JP3200710U - Optical emission spectrometer - Google Patents

Abstract

[PROBLEMS] To provide a sample pressing mechanism that is easy to operate, can change the pressing point on the sample in various ways, can handle samples of various shapes, holds the sample reliably and stably, and improves the reliability of the analysis result. Provided is an emission spectroscopic analyzer. To a sample W arranged so as to close an opening 12a of a discharge chamber 12, a support 31 fixed to a light-emitting stand 2, and a support 31 can be slid and rotated in a vertical axis direction. A freely supported shaft 32, a weight 33 that engages with the lower end portion of the shaft 32, a takeout member 34 that is fixed to the upper end portion of the shaft 32 and protrudes laterally, and protrudes downward from the takeout member 34. A sample pressing mechanism 3 including a sample pressing bar 35 is provided, and the sample W is pressed by its own weight. [Selection] Figure 1

Description

  The present invention relates to an emission spectroscopic analyzer for qualitatively and quantitatively analyzing elements contained in a sample from a spectrum of light generated by discharge on a metal sample.

  In an emission spectroscopic analyzer, generally, spark discharge or arc discharge is generated between a sample and an electrode, and light generated at that time is analyzed by a spectroscope, thereby qualitatively and quantitatively analyzing elements contained in the sample.

  In this type of analyzer, a discharge chamber that houses an electrode for discharge and has an opening above, a light guide hole for guiding light generated in the discharge chamber to a spectrometer, A thing provided with the component called the light emission stand provided with the sample pressing mechanism etc. which press the sample arrange | positioned so that an opening part may be plugged is used abundantly. FIG. 4A is a longitudinal sectional view showing an example of the configuration of a main part of a conventional emission spectroscopic analyzer provided with a sample pressing mechanism using a leaf spring.

  The light emitting stand 100 has a stand base 11 as a main structure, and the stand base 11 is fixed to the frame of the spectrometer 2. The stand base 11 is formed with a discharge chamber 12 and a light guide hole 13 that guides light generated in the discharge chamber 12 to the spectrometer 2. The discharge chamber 12 accommodates a discharge rod-like electrode 14, and an opening 12 a is formed in the ceiling portion.

  The sample W is placed on the stand base 11 so as to close the opening 12a of the discharge chamber 12 via a placement plate 16 that is an annular plate member having a hole formed in the center. The stand base 11 is provided with a sample pressing mechanism 4, and the sample W placed on the stand base 11 is subjected to analysis while being pressed downward by the sample pressing mechanism 4. At the time of analysis, Ar gas is introduced through a gas inlet (not shown) formed in the discharge chamber 12, and an element contained in the sample W is excited by discharge between the electrode 14 and the sample W in the Ar atmosphere. Data of the elements contained in the sample W is obtained by emitting light and guiding the light to the spectrometer 2 for spectroscopic analysis.

  A sample pressing portion 42 is fixed to the lower surface of the distal end portion of the leaf spring 41 constituting the main configuration of the sample pressing mechanism 4 shown in FIG. 4, and the base end portion is fixed to the slide portion 43. The slide portion 43 can move in the vertical direction along a support 44 fixed to the stand base 11 and can rotate around the support 44. When pressing the sample W, as shown in an enlarged view in FIG. 4B, from the state where the slide portion 43 is lowered and the sample pressing portion 42 at the tip of the leaf spring 41 is in contact with the upper surface of the sample W. The plate spring 41 is bent by lowering the slide portion 43, and the sample W is pressed using the restoring force of the plate spring 41 generated thereby as a pressing force (see, for example, Patent Document 1).

As other configurations of the sample pressing mechanism used in this type of analyzer, those using a cylinder and those using a tension coil spring have been put into practical use.
The sample pressing mechanism 5 using the cylinder (air cylinder) 53 shown in FIG. 5 holds the base end portion of the take-out arm 52 on the support column 51 arranged on the stand base 11, and a piston on the tip end portion of the take-out arm 52. The air cylinder 53 is held so that the rod 53a is on the lower side. A pressing member 54 is attached to the tip of the piston rod 53a. The piston rod 53a is extended by driving the air cylinder 53, and the sample W is pressed by the pressing member 54 at the tip.

