JPH0650715A - Optical displacement cage - Google Patents

Optical displacement cage

Info

Publication number
JPH0650715A
JPH0650715A JP4204994A JP20499492A JPH0650715A JP H0650715 A JPH0650715 A JP H0650715A JP 4204994 A JP4204994 A JP 4204994A JP 20499492 A JP20499492 A JP 20499492A JP H0650715 A JPH0650715 A JP H0650715A
Authority
JP
Japan
Prior art keywords
light
reflecting mirror
inspected
detector
displacement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP4204994A
Other languages
Japanese (ja)
Inventor
Akio Kondo
明男 近藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP4204994A priority Critical patent/JPH0650715A/en
Publication of JPH0650715A publication Critical patent/JPH0650715A/en
Withdrawn legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)

Abstract

PURPOSE:To obtain an optical displacement gage suitably employed in the measurement of profile of a planar member including flatness thereof in which highly accurate measurement is realized through simple signal processing while fixing the optical displacement gage body even when the surface to be measured varies significantly. CONSTITUTION:When a surface 16 to be inspected is located on the outside of displacement measurable range, an optical beam is projected toward a cross point P between a passage of reference reflection light at a time when an optical beam is projected onto a predetermined reference surface located in the displacement measurable range and a set reference surface 15 for the surface 16 to be inspected located on the outside of the displacement measurable range. Fixing angles theta1, theta2 of first and second reflectors 9, 10 and fixing positions X, Y are regulated, respectively, by means of first and second drive mechanisms 11, 12 such that the light reflected on the cross point P1 impinges on a same position A0 as that of the reference reflection light on a detector 6.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、板状被検材の平坦度等
の形状を測定する際に用いて好適の光変位計に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an optical displacement meter suitable for use in measuring the flatness or other shape of a plate-shaped test material.

【0002】[0002]

【従来の技術】光変位計を用いて三角測量法による距離
計測を行なう手段の代表的なものを図2に示す。この図
2において、1は半導体レーザ等の光源、2は光源1か
ら出射された光を集光して被検材3の被検面7もしくは
8上へ照射する投光レンズ、5は光源1から投光レンズ
2を通して被検面7もしくは8上へ照射された光の該被
検面7もしくは8からの反射光を受光する受光レンズ、
6は受光レンズ5を通して被検面7もしくは8からの反
射光を受けその入射位置を検出するPSD(位置検出素
子)からなる検出器である。
2. Description of the Related Art FIG. 2 shows a typical means for performing distance measurement by a triangulation method using an optical displacement meter. In FIG. 2, reference numeral 1 is a light source such as a semiconductor laser, 2 is a light projecting lens that collects light emitted from the light source 1 and irradiates it onto a surface 7 or 8 of a material 3 to be inspected, and 5 is a light source 1 A light receiving lens for receiving reflected light from the surface 7 or 8 to be inspected from the surface 7 or 8 to be inspected through the light projecting lens 2.
Reference numeral 6 denotes a detector formed of a PSD (position detecting element) which receives reflected light from the surface 7 or 8 to be detected through the light receiving lens 5 and detects the incident position thereof.

【0003】このような光変位計を用いて被検面7の位
置を測定する際には、光源1から投光レンズ2を通し被
検面7上の点O0に向けて光線が照射され、被検面7上
からの反射光は、受光レンズを通して検出器6上の点a
0に入射・結像される。
When measuring the position of the surface 7 to be inspected using such an optical displacement meter, a light beam is emitted from the light source 1 through the projection lens 2 toward a point O 0 on the surface 7 to be inspected. , The reflected light from the surface 7 to be inspected passes through the light receiving lens to the point a on the detector 6.
It is incident on 0 and is imaged.

【0004】受光レンズ5の中心からの点a0の位置を
読み取れば、受光レンズ5と検出器6との間の距離dは
既知であるので、点O0と点a0とを結ぶ線分の垂直線
(被検面7,8に垂直な線)に対する方位角を、容易に計
算することができる。照射光線の照射角、および、投光
レンズ2と受光レンズ5との間隔Dは、初期設定値であ
るので、検出器6にて得られた前記方位角に基づき、三
角測量の原理により被検面7上の点O0までの距離Lを
求めることができる。
If the position of the point a 0 from the center of the light receiving lens 5 is read, the distance d between the light receiving lens 5 and the detector 6 is known, and therefore the line segment connecting the point O 0 and the point a 0. Vertical line
The azimuth angle (line perpendicular to the surfaces 7 and 8 to be inspected) can be easily calculated. Since the irradiation angle of the irradiation light beam and the distance D between the light projecting lens 2 and the light receiving lens 5 are initial setting values, based on the above-mentioned azimuth angle obtained by the detector 6, the inspection is performed by the principle of triangulation. The distance L to the point O 0 on the surface 7 can be obtained.

【0005】なお、被検材3の位置が変わり、光源1か
らの光の照射点が被検面8上の点O1になった場合に
は、検出器6上の反射光結像位置がa1になり、前述と
同様にして被検面8上の点O1までの距離を求めること
ができる。
When the position of the material 3 to be inspected is changed and the irradiation point of the light from the light source 1 becomes the point O 1 on the surface 8 to be inspected, the reflected light image forming position on the detector 6 is changed. becomes a 1, it is possible to determine the distance to the point O 1 on the test surface 8 in the same manner as described above.

