JPH0624999Y2 - Film forming equipment - Google Patents

Film forming equipment

Info

Publication number
JPH0624999Y2
JPH0624999Y2 JP663988U JP663988U JPH0624999Y2 JP H0624999 Y2 JPH0624999 Y2 JP H0624999Y2 JP 663988 U JP663988 U JP 663988U JP 663988 U JP663988 U JP 663988U JP H0624999 Y2 JPH0624999 Y2 JP H0624999Y2
Authority
JP
Japan
Prior art keywords
substrate
heating
cart
cooling
reaction chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP663988U
Other languages
Japanese (ja)
Other versions
JPH01110429U (en
Inventor
佳興 横山
博 高宮
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP663988U priority Critical patent/JPH0624999Y2/en
Publication of JPH01110429U publication Critical patent/JPH01110429U/ja
Application granted granted Critical
Publication of JPH0624999Y2 publication Critical patent/JPH0624999Y2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Description

【考案の詳細な説明】 〔産業上の利用分野〕 この考案は、基板上に膜形成を行うための成膜装置に関
し、特に該成膜装置における基板の加熱,冷却時間の短
縮を図るための機構に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial field of application] The present invention relates to a film forming apparatus for forming a film on a substrate, and particularly for reducing the heating and cooling time of the substrate in the film forming apparatus. It is related to the mechanism.

〔従来の技術〕[Conventional technology]

一般に、プラズマCVDやスパッタリング等の成膜装置
においては、反応のために基板を数百度に加熱する必要
があり、また反応終了後は基板を外部に取り出すために
これを冷却する必要がある。
Generally, in a film forming apparatus such as plasma CVD or sputtering, it is necessary to heat the substrate to several hundred degrees for the reaction, and to cool the substrate after the reaction to take it out to the outside.

そこで成膜装置においては、反応室とは別に、加熱・冷
却用の室が設けられており、基板を基板カートに装着し
て前記加熱,冷却用の室と反応室との間を搬送するよう
にしている。そして外部から基板カートに装着された基
板が加熱・冷却室に挿入されると、該加熱・冷却室のヒ
ータがオンされ、所定の温度に加熱される。そしてこの
所定温度に加熱された基板及び基板カートは、反応室内
に搬送され、プラズマCVD法等により成膜が行われ
る。この成膜が終了すると、前記基板は基板カートとと
もに前記加熱・冷却室に搬送され、ここで冷却されて外
部に取り出される。
Therefore, in the film forming apparatus, a heating / cooling chamber is provided separately from the reaction chamber, and the substrate is mounted on the substrate cart so that the substrate is transported between the heating / cooling chamber and the reaction chamber. I have to. When the substrate mounted on the substrate cart is inserted into the heating / cooling chamber from the outside, the heater in the heating / cooling chamber is turned on and heated to a predetermined temperature. Then, the substrate and the substrate cart heated to the predetermined temperature are transported into the reaction chamber, and a film is formed by a plasma CVD method or the like. Upon completion of this film formation, the substrate is transported to the heating / cooling chamber together with the substrate cart, cooled there, and taken out to the outside.

〔考案が解決しようとする課題〕[Problems to be solved by the device]

ところが、前記のような従来の成膜装置では、基板取り
出し時において、基板を基板カートに取りつけたまま冷
却を行っており、冷却時間に約30分〜40分程度かか
っていた。またその逆に、基板を加熱して成膜室に挿入
する時には、基板の加熱とともに、冷却された基板カー
トの昇温に時間がかかってしまい、熱のロス及び時間の
ロスが大きく、処理能力が低いという問題があった。
However, in the conventional film forming apparatus as described above, when the substrate is taken out, the substrate is cooled while being attached to the substrate cart, and the cooling time is about 30 to 40 minutes. On the contrary, when the substrate is heated and inserted into the film forming chamber, it takes time to heat the cooled substrate cart along with the heating of the substrate, resulting in a large heat loss and a large time loss. There was a problem of low.

