
からである。
However, when determining the terminal insertion state of the IC component on the mounting board as described above, even if the land to which the second power source or the like is connected is limited, even if the erroneous insertion is actually made, it is exceptional. There is a problem in that some current flows to some extent due to the influence of peripheral circuits, or almost no current flows even if it is inserted properly. This is because, in the latter case, exceptionally, the protection diode which should normally be included in the IC component is not inserted.

本発明はこのような従来の問題点を着目してなされたも
のであり、種々のIC部品や実装基板に対し、正確に実
装基板上のIC部品の端子挿入状態を判定する方法を提
供することを目的とする。
The present invention has been made in view of such conventional problems, and provides a method for accurately determining a terminal insertion state of an IC component on a mounting board for various IC components and a mounting board. With the goal.

課題を解決するための手段 上記目的を達成するための手段を、以下実施例に対応す
る第1図及び第2図を用いて説明する。
Means for Solving the Problems Means for achieving the above object will be described below with reference to FIGS. 1 and 2 corresponding to the embodiments.

この実装基板上のIC部品の端子挿入状態判定方法はプ
リント基板に実装した電源端子18、接地端子20、入
力端子22、及び出力端子24を有するIC部品10に
対し、両電源電圧の和はそのIC部品10に通常含まれ
る保護ダイオード26、28、30、32の立ち上り電
圧より大きいが、各電源電圧単独ではその立ち上り電圧
より小さくなる第1電源12と第2電源14とを用い、
第1電源電圧を電源端子18と接地端子20とに印加
し、第2電源電圧を電流計16を介して電源端子18又
は接地端子20と入力端子22又は出力端子24とに印
加し、電流計16が指示した測定値により、正常挿入時
の測定値から基準値を設定し、その値と検査時の測定値
を比較して、正常挿入、誤挿入の判定を行なうものであ
る。その際、上記正常挿入時の測定値が一定値以下のも
のと一定値より大きいものに分け、前、後者に対応する
第1、第2基準値を、第1基準値より第2基準値を大き
くしてそれぞれ設定し、それらの基準値と検査時の測定
値を比較し、前者に対応する検査時の測定値が第1基準
値以下の時には正常挿入、第1基準値より大きい時には
誤挿入と判定し、又後者に対応する検査時の測定値が第
2基準値以上の時には正常挿入、第2基準値より小さい
時には誤挿入と判定する。
The method of determining the terminal insertion state of the IC component on the mounting board is the sum of the two power supply voltages for the IC component 10 having the power supply terminal 18, the ground terminal 20, the input terminal 22, and the output terminal 24 mounted on the printed board. Using the first power supply 12 and the second power supply 14 which are larger than the rising voltage of the protection diodes 26, 28, 30, 32 normally included in the IC component 10 but smaller than the rising voltage at each power supply voltage alone,
The first power supply voltage is applied to the power supply terminal 18 and the ground terminal 20, and the second power supply voltage is applied to the power supply terminal 18 or the ground terminal 20 and the input terminal 22 or the output terminal 24 via the ammeter 16 to obtain the ammeter. According to the measurement value indicated by 16, a reference value is set from the measurement value at the time of normal insertion, and that value is compared with the measurement value at the time of inspection to determine normal insertion or erroneous insertion. At that time, the measured values at the time of normal insertion are divided into those below a certain value and those above a certain value, and the first and second reference values corresponding to the former and the latter are changed from the first reference value to the second reference value. Set larger and set each, and compare those reference values with the measurement values at the time of inspection, normal insertion when the measurement value at the time of inspection corresponding to the former is less than the first reference value, incorrect insertion when it is greater than the first reference value. If the measured value at the time of inspection corresponding to the latter is equal to or more than the second reference value, it is determined to be normal insertion, and if it is smaller than the second reference value, it is determined to be erroneous insertion.

