JPH0636584Y2 - Substrate storage container - Google Patents

Substrate storage container

Info

Publication number
JPH0636584Y2
JPH0636584Y2 JP1988113847U JP11384788U JPH0636584Y2 JP H0636584 Y2 JPH0636584 Y2 JP H0636584Y2 JP 1988113847 U JP1988113847 U JP 1988113847U JP 11384788 U JP11384788 U JP 11384788U JP H0636584 Y2 JPH0636584 Y2 JP H0636584Y2
Authority
JP
Japan
Prior art keywords
substrate
substrate storage
side holding
wafer
storage container
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP1988113847U
Other languages
Japanese (ja)
Other versions
JPH0235448U (en
Inventor
俊作 児玉
賢司 杉本
茂 小原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP1988113847U priority Critical patent/JPH0636584Y2/en
Publication of JPH0235448U publication Critical patent/JPH0235448U/ja
Application granted granted Critical
Publication of JPH0636584Y2 publication Critical patent/JPH0636584Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Description

【考案の詳細な説明】 《産業上の利用分野》 本考案は、半導体ウエハや液晶用基板等の薄板状基板を
所要の処理液あるいは所要の蒸気内に浸漬して洗浄処理
する際に、複数枚の薄板状基板を垂直姿勢で前後に平行
させて保持する為の基板収納容器に関する。
[Detailed Description of the Invention] << Industrial Application Field >> The present invention is applicable to a plurality of thin substrates such as semiconductor wafers and liquid crystal substrates when they are immersed in a required processing liquid or a required vapor for cleaning treatment. The present invention relates to a substrate storage container for holding a plurality of thin plate-shaped substrates in a vertical posture in parallel with each other in the front-rear direction.

《従来技術》 薄板状の基板(以下、端にウエハという)を洗浄槽等の
薬液槽に浸漬して処理する際に、複数枚のウエハをカセ
ツト内に垂直姿勢で前後に平行させて収容させ、カセツ
トごと薬液槽に浸漬するようにしている。そして、この
カセツトとして、従来、例えば実開昭57-17143号公報
(考案の名称「半導体ウエハ収納治具」)に開示された
ものが知られている。
<Prior art> When a thin plate substrate (hereinafter referred to as a wafer at the end) is immersed in a chemical bath such as a cleaning bath for processing, a plurality of wafers are housed in a cassette in a vertical posture in parallel with each other. , The cassette is soaked in a chemical bath. As this cassette, the one disclosed in, for example, Japanese Utility Model Laid-Open No. 57-17143 (invention name "semiconductor wafer storage jig") is known.

これは、前後側壁部材と、内面に複数の基板収容溝を垂
直方向に多数形成した側壁部材とで上下開放状の枠体で
カセツトを構成し、側壁部材の内面に形成した基板収納
溝を側壁部材の上端部から側壁部材の上下中間部まで刻
設することにより、基板収納溝の下端部でウエハを受け
止めるように構成してあった。
This is a cassette composed of a front and rear side wall member and a side wall member having a plurality of substrate receiving grooves vertically formed on the inner surface thereof. By engraving from the upper end of the member to the upper and lower intermediate parts of the side wall member, the wafer is received at the lower end of the substrate storage groove.

《解決しようとする課題》 従来のこの種カセツトはフッ素樹脂やポリプロピレン等
の耐薬品性樹脂で一体に形成されている。ところが樹脂
製カセツトの場合、薬液処理済のウエハを純水で洗浄す
る際に当該カセツトの地肌に染み込んだ処理薬液が純水
中に流出し、ウエハに異物を付着させるという問題があ
った。これは、樹脂製カセットを成形する際に樹脂表面
に生成されたポーラス状の微細な凹部や穴部に処理薬液
が毛細管現象により浸入して、微細な凹部等に残留し、
この残留した処理薬液が純水中に流出して、ウエハを汚
染するためと考えられる。
<Problems to be Solved> A conventional cassette of this kind is integrally formed of a chemical resistant resin such as fluororesin or polypropylene. However, in the case of a resin cassette, there is a problem in that, when a wafer treated with a chemical solution is washed with pure water, the processing chemical solution that has permeated the background of the cassette flows out into the pure water and adheres foreign matter to the wafer. This is because the processing chemical solution infiltrates into the porous minute recesses and holes generated on the resin surface when molding the resin cassette by capillary action, and remains in the minute recesses, etc.,
It is considered that this residual processing chemical solution flows out into pure water and contaminates the wafer.