  Further, in the sample pressing mechanism 6 using the tension coil spring 64 shown in FIG. 6, one end of the arm 62 is rotatably supported on a horizontal support shaft 61 a provided on the column 61 fixed to the stand base 11. At the other end of the arm 62, an operation portion 62a for manually rotating the arm 62 around the support shaft 61a is formed. A pressing bar 63 for pressing the sample W is attached to an intermediate portion of the arm 62. Pins 61b and 62b are fixed to the column 61 and the arm 62, respectively, and both ends of the tension coil spring 64 are engaged between these pins 61b and 62b.

  In the configuration of FIG. 6, when the pin 62 b on the arm 62 side is located below the pin 61 b on the column 61 side, the contraction force of the tension coil spring 64 moves the tip side of the arm 62 downward. Thus, the presser bar 63 presses the sample W. From this state, the operating portion 62a of the arm 62 is manually pushed upward, and the pin 62b on the arm 62 side is positioned above the pin 61b on the column 61 side, so that the contraction force of the tension coil spring 64 is on the distal end side of the arm 62. Is moved upward, whereby the pressing of the sample W by the presser bar 63 is released.

JP 11-51867 A

  By the way, the shape of the sample provided to this type of analyzer is not necessarily a flat surface having a uniform upper surface as shown in FIGS. Considering these points, the performance and function required for the sample holding mechanism in this type of analyzer are as follows: (1) the user can easily hold the part on the sample, and (2) the sample. For example, it is possible to stably apply a force equal to or greater than a certain load, and (3) ease of use for the user. When considering the conventional sample pressing mechanism shown in FIGS. 4 to 6 by paying attention to these required items, the following problems exist.

  Since the sample pressing mechanism 4 using the plate spring 41 of FIG. 4 can rotate the plate spring 41 around the support column 44, the pressing position of the sample W can be selected as appropriate. This can correspond to the sample W having a shape. However, there is a problem in operability because considerable force is required when the leaf spring 41 is bent manually when the sample W is pressed. Further, since the pressing force of the sample W changes depending on the amount of bending of the leaf spring 41, the pressing force may be changed by the user and affect the measurement accuracy.

  On the other hand, the sample pressing mechanism 5 using the air cylinder 53 of FIG. 5 does not require human power when pressing the sample W, but not only the pressing position of the sample W is limited, but also the location where the sample W is actually pressed is known. There is a problem that it is difficult. In addition, the pressing force of the sample W is determined by the air pressure of the air cylinder 53, but if the air pressure is too strong, the sample W may tilt and affect the measurement result.

  Further, the sample pressing mechanism 6 using the tension coil spring 64 of FIG. 6 does not require much force because the extension of the tension coil spring 64 during operation is performed by the lever action using the arm 62. However, since the pressing bar 63 during the pressing operation presses the sample W while drawing an arcuate locus as indicated by an arrow A in FIG. 6, it is difficult to determine the pressing point on the sample W. There is a problem that the place where W is pressed is limited.

  The present invention has been made in view of such circumstances, and does not require a large force during operation. The pressing position of the sample can be selected as appropriate, and can be applied to samples of various shapes, and the pressing point of the sample can be understood. Equipped with a sample pressing mechanism that can easily and reliably obtain a stable pressing force under simple operation, and provide an emission spectroscopic analyzer that can perform accurate analysis on samples of various shapes That is the issue.

  In order to solve the above problems, an emission spectroscopic analysis apparatus according to the present invention includes a discharge chamber in which an electrode for discharge is housed and an opening is formed above the discharge chamber, and the light generated in the discharge chamber is a spectrometer. A light emitting stand having a light guide hole leading to the electrode, and the sample and the electrode in a state where the sample is placed on the light emitting stand so as to close the opening of the discharge chamber and pressed by the sample pressing mechanism. In the emission spectroscopic analyzer for analyzing the elements contained in the sample by measuring the light generated by the discharge with a spectrometer and supporting the sample holding mechanism fixed to the light emitting stand A shaft that is slidable in the vertical axis direction with respect to the support body and that is pivotable about the axis, a weight that engages with a lower end portion of the shaft, and an upper end portion of the shaft Fixed to the shaft And taking out member which projects Luo lateral characterized by being constituted by the sample presser bar for pressing the upper surface of the sample extends downward is fixed to the take-out member.

