JPH06320661A - Production of transparent conductive film - Google Patents

Production of transparent conductive film

Info

Publication number
JPH06320661A
JPH06320661A JP5137005A JP13700593A JPH06320661A JP H06320661 A JPH06320661 A JP H06320661A JP 5137005 A JP5137005 A JP 5137005A JP 13700593 A JP13700593 A JP 13700593A JP H06320661 A JPH06320661 A JP H06320661A
Authority
JP
Japan
Prior art keywords
transparent conductive
conductive layer
substrate
temp
plastic substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5137005A
Other languages
Japanese (ja)
Inventor
Junichi Aso
順一 阿相
Yoshihiro Arai
芳博 荒井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tonen Chemical Corp
Original Assignee
Tonen Sekiyu Kagaku KK
Tonen Chemical Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tonen Sekiyu Kagaku KK, Tonen Chemical Corp filed Critical Tonen Sekiyu Kagaku KK
Priority to JP5137005A priority Critical patent/JPH06320661A/en
Publication of JPH06320661A publication Critical patent/JPH06320661A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To provide a transparent conductive film having low resistance and high visible light transmissivity by forming the transparent conductive layer on a plastic substrate at the thermal deterioration temp. of the plastic substrate or lower and subsequently applying specific heat treatment to the conductive layer. CONSTITUTION:A transparent conductive layer is provided to a plastic substrate at the thermal deterioration temp. of the substrate or lower. The transparent conductive layer is formed from metal oxide such as Sn added In2O3, Sb added SnO2 or F added SnO2 by a vapor deposition method, a sputtering method, an ion plating method, a CVD method and a spray method. At this time, the transparent conductive layer is formed at the thermal deterioration temp. of the substrate or lower, for example, at temp. of 100 deg.C or lower. Thereafter, the plastic substrate having the transparent conductive layer provided thereto is heat-treated for 15min at temp. of 80 below 150 deg.C under vacuum of 1Torr or less. By this method, the transparent conductive film having low resistance and high transmissivity can be easily obtained.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は透明導電膜の製造方法に
関する。
FIELD OF THE INVENTION The present invention relates to a method for producing a transparent conductive film.

【0002】[0002]

【従来の技術およびその課題】基板上にIn2 3 、Z
nO、SnO2 等の導電材料の層を設けた透明導電薄膜
は、液晶ディスプレイ、タッチパネル、センサ、太陽電
池における透明電極等の分野において広く用いられてい
る。
2. Description of the Related Art In 2 O 3 , Z on a substrate
A transparent conductive thin film provided with a layer of a conductive material such as nO or SnO 2 is widely used in the fields of liquid crystal displays, touch panels, sensors, transparent electrodes in solar cells and the like.

【0003】透明導電薄膜の基板は、例えば液晶ディス
プレイなどでは、薄型化、軽量化および耐衝撃性改善の
観点から、従来のガラス基板からプラスチック基板への
代替が進んでいる。
In the case of a liquid crystal display, for example, the transparent conductive thin film substrate is being replaced by a conventional glass substrate by a plastic substrate from the viewpoints of thinning, weight reduction and impact resistance improvement.

【0004】ところで、透明導電薄膜の品質は膜の比抵
抗値によって決まり、例えば液晶ディスプレイにおいて
は、大面積化、表示密度の向上に伴って、より比抵抗値
の小さい透明導電薄膜が要求されるようになってきた。
他の用途においても同様に、比抵抗値をより小さくする
ことが求められている。ガラス基板の場合、低抵抗化の
手段として、加熱による膜の結晶化(ITO膜では150
〜200 ℃以上)の手法が有効であった。しかしながら、
プラスチック基板は耐熱性に乏しいため、この様な加熱
処理が行えない。
By the way, the quality of the transparent conductive thin film is determined by the specific resistance value of the film. For example, in a liquid crystal display, a transparent conductive thin film having a smaller specific resistance value is required with an increase in area and display density. It's starting to happen.
Similarly, in other applications, it is required to make the specific resistance value smaller. In the case of a glass substrate, crystallization of the film by heating (ITO film is 150
The above method was effective. However,
Since the plastic substrate has poor heat resistance, such heat treatment cannot be performed.