また従来では、基板収納溝を側壁部材の途中まで形成
し、基板収納溝の下端部でウエハの周縁部を受け止める
ようにしていたことから、基板収納溝下端部のウエハを
受け止める部分等に処理液が残留することがある。
Further, in the past, since the substrate storage groove was formed up to the middle of the side wall member and the lower edge of the substrate storage groove was used to receive the peripheral edge of the wafer, the processing liquid was applied to the lower end portion of the substrate storage groove that receives the wafer. May remain.

即ち、側部保持板の基板収納溝に連なる上端面が水平面
であれば、当該基板収納容器を処理液や処理液蒸気の処
理槽内に浸漬してウエハを処理した後、これを取り出
し、あるいは処理槽内の処理液を排出する際に、当該側
部保持板の上端面に処理液が液滴となって滞留する。こ
の液滴は基板収納容器を移送等する際に流下して基板収
納溝のウエハを受け止める部分に残留する。
That is, if the upper end surface of the side holding plate that is continuous with the substrate storage groove is a horizontal surface, the substrate storage container is immersed in a processing bath of processing liquid or processing liquid vapor to process the wafer, and then the wafer is taken out, or When the processing liquid in the processing tank is discharged, the processing liquid stays as droplets on the upper end surface of the side holding plate. The droplets flow down during transfer of the substrate storage container and remain in the portion of the substrate storage groove that receives the wafer.

また、ウエハを収容した基板収納容器を複数種の処理槽
内に順次浸漬してウエハの処理をなす装置にいおては、
上記液滴が別の処理液に混入して処理品質が低下するの
みならず、処理液の持ち出しにより処理液を余分に消費
することとなる。
Further, in the apparatus for processing a wafer by sequentially immersing the substrate storage container containing the wafer in a plurality of types of processing tanks,
Not only the droplets mix with another processing liquid to deteriorate the processing quality, but also the processing liquid is consumed and the processing liquid is excessively consumed.

しかも、ウエハ処理後、引き続き当該基板収納容器を乾
燥する場合には、残留した液滴が乾燥の障害になる。
Moreover, when the substrate storage container is subsequently dried after the wafer processing, the remaining droplets hinder the drying.

さらに、基板収納容器に付着した液滴がウエハに再付着
すると、ウエハにしみ状の汚れが発生することにもな
る。
Further, when the droplets attached to the substrate storage container are reattached to the wafer, stains on the wafer may occur.

本考案はこのような不都合を解消する基板収納容器を提
供することを目的とする。
An object of the present invention is to provide a substrate storage container that eliminates such inconvenience.

《課題を解決するための手段》 上記目的を達成するために、本考案は以下のように構成
される。
<< Means for Solving the Problems >> In order to achieve the above object, the present invention is configured as follows.

即ち、上下開放状の枠体内に形成した基板収容空間に複
数枚の基板を垂直姿勢で前後に並列させて収容保持する
基板収納容器であって、 上下に貫通する複数の基板収納溝を一定のピッチで形成
し、基板収納溝同士が所定間隙へだてて左右に多孔する
状態に配置した左右の側部保持板と、側部保持板の基板
収納溝と同一ピッチで基板受止溝を形成し、基板受止溝
が側部保持板の基板収納溝と同一垂直平面内に位置する
状態で配置した底部保持杆と、側部保持板及び底部保持
杆の核両端部に連結された前後一組の固設部材とからな
り、 前記基板収納溝を上下に貫通形成した側部保持板の上端
面及び下端面を傾斜面に形成するとともに、底部保持杆
の基板受止溝の底面を、そこに受け止める基板の端縁に
沿い基板収納容器の内側に向いて下向きに傾斜する傾斜
面に形成し、底部保持杆を左右の側部保持板同士間の中
央部から左右に外れた位置に配置し、側部保持板の基板
収納溝の上端を基板との接触位置より高く形成し、左右
側部保持板と前後固設部材との少なくとも一方の外壁部
に被挟持用の外向きの鍔部を形成し、左右側部保持板と
底部保持杆及び前後固設部材を石英材料で形成したこと
を特徴としている。
That is, it is a substrate storage container that stores and holds a plurality of substrates side by side in a vertical posture in a substrate storage space formed in an open-closed frame, and a plurality of substrate storage grooves that penetrate vertically are fixed. Formed at a pitch, the left and right side holding plates arranged in a state where the board receiving grooves are poked to a predetermined gap and are perforated left and right, and the board receiving grooves are formed at the same pitch as the board receiving grooves of the side holding plates, A bottom holding rod arranged in a state where the substrate receiving groove is located in the same vertical plane as the substrate receiving groove of the side holding plate, and a pair of front and rear connected to both ends of the core of the side holding plate and the bottom holding rod. The upper and lower end surfaces of the side holding plate, which is formed of a fixed member and vertically penetrates the substrate storage groove, are formed into inclined surfaces, and the bottom surface of the substrate receiving groove of the bottom holding rod is received by the side holding plate. Along the edge of the board, facing the inside of the board container and facing downward It is formed on a slanted inclined surface, the bottom holding rod is arranged at a position deviated to the left and right from the central portion between the left and right side holding plates, and the upper end of the substrate storage groove of the side holding plate is located more than the contact position with the substrate Formed high, an outward facing flange for holding is formed on at least one outer wall of the left and right side holding plates and the front and rear fixed members, and the left and right side holding plates, the bottom holding rod and the front and rear fixed members are formed. It is characterized by being formed of a quartz material.