【0006】上述のように、従来、光変位計を用いた板
状被検材の形状計測においては、光変位計投光部(光源
1,投光レンズ2)から被検材に直接投光され、被検材
表面で反射される光を光変位計受光部(受光レンズ5,
検出器6)で受光し、被検材上の反射位置を測定してい
る。この方式は非接触であり、測定のための特別なセン
サ倣い装置等を必要とせず、高速で精度の高い測定を行
なえるという特徴を有している。
As described above, conventionally, in the shape measurement of the plate-shaped test material using the optical displacement meter, the light is directly projected onto the test material from the optical displacement meter projecting section (the light source 1, the projecting lens 2). The light reflected by the surface of the material to be inspected is received by the optical displacement meter light receiving portion (light receiving lens 5,
The light is received by the detector 6) and the reflection position on the test material is measured. This method is non-contact and does not require a special sensor copying device or the like for measurement, and is characterized by high-speed and highly-accurate measurement.

【0007】[0007]

【発明が解決しようとする課題】ところで、一般的な光
変位計において分解能が数μm〜数十μmの場合、測定
できる被検材の変位範囲は数mm〜数十mmである。板状材
料の平坦度は、材料表面(被検面)上の該当する点の位置
を測定し、定盤平面,パスライン等を基準にして、その
測定点の位置と基準の位置との差を算出し、これら変位
量の前後左右を関係付けることにより表わされる。
By the way, in a general optical displacement meter, when the resolution is several μm to several tens μm, the measurable displacement range of the test material is several mm to several tens mm. The flatness of a plate-shaped material is measured by measuring the position of the corresponding point on the surface of the material (inspected surface) and using the plane of the surface plate, pass line, etc. as a reference, the difference between the position of that measurement point and the reference position. Is calculated, and the front, rear, left, and right of these displacement amounts are related to each other.

【0008】ローラテーブル等で搬送されてくる一連の
材料の平坦度の連続測定において、材料間での厚さ変化
がこの光変位計の測定可能範囲を超えているような場合
には、被検材表面上の測定点の位置に厚さの影響が及ば
ないように被検材裏面側から測定がなされている。
In the continuous measurement of the flatness of a series of materials conveyed on a roller table or the like, when the change in thickness between the materials exceeds the measurable range of this optical displacement meter, it is inspected. The measurement is performed from the back surface side of the test material so that the position of the measurement point on the material surface is not affected by the thickness.

【0009】しかし、この場合、測定される変位量に
は、本来の変位のほかに、重力による被検材の歪みによ
る変位等が交錯しているため、これらを分離し本来の変
位のみを抽出する必要があり、そのために、信号処理機
能が強化され複雑な信号処理を実施しなければならな
い。この結果、装置コストの上昇を伴うばかりでなく、
信号処理アルゴリズムの不適切さや不完全さのために測
定結果の信頼性を損なうという課題があった。
However, in this case, the measured displacement includes not only the original displacement but also the displacement due to the strain of the material to be inspected due to gravity, so these are separated and only the original displacement is extracted. Therefore, the signal processing function must be enhanced and complex signal processing must be performed. As a result, not only is the device cost increased, but
There is a problem that the reliability of the measurement result is impaired due to the inadequacy and incompleteness of the signal processing algorithm.

【0010】そこで、被検材表面側に光変位計を配置
し、ロール直上近傍での変位を測定する手段が考えられ
るが、この場合には、測定可能な変位量範囲は広いが、
測定精度で劣る光変位計を用いるか、あるいは、数mm〜
百数十mmの被検材厚さの変動量を光変位計の測定可能な
変位量範囲でカバーすることができないので、光変位計
の取付位置を被検材の厚さに対応して、正確かつ迅速に
移動させることのできる堅牢で精密な移動装置に光変位
計を取り付ける構造が必要になる。前者の場合には、高
い測定精度が得られないという課題があるほか、後者の
場合には、精密な移動装置のために、光変位計を用いる
ことにより簡潔な装置構成できるという特徴が損なわれ
てしまうなどの課題がある。
Therefore, it is conceivable to dispose an optical displacement meter on the surface side of the material to be measured and measure the displacement immediately above the roll. In this case, the measurable displacement range is wide,
Use an optical displacement meter that is inferior in measurement accuracy, or
Since it is not possible to cover the fluctuation amount of the thickness of the test material of a hundred and several tens of mm within the measurable displacement range of the optical displacement meter, the mounting position of the optical displacement meter corresponds to the thickness of the test material. There is a need for a structure that attaches an optical displacement meter to a robust and precise moving device that can move accurately and quickly. In the case of the former, there is a problem that high measurement accuracy cannot be obtained, and in the case of the latter, the characteristic that a simple device configuration can be configured by using an optical displacement meter is impaired because of a precise moving device. There are problems such as being lost.

【0011】本発明は、このような課題を解決しようと
するもので、被検材の厚さ変化等により測定範囲を大き
く変える必要がある場合であっても、光変位計本体の取
付位置を変更することなく、簡素な構成かつ単純な信号
処理で高精度の測定を実現した光変位計を提供すること
を目的とする。
The present invention is intended to solve such a problem. Even when it is necessary to greatly change the measurement range due to the change in the thickness of the material to be inspected, the mounting position of the optical displacement meter main body can be changed. It is an object of the present invention to provide an optical displacement meter that realizes highly accurate measurement with a simple configuration and simple signal processing without modification.