作用 上記のように構成すると、正常挿入時の測定電流値が一
定値以下のものと一定値より大きいものに分け、前、後
者に対応する第1、第2基準値を設定する際にそれぞれ
許容範囲を考慮した上、第1基準値より第2基準値を大
きく設定することができる。そこで、前者に対応する検
査時の測定値が第1基準値以下の時にはほとんど電流は
流れていないが、そのIC部品の所定位置にダイオード
が入っていない、或いはダイオードが逆方向に入ってい
る等してダイオード特性を示さないものとして、正常挿
入であると判定できる。更に、検査時の測定値が第1基
準値より大きい時には本来はほとんど電流が流れないは
ずのものであるのに、ある程度の大きさを有する電流が
流れたのであるから、誤挿入であると判定できる。又、
後者に対応する検査時の測定値が第2基準値以上の時に
は明らかに大きな電流が流れたのであるから正常挿入で
あると判定できる。更に、検査時の測定値が第2基準値
より小さい時にはある程度の電流は流れているが、予定
したものより小さく、誤挿入であると判定できる。
Operation With the above configuration, the measured current value at the time of normal insertion is divided into those below a certain value and those above a certain value, and each is allowed when setting the first and second reference values corresponding to the former and latter. In consideration of the range, the second reference value can be set larger than the first reference value. Therefore, when the measured value at the time of inspection corresponding to the former is less than the first reference value, almost no current flows, but there is no diode in the predetermined position of the IC component, or the diode is in the reverse direction. Then, it can be determined that the insertion is normal when the diode characteristic is not shown. Further, when the measured value at the time of the inspection is larger than the first reference value, the current should have hardly flowed, but the current having a certain size has flowed, so it is determined that the insertion is incorrect. it can. or,
When the measured value at the time of inspection corresponding to the latter is equal to or higher than the second reference value, a large current obviously flows, so that it can be determined that the insertion is normal. Furthermore, when the measured value at the time of inspection is smaller than the second reference value, a certain amount of current is flowing, but it is smaller than expected and it can be determined that the insertion is incorrect.

実施例 以下、添付図面に基づいて、本発明の実施例を説明す
る。
Embodiment An embodiment of the present invention will be described below with reference to the accompanying drawings.

第1図は本発明による実装基板上のIC部品の端子挿入
状態判定方法をIC部品を実装した基板に適用し、その
端子間電流を測定する回路図である。図中、10はプリ
ント基板に実装したIC部品、12は第1電源、14は
第2電源、及び16は電流計である。なお、図にはプリ
ント基板に対してIC部品10を正常挿入した場合を示
している。このIC部品10はその外部に電源端子1
8、接地端子20、入力端子22、及び出力端子24を
有する。しかも、その内部には通常第2図(a)に示すよ
うに電源、接地、出力の各端子18、20、24に対し
ては等価回路的に2個の保護ダイオード26、28を含
んでいる。但し、両端子18、20の間に、各カソード
を電源端子側に向けて直列に接続した上、その中間点を
更に出力端子24と接続する。又、第2図(b)に示すよ
うに電源、接地、入力の各端子18、20、22に対し
ては等価回路的に2個の保護ダイオード30、32を含
んでいる。但し、両ダイオード30、32は電源、接地
の両端子18、20の間に、各カソードを電源端子側に
向けて直列に接続した上、その中間点を入力端子22に
接続する。
FIG. 1 is a circuit diagram in which the method for determining the terminal insertion state of an IC component on a mounting substrate according to the present invention is applied to a substrate on which an IC component is mounted and the current between the terminals is measured. In the figure, 10 is an IC component mounted on a printed circuit board, 12 is a first power supply, 14 is a second power supply, and 16 is an ammeter. The figure shows a case where the IC component 10 is normally inserted in the printed circuit board. This IC component 10 has a power supply terminal 1 on the outside.
It has 8, a ground terminal 20, an input terminal 22, and an output terminal 24. Moreover, as shown in FIG. 2 (a), two protection diodes 26 and 28 are normally included in the inside of the power supply, ground and output terminals 18, 20 and 24 in an equivalent circuit. . However, the cathodes are connected in series between both terminals 18 and 20 toward the power supply terminal side, and the intermediate point is further connected to the output terminal 24. Further, as shown in FIG. 2 (b), the power supply, ground, and input terminals 18, 20 and 22 include two protection diodes 30 and 32 in an equivalent circuit. However, both diodes 30 and 32 have their cathodes connected in series between the power supply and ground terminals 18 and 20 so as to face the power supply terminal side, and the midpoint thereof is connected to the input terminal 22.