《作用》 本考案では基板収納容器を石英材料で構成してあること
から、その表面をポーラス状の微細な凹部や穴部がない
平滑面に形成することができ、構成部材への薬液の地肌
への浸入やそこから流出したパーテイクルが基板に付着
するという現象が生じることがなくなる。
<Operation> Since the substrate container is made of a quartz material in the present invention, its surface can be formed into a smooth surface without microscopic concaves and holes, and the background of the chemical solution on the constituent members can be formed. The phenomenon that the particles infiltrate into the substrate and the particles that flow out therefrom adhere to the substrate will not occur.

また、本考案では、基板収納溝を上下に貫通形成した側
部保持板の上端面及び下端面を傾斜面に形成するととも
に、底部保持杆の基板受止溝の底面を、そこに受け止め
る基板の端縁に沿い基板収納容器の内側方向に向いて下
向きに傾斜する傾斜面に形成したことから、以下のよう
に作用する。
Also, in the present invention, the upper and lower end surfaces of the side holding plate having the board receiving groove formed vertically therethrough are formed as inclined surfaces, and the bottom surface of the board receiving groove of the bottom holding rod is received by the board. Since it is formed as an inclined surface that is inclined downward toward the inner side of the substrate storage container along the edge, it operates as follows.

基板収納容器を処理槽内より取り出し、あるいは、処理
槽内の処理液を排出する際に、処理液は上記核傾斜面に
沿って速やかに流下する。つまり、当該側部保持板の上
端面や下端面、及び底部保持杆の基板受止溝に処理液が
液滴となって滞留することはない。
When the substrate storage container is taken out of the processing tank or the processing liquid in the processing tank is discharged, the processing liquid quickly flows down along the nuclear inclined surface. That is, the processing liquid does not stay in the form of liquid droplets on the upper end surface and the lower end surface of the side holding plate and the substrate receiving groove of the bottom holding rod.

従って、基板収納容器を移送等る際に、液滴が流下して
基板収納溝のウエハを受け止める部分に残留する等の不
都合は生じない。
Therefore, when the substrate storage container is transferred or the like, there is no inconvenience that the liquid droplets flow down and remain on the portion of the substrate storage groove that receives the wafer.

《実施例》 図面は本考案の実施例を示し、第1図は一部を切除した
斜視図、第2図は縦断正面図である。
<< Embodiment >> A drawing shows an embodiment of the present invention, FIG. 1 is a partially cutaway perspective view, and FIG. 2 is a vertical sectional front view.

この基板収納容器(以下カセットという)は、上下に貫
通する複数の基板収納溝(1)を一定のピツチで前後に
形成した左右一対の側部保持板(2)と、周面の一部に
前記基板収納溝(1)の形成ピッチと同一のピツチで基
板受止溝(3)をそれぞれ形成した一対の円柱状の底部
保持杆(4)と、各側部保持板(2)及び底部保持杆
(3)の各両端部に連結する前後一組の固設部材(5)
とで構成してある。
This substrate storage container (hereinafter referred to as a cassette) has a pair of left and right side holding plates (2) having a plurality of substrate storage grooves (1) penetrating vertically and formed with a certain pitch in front and back, and a part of the peripheral surface. A pair of columnar bottom holding rods (4) each having a substrate receiving groove (3) formed at the same pitch as the substrate accommodating groove (1), and side holding plates (2) and bottom holding. A set of front and rear fixed members (5) connected to both ends of the rod (3)
It consists of and.