【0012】[0012]

【課題を解決するための手段】上記目的を達成するため
に、本発明の光変位計は、光源と、該光源から出射され
た光ビームを被検面上へ所定入射角で集光・照射する投
光レンズと、前記被検面から反射されてきた反射光を受
光する受光レンズと、該受光レンズにより前記反射光を
結像され該反射光の入射・結像位置を検出する検出器と
をそなえ、前記検出器の検出結果に基づき三角測量の原
理により前記被検面の変位を検出するものにおいて、前
記投光レンズの光ビーム射出側直後に配置される第1反
射鏡と、該第1反射鏡に対向しうるように前記の光ビー
ムと反射光との間に配置される第2反射鏡と、前記第1
反射鏡の取付角度を調整駆動する第1駆動機構と、前記
第2反射鏡の取付角度および取付位置を調整駆動する第
2駆動機構とをそなえ、前記被検面が前記検出器による
所定の変位測定可能範囲外にある場合には、前記被検面
が前記所定の変位測定可能範囲内にある場合の所定基準
面に前記光ビームを照射した際の前記検出器への基準反
射光の経路と、前記所定の変位測定可能範囲外にある当
該被検面についての設定基準面との交点位置へ向けて前
記光ビームが照射されるとともに、該交点位置からの反
射光が前記検出器上の前記基準反射光の入射位置と同一
位置に入射するように、前記第1反射鏡の取付角度と、
前記第2反射鏡の取付角度および取付位置とを、それぞ
れ前記の第1駆動機構および第2駆動機構により調整
し、前記光ビームを、前記の第1反射鏡および第2反射
鏡により反射して前記被検面上へ照射することを特徴と
している。
In order to achieve the above object, an optical displacement meter of the present invention comprises a light source and a light beam emitted from the light source, which is focused and irradiated on a surface to be inspected at a predetermined incident angle. A light projecting lens, a light receiving lens that receives the reflected light reflected from the surface to be inspected, and a detector that forms an image of the reflected light by the light receiving lens and detects an incident / image forming position of the reflected light. In the device for detecting the displacement of the surface to be inspected by the principle of triangulation based on the detection result of the detector, a first reflecting mirror arranged immediately after the light beam emitting side of the light projecting lens; A second reflecting mirror arranged between the light beam and the reflected light so as to face the first reflecting mirror;
A first drive mechanism that adjusts and drives the mounting angle of the reflecting mirror and a second drive mechanism that adjusts and drives the mounting angle and the mounting position of the second reflecting mirror, and the surface to be inspected has a predetermined displacement by the detector. If it is out of the measurable range, the path of the reference reflected light to the detector when the light beam is applied to the predetermined reference surface when the surface to be inspected is in the predetermined displacement measurable range, and The light beam is irradiated toward an intersection position of the surface to be inspected, which is outside the predetermined displacement measurable range, with the set reference surface, and reflected light from the intersection position is on the detector. A mounting angle of the first reflecting mirror so that the reference reflected light is incident on the same position as the incident position;
The mounting angle and the mounting position of the second reflecting mirror are adjusted by the first driving mechanism and the second driving mechanism, respectively, and the light beam is reflected by the first reflecting mirror and the second reflecting mirror. Irradiation is performed on the surface to be inspected.

【0013】[0013]

【作用】上述した本発明の光変位計では、被検面が検出
器による変位測定可能範囲外にある場合、被検面が変位
測定可能範囲内にある場合の所定基準面に光ビームを照
射した際の基準反射光の経路と、変位測定可能範囲外に
ある被検面についての設定基準面との交点位置へ向けて
光ビームが照射されるとともに、その交点位置からの反
射光が検出器上の基準反射光の入射位置と同一位置に入
射するように、第1反射鏡の取付角度と、第2反射鏡の
取付角度,取付位置とをそれぞれ第1駆動機構および第
2駆動機構により調整し、光ビームの経路を制御するこ
とにより、光変位計本体を被検面上方に固定することが
でき、光変位計の高い分解能を保ったままで測定面の大
幅な変化に対応できる。
In the above-mentioned optical displacement meter of the present invention, when the surface to be inspected is outside the displacement measurable range by the detector, the predetermined reference plane is irradiated when the surface to be inspected is within the displacement measurable range. The light beam is directed toward the intersection of the path of the reference reflected light and the reference surface that is set outside the displacement measurable range, and the light reflected from the intersection is detected by the detector. The mounting angle of the first reflecting mirror, the mounting angle of the second reflecting mirror, and the mounting position are adjusted by the first drive mechanism and the second drive mechanism, respectively, so that the reference reflection light is incident on the same position as the incident position. However, by controlling the path of the light beam, the main body of the optical displacement meter can be fixed above the surface to be inspected, and it is possible to cope with a large change in the measurement surface while maintaining the high resolution of the optical displacement meter.

