JPH06268261A - 発光素子の発光位置検出方法 - Google Patents

発光素子の発光位置検出方法

Info

Publication number
JPH06268261A
JPH06268261A JP5073893A JP5073893A JPH06268261A JP H06268261 A JPH06268261 A JP H06268261A JP 5073893 A JP5073893 A JP 5073893A JP 5073893 A JP5073893 A JP 5073893A JP H06268261 A JPH06268261 A JP H06268261A
Authority
JP
Japan
Prior art keywords
light emitting
emitting element
light
image
point
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5073893A
Other languages
English (en)
Japanese (ja)
Inventor
Hiroki Okawachi
浩喜 大川内
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP5073893A priority Critical patent/JPH06268261A/ja
Priority to TW083101766A priority patent/TW273027B/zh
Priority to KR1019940004527A priority patent/KR940022483A/ko
Publication of JPH06268261A publication Critical patent/JPH06268261A/ja
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F77/00Constructional details of devices covered by this subclass
    • H10F77/95Circuit arrangements
    • H10F77/953Circuit arrangements for devices having potential barriers
    • H10F77/957Circuit arrangements for devices having potential barriers for position-sensitive photodetectors, e.g. lateral-effect photodiodes or quadrant photodiodes

Landscapes

  • Semiconductor Lasers (AREA)
  • Led Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP5073893A 1993-03-11 1993-03-11 発光素子の発光位置検出方法 Pending JPH06268261A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP5073893A JPH06268261A (ja) 1993-03-11 1993-03-11 発光素子の発光位置検出方法
TW083101766A TW273027B (cs) 1993-03-11 1994-03-01
KR1019940004527A KR940022483A (ko) 1993-03-11 1994-03-09 발광소자의 발광위치 검출방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5073893A JPH06268261A (ja) 1993-03-11 1993-03-11 発光素子の発光位置検出方法

Publications (1)

Publication Number Publication Date
JPH06268261A true JPH06268261A (ja) 1994-09-22

Family

ID=12867184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5073893A Pending JPH06268261A (ja) 1993-03-11 1993-03-11 発光素子の発光位置検出方法

Country Status (3)

Country Link
JP (1) JPH06268261A (cs)
KR (1) KR940022483A (cs)
TW (1) TW273027B (cs)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005235955A (ja) * 2004-02-18 2005-09-02 Sharp Corp 光学素子の位置検査方法および位置検査装置ならびにダイボンド方法およびダイボンド装置

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5471266B2 (ja) * 2009-10-07 2014-04-16 セイコーエプソン株式会社 位置検出機能付き投射型表示装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005235955A (ja) * 2004-02-18 2005-09-02 Sharp Corp 光学素子の位置検査方法および位置検査装置ならびにダイボンド方法およびダイボンド装置

Also Published As

Publication number Publication date
KR940022483A (ko) 1994-10-21
TW273027B (cs) 1996-03-21

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