【0005】また、現在、透明導電薄膜の作製法は、ス
パッタ法が主流であるが、スパッタ法による膜の低抵抗
化の技術として、4極スパッタ、さらにはカソード部の
磁場を強めることにより放電インピーダンスを下げ、低
電圧にてスパッタする等の技術が開発されている。しか
し、前者は熱フィラメントを用いるため、その熱輻射に
よる基板劣化が生じ、熱遮断板を設ける等カソード周り
が複雑になり、操作性が悪くなるという問題があった。
また、後者の場合、低抵抗化にある程度有効であるが、
それだけではまだ十分低い抵抗率が得られない。
At present, a sputtering method is mainly used as a method for producing a transparent conductive thin film, but as a technique for reducing the resistance of a film by the sputtering method, quadrupole sputtering is performed, and further discharge by increasing the magnetic field of the cathode portion. Techniques such as lowering impedance and sputtering at low voltage have been developed. However, since the former uses a hot filament, there is a problem that the substrate is deteriorated due to its heat radiation, the surroundings of the cathode are complicated by providing a heat shield plate, and the operability is deteriorated.
In the latter case, it is effective to reduce the resistance to some extent,
It is not enough to obtain sufficiently low resistivity.

【0006】また、上記したような低抵抗化の手法を行
った場合、ある程度の可視光透過率は得られるが、高い
透過率(85%以上)を得るのは難しいのが現状であ
る。
[0006] Further, when the above-mentioned method of reducing the resistance is performed, visible light transmittance can be obtained to some extent, but it is difficult to obtain high transmittance (85% or more) at present.

【0007】そこで本発明は、低抵抗でかつ高い可視光
透過率を有する透明導電膜を得る方法を提供することを
目的とする。
Therefore, it is an object of the present invention to provide a method for obtaining a transparent conductive film having low resistance and high visible light transmittance.

【0008】[0008]

【課題を解決するための手段】本発明者らは、プラスチ
ック基板にその熱劣化温度以下の温度で透明導電層を成
膜した後特定の加熱処理を施すと、低抵抗で透過率も高
い透明導電膜が得られることを見出し、本発明に至っ
た。
Means for Solving the Problems The present inventors have found that when a transparent conductive layer is formed on a plastic substrate at a temperature not higher than its heat deterioration temperature and then subjected to a specific heat treatment, it is transparent with low resistance and high transmittance. The inventors have found that a conductive film can be obtained, and completed the present invention.

【0009】すなわち本発明は、プラスチック基板上に
少なくとも透明導電層が設けられた透明導電膜の製造方
法において、プラッスチック基板の熱劣化温度以下の温
度で基板上に透明導電層を設けた後、80〜150℃未
満の温度かつ1トール以下の真空度にて15分間以上熱
処理することを特徴とする方法を提供するものである。
That is, according to the present invention, in a method for producing a transparent conductive film in which at least a transparent conductive layer is provided on a plastic substrate, after the transparent conductive layer is provided on the substrate at a temperature not higher than the heat deterioration temperature of the plastic substrate, 80 The present invention provides a method characterized by performing a heat treatment for 15 minutes or more at a temperature of less than 150 ° C and a vacuum degree of 1 Torr or less.

