JPH0641159Y2 - Sample holding mechanism in optical emission spectrometer - Google Patents
Sample holding mechanism in optical emission spectrometerInfo
- Publication number
- JPH0641159Y2 JPH0641159Y2 JP8257789U JP8257789U JPH0641159Y2 JP H0641159 Y2 JPH0641159 Y2 JP H0641159Y2 JP 8257789 U JP8257789 U JP 8257789U JP 8257789 U JP8257789 U JP 8257789U JP H0641159 Y2 JPH0641159 Y2 JP H0641159Y2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- pressing
- holding mechanism
- sample holding
- optical emission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Description
【考案の詳細な説明】 〈産業上の利用分野〉 本考案は、発光分光分析装置において、試料を放電用電
極棒に対向して配置固定するための試料押さえ機構に関
する。DETAILED DESCRIPTION OF THE INVENTION <Industrial field of application> The present invention relates to a sample holding mechanism for disposing and fixing a sample in an emission spectroscopic analyzer so as to face a discharge electrode rod.
〈従来の技術〉 金属材料等の成分元素の迅速分析には発光分光分析装置
が適用される。この発光分光分析装置では、試料を放電
発光させてその放射光を各元素固有の波長をもつスペク
トル線に分光し、これらの各スペクトル線の光強度を測
定することにより成分元素の定性、定量分析を行う。こ
の場合、試料の放電発光を大気中で行うと、試料中の
Ｃ、Ｓ、Ｐ等のスペクトル線が酸素に吸収されて分析精
度を損なうので、通常はArガス気流中で発光させるよう
にしている。<Prior Art> An emission spectroscopic analyzer is applied to rapid analysis of component elements such as metal materials. In this emission spectroscopic analyzer, a sample is discharged for emission and its emitted light is dispersed into spectral lines having wavelengths peculiar to each element, and the qualitative and quantitative analysis of component elements is performed by measuring the light intensity of each of these spectral lines. I do. In this case, when the discharge emission of the sample is performed in the atmosphere, the spectrum lines of C, S, P, etc. in the sample are absorbed by oxygen and impair the analysis accuracy. There is.
ところで、試料を放電発光させるに際しては、試料を放
電用電極棒に対向する位置に配置固定する必要がある。
そのため、従来は、第２図に示すように、放電用スタン
ドａに支柱ｐを立設し、この支柱ｐに摺動部材ｂを嵌合
し、この摺動部材ｂにばね板ｆを取り付け、このばね板
ｆの端部に押さえピンｄを固定した構造のものが提供さ
れている。この構造では、摺動部材ｂを支柱ｐにそって
上下動させることで押さえピンｄを試料s0に押し付け、
この状態で摺動部材ｂを支柱ｐにねじｑで固定すること
で試料s0が固定板ｅに押圧固定される。なお、ｉはスパ
ーク放電用の電極棒、ｊはArガス流通室である。By the way, when the sample is caused to emit light by discharge, it is necessary to dispose and fix the sample at a position facing the discharge electrode rod.
Therefore, conventionally, as shown in FIG. 2, a support p is erected on the discharge stand a, a sliding member b is fitted on the support p, and a spring plate f is attached to the sliding member b. There is provided a structure in which a pressing pin d is fixed to the end of the spring plate f. In this structure, the pressing pin d is pressed against the sample s 0 by vertically moving the sliding member b along the support p,
In this state, the sample s 0 is pressed and fixed to the fixed plate e by fixing the sliding member b to the support p with the screw q. In addition, i is an electrode rod for spark discharge, and j is an Ar gas flow chamber.
〈考案が解決しようとする課題〉 しかし、従来の上記構造のものでは、試料s0を固定板ｅ
に安定して押さえ付けることができない。すなわち、分
析対象となる試料s0の形状は必ずしも一定したものでは
なく、種々の形状のものがある。たとえば、第２図に示
すような釣り鐘形をした試料s0に対しては、押さえピン
ｄの押圧力が大きいと試料s0が矢印方向に不意に移動し
て分析位置がずれてしまう。<Problems to be Solved by the Invention> However, in the conventional structure described above, the sample s 0 is fixed to the fixing plate e.
Cannot be pressed down stably. That is, the shape of the sample s 0 to be analyzed is not always constant, and there are various shapes. For example, with respect to the bell-shaped sample s 0 as shown in FIG. 2, if the pressing force of the pressing pin d is large, the sample s 0 abruptly moves in the arrow direction and the analysis position shifts.