【0014】[0014]

【実施例】以下、図面により本発明の一実施例としての
光変位計について説明すると、図1はその構成およびそ
の動作を説明するための模式図であり、この図1に示す
ように、本実施例の光変位計も、基本的には従来のもの
と同様に、半導体レーザ等の光源1と、この光源1から
出射された光ビームを板材(被検材)13の被検面16上
へ所定入射角で集光・照射する投光レンズ2と、被検面
13から反射されてきた反射光を受光する受光レンズ5
と、この受光レンズ5により反射光を結像されその入射
・結像位置を検出する検出器6とをそなえ、検出器6の
検出結果に基づき三角測量の原理により被検面16の変
位(後述する所定基準面14もしくは公称板厚面15に
対する変位)を検出するものである。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An optical displacement meter as an embodiment of the present invention will be described below with reference to the drawings. FIG. 1 is a schematic diagram for explaining its configuration and its operation. As shown in FIG. The optical displacement meter of the embodiment is basically similar to the conventional one, and the light source 1 such as a semiconductor laser and the light beam emitted from the light source 1 are projected on the surface 16 to be inspected of the plate material (inspection material) 13. A light projecting lens 2 that collects and irradiates the light at a predetermined incident angle, and a light receiving lens 5 that receives the reflected light reflected from the surface 13 to be tested.
And a detector 6 which forms an image of reflected light by the light receiving lens 5 and detects the incident / image forming position of the reflected light, and based on the detection result of the detector 6, the displacement of the surface 16 to be detected (described later) by the principle of triangulation. The displacement relative to the predetermined reference plane 14 or the nominal plate thickness plane 15) is detected.

【0015】そして、本実施例の光変位計において、符
号1,2,5,6で示す上記構成要素(光変位計本体)の
位置は変更されるものではなく、新たに第1反射鏡9,
第2反射鏡10,第1駆動機構11,第2駆動機構12
が追加されている。
In the optical displacement meter of this embodiment, the positions of the above-mentioned components (optical displacement meter main body) indicated by reference numerals 1, 2, 5 and 6 are not changed, and the first reflecting mirror 9 is newly added. ,
Second reflecting mirror 10, first driving mechanism 11, second driving mechanism 12
Has been added.

【0016】第1反射鏡9は、投光レンズ2の光ビーム
射出側直後に配置され、第2反射鏡10は、第1反射鏡
9に対向しうるように光ビームと反射光との間に配置さ
れている。また、第1駆動機構11は、第1反射鏡9の
取付角度θ1を調整駆動するものであり、第2駆動機構
12は、第2反射鏡10の取付角度θ2および取付位置
X,Y(第1反射鏡9の中心M1を原点とする座標系)を
調整駆動するものである。
The first reflecting mirror 9 is arranged immediately after the light beam exit side of the light projecting lens 2, and the second reflecting mirror 10 is provided between the light beam and the reflected light so as to face the first reflecting mirror 9. It is located in. The first drive mechanism 11 adjusts and drives the mounting angle θ 1 of the first reflecting mirror 9, and the second driving mechanism 12 controls the mounting angle θ 2 of the second reflecting mirror 10 and the mounting positions X and Y. (Coordinate system with the center M 1 of the first reflecting mirror 9 as the origin) is adjusted and driven.

【0017】ただし、本実施例の光変位計により変位測
定を行なう板材13の被検面16が検出器6による所定
の変位測定可能範囲内にある場合には、第1反射鏡9は
投光レンズ2からの光ビームの方向に平行に配置され、
投光レンズ2からの光ビームは、第1反射鏡9により反
射されることなく被検面上へ照射されるようになってい
る。
However, when the surface 16 to be measured of the displacement measured by the optical displacement meter of this embodiment is within a predetermined displacement measurable range by the detector 6, the first reflecting mirror 9 emits light. Arranged parallel to the direction of the light beam from the lens 2,
The light beam from the light projecting lens 2 is irradiated onto the surface to be inspected without being reflected by the first reflecting mirror 9.

【0018】なお、所定基準面(被検面16が検出器6
による所定の変位測定可能範囲内にある場合において被
検面16の変位基準となる面)14上の反射点P0に対す
る光ビームの入射角(所定基準面14に垂直な線に対す
る角度)αと、板材13についての設定基準面(被検面1
6が検出器6による所定の変位測定可能範囲外になった
場合において、被検面16の変位基準となる面で、前記
の所定基準面14よりもTだけ上方の面)15上の反射
点P1に対する光ビームの入射角(設定基準面15に垂直
な線に対する角度)γと、反射点P0での反射光の検出器
6での検出角(所定基準面14に垂直な線に対する角度)
βとは、板材13の表面性状,光ビームの反射・散乱状
況,光ビームの強度,必要な測定精度を考慮して、最適
になるように予め設定される値である。
It should be noted that a predetermined reference surface (the surface to be detected 16 is the detector 6
The angle of incidence of the light beam with respect to the reflection point P 0 on the surface 14 serving as the displacement reference of the surface 16 to be inspected when it is within the predetermined displacement measurable range (angle with respect to a line perpendicular to the predetermined reference plane 14) α Setting reference plane for the plate material 13 (test surface 1
When 6 is out of the predetermined displacement measurable range by the detector 6, a reflection point on a surface 15 which is a displacement reference of the surface 16 to be inspected and which is located above the predetermined reference surface 14 by T). The incident angle of the light beam with respect to P 1 (angle with respect to the line perpendicular to the set reference plane 15) γ, and the detection angle of the reflected light at the reflection point P 0 at the detector 6 (angle with respect to the line perpendicular to the predetermined reference plane 14) )
β is a value that is preset to be optimal in consideration of the surface properties of the plate material 13, the reflection / scattering state of the light beam, the intensity of the light beam, and the required measurement accuracy.