【0010】本発明において使用するプラスチック基板
としては、例えばポリエチレンテレフタレート、ポリブ
チレンテレフタレート等のポリエステル、ポリアミド、
ポリ塩化ビニル、ポリカーボネート、ポリスチレン、ポ
リプロピレン、ポリエチレン等(単独重合体の他に共重
合体も含む)の基板が挙げられる。また、基板はこれら
を2種以上含む積層体であっても良い。基板の厚さは、
用途によって異なるが、通常1.0〜1000μmであ
る。
Examples of the plastic substrate used in the present invention include polyesters such as polyethylene terephthalate and polybutylene terephthalate, polyamides,
Substrates made of polyvinyl chloride, polycarbonate, polystyrene, polypropylene, polyethylene and the like (including copolymers in addition to homopolymers) can be mentioned. Further, the substrate may be a laminated body containing two or more of these. The thickness of the substrate is
Although it depends on the application, it is usually 1.0 to 1000 μm.

【0011】透明導電層としては、慣用の透明導電層の
材料、例えば金属酸化物を用いることができる。具体的
には例えばBi2 3 、TiO2 、SnO2 、CdO、
ZnO、ZrO2 、CTO系(CdSnO3 、Cd2
nO4 、CdSnO4 )、In2 3 、CdIn
2 4 、In2 TeO6 、WO系、MoO3 系、NiO
系、IrO系等が挙げられる。好ましくは上記の金属酸
化物に、Sn、Sb、W、Mo、F、AsおよびAlか
ら選ばれる1種または2種以上を添加した複合(ドー
プ)相である。その中でも好ましいものは、Snを添加
したIn2 3 (ITO)、Sbを添加したSnO2
Fを添加したSnO2 等である。透明導電層はこれらの
層を単層または多層で使用することができる。層厚は、
材質によって異なるが、例えばITO層では300〜3
500オングストロームが好ましく、より好ましくは3
60〜3100オングストロームである。また透明導電
層のシート抵抗は400Ω/□以下であれば特に制限は
ない。
As the transparent conductive layer, a conventional transparent conductive layer material such as a metal oxide can be used. Specifically, for example, Bi 2 O 3 , TiO 2 , SnO 2 , CdO,
ZnO, ZrO 2 , CTO system (CdSnO 3 , Cd 2 S
nO 4 , CdSnO 4 ), In 2 O 3 , CdIn
2 O 4 , In 2 TeO 6 , WO series, MoO 3 series, NiO
System, IrO system and the like. A complex (doped) phase in which one or more selected from Sn, Sb, W, Mo, F, As and Al is added to the above metal oxide is preferable. Among them, preferable ones are In 2 O 3 (ITO) containing Sn, SnO 2 containing Sb,
For example, SnO 2 with F added. As the transparent conductive layer, these layers can be used as a single layer or multiple layers. The layer thickness is
Although it depends on the material, for example, the ITO layer is 300 to 3
500 angstroms is preferable, and 3 is more preferable.
60 to 3100 angstroms. The sheet resistance of the transparent conductive layer is not particularly limited as long as it is 400Ω / □ or less.

【0012】なお、任意的に基板とITO膜との間に、
保護層として例えばSiO2 層を設けることも可能であ
る。
Optionally, between the substrate and the ITO film,
For example, a SiO 2 layer can be provided as the protective layer.

【0013】本発明の方法においては、まず上記の透明
導電層を成膜する。成膜手段としては、公知の製膜法、
例えば蒸着法、スパッタ法、イオンプレーティング法、
CVD法、スプレー法等を使用することができる。その
際に、基板の熱劣化温度以下の温度、例えば100℃以
下の温度で成膜を行う。その他の条件は慣用の成膜条件
を使用することができる。
In the method of the present invention, the transparent conductive layer is first formed. As a film forming means, a known film forming method,
For example, vapor deposition method, sputtering method, ion plating method,
A CVD method, a spray method or the like can be used. At that time, film formation is performed at a temperature not higher than the heat deterioration temperature of the substrate, for example, a temperature not higher than 100 ° C. As other conditions, conventional film forming conditions can be used.