これら側部保持板(2)、底部保持杆(4)、固設部材
(5)はそれぞれ石英材料で形成してあり、所定間隔へ
だてて対置させた前後固設部材(5)(5)間に側部保
持板(2)を基板収納溝(1)同士が所定間隙へだてて
左右に対向する状態に配置するとともに、前後固設部材
間(5)(5)に底部保持杆(4)をその基板受止溝
(3)が側部保持板(2)の基板収納溝(1)と同一垂
直平面内に位置する状態で左右に小間隔へだてて配置す
ることにより、上下開放状の枠体に一体形成している。
The side holding plate (2), the bottom holding rod (4), and the fixing member (5) are each made of a quartz material, and are placed between the front and rear fixing members (5) and (5) that are opposed to each other at a predetermined interval. The side holding plate (2) is arranged such that the substrate storage grooves (1) face each other with a predetermined gap, and the bottom holding rod (4) is placed between the front and rear fixed members (5) (5). A frame body that is vertically open by arranging the substrate receiving groove (3) with a small space left and right with the substrate receiving groove (3) located in the same vertical plane as the substrate receiving groove (1) of the side holding plate (2). It is formed integrally with.

側部保持板(2)に形成した基板収納溝(1)の上端
は、カセット内にウエハ(9)を収納した際、ウエハ
(9)と接触する左右の位置より少なくとも所定の高さ
上方まで形成されていることが必要である。これは、例
えば第4図に示すように各ウエハ(9)ごとのオリエン
テーションフッラットを揃えるため、ウエハ(9)の下
方りオリエンテーション合わせのための回転自在のロー
ラ(10)を上昇させ、ウエハ(9)を底部保持杆(4)
(4)より上昇させて回転させる場合のウエハガイド作
用を側部保持板(2)(2)に持たせるためである。
The upper end of the substrate storage groove (1) formed in the side holding plate (2) is at least a predetermined height above the left and right positions in contact with the wafer (9) when the wafer (9) is stored in the cassette. It must be formed. For example, as shown in FIG. 4, in order to align the orientation flats of the wafers (9), the rotatable roller (10) for lowering the orientation of the wafer (9) is raised to move the wafer (9). 9) Bottom holding rod (4)
This is because the side holding plates (2) and (2) have a wafer guiding action when they are raised and rotated from (4).

又、基板収納溝(1)の高さとしては、洗浄槽内にカセ
ットを浸漬させて第4図のように、ウエハ(9)を回転
させながら洗浄処理する場合のウエハガイド作用を、側
部保持板(2)が行えるような高さがあればよい。
Further, the height of the substrate storage groove (1) is such that the wafer guide action when the cassette is immersed in the cleaning tank and the cleaning process is performed while rotating the wafer (9) as shown in FIG. It suffices if the height is such that the holding plate (2) can be operated.

なお、第2図に示すようにウエハ昇降杆(12)のウエハ
収納溝にウエハ(9)を載置させ、ウエハ(9)をカセ
ットより上昇させ、一対のウエハ挟持杆(13)にて挟持
し、ウエハ(9)を他のカセットに移し替える場合での
ウエハの昇降ガイド機能を側部保持板(2)(2)は有
している。
As shown in FIG. 2, the wafer (9) is placed in the wafer storage groove of the wafer elevating rod (12), the wafer (9) is lifted from the cassette, and is held by the pair of wafer holding rods (13). However, the side holding plates (2) and (2) have a wafer elevating / lowering guide function when the wafer (9) is transferred to another cassette.

また、図外の自動搬送手段の挟持フィンガーを第1図の
鍔部(6)(6)に係止して他の処理槽に移送する際に
は、各側部保持板(2)(2)の基板収納溝(1)は、
ウエハ(9)が振動により落下するのを防止する振れ止
め機能をも有する。このような各種機能を果たすよう
に、上記基板収納溝(1)の長さが決定される。
Further, when the holding fingers of the automatic transfer means (not shown) are locked to the collar portions (6) and (6) in FIG. 1 and transferred to another processing tank, the side holding plates (2) (2) ) Board storage groove (1)
It also has a steady rest function to prevent the wafer (9) from falling due to vibration. The length of the substrate accommodating groove (1) is determined so as to fulfill such various functions.