【0019】また、第1反射鏡9での光ビームの反射方
向Δα(反射光が所定基準面14となす角度)と、所定基
準面14から第1反射鏡9の中心点M1までの距離Sと
は、変位計本体の取付スペース,板材13の板厚範囲等
によって選ばれる値である。
Further, the reflection direction Δα of the light beam at the first reflecting mirror 9 (the angle formed by the reflected light with the predetermined reference surface 14) and the distance from the predetermined reference surface 14 to the center point M 1 of the first reflecting mirror 9. S is a value selected depending on the mounting space of the displacement gauge main body, the plate thickness range of the plate member 13, and the like.

【0020】さらに、所定基準面14から投光レンズ2
と受光レンズ5とを結ぶ線までの距離Lと、投光レンズ
2と受光レンズ5との水平距離Dと、受光レンズ5と検
出器6との距離dとは、光変位計により測定できる板材
13の変位範囲および測定精度によって定まる光変位計
固有の値である。
Further, from the predetermined reference plane 14, the projection lens 2
The distance L to the line connecting the light receiving lens 5 with the light receiving lens 5, the horizontal distance D between the light projecting lens 2 and the light receiving lens 5, and the distance d between the light receiving lens 5 and the detector 6 can be measured by an optical displacement meter. It is a value peculiar to the optical displacement meter determined by the displacement range of 13 and the measurement accuracy.

【0021】上述の構成により、本実施例の光変位計で
は、まず、第1反射鏡9を投光レンズ2からの光ビーム
に対して平行に配置することにより、光ビームを所定基
準面14上の反射点P0に直接投光・照射し、その際に
おける検出器6での反射光の入射・結像位置A0を得
て、その位置A0を以降の変位測定の基準とする。この
とき、光ビームは、光源1から投光レンズ2を通し、所
定基準面14上の反射点P0に対して入射角αで照射さ
れ、反射点P0での反射光が、方位角βで受光レンズ5
を通し検出器6へ入射する。
With the above-described structure, in the optical displacement meter of this embodiment, first, the first reflecting mirror 9 is arranged in parallel with the light beam from the light projecting lens 2, so that the light beam is directed to the predetermined reference plane 14. The upper reflection point P 0 is directly projected and irradiated, and the incident / imaged position A 0 of the reflected light on the detector 6 at that time is obtained, and this position A 0 is used as a reference for subsequent displacement measurement. At this time, the light beam passes through the light projecting lens 2 from the light source 1 and is irradiated at an incident angle α with respect to the reflection point P 0 on the predetermined reference surface 14, and the reflected light at the reflection point P 0 has an azimuth angle β. With light-receiving lens 5
And enters the detector 6.

【0022】そして、板材13の被検面16が検出器6
による所定の変位測定可能範囲内にある場合には、第1
反射鏡9を投光レンズ2からの光ビームに対して平行に
配置したままで、従来通りの変位測定を行なう一方、被
検面16が検出器6による所定の変位測定可能範囲外に
ある場合には、板材13の公称板厚に基づき、所定基準
面14よりもTだけ上方に新たな該光変位計の変位基準
となる設定基準面15が設けられる。設定基準面15
は、その板材13の公称板厚面(板材13の板厚が公称
板厚通りである場合の被検面)と同一でもよいし、該光
変位計で測定される板材の全公称板厚を網羅する範囲を
適切な間隔で区分する面として設けられてもよい。
The surface 16 to be detected of the plate member 13 is the detector 6
If it is within the predetermined displacement measurable range by
When the conventional displacement measurement is performed while the reflecting mirror 9 is arranged parallel to the light beam from the light projecting lens 2, and the surface 16 to be detected is outside the predetermined displacement measurable range by the detector 6. Is provided with a set reference surface 15 serving as a displacement reference of the new optical displacement meter above the predetermined reference surface 14 by T based on the nominal plate thickness of the plate member 13. Setting reference plane 15
May be the same as the nominal plate thickness surface of the plate member 13 (the surface to be inspected when the plate member 13 has a plate thickness equal to the nominal plate thickness), or the total nominal plate thickness of the plate member measured by the optical displacement meter. It may be provided as a surface that divides the covered range at appropriate intervals.

【0023】設定基準面が公称板厚面と同一な場合につ
いて説明すると、所定基準面14の反射点P0に光ビー
ムを照射した際の基準反射光の経路と公称板厚面15と
の交点位置P1へ向けて光ビームが照射されるととも
に、交点位置P1からの反射光が検出器6上の基準反射
光の入射・結像位置A0と同一位置に入射するように、
第1反射鏡9の取付角度θ1と、第2反射鏡10の取付
角度θ2,取付位置X,Yとをそれぞれ第1駆動機構1
1および第2駆動機構12により調整する。
The case where the set reference surface is the same as the nominal plate thickness surface will be described. The intersection of the path of the reference reflected light and the nominal plate thickness surface 15 when the light beam is applied to the reflection point P 0 of the predetermined reference surface 14. with light beams toward the position P 1 is irradiated, as reflected light from the intersection P 1 is incident on the same position as the incident-imaging position a 0 of the reference light reflected on the detector 6,
A mounting angle theta 1 of the first reflecting mirror 9, the mounting angle theta 2 of the second reflecting mirror 10, the mounting position X, the first drive mechanism and a Y respectively 1
It is adjusted by the first and second drive mechanisms 12.