【0014】本発明においては、上記のようにして得た
透明導電膜に特定の条件で加熱処理を施す。すなわち、
80〜150℃未満、好ましくは100〜150℃未満
の温度かつ1トール(torr)以下、好ましくは0.1トー
ル以下の真空度にて、15分間以上、好ましくは30分
間以上熱処理する。熱処理温度は高い方が低抵抗化には
有利であるが、プラスチック基板の耐熱温度に上限があ
るため、プラスチックの種類により上記の範囲で最大可
能温度を選択するのが有効である。このような加熱処理
は、市販の簡易な真空オーブンで実行可能である。熱処
理温度が低すぎると、抵抗率が低下し、かつ透過率も低
くなる。また、真空度が1トールを超えると酸化の進行
により抵抗率が劣化する。時間の上限は特に限定されな
いが、通常は2時間以下である。
In the present invention, the transparent conductive film obtained as described above is heat-treated under specific conditions. That is,
Heat treatment is performed at a temperature of 80 to less than 150 ° C., preferably 100 to less than 150 ° C. and a vacuum of 1 torr or less, preferably 0.1 torr or less for 15 minutes or more, preferably 30 minutes or more. A higher heat treatment temperature is advantageous for lowering the resistance, but since the heat resistant temperature of the plastic substrate has an upper limit, it is effective to select the maximum possible temperature within the above range depending on the type of plastic. Such heat treatment can be performed in a commercially available simple vacuum oven. If the heat treatment temperature is too low, the resistivity decreases and the transmittance also decreases. Further, when the degree of vacuum exceeds 1 Torr, the progress of oxidation deteriorates the resistivity. The upper limit of time is not particularly limited, but it is usually 2 hours or less.

【0015】上記の加熱処理により、膜中の歪みおよび
不純物が減少するので、透過率も高くなる。
The above heat treatment reduces strain and impurities in the film, and thus increases the transmittance.

【0016】本発明の方法によって製造される透明導電
膜は、太陽電池、光センサ等の光電変換用途;液晶、エ
レクトロルミネセンス、エレクトロクロミック、EL等
の表示素子用途;建築物、自動車、航空機、炉ののぞき
窓等の各種窓の熱線反射用途、可視光の可変遮光用途、
防曇防氷用途;帯電防止用途;タッチスイッチ用途;光
通信用途等の広い分野で使用することができる。
The transparent conductive film produced by the method of the present invention is used for photoelectric conversion such as solar cells and photosensors; for display devices such as liquid crystal, electroluminescence, electrochromic and EL; for buildings, automobiles, aircraft, Heat ray reflection applications for various windows such as furnace peep windows, variable light blocking applications for visible light,
It can be used in a wide range of fields such as anti-fogging and anti-icing applications; antistatic applications; touch switch applications; optical communication applications.

【0017】[0017]

【実施例】以下の実施例により、本発明をさらに詳しく
説明する。実施例1〜8 厚さ1.0mmのポリカーボネート(以下、PCというこ
とがある)基板上に、基板搬送通過型(インライン方
式)の直流プレーナー型マグネトロンスパッタ装置(U
LVAC社製)を使用して、スパッタ成膜を行った。タ
ーゲットとしてIn2 3 とSnO2 の粉末焼結体(重
量比90:10)を用い、初期真空度 5×10-6torr以
下、ガス種 Ar+O2 (160 SCCM:0.5 〜4.5 SCC
M)、ガス圧4×10-3 torr 、ターゲット投入電力 3.
5 W/cm2 、ターゲット上漏洩平行磁束密度 1100ガウ
ス(従来のカソード強磁場に基づく)、および基板搬送
速度0.8 m/分の条件で、膜厚1200オングストロー
ムのITO膜を成膜した。
The present invention will be described in more detail by the following examples. Examples 1 to 8 A substrate transport passage type (in-line type) DC planar type magnetron sputtering apparatus (U
The film was formed by sputtering by using LVAC). Using a powder sintered body of In 2 O 3 and SnO 2 (weight ratio 90:10) as a target, an initial vacuum degree of 5 × 10 −6 torr or less, gas type Ar + O 2 (160 SCCM: 0.5 to 4.5 SCC)
M), gas pressure 4 × 10 -3 torr, target input power 3.
An ITO film having a film thickness of 1200 Å was formed under the conditions of 5 W / cm 2 , leakage parallel magnetic flux density on the target of 1100 gauss (based on the conventional strong cathode magnetic field), and substrate transfer speed of 0.8 m / min.