一方、試料分析の自動化を図るために、第３図に示すよ
うに、エアーシリンダを構成する押圧棒ｇの一端に試料
s1に当接する傘状の試料押さえ具ｈを直接固定し、この
押さえ具ｈで試料s1を固定板ｅに押さえ付ける構成が考
えられる。On the other hand, in order to automate the sample analysis, as shown in FIG. 3, the sample is attached to one end of the pressing rod g constituting the air cylinder.
A configuration is conceivable in which an umbrella-shaped sample holder h that comes into contact with s 1 is directly fixed and the sample s 1 is pressed against the fixing plate e by this holder h.
しかしながら、この構成のものでは、次の不具合があ
る。すなわち、鉄鋼分析等の試料s1では図示のようにＴ
字形状をしたものがあり、また、試料s1に中心偏析が存
在するため試料s1の中心から外れた部分を分析する必要
がある。そこで、試料s1の中心を押圧棒ｇの軸心ｃから
外れた位置に配置すると、試料s1が固定板ｅから傾いて
両者間の密着性が悪くなり、その隙間からArガス流通室
ｊ内に空気が入り込む。このため、Arガス気流中で試料
s1を放電発光させることができなくなって分析精度が悪
くなる。また、極端な場合には試料s1が転倒してしまい
分析ができなくなることもある。However, this configuration has the following problems. Ie, T as shown in the sample s 1 steel analysis, etc.
Some of them are in the shape of a letter, and since the sample s 1 has center segregation, it is necessary to analyze the part deviated from the center of the sample s 1 . Therefore, placing the center of the sample s 1 at a position deviated from the axis c of the pressure rod g, adhesiveness is poor between the two samples s 1 is tilted from the fixed plate e, Ar gas flow chamber j through the gap Air enters inside. Therefore, the sample in Ar gas flow
Since s 1 cannot be made to emit light by discharge, the analysis accuracy deteriorates. Further, in an extreme case, the sample s 1 may fall down and analysis may not be possible.
〈課題を解決するための手段〉 本考案は、このような事情に鑑みてなされたものであっ
て、試料分析の自動化を図るに際して、試料の形状に影
響されることなく、試料を固定板に対して常に安定して
配置固定できるようにするものである。<Means for Solving the Problem> The present invention has been made in view of such circumstances, and when automating sample analysis, the sample is fixed on the fixing plate without being affected by the shape of the sample. On the other hand, it is possible to always stably arrange and fix.
そのため、本考案の発光分光分析装置における試料押え
機構では、試料が載置される固定板に対して試料を押圧
する押圧棒が出退可能に設けられ、この押圧棒の先端部
には可とう性部材が取り付けられ、この可とう性部材に
前記試料に当接する傘状の試料押さえ具が固定されてい
る構成とした。Therefore, in the sample holding mechanism in the emission spectroscopic analyzer of the present invention, a pressing rod for pressing the sample against the fixed plate on which the sample is placed is provided so as to be able to move in and out, and the tip end of this pressing rod is flexible. A flexible member is attached to the flexible member, and an umbrella-shaped sample holder that contacts the sample is fixed to the flexible member.
〈作用〉 上記構成において、試料の中心を押圧棒の軸心から外れ
た位置に配置して押圧棒で試料を押さえ付ける場合で
も、試料が傾斜する以前に可とう性部材が変形して試料
に加わる応力を緩和するようになるので、試料は固定板
に安定して密着させられる。このため、試料形状に起因
して分析精度が悪くなる等の不具合が回避される。<Operation> In the above-mentioned configuration, even when the center of the sample is arranged at a position deviated from the axis of the pressing rod and the sample is pressed by the pressing rod, the flexible member is deformed before the sample is tilted and Since the applied stress is relaxed, the sample can be brought into stable contact with the fixing plate. Therefore, it is possible to avoid problems such as deterioration of analysis accuracy due to the sample shape.
〈実施例〉 第１図は本考案の実施例に係る発光分光分析装置におけ
る試料押え機構を含む試料発光部の一部切欠正面図であ
る。同図において、符号１は試料押さえ機構であって、
この試料押さえ機構１は、分析室を構成するハウジング
２にエアーシリンダ４が取り付けられ、このエアーシリ
ンダ４の押圧棒６が試料８が載置される固定板10に対し
て出退可能に設けられており、さらに、この押圧棒６の
先端部にはベークライト等の絶縁体12を介して防振用ゴ
ムからなる可とう性部材14が取り付けられ、この可とう
性部材14に傘状の試料押さえ具16が固定されて構成され
る。<Embodiment> FIG. 1 is a partially cutaway front view of a sample light emitting portion including a sample holding mechanism in an emission spectroscopic analyzer according to an embodiment of the present invention. In the figure, reference numeral 1 is a sample pressing mechanism,
In this sample pressing mechanism 1, an air cylinder 4 is attached to a housing 2 that constitutes an analysis chamber, and a pressing rod 6 of the air cylinder 4 is provided so as to be able to move in and out of a fixed plate 10 on which a sample 8 is placed. Further, a flexible member 14 made of vibration-proof rubber is attached to the tip of the pressing rod 6 through an insulator 12 such as Bakelite, and the flexible member 14 holds the umbrella-shaped sample. The tool 16 is fixed and configured.