【0024】上述のような条件を満たす第1反射鏡9の
取付角度θ1と、第2反射鏡10の取付角度θ2,取付位
置X,Yとは、次のようにして求められる。第1反射鏡
9の中心M1は、投光レンズ2中心と所定基準面14上
の反射点P0とを結ぶ線上で所定基準面14の上方Sの
距離に配置されており、その所定基準面14に対する取
付角度θ1は、次式(1)により、投光レンズ2からの光ビ
ームが第1反射鏡9の中心M1で所定基準面14と角度
Δαをなす方向に反射するように設定され、第1反射鏡
9は、取付角度θ1に第1駆動機構11により調整配置
される。
[0024] The mounting angle theta 1 of satisfying the first reflecting mirror 9 as described above, the mounting angle theta 2 of the second reflecting mirror 10, the mounting position X, and Y, are determined as follows. The center M 1 of the first reflecting mirror 9 is arranged at a distance S above the predetermined reference plane 14 on the line connecting the center of the light projecting lens 2 and the reflection point P 0 on the predetermined reference plane 14, and the predetermined reference The mounting angle θ 1 with respect to the surface 14 is set so that the light beam from the light projecting lens 2 is reflected by the center M 1 of the first reflecting mirror 9 in the direction forming an angle Δα with the predetermined reference surface 14 according to the following equation (1). The first reflecting mirror 9 is set and adjusted by the first driving mechanism 11 at the mounting angle θ 1 .

【0025】 θ1=(90°−α−Δα)/2 (1) ここで、Δαは、前述の通り、第1反射鏡9で反射され
る光ビームと第1反射鏡9の中心M1を通り所定基準面
14に平行に引いた線とのなす角度であり、この平行線
について投光レンズ2側に反射させる場合を“+”、所
定基準面14側に反射させる場合を“−”とする。
Θ 1 = (90 ° −α−Δα) / 2 (1) where Δα is the light beam reflected by the first reflecting mirror 9 and the center M 1 of the first reflecting mirror 9 as described above. Is an angle formed by a line drawn in parallel with the predetermined reference surface 14 and is "+" when the parallel line is reflected toward the projection lens 2 side, and "-" when the parallel line is reflected toward the predetermined reference surface 14 side. And

【0026】一方、第2反射鏡10は、第2駆動機構1
2により、その中心M2まわりに所定基準面14に対す
る取付角度θ2を調整できるとともに、第1反射鏡9の
中心M1に対する中心M2の取付位置X,Yを調整できる
ように配置されており、第2反射鏡10による光ビーム
の反射光が、公称板厚面15上の反射点P1に所定入射
角γで入射し、前述の条件を満たす経路を通るための、
取付角度θ2および取付位置X,Yは次式(2)〜(4)によ
り設定される。
On the other hand, the second reflecting mirror 10 has the second driving mechanism 1
The 2, it is possible to adjust the mounting angle theta 2 with respect to a predetermined reference surface 14 around the center M 2, the mounting position X of the center M 2 with respect to the center M 1 of the first reflection mirror 9 is disposed so as to be able to adjust the Y In order for the reflected light of the light beam from the second reflecting mirror 10 to enter the reflection point P 1 on the nominal plate thickness surface 15 at a predetermined incident angle γ, and to pass through the path satisfying the above condition,
The mounting angle θ 2 and the mounting positions X and Y are set by the following equations (2) to (4).

【0027】[0027]

【数1】 [Equation 1]

【0028】ただし、所定基準面14よりも上方に距離
Tにある板材13の公称板厚面15に対する第2反射鏡
10での反射光の入射角γを所定基準面14からの板材
13の公称板厚面15との距離Tに応じて変える必要の
ない場合には、第2反射鏡10の角度θ2は固定とする
ことができる。
However, the incident angle γ of the reflected light at the second reflecting mirror 10 with respect to the nominal plate thickness surface 15 of the plate member 13 located at a distance T above the predetermined reference surface 14 is the nominal value of the plate member 13 from the predetermined reference surface 14. The angle θ 2 of the second reflecting mirror 10 can be fixed if it is not necessary to change it according to the distance T from the plate thickness surface 15.