このようなIC部品10のプリント基板に対する各端子
18、20、22、及び24の挿入状態を検査するには
第1電源12を電源端子18と接地端子20とに接続
し、第2電源14を電流計16を介して電源端子18又
は接地端子20と入力端子22又は出力端子24に接続
する。尤も、正常挿入時には第2図(a)の回路構成とな
るが、誤挿入(逆挿入)されていると、第2図(b)の回
路構成となり、第1電源12は位置が入れ代った電源端
子18と接地端子20に接続され、第2電源14と電流
計16は接地端子20と入力端子22に接続される。こ
れらの回路構成によりIC部品10の端子挿入状態の判
定、即ち電源端子18と接地端子20との逆挿入の検出
に上述したダイオードの正、逆方向特性を利用すること
ができる。そこで、両電源電圧の和は各ダイオード2
6、28、30、32の立ち上り電圧より大きくする
が、各電源電圧単独ではその立ち上り電圧より小さくす
る。例えばシリコンダイオードであれば、その立ち上り
電圧が0.6V程であるから、第1電源12の電圧を
0.4V程に、第2電源14の電圧を0.2V程にす
る。
In order to inspect the insertion state of each terminal 18, 20, 22, and 24 on the printed circuit board of the IC component 10 as described above, the first power supply 12 is connected to the power supply terminal 18 and the ground terminal 20, and the second power supply 14 is connected. The power supply terminal 18 or the ground terminal 20 and the input terminal 22 or the output terminal 24 are connected via the ammeter 16. However, the circuit configuration shown in FIG. 2 (a) is normally inserted, but if it is inserted incorrectly (reverse insertion), the circuit configuration shown in FIG. 2 (b) is obtained, and the positions of the first power supply 12 are changed. The power supply terminal 18 and the ground terminal 20 are connected, and the second power supply 14 and the ammeter 16 are connected to the ground terminal 20 and the input terminal 22. With these circuit configurations, it is possible to utilize the forward and reverse characteristics of the diode described above for determining the terminal insertion state of the IC component 10, that is, for detecting the reverse insertion of the power supply terminal 18 and the ground terminal 20. Therefore, the sum of both power supply voltages is the diode 2
6, 28, 30 and 32 are higher than the rising voltage, but each power supply voltage alone is lower than the rising voltage. For example, in the case of a silicon diode, since the rising voltage is about 0.6V, the voltage of the first power supply 12 is set to about 0.4V and the voltage of the second power supply 14 is set to about 0.2V.

このため、正常挿入時には保護ダイオード28の順方向
に両電源電圧の和が加わり、それが立ち上るので、電流
計16には矢印方向に大きな電流が流れる。又、逆挿入
時には保護ダイオード30の順方向には第2電源電圧が
加わり、保護ダイオード32には逆方向に両電源電圧の
和が加わるため、それらは立ち上らず、電流計16には
矢印方向に点線に沿ってほんの僅かの電流が流れるだけ
である。
Therefore, at the time of normal insertion, the sum of both power supply voltages is applied in the forward direction of the protection diode 28 and rises, so that a large current flows in the ammeter 16 in the arrow direction. In addition, since the second power supply voltage is applied in the forward direction of the protection diode 30 and the sum of both power supply voltages is applied in the reverse direction to the protection diode 32 during reverse insertion, they do not rise, and the ammeter 16 is indicated by the arrow. Only a small amount of current flows in the direction along the dotted line.

しかしながら、実際には誤挿入であっても、例外的に周
囲回路の影響等によりある程度の電流が流れるものがあ
る。又、正常に挿入されていても、例外的に保護ダイオ
ードを入れないため、ダイオード特性を示さずに、ほと
んど電流が流れないものがある。結局、IC部品10は
正常挿入、誤挿入にかかわらず、電流計16にはほとん
ど電流が流れないものと、ある程度流れるものとの2通
りに大別できる。
However, in reality, even if the insertion is incorrect, some current may exceptionally flow a certain amount of current due to the influence of peripheral circuits. In addition, even if it is inserted normally, there is an exception that the protection diode is not inserted, so that there is a diode that does not exhibit diode characteristics and hardly flows a current. After all, the IC component 10 can be roughly classified into two types, that is, a current hardly flows through the ammeter 16 and a current flowing through the ammeter 16 regardless of whether the IC component 10 is normally or incorrectly inserted.