なお、18はスパーク放電用の電極棒、20は電極ホルダ、
22は放電用スタンド、24は放電用スタンド22内に形成さ
れたArガス流通室、26は固定板10に形成された放電用貫
通孔である。In addition, 18 is an electrode rod for spark discharge, 20 is an electrode holder,
22 is a discharge stand, 24 is an Ar gas flow chamber formed in the discharge stand 22, and 26 is a discharge through hole formed in the fixed plate 10.
したがって、上記構成において、試料８が図示のように
Ｔ字形状をしたもので、しかも、この試料８が押圧棒６
の軸心ｃから外れた位置に配置されている場合でも、押
圧棒６で試料８を押さえ付けると、試料８が傾斜する以
前に可とう性部材14が変形して試料８に加わる応力を緩
和するので、試料８は固定板10に安定して密着させられ
る。このため、試料８と固定板10との隙間からArガス流
通室24内に空気が入り込む等の不具合が回避される。Therefore, in the above structure, the sample 8 has a T-shape as shown in the drawing, and the sample 8 is the pressing rod 6.
Even if the sample 8 is placed at a position deviated from the axis c, the flexible member 14 is deformed before the sample 8 is tilted and the stress applied to the sample 8 is relaxed when the sample 8 is pressed. Therefore, the sample 8 can be stably brought into close contact with the fixing plate 10. Therefore, it is possible to avoid such a problem that air enters the Ar gas flow chamber 24 through the gap between the sample 8 and the fixed plate 10.
〈考案の効果〉 本考案によれば、試料分析の自動化を図るに際して、試
料の形状に影響されることなく、試料を固定板に対して
常に安定して配置固定できるようになる等の優れた効果
が発揮される。<Effect of the Invention> According to the present invention, when automating the sample analysis, it is possible to always stably arrange and fix the sample on the fixing plate without being affected by the shape of the sample. The effect is demonstrated.
第１図は本考案の実施例に係る発光分光分析装置におけ
る試料押え機構を含む試料発光部の一部切欠正面図、第
２図は従来の試料押さえ機構を含む試料発光部の一部切
欠正面図、第３図は従来の他の試料押さえ機構を含む試
料発光部の一部切欠正面図である。 １……試料押さえ機構、６……押圧棒、８……試料、10
……固定板、14……可とう性部材、16……試料押さえ
具。FIG. 1 is a partially cutaway front view of a sample light emitting part including a sample holding mechanism in an emission spectroscopy analyzer according to an embodiment of the present invention, and FIG. 2 is a partially cutaway front view of a sample light emitting part including a conventional sample holding mechanism. FIG. 3 is a partially cutaway front view of a sample light emitting portion including another conventional sample pressing mechanism. 1 ... Sample holding mechanism, 6 ... Pressing rod, 8 ... Sample, 10
...... Fixing plate, 14 …… Flexible member, 16 …… Sample holder.
Claims (1)
圧する押圧棒が出退可能に設けられ、この押圧棒の先端
部には可とう性部材が取り付けられ、この可とう性部材
に前記試料に当接する傘状の試料押さえ具が固定されて
いることを特徴とする発光分光分析装置における試料押
さえ機構。1. A pressing rod for pressing a sample against a fixed plate on which the sample is placed is provided so as to be capable of retracting, and a flexible member is attached to a tip end portion of the pressing rod. A sample pressing mechanism in an emission spectroscopic analysis apparatus, wherein an umbrella-shaped sample pressing tool that contacts the sample is fixed to the member.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8257789U JPH0641159Y2 (en) | 1989-07-13 | 1989-07-13 | Sample holding mechanism in optical emission spectrometer |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8257789U JPH0641159Y2 (en) | 1989-07-13 | 1989-07-13 | Sample holding mechanism in optical emission spectrometer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0321759U JPH0321759U (en) | 1991-03-05 |
| JPH0641159Y2 true JPH0641159Y2 (en) | 1994-10-26 |
Family
ID=31629521
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8257789U Expired - Lifetime JPH0641159Y2 (en) | 1989-07-13 | 1989-07-13 | Sample holding mechanism in optical emission spectrometer |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0641159Y2 (en) |
-
1989
- 1989-07-13 JP JP8257789U patent/JPH0641159Y2/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0321759U (en) | 1991-03-05 |
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