【0029】ところで、ローラテーブル等で搬送されて
くるその公称板厚面15が所定基準面14よりもTだけ
上方にある板材13の平坦度を連続測定する場合には、
上述のごとく第1反射鏡9の取付角度θ1と第2反射鏡
10の取付角度θ2および取付位置X,Yとを設定した
状態で、板材13を搬送しつつ所定サンプリング周期で
連続的に被検面16からの反射光の検出器6上での入射
・結像位置A1を検出し、距離Δa(=A0−A1)を逐次
演算して取り込む。この距離Δaに基づいて、板材13
の被検面16の公称板厚面15に対する変位ΔTは、次
式(5)を用いて求めることができる。
By the way, in the case of continuously measuring the flatness of the plate member 13 whose nominal plate thickness surface 15 conveyed by a roller table or the like is above the predetermined reference surface 14 by T,
Mounting angle theta 2 and the mounting position X of the mounting angle theta 1 and the second reflecting mirror 10 of the first reflecting mirror 9 as described above, in a state of setting the Y, continuously at a predetermined sampling period while conveying the sheet material 13 The incident / imaged position A 1 of the reflected light from the surface 16 to be detected on the detector 6 is detected, and the distance Δa (= A 0 −A 1 ) is sequentially calculated and fetched. Based on this distance Δa, the plate material 13
The displacement ΔT of the surface 16 to be measured with respect to the nominal thickness surface 15 can be obtained by using the following equation (5).

【0030】[0030]

【数2】 [Equation 2]

【0031】ここで、Δaは、前述の通り、板材13の
公称板厚面15上での光ビームの反射点P1の検出器6
上での入射・結像点A0(所定基準面14上の反射点P0
からの反射光の入射・結像点でもある)から、板材13
の被検面16上での反射点P2からの反射光の入射・結
像点A1までの距離であり、板材13の被検面16上の
反射点P2の結像点A1が板材13の公称板厚面15の反
射点P1の結像点A0の右にある時は“+”、左にある時
は“−”とする。
Here, Δa is, as described above, the detector 6 at the reflection point P 1 of the light beam on the nominal thickness surface 15 of the plate member 13.
Incident / imaging point A 0 on top (reflection point P 0 on the predetermined reference plane 14
Is also the point of incidence and image formation of reflected light from the plate material 13
Of the distance to the entrance-imaging point A 1 of the reflected light from the reflection point P 2 in the above test surface 16, the image forming point A 1 of the reflection point P 2 on the test surface 16 of the plate 13 When the reflection point P 1 on the nominal plate thickness surface 15 of the plate member 13 is on the right of the image formation point A 0 , it is “+”, and when it is on the left, it is “−”.

【0032】そして、所定サンプリング周期で連続的に
得られた変位ΔTについて、隣合う最大のΔTmaxと、
最小のΔTminとを抽出し、その最大値ΔTmaxを得た位
置から、最小値ΔTminを含む次の最大値ΔTmaxを得る
位置までの板材13の距離Rを搬送速度から求め、次式
(6)により、板材13の被検面16の平坦度(急峻度)λ
を算出する。
Then, with respect to the displacement ΔT continuously obtained at a predetermined sampling period, the maximum adjacent ΔTmax and
The minimum ΔTmin is extracted, and the distance R of the plate material 13 from the position where the maximum value ΔTmax is obtained to the position where the next maximum value ΔTmax including the minimum value ΔTmin is obtained from the transport speed.
By (6), the flatness (steepness) λ of the test surface 16 of the plate material 13
To calculate.

【0033】 λ=(ΔTmax−ΔTmin)/R (6) このように、本実施例の光変位計によれば、一般的な光
変位計に簡便な構造の2つの反射鏡9,10を追加しそ
の取付角度θ1,θ2および取付位置X,Yを調整するこ
とにより、光変位計本体を固定したままで、光変位計を
用いて被検面16が大きく変わるような場合でも、板材
13の材内変動を高い精度で測定することが可能とな
る。その結果、板材13の重力による変位や搬送に伴う
振動等の板材13の変位に関する外乱要因の影響の最も
少ない測定点を選んで、光変位計を板材13上方に容易
に設置することが可能となるほか、検出器6による測定
値の補正も幾何学的に行なえばよいので、単純な信号処
理で正確な測定結果を得ることができる。
Λ = (ΔTmax−ΔTmin) / R (6) As described above, according to the optical displacement meter of this embodiment, two reflecting mirrors 9 and 10 having a simple structure are added to a general optical displacement meter. By adjusting the mounting angles θ 1 and θ 2 and the mounting positions X and Y, the plate material can be used even when the optical displacement meter is used to greatly change the surface 16 to be measured while the optical displacement meter main body is fixed. It becomes possible to measure the intra-material variation of No. 13 with high accuracy. As a result, it is possible to easily install the optical displacement meter above the plate member 13 by selecting a measurement point that has the least influence of disturbance factors related to the displacement of the plate member 13 such as the displacement of the plate member 13 due to gravity or the vibration accompanying conveyance. In addition, since the correction of the measurement value by the detector 6 may be geometrically performed, an accurate measurement result can be obtained by simple signal processing.

【0034】従って、本実施例の光変位計を用いること
により、ローラテーブル等で搬送されて来る板材13被
検材の平坦度等の形状測定を、簡潔な装置構成で高い測
定精度で行なえる利点がある。
Therefore, by using the optical displacement meter of the present embodiment, the flatness and other shapes of the plate material 13 to be inspected, which is conveyed by the roller table or the like, can be measured with a simple apparatus configuration and high measurement accuracy. There are advantages.