そこで、実装基板におけるIC部品10の各端子18、
20、22、24の挿入状態を判定する際に、先ず良品
基板で正常挿入時の電流を測定し、その値が一定値以下
例えば10μA以下のものと、一定値10μAより大き
いものに分ける。次に、前、後者に応じ、検査時の測定
値と比較するため、第1、第2基準値をそれぞれ設定す
る。その際、第1、第2の両基準値はいずれも正常挿入
時の測定電流値に対して許容範囲を考慮し、例えば第1
基準値は正常挿入時の測定電流値に関係なく50μAに
し、第2基準値は電流値に許容値を付加して第1基準値
よりも大きく、例えば80μAに設定する。そして、前
者に対応する検査時の測定値が第1基準値以下の時には
正常挿入、その値より大きい時には誤挿入と判定する。
又、後者に対応する検査時の測定値が第2基準値以上の
時には正常挿入、その値より小さい時には誤挿入と判定
する。例えば検査の対象となるIC部品10が50μA
を基準値とするものであると、測定電流値が8μAであ
れば、第3図(a)の棒グラフに示すようにそれは正常挿
入領域にあるため、正常挿入されていると判定できる。
又、IC部品10が80μAを基準値とするものである
と、測定電流値が100μAであれば、第3図(b)の棒
グラフに示すようにやはり正常挿入領域にあるため、正
常挿入されていると判定できる。このように検査の対象
となるIC部品10を正常挿入時の測定値に応じて、基
準値を異にする2クループに分け、クループ毎に基準値
を境界にして正常挿入、誤挿入の判定を行うと、判定が
一層正確に行える。従って、IC部品のロット違いによ
る誤判定や温度特性に基づく誤判定が少なくなる。
Therefore, each terminal 18 of the IC component 10 on the mounting board,
When determining the insertion state of 20, 22, and 24, first, the current at the time of normal insertion is measured on a non-defective substrate, and the value is divided into a certain value or less, for example, 10 μA or less and a value larger than the certain value, 10 μA. Next, in order to compare with the measurement value at the time of inspection, the first and second reference values are set according to the former and latter cases. At that time, both the first and second reference values consider the allowable range with respect to the measured current value at the time of normal insertion, for example, the first reference value.
The reference value is set to 50 μA regardless of the measured current value at the time of normal insertion, and the second reference value is set larger than the first reference value by adding an allowable value to the current value, for example, 80 μA. Then, when the measured value at the time of inspection corresponding to the former is less than or equal to the first reference value, it is determined that the insertion is normal, and when it is greater than that value, it is determined that the insertion is incorrect.
If the measured value at the time of inspection corresponding to the latter is equal to or larger than the second reference value, it is determined as normal insertion, and if it is smaller than that value, it is determined as incorrect insertion. For example, the IC component 10 to be inspected is 50 μA
When the measured current value is 8 μA, it can be determined that the insertion is normally performed because it is in the normal insertion region as shown in the bar graph of FIG. 3 (a).
If the IC component 10 has a reference value of 80 μA, if the measured current value is 100 μA, it is in the normal insertion area as shown in the bar graph of FIG. It can be determined that there is. In this way, the IC component 10 to be inspected is divided into two croups having different reference values according to the measured values at the time of normal insertion, and normal insertion or erroneous insertion is determined for each group with the reference value as a boundary. If done, the determination can be made more accurately. Therefore, erroneous determinations due to different lots of IC parts and erroneous determinations based on temperature characteristics are reduced.

なお、一般にはプリント基板にIC部品10のみを単品
で実装することはほとんど無く、その電源端子18と接
地端子20との間に、第4図に示すようにセラミックコ
ンデンサや電解コンデンサ等のバイパスコンデンサ34
が接続されている。この場合にはその(a)に示すように
先ず第1電源12を接続して電圧を印加し、コンデンサ
34を充電して過渡現象を除いた後、第2電源14と電
流計16を接続して更に電圧を印加するという手順を踏
むとよい。
Generally, it is rare to mount only the IC component 10 on a printed circuit board as a single component, and a bypass capacitor such as a ceramic capacitor or an electrolytic capacitor is provided between the power supply terminal 18 and the ground terminal 20 as shown in FIG. 34
Are connected. In this case, as shown in (a), first, the first power source 12 is connected to apply a voltage, the capacitor 34 is charged to eliminate the transient phenomenon, and then the second power source 14 and the ammeter 16 are connected. It is advisable to take the procedure of further applying a voltage.