左右側部保持板(2)の各上端部に外向きの鍔部(6)
を形成してカセットを左右方向から挟持して吊持可能に
構成するとともに、前後固設部材(5)の左右側部にお
ける上端部に凹部(7)を形成してカセットを前後方向
から挟持して吊持可能に構成してある。また、左右側部
保持板(2)の下端縁は前後固設部材(5)の下端縁よ
りも高く位置するように形成することにより、処理液が
カセットの内部に形成される基板収納空間(8)内に流
れ込み易くなり、処理液とウエハ(9)とが効率よく接
触するように構成してある。従って、下方より超音波洗
浄する際にも、超音波がウエハ表面に到達し易くなる。
Outward flanges (6) on the upper ends of the left and right side holding plates (2)
To form a concave portion (7) at the upper end portions of the left and right side portions of the front and rear fixing member (5) to hold the cassette from the front-rear direction. It is configured so that it can be suspended. Further, by forming the lower end edges of the left and right side holding plates (2) to be positioned higher than the lower end edges of the front and rear fixing members (5), the substrate storage space (where the processing liquid is formed inside the cassette) is formed. 8) It is easy to flow into the inside, and the processing liquid and the wafer (9) are efficiently contacted. Therefore, even when ultrasonic cleaning is performed from below, ultrasonic waves easily reach the wafer surface.

また、第1図及び後述する第2図〜第4図に示すよう
に、基板収納溝(1)を上下に貫通した側部保持板
(2)の上端面(1a)及び下端面(1b)をそれぞれ傾斜
面に形成する。基板収納容器を処理槽内より取り出し、
あるいは、処理槽内の処理液を排出する際に、処理液を
上記核傾斜面(1a)(1b)に沿って速やかに流下させ
て、滞留させないためである。従って、基板収納容器を
移送等する際に、液滴が流下して基板収納溝(1)のウ
エハ(9)を受け止める部分に残留する等の不都合は生
じない。
Further, as shown in FIG. 1 and FIGS. 2 to 4 described later, the upper end surface (1a) and the lower end surface (1b) of the side part holding plate (2) vertically penetrating the substrate storage groove (1). Are formed on the respective inclined surfaces. Remove the substrate storage container from the processing tank,
Alternatively, when the processing liquid in the processing tank is discharged, the processing liquid is caused to quickly flow down along the nuclear inclined surfaces (1a) and (1b) so as not to stay. Therefore, when the substrate storage container is transferred, there is no inconvenience that the droplets flow down and remain on the portion of the substrate storage groove (1) that receives the wafer (9).

底部保持杆(4)は枠状に形成したカセットの左右中心
線を通る垂直面に対して面対称に配置してあり、基板の
真下から離れて配置されている。このため、一対の底部
保持杆(4)の間にウエハ(9)のオリエンテーション
フラットを合わせるためのローラ(10)を挿出入させた
り、ウエハを他の容器に移し替える為のウエハ昇降機構
(12)を挿出入させたりすることができる。また、核底
部保持杆(4)に形成されている基板受止溝(3)はそ
の底面が、そこに受け止めるウエハ(9)の端縁に沿
い、それぞれカセット内側方向に向かって下向きに傾斜
する傾斜面に形成されている。
The bottom holding rod (4) is arranged in plane symmetry with respect to a vertical plane passing through the left and right centerlines of the cassette formed in a frame shape, and is arranged apart from directly under the substrate. For this reason, a roller (10) for adjusting the orientation flat of the wafer (9) between the pair of bottom holding rods (4) and a wafer lifting mechanism (12) for transferring the wafer to another container. ) Can be inserted and removed. The bottom surface of the substrate receiving groove (3) formed in the nucleus bottom holding rod (4) is inclined downward toward the inside of the cassette along the edge of the wafer (9) received there. It is formed on an inclined surface.