  Here, in the present invention, it is preferable to adopt a configuration in which the sample pressing bar is inclined in a direction away from the vertical axis toward the lower side.

  Moreover, in this invention, the structure engaged with the said shaft so that the weight of the said weight can be changed is also employable.

  In the present invention, a sample pressing rod is fixed to a shaft that is slidable along the vertical axis and supported so as to be rotatable around the vertical axis through a take-out member, and is engaged with the shaft. The problem is to be solved by obtaining the pressing force of the sample by the weight that has been caused.

  That is, by enabling the shaft to rotate around the vertical axis, the sample pressing bar is fixed to the shaft via the take-out member, so that the area on the sample that can be pressed is widened. Further, since the movement in the approach / separation direction with respect to the sample is in the vertical axis direction, the user can easily grasp the pressing point of the sample visually, and the intended point can be easily pressed. Moreover, since the pressing force acting on the sample is determined by the weight, the sample can be pressed with a constant and stable force. Further, the force required by the user for pressing the sample is only a force for lifting the shaft and the weight engaged therewith, and no excessive force is required unlike the mechanism using the leaf spring of FIG.

  According to the present invention, a large force is not required at the time of operating the sample pressing mechanism, and the pressing position of the sample can be appropriately selected, so that samples of various shapes can be handled. In addition, the pressing point of the sample is easy to understand, and a reliable and stable pressing force can be obtained under a simple operation, so that samples of various shapes can be used for analysis in a state where they are pressed with an accurate and stable force. As a result, the reliability of the analysis result can be improved.

The longitudinal cross-sectional view which shows the principal part structure of the emission-spectral-analysis apparatus based on this invention. Explanatory drawing of the shape of a sample used by this invention, and an analysis object site | part. Explanatory drawing which shows an example of the weight for changing the weight of a weight in this invention. The figure which shows the principal part structure of the conventional emission-spectral-analysis apparatus which used the leaf | plate spring as a sample pressing mechanism. Explanatory drawing of the conventional sample pressing mechanism using a cylinder. Explanatory drawing of the conventional sample pressing mechanism using a tension coil spring.

  Hereinafter, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a longitudinal cross-sectional view showing a main configuration of an emission spectroscopic analyzer according to the present invention. The feature of the present invention resides in the sample pressing mechanism 3, and the other parts are the same as those shown in FIG. 4A. Therefore, the same components as those shown in FIG. The description will be omitted.

  The light emitting stand 1 is formed with a discharge chamber 12 and a light guide hole 13 as in FIG. 4A, and an opening 12a is formed above the discharge chamber 12 so as to block the opening 12a. The sample W placed via the placement plate 16 is pressed from above by the sample pressing mechanism 3.

  The sample pressing mechanism 3 includes a support 31 fixed to the stand base 11 of the light-emitting stand 1, a shaft 32 supported by the support 31, a weight 33 that engages with a lower end of the shaft 32, and an upper end of the shaft 32. And a sample pressing bar 35 fixed to the lower surface of the take-out member 34 and projecting downward.

  A through hole extending in the vertical axis direction is formed in the support 31, and a bush 31 a is fixed to the through hole. A shaft 32 is inserted into the bush 31a, and is slidably and rotatably supported in the bush 31a. That is, the shaft 32 is supported so as to be slidable in the vertical axis direction with respect to the support 31 and to be rotatable around the vertical axis. The sample pressing bar 35 is inclined in a direction away from the shaft 32 toward the lower side.

  In FIG. 1, the take-out member 34 is largely drawn. This is because a substrate unrelated to the present invention is arranged using the upper surface of the take-out member 34, and a resin cover for covering this is attached. This is because the weight of the take-out member 34 is significantly lighter than that of the weight 33.