このような実装基板上のIC部品の端子挿入状態判定方
法はインサーキットテスタに適用することができる。そ
の際、インサーキットテスタを構成する演算装置例えば
マイクロコンピュータのROMに、第5図及び第6図に
示すような端子挿入状態判定用のサブルーチンを付加し
た処理プログラムを格納する。なお、第5図は基準値設
定用サブルーチンを示すP1〜P4のステップから成る
フローチャート、第6図は設定した基準値に基づく判定
用サブルーチンを示すP5〜P11のステップから成るフ
ローチャートである。この基準値設定用サブルーチンを
実行するには、先ずP1で、IC部品を正常挿入してあ
る良品の実装基板を用い、第1図又は第4図に示す回路
構成により、電流を計測してデータを吸収する。次にP
2へ行く。P2では計測電流値が一定値例えば10μA
以下か判断する。YESの場合はP3へ、NOの場合は
P4へ行く。P3ではスレッシュ値たる第1基準値を算
出し、例えば50μAに設定する。又、P4では第2基
準値を算出し、例えば80μAに設定する。
Such a method for determining the terminal insertion state of the IC component on the mounting board can be applied to the in-circuit tester. At that time, a processing program to which a subroutine for determining the terminal insertion state as shown in FIGS. 5 and 6 is added is stored in the ROM of an arithmetic unit such as a microcomputer which constitutes the in-circuit tester. Note that FIG. 5 is a flow chart including steps P1 to P4 showing a reference value setting subroutine, and FIG. 6 is a flow chart including steps P5 to P11 showing a determination subroutine based on the set reference value. In order to execute this reference value setting subroutine, first, at P1, a good mounting board in which IC components are normally inserted is used, and the current is measured by the circuit configuration shown in FIG. 1 or 4 to obtain data. Absorbs. Then P
Go to 2. In P2, the measured current value is a constant value, for example 10 μA
Determine if If YES, go to P3, and if NO, go to P4. At P3, a first reference value that is a threshold value is calculated and set to, for example, 50 μA. In P4, the second reference value is calculated and set to 80 μA, for example.

次に、設定した第1、第2基準値に基づき、判定用サブ
ルーチンを実行するには、先ずP5で、検査の対象とな
る実装基板が第1基準値によるものか判断する。YES
の場合はP6へ、NOの場合にはP10へ行く。P6では
計測値と第1基準値を比較する。次にP7へ行く。P7
では計測値が第1基準値以下か判断する。YESの場合
はP8へ行き、GOOD即ち正常挿入であると判定す
る。NOの場合はP9へ行き、NG即ち誤挿入であると
判定する。P10でも計測値と第2基準値を比較し、P11
へ行く。P11では計測値が第2基準値以上か判断する。
YESの場合はP8へ、NOの場合はP9へ行く。この
結果、実装基板におけるIC部品の端子挿入状態の判定
を高速化することができる。
Next, in order to execute the determination subroutine based on the set first and second reference values, first in P5, it is determined whether or not the mounting substrate to be inspected has the first reference value. Yes
If NO, go to P6, and if NO, go to P10. At P6, the measured value and the first reference value are compared. Then go to P7. P7
Then, it is determined whether the measured value is less than or equal to the first reference value. If YES, go to P8 and determine GOOD, that is, normal insertion. If NO, go to P9 and determine NG, that is, erroneous insertion. Even on P10, the measured value and the second reference value are compared, and P11
Go to At P11, it is determined whether the measured value is the second reference value or more.
If YES, go to P8, and if NO, go to P9. As a result, it is possible to speed up the determination of the terminal insertion state of the IC component on the mounting board.

発明の効果 以上説明した本発明によれば、検査の対象となるIC部
品を正常挿入時の測定値に応じて基準値を異にする2グ
ループに分け、グループ毎に基準値を境界にして正常挿
入、誤挿入の判定を行うため、種々のIC部品や実装基
板に対し、IC部品の挿入状態をを正確に判定すること
ができる。
EFFECTS OF THE INVENTION According to the present invention described above, the IC component to be inspected is divided into two groups having different reference values according to the measurement values at the time of normal insertion, and the reference values are used as boundaries for each group to perform normal operation. Since it is determined whether the IC component has been inserted or erroneously inserted, it is possible to accurately determine the insertion state of the IC component for various IC components or mounting boards.

【図面の簡単な説明】[Brief description of drawings]