このように形成したカセットでは、ウエハ(9)を側部
保持板(2)に形成した基板収納溝(1)でガイドした
状態でその内部に形成される基板収納空間(8)内に挿
入し、ウエハ(9)を垂直姿勢に立てた状態で収納する
のであるが、基板収納溝(1)は上下貫通状に形成され
ているから、ウエハ(9)は底部保持杆(4)の基板受
止溝(3)で受け止められてその落下を阻止することに
なる。このとき、基板受止溝(3)の底部はウエハ
(9)の周面に接線状に接触するから、ウエハ(9)の
周面と基板受止溝(3)の底面は点接触で当接してい
る。このため、カセットを処理液槽から引き上げた際
に、基板収納溝(1)や基板受止溝(3)部分に処理液
や異物が残留することがなく、液切りを確実に行うこと
ができる。
In the cassette thus formed, the wafer (9) is inserted into the substrate storage space (8) formed therein while being guided by the substrate storage groove (1) formed in the side holding plate (2). , The wafer (9) is accommodated in a vertical posture, but since the substrate accommodating groove (1) is formed in a vertically penetrating manner, the wafer (9) is accommodated in the substrate receiving member of the bottom holding rod (4). It will be received by the stop groove (3) and will prevent its fall. At this time, since the bottom of the substrate receiving groove (3) is tangentially in contact with the peripheral surface of the wafer (9), the peripheral surface of the wafer (9) and the bottom surface of the substrate receiving groove (3) are in point contact with each other. Touching. Therefore, when the cassette is pulled out from the processing liquid tank, the processing liquid or foreign matter does not remain in the substrate storage groove (1) or the substrate receiving groove (3) portion, and the liquid can be surely drained. .

なお、上記実施例では底部保持杆(4)を左右一対の杆
体で構成したが、これを1本の杆体で構成するようにし
てもよい。
Although the bottom holding rod (4) is composed of a pair of left and right rods in the above embodiment, it may be constituted by a single rod.

第1図中符号(15)は固設部材(5)の外面に形成され
た基準当たり面であり、この基準当たり面(15)を基準
にして側部保持板(2)に基板収納溝(1)を、また底
部保持杆(4)に基板受止溝(3)を加工するようにし
てある。又、基準当たり面(15)は位置決めに用い、基
準当たり面(15)を図示していない位置決め部に当接さ
せることにより、図示していない外部のウエハ挟持杆、
又はウエハ昇降杆のウエハ収納溝とのピッチを正確に一
致させ、ウエハを挟持又は昇降の際、落下させないよう
にしている。
Reference numeral (15) in FIG. 1 denotes a reference contact surface formed on the outer surface of the fixed member (5), and the side surface holding plate (2) is provided with a substrate storage groove ( 1) and the substrate holding groove (3) is processed in the bottom holding rod (4). Further, the reference contact surface (15) is used for positioning, and the reference contact surface (15) is brought into contact with a positioning portion (not shown), so that an external wafer holding rod (not shown),
Alternatively, the pitch of the wafer elevating rod and the wafer accommodating groove are accurately matched so that the wafer is not dropped when it is clamped or lifted.

第3図は本考案の別実施例を示し、これは、各側部保持
板(2)を上下に二分割し、その間に処理液流通空間
(11)を設けるとともに、前後固設部材(5)(5)の
下部間に架着する底部保持杆(4)を断面三角形状の角
柱で形成し、角柱状の底部保持杆(4)をその頂角が上
向きとなる状態に配置したものであり、この場合にも底
部保持杆(4)に基板受止溝(3)が形成してあり、そ
の基板受止溝(3)は、処理液や異物が溜まらないよう
にその溝底面をそこに受け止める基板の端縁に沿ってカ
セットの内側方向に向いて下向きに傾斜する傾斜面に形
成してある。
FIG. 3 shows another embodiment of the present invention, in which each side holding plate (2) is divided into upper and lower parts, a processing liquid flow space (11) is provided between them, and front and rear fixing members (5). ) The bottom holding rod (4) mounted between the lower parts of (5) is formed by a prism having a triangular cross section, and the bottom holding rod (4) having a prismatic shape is arranged with its apex angle facing upward. Even in this case, the substrate holding groove (3) is formed in the bottom holding rod (4), and the substrate receiving groove (3) is formed on the bottom surface of the groove so that the processing liquid and the foreign matter are not accumulated. It is formed on the inclined surface which is inclined downward toward the inner side of the cassette along the edge of the substrate which is received.

なお、第5図のように側部保持板(2)の下端を長手方
向に傾斜させるように構成してもよい。
The lower end of the side holding plate (2) may be inclined in the longitudinal direction as shown in FIG.

また、スピンドライヤーと称される旋回仕切乾燥装置内
にウエハを収納するためのウエハカセットとして、本考
案に係る基板収納容器を用いてもよい。
Further, the substrate storage container according to the present invention may be used as a wafer cassette for storing wafers in a rotary partition dryer called a spin dryer.