【0035】[0035]

【発明の効果】以上詳述したように、本発明の光変位計
によれば、一般的な光変位計に簡便な構造の2つの反射
鏡を追加しその取付角度および取付位置を調整すること
により、被検材の厚さ変化等により測定範囲を大きく変
える必要がある場合であっても、光変位計本体の取付位
置を変更することなく、簡素な構成かつ単純な信号処理
で高精度の測定を実現できる効果がある。
As described above in detail, according to the optical displacement meter of the present invention, two reflecting mirrors having a simple structure are added to a general optical displacement meter and the mounting angle and the mounting position thereof are adjusted. As a result, even if the measurement range needs to be changed significantly due to changes in the thickness of the material to be tested, etc., it is possible to achieve high accuracy with a simple configuration and simple signal processing without changing the mounting position of the optical displacement meter main body. There is an effect that the measurement can be realized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例としての光変位計の構成およ
びその動作を説明するための模式図である。
FIG. 1 is a schematic diagram for explaining a configuration and an operation of an optical displacement meter as an embodiment of the present invention.

【図2】従来の光変位計の構成およびその動作を説明す
るための模式図である。
FIG. 2 is a schematic diagram for explaining the configuration and operation of a conventional optical displacement meter.

【符号の説明】[Explanation of symbols]

1 光源 2 投光レンズ 5 受光レンズ 6 検出器 9 第1反射鏡 10 第2反射鏡 11 第1駆動機構 12 第2駆動機構 13 板材(被検材) 14 所定基準面 15 公称板厚面(設定基準面) 16 被検面 DESCRIPTION OF SYMBOLS 1 light source 2 light emitting lens 5 light receiving lens 6 detector 9 first reflecting mirror 10 second reflecting mirror 11 first driving mechanism 12 second driving mechanism 13 plate material (test material) 14 predetermined reference surface 15 nominal plate thickness surface (setting) Reference surface) 16 Test surface

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 光源と、該光源から出射された光ビーム
を被検面上へ所定入射角で集光・照射する投光レンズ
と、前記被検面から反射されてきた反射光を受光する受
光レンズと、該受光レンズにより前記反射光を結像され
該反射光の入射・結像位置を検出する検出器とをそな
え、前記検出器の検出結果に基づき三角測量の原理によ
り前記被検面の変位を検出する光変位計において、 前記投光レンズの光ビーム射出側直後に配置される第1
反射鏡と、該第1反射鏡に対向しうるように前記の光ビ
ームと反射光との間に配置される第2反射鏡と、前記第
1反射鏡の取付角度を調整駆動する第1駆動機構と、前
記第2反射鏡の取付角度および取付位置を調整駆動する
第2駆動機構とがそなえられ、 前記被検面が前記検出器による所定の変位測定可能範囲
外にある場合には、前記被検面が前記所定の変位測定可
能範囲内にある場合の所定基準面に前記光ビームを照射
した際の前記検出器への基準反射光の経路と、前記所定
の変位測定可能範囲外にある当該被検面についての設定
基準面との交点位置へ向けて前記光ビームが照射される
とともに、該交点位置からの反射光が前記検出器上の前
記基準反射光の入射位置と同一位置に入射するように、
前記第1反射鏡の取付角度と、前記第2反射鏡の取付角
度および取付位置とが、それぞれ前記の第1駆動機構お
よび第2駆動機構により調整され、前記光ビームが、前
記の第1反射鏡および第2反射鏡により反射されて前記
被検面上へ照射されることを特徴とする光変位計。
1. A light source, a light projecting lens for collecting and irradiating a light beam emitted from the light source onto a surface to be inspected at a predetermined incident angle, and receiving reflected light reflected from the surface to be inspected. The light receiving lens and a detector that forms an image of the reflected light by the light receiving lens and detects an incident / image forming position of the reflected light. Based on the detection result of the detector, the surface to be inspected is based on the principle of triangulation. An optical displacement meter for detecting the displacement of the first
A reflecting mirror, a second reflecting mirror arranged between the light beam and the reflected light so as to be opposed to the first reflecting mirror, and a first drive for adjusting and driving an attachment angle of the first reflecting mirror. A mechanism and a second drive mechanism for adjusting and driving the mounting angle and the mounting position of the second reflecting mirror, and when the surface to be detected is outside a predetermined displacement measurable range by the detector, The path of the reference reflected light to the detector when the predetermined reference surface is irradiated with the light beam when the surface to be inspected is within the predetermined displacement measurable range, and is outside the predetermined displacement measurable range The light beam is irradiated toward an intersection position of the surface to be inspected with the set reference surface, and reflected light from the intersection position is incident on the detector at the same position as the incident position of the reference reflected light. To do
The mounting angle of the first reflecting mirror and the mounting angle and mounting position of the second reflecting mirror are adjusted by the first driving mechanism and the second driving mechanism, respectively, and the light beam is adjusted to the first reflecting mechanism. An optical displacement meter which is reflected by a mirror and a second reflecting mirror and is irradiated onto the surface to be inspected.
JP4204994A 1992-07-31 1992-07-31 Optical displacement cage Withdrawn JPH0650715A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4204994A JPH0650715A (en) 1992-07-31 1992-07-31 Optical displacement cage

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4204994A JPH0650715A (en) 1992-07-31 1992-07-31 Optical displacement cage

Publications (1)

Publication Number Publication Date
JPH0650715A true JPH0650715A (en) 1994-02-25

Family

ID=16499708

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4204994A Withdrawn JPH0650715A (en) 1992-07-31 1992-07-31 Optical displacement cage

Country Status (1)

Country Link
JP (1) JPH0650715A (en)

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