【0018】かくして得られた透明導電膜を、市販の真
空オーブン(ヤマト科学社製)を用いて、表1に示した
条件にて熱処理を行った。熱処理後の透明導電膜の抵抗
率を、ホール効果測定器で測定し、透過率をヘイズメー
ターにて測定した。結果を表1に示す。比較例1〜4 実施例1〜4とそれぞれ全く同様にして透明導電膜を製
造したが、製膜後の加熱処理は行わなかった。透明導電
膜の抵抗率および透過率を表1に示す。比較例5〜8 実施例5〜6とそれぞれ全く同様にして透明導電膜を製
造した。次いで、表1に示した条件で熱処理を行った。
熱処理後の透明導電膜の抵抗率および透過率を表1に示
す。
The transparent conductive film thus obtained was heat-treated under the conditions shown in Table 1 using a commercially available vacuum oven (made by Yamato Scientific Co., Ltd.). The resistivity of the transparent conductive film after the heat treatment was measured with a Hall effect measuring device, and the transmittance was measured with a haze meter. The results are shown in Table 1. Comparative Examples 1 to 4 Transparent conductive films were produced in exactly the same manner as in Examples 1 to 4, but no heat treatment was performed after the film formation. Table 1 shows the resistivity and the transmittance of the transparent conductive film. Comparative Examples 5-8 Transparent conductive films were produced in exactly the same manner as in Examples 5-6. Then, heat treatment was performed under the conditions shown in Table 1.
Table 1 shows the resistivity and the transmittance of the transparent conductive film after the heat treatment.

【0019】[0019]

【表1】 [Table 1]

【0020】[0020]

【発明の効果】本発明によれば、低抵抗でかつ高い透過
率を有する透明導電膜を簡易に得ることができる。よっ
て、本発明の方法は工業的に有用である。
According to the present invention, a transparent conductive film having a low resistance and a high transmittance can be easily obtained. Therefore, the method of the present invention is industrially useful.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 プラスチック基板上に少なくとも透明導
電層が設けられた透明導電膜の製造方法において、プラ
ッスチック基板の熱劣化温度以下の温度で基板上に透明
導電層を設けた後、80〜150℃未満の温度かつ1ト
ール以下の真空度にて15分間以上熱処理することを特
徴とする方法。
1. A method for producing a transparent conductive film in which at least a transparent conductive layer is provided on a plastic substrate, the transparent conductive layer is provided on the substrate at a temperature not higher than the heat deterioration temperature of the plastic substrate, and then 80 to 150 ° C. A method characterized by performing a heat treatment for 15 minutes or more at a temperature of less than 1 torr and a vacuum degree of 1 Torr or less.
JP5137005A 1993-05-17 1993-05-17 Production of transparent conductive film Pending JPH06320661A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5137005A JPH06320661A (en) 1993-05-17 1993-05-17 Production of transparent conductive film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5137005A JPH06320661A (en) 1993-05-17 1993-05-17 Production of transparent conductive film

Publications (1)

Publication Number Publication Date
JPH06320661A true JPH06320661A (en) 1994-11-22

Family

ID=15188583

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5137005A Pending JPH06320661A (en) 1993-05-17 1993-05-17 Production of transparent conductive film

Country Status (1)

Country Link
JP (1) JPH06320661A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102678035A (en) * 2012-05-02 2012-09-19 蒙特集团(香港)有限公司 Intelligent high definition light control device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102678035A (en) * 2012-05-02 2012-09-19 蒙特集团(香港)有限公司 Intelligent high definition light control device
CN102678035B (en) * 2012-05-02 2015-02-25 凡登(常州)新型金属材料技术有限公司 Intelligent high definition light control device

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