《効果》 本考案では基板収納容器を石英材料で構成してあること
から、その表面をポーラス状の微細な凹部や穴部がない
平滑面に形成することができ、構成部材への薬液の基板
収納容器表面からの浸入やそこから染み出したパーテイ
クルが基板に付着するという現象が生じることがなくな
る。これにより、処理液槽に前工程における処理液の影
響が生じることがなくなり、基板の表面処理を高品質で
行うことができる。
<Effect> In the present invention, since the substrate storage container is made of a quartz material, the surface thereof can be formed into a smooth surface having no minute concave portions or holes of a porous shape, and the substrate of the chemical solution to the constituent members can be formed. The phenomenon that infiltration from the surface of the storage container and particles exuding from the surface adhere to the substrate does not occur. As a result, the treatment liquid tank is not affected by the treatment liquid in the previous step, and the surface treatment of the substrate can be performed with high quality.

また、本考案では、側部保持板の上端面及び下端面と底
部保持杆の基板受止溝の底面を、それぞれ傾斜面に形成
したことから、基板収納容器を処理槽内より取り出し、
あるいは、処理槽内の処理液を排出する際に、処理液は
上記各傾斜面に沿って速やかに流下し、当該側部保持板
の上端面や底部保持杆の基板受止溝に処理液が液滴とな
って滞留することはないので、以下の効果を奏する。
Further, in the present invention, since the upper end surface and the lower end surface of the side holding plate and the bottom surface of the substrate receiving groove of the bottom holding rod are formed as inclined surfaces, respectively, the substrate storage container is taken out from the processing tank,
Alternatively, when the processing liquid in the processing tank is discharged, the processing liquid quickly flows down along each of the inclined surfaces, and the processing liquid is discharged to the upper end surface of the side holding plate and the substrate receiving groove of the bottom holding rod. Since it does not stay as droplets, it has the following effects.

ウエハを収容した基板収納容器を複数種の処理槽内に
順次浸漬してウエハの処理をなす装置においては、基板
収納容器に付着した液滴が別の処理液に混入して処理品
質が低下するおそれはない。
In an apparatus for processing a wafer by sequentially immersing a substrate storage container containing a wafer in a plurality of types of processing tanks, the droplets adhering to the substrate storage container are mixed with another processing liquid to deteriorate the processing quality. There is no fear.

また、処理液の持ち出しによる処理液の消費を少なく
できる。
Further, it is possible to reduce the consumption of the processing liquid due to taking out the processing liquid.

さらに、上記処理後、引き続きウエハを収容した基板
収納容器を乾燥する装置において、水滴が乾燥の障害に
なることもない。
Further, in the apparatus for drying the substrate storage container that stores the wafers after the above processing, water droplets do not hinder the drying.

しかも、基板収納容器に付着した水滴ウエハに再付着
することもないので、ウエハにしみ状の汚れが発生する
こともない。
Moreover, since the water droplets that have adhered to the substrate storage container do not reattach to the wafer, stains on the wafer do not occur.

【図面の簡単な説明】[Brief description of drawings]

図面は本考案の実施例を示し、第1図は一部を切除した
斜視図、第2図は縦断正面図、第3図及び第4図はそれ
ぞれ別実施例の第2図相当図、第5図は別実施例の一部
を切除した側面図である。 1……基板収納溝、1a……側部保持板の上端面、1b……
側部保持板の下端面、2……側部保持板、3……基板受
止溝、4……底部保持杆、5……固設部材、6……鍔
部、8……基板収納空間、9……基板。
The drawings show an embodiment of the present invention. Fig. 1 is a partially cutaway perspective view, Fig. 2 is a longitudinal front view, and Figs. 3 and 4 are views corresponding to Fig. 2 of another embodiment, respectively. FIG. 5 is a side view in which a part of another embodiment is removed. 1 ... Substrate storage groove, 1a ... Upper surface of side holding plate, 1b ...
Lower end surface of side holding plate, 2 ... Side holding plate, 3 ... Board receiving groove, 4 ... Bottom holding rod, 5 ... Fixed member, 6 ... Collar part, 8 ... Board storage space , 9 ... substrate.