  As shown in FIG. 1, the sample pressing mechanism 3 of the present invention having the above-described configuration has a structure including a shaft 32, a weight 33, a take-out member 34, and a sample pressing bar 35 in the vertical axis direction by a bush 31 a by its own weight. The structure descends while being guided, and the lowering is stopped when the tip of the sample pressing bar 35 comes into contact with the sample W, thereby pressing the sample W. Therefore, the operation may be performed by holding the structure by hand and preventing the lowering, and after placing the sample W, the sample pressing bar 35 is brought into contact with the upper surface and the hand is released. As described above, the sample W is stably pressed by a constant force corresponding to the weight of the structure including the weight 33 as a main body by such a simple operation.

  Further, since the sample pressing bar 35 moves in an arc shape around the vertical axis and is inclined with respect to the vertical axis, various parts of various samples W can be pressed. That is, the sample W provided for this type of analyzer is not only the sample W having a flat upper surface as shown in FIG. 2 (a) but also the sample W having protrusions formed on the upper surface as shown in FIG. 2 (b). is there. In the present invention, by using the sample pressing bar 35 that is displaced in an arc around the vertical axis and is inclined with respect to the vertical axis, the optimal method can be selected by variously changing the pressing method of the sample W. .

  Further, in this type of analyzer, the analysis target part of the sample W is directly above the electrode 14, but the center of the sample W is not always the analysis target part. For example, as shown in FIG. There may be a case where a part P deviated from the center of the analysis target. In such a case, in particular, it is possible to move in an arc shape with the vertical axis as a base point, and by using the inclined sample pressing bar 35, various portions of the sample W can be pressed, which is useful.

  Here, when it is necessary to change the pressing force of the sample W, it is necessary to change the weight of the structure including the shaft 32, the weight 33, the take-out member 34, and the sample pressing bar 35. It is possible to change the weight of the weight 33 using the weight 330. For example, as shown in a front view (a) and a side view (b) of FIG. 3, a weight 330 having a notch 330a into which the shaft 32 can be inserted may be arbitrarily attached and detached.

  In the above embodiment, the sample pressing bar 35 is tilted with respect to the vertical axis to achieve the above-described effect. However, the present invention is not limited to this, and the sample pressing bar is mounted on the vertical axis. May be provided in parallel. In that case, particularly for a sample having a non-flat upper surface, the pressing operation is slightly restricted as compared with the case of inclining, but other effects can be obtained as they are.

DESCRIPTION OF SYMBOLS 1 Light emission stand 11 Stand base 12 Discharge chamber 12a Opening part 13 Light guide hole 14 Electrode 16 Mounting plate 2 Spectrometer 3 Sample pressing mechanism 31 Support body 31a Bush 32 Shaft 33 Weight 34 Taking-out member 35 Sample pressing rod W Sample

Claims (3)

A discharge stand having a discharge electrode accommodated therein and an opening formed above the discharge chamber; and a light guide hole for guiding light generated in the discharge chamber to the spectrometer; A sample is placed on the light emitting stand so as to close the opening of the discharge chamber and is pressed by the sample pressing mechanism, and is discharged between the sample and the electrode. In an emission spectroscopic analyzer that measures and analyzes elements contained in a sample,
A support body fixed to the light-emitting stand; a shaft that is slidable in the vertical axis direction with respect to the support body; and a shaft that is rotatably supported about the shaft; A weight that engages with the lower end of the shaft, a take-out member that is fixed to the upper end of the shaft and protrudes laterally from the shaft, and a sample that is fixed to the take-out member and extends downward to press the upper surface of the sample An emission spectroscopic analyzer characterized by comprising a presser bar.   The emission spectroscopic analysis apparatus according to claim 1, wherein the sample pressing bar is inclined in a direction away from the vertical axis toward the lower side.   3. The emission spectroscopic analyzer according to claim 1, wherein the weight is engaged with the shaft so that the weight thereof can be changed.

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