第1図は本発明による実装基板上のIC部品の端子挿入
状態判定方法をIC部品を実装した基板に適用し、その
端子間電流を測定する回路図、第2図は同IC部品にお
ける一般的な内部回路を示す図である。 第3図は同判定方法による電流測定後の処理を説明する
図である。 第4図は同判定方法をIC部品と共にコンデンサを実装
した基板に適用し、その端子間電流の測定に至る過程を
示す回路図である。 第5図は同判定方法を適用したインサーキットテスタに
採用する基準値設定用サブルーチンを示すフローチャー
ト、第6図はその基準値に基づく判定用サブルーチンを
示すフローチャートである。 10…IC部品、12、14…第1、第2電源、16…
電流計、18、20、22、24…電源、接地、入力、
出力の各端子、26、28、30、32…保護ダイオー
FIG. 1 is a circuit diagram in which the method for determining the terminal insertion state of an IC component on a mounting substrate according to the present invention is applied to a substrate on which an IC component is mounted, and the inter-terminal current is measured, and FIG. 2 is a general circuit diagram of the IC component. It is a figure which shows a different internal circuit. FIG. 3 is a diagram for explaining processing after current measurement by the determination method. FIG. 4 is a circuit diagram showing a process of applying the same determination method to a substrate on which a capacitor is mounted together with an IC component and measuring the inter-terminal current. FIG. 5 is a flow chart showing a reference value setting subroutine adopted in an in-circuit tester to which the same determination method is applied, and FIG. 6 is a flow chart showing a determination subroutine based on the reference value. 10 ... IC parts, 12, 14 ... First and second power supplies, 16 ...
Ammeter, 18, 20, 22, 24 ... power supply, ground, input,
Output terminals, 26, 28, 30, 32 ... Protection diodes

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】プリント基板に実装した電源端子、接地端
子、入力端子、及び出力端子を有するIC部品に対し、
両電源電圧の和はそのIC部品に通常含まれる保護ダイ
オードの立ち上り電圧より大きいが、各電源電圧単独で
はその立ち上り電圧より小さくなる第1電源と第2電源
とを用い、第1電源電圧を電源端子と接地端子とに印加
し、第2電源電圧を電流計を介して電源端子又は接地端
子と入力端子又は出力端子とに印加し、電流計が指示し
た測定値により、正常挿入時の測定値から基準値を設定
し、その値と検査時の測定値を比較して、正常挿入、誤
挿入を判定する実装基板上のIC部品の端子挿入状態判
定方法において、上記正常挿入時の測定値が一定値以下
のものと一定値より大きいものに分け、前、後者に対応
する第1、第2基準値を、第1基準値より第2基準値を
大きくしてそれぞれ設定し、それらの基準値と検査時の
測定値を比較し、前者に対応する検査時の測定値が第1
基準値以下の時には正常挿入、その値より大きい時には
誤挿入と判定し、又後者に対応する検査時の測定値が第
2基準値以上の時には正常挿入、その値より小さい時に
は誤挿入と判定することを特徴とする実装基板上のIC
部品の端子挿入状態判定方法。
1. An IC component having a power supply terminal, a ground terminal, an input terminal, and an output terminal mounted on a printed circuit board,
The sum of the two power supply voltages is higher than the rising voltage of the protection diode normally included in the IC component, but each power supply voltage alone uses the first power supply and the second power supply that are smaller than the rising voltage. Apply the second power supply voltage to the power supply terminal or the ground terminal and the input terminal or the output terminal through the ammeter, and the measurement value indicated by the ammeter. In the method for determining the terminal insertion state of the IC component on the mounting board that determines the normal insertion and the incorrect insertion by setting a reference value from the It is divided into those below a certain value and those above a certain value, and the first and second reference values corresponding to the former and the latter are respectively set by making the second reference value larger than the first reference value, and those reference values are set. And the measured value at the time of inspection are compared, 'S measurements during a test corresponding to the first
If it is less than the reference value, it is determined as normal insertion, and if it is greater than that value, it is determined as incorrect insertion. If the measurement value corresponding to the latter is greater than or equal to the second reference value, it is determined as normal insertion, and if it is less than that value, it is determined as incorrect insertion. An IC on a mounting board characterized in that
Method for determining the terminal insertion state of parts.
JP1104191A 1989-04-24 1989-04-24 Method for determining the terminal insertion state of IC component on mounting board Expired - Lifetime JPH0652291B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1104191A JPH0652291B2 (en) 1989-04-24 1989-04-24 Method for determining the terminal insertion state of IC component on mounting board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1104191A JPH0652291B2 (en) 1989-04-24 1989-04-24 Method for determining the terminal insertion state of IC component on mounting board

Publications (2)

Publication Number Publication Date
JPH02281162A JPH02281162A (en) 1990-11-16
JPH0652291B2 true JPH0652291B2 (en) 1994-07-06

Family

ID=14374094

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1104191A Expired - Lifetime JPH0652291B2 (en) 1989-04-24 1989-04-24 Method for determining the terminal insertion state of IC component on mounting board

Country Status (1)

Country Link
JP (1) JPH0652291B2 (en)

Also Published As

Publication number Publication date
JPH02281162A (en) 1990-11-16

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