───────────────────────────────────────────────────── フロントページの続き (56)参考文献 特開 昭60−177642(JP,A) 特開 昭61−39545(JP,A) 実開 昭60−926(JP,U) ─────────────────────────────────────────────────── ─── Continuation of the front page (56) References JP-A-60-177642 (JP, A) JP-A-61-39545 (JP, A) Actual development Sho-60-926 (JP, U)

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】上下開放状の枠体内に形成した基板収容空
間に複数枚の基板を垂直姿勢で前後に並列させて収容保
持する基板収納容器であって、 上下に貫通する複数の基板収納溝を一定のピッチで形成
し、基板収納溝同士が所定間隙へだてて左右に対向する
状態に配置した左右の側部保持板と、 側部保持板の基板収納溝と同一ピッチで基板受止溝を形
成し、基板受止溝が側部保持板の基板収納溝と同一垂直
平面内に位置する状態で配置した底部保持杆と、 側部保持板及び底部保持杆の各両端部に連結された前後
一組の固設部材とからなり、 前記基板収納溝を上下に貫通形成した側部保持板の上端
面及び下端面を傾斜面に形成するとともに、 底部保持杆の基板受止溝の底面を、そこに受け止める基
板の端縁に沿い基板収納容器の内側に向いて下向きに傾
斜する傾斜面に形成し、 底部保持杆を左右の側部保持板同士間の中央部から左右
に外れた位置に配置し、側部保持板の基板収納溝の上端
を基板との接触位置より高く形成し、 左右側部保持板と前後固設部材との少なくとも一方の外
壁部に被挟持用の外向きの鍔部を形成し、 左右側部保持板と底部保持杆及び前後固設部材を石英材
料で形成したことを特徴とする基板収納容器。
1. A substrate storage container for storing and holding a plurality of substrates side by side in a vertical posture in a substrate storage space formed in a vertically open frame body, and a plurality of substrate storage grooves penetrating vertically. Are formed at a fixed pitch, and the left and right side holding plates are arranged so that the board receiving grooves face each other with a predetermined gap and face each other, and the board receiving grooves are formed at the same pitch as the board receiving grooves of the side holding plates. The bottom holding rods are formed so that the board receiving groove is located in the same vertical plane as the board receiving groove of the side holding plate, and the front and rear connected to each end of the side holding plate and the bottom holding rod. It is composed of a set of fixed members, and the upper and lower end surfaces of the side holding plates which are formed by vertically penetrating the substrate housing groove are formed as inclined surfaces, and the bottom surface of the substrate receiving groove of the bottom holding rod is Along the edge of the board that receives it, facing the inside of the board storage container It is formed on an inclined surface that tilts in the direction, and the bottom holding rod is placed at a position left and right apart from the center between the left and right side holding plates, and the upper end of the substrate storage groove of the side holding plate contacts the substrate. Formed higher than the position, an outward facing flange for holding is formed on the outer wall of at least one of the left right side holding plate and the front and rear fixed members, and the left right side holding plate, bottom holding rod and front and rear fixed A substrate storage container, wherein the member is made of a quartz material.
JP1988113847U 1988-08-29 1988-08-29 Substrate storage container Expired - Lifetime JPH0636584Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988113847U JPH0636584Y2 (en) 1988-08-29 1988-08-29 Substrate storage container

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988113847U JPH0636584Y2 (en) 1988-08-29 1988-08-29 Substrate storage container

Publications (2)

Publication Number Publication Date
JPH0235448U JPH0235448U (en) 1990-03-07
JPH0636584Y2 true JPH0636584Y2 (en) 1994-09-21

Family

ID=31354053

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988113847U Expired - Lifetime JPH0636584Y2 (en) 1988-08-29 1988-08-29 Substrate storage container

Country Status (1)

Country Link
JP (1) JPH0636584Y2 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0810196Y2 (en) * 1991-03-22 1996-03-27 ヤマハ株式会社 Wafer carrier
JP2585005Y2 (en) * 1992-06-04 1998-11-11 株式会社柿崎製作所 Basket for semiconductor wafer
JP2002329702A (en) * 2001-05-01 2002-11-15 Sumitomo Electric Ind Ltd Semiconductor substrate cleansing tool and method of inserting wafer into it
JP5153399B2 (en) * 2008-03-19 2013-02-27 三洋電機株式会社 Substrate case and processing method

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60926U (en) * 1983-06-15 1985-01-07 ソニー株式会社 Semiconductor substrate storage container
JPS60177642A (en) * 1984-02-24 1985-09-11 Hitachi Ltd Container vessel
JPS6139545A (en) * 1984-07-31 1986-02-25 Toshiba Ceramics Co Ltd Wafer carrier

Also Published As

Publication number Publication date
JPH0235448U (en) 1990-03-07

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