この考案は、かかる点に鑑みてなされたもので、基板の
加熱,冷却時における熱及び時間のロスをなくして、処
理能力が高く、生産性の高い成膜装置を得ることを目的
とする。
The present invention has been made in view of the above points, and an object thereof is to obtain a film forming apparatus having high processing capacity and high productivity by eliminating heat and time loss during heating and cooling of a substrate.

〔課題を解決するための手段〕[Means for Solving the Problems]

この考案に係る成膜装置は、基板の加熱,冷却を行うた
めの加熱・冷却室と、前記基板表面に膜形成を行うため
の反応室とを備えたものにおいて、前記反応室内に基板
カートを待機させてこれを所定の温度に保持するととも
に、前記加熱・冷却室に、前記基板カートに基板を脱着
するための基板脱着機構を設け、基板加熱時は、前記反
応室内で所定の温度に加熱された基板カートに基板を装
着して加熱し、反応終了後の冷却時は、前記基板カート
から基板を取り外し、基板のみを冷却するようにしたも
のである。
A film forming apparatus according to the present invention comprises a heating / cooling chamber for heating and cooling a substrate and a reaction chamber for forming a film on the surface of the substrate. The substrate is placed in a standby state and kept at a predetermined temperature, and the heating / cooling chamber is provided with a substrate attaching / detaching mechanism for attaching / detaching the substrate to / from the substrate cart. When the substrate is heated, the substrate is heated to a prescribed temperature. The substrate is mounted on the prepared substrate cart and heated, and at the time of cooling after completion of the reaction, the substrate is removed from the substrate cart and only the substrate is cooled.

〔作用〕[Action]

この考案においては、基板カートを反応室内で所定の温
度に保持して待機させておく。そして外部から基板が加
熱・冷却室に挿入されたら、前記予め所定の温度に加熱
された基板カートに前記基板を装着し、これらを加熱す
る。従って基板カートを加熱する時間が大幅に短縮さ
れ、全体の加熱時間は著しく短縮される。また、反応終
了後の基板冷却時は、基板カートから基板を取り外し、
この基板のみを冷却するとともに、前記基板カートは反
応室に搬送し、ここで所定の温度に保持する。これによ
り冷却時間が短縮されるとともに、基板カートが冷却さ
れないので、次の基板加熱時において、前述のように基
板カートを昇温する時間が短縮され、全体的な生産性が
向上する。
In this invention, the substrate cart is kept in a standby state in the reaction chamber at a predetermined temperature. Then, when the substrate is inserted into the heating / cooling chamber from the outside, the substrate is mounted on the substrate cart which has been heated to the predetermined temperature in advance, and these are heated. Therefore, the time for heating the substrate cart is significantly reduced, and the overall heating time is significantly reduced. In addition, when cooling the substrate after the reaction, remove the substrate from the substrate cart,
Only the substrate is cooled, and the substrate cart is transported to the reaction chamber where it is kept at a predetermined temperature. As a result, the cooling time is shortened and the substrate cart is not cooled, so that the time for heating the substrate cart during the next substrate heating is shortened as described above, and the overall productivity is improved.

〔実施例〕〔Example〕

以下、本考案の実施例を図に基づいて説明する。図面は
本考案の一実施例による成膜装置の概略構成を示し、本
成膜装置は、主に基板1の加熱,冷却を行う加熱・冷却
室10及び前記基板表面に膜形成を行う反応室20から
なり、これらの間の基板1の搬送は、基板カート2によ
り行われる。前記加熱・冷却室10には、前記基板カー
ト2に対して基板1の脱着を行うための基板取り付け・
取り外し装置11が設けられ、この基板取り付け取り外
し装置11の上面は基板1を載置する載置台となってい
る。また、加熱・冷却室10の上部には、基板取り付け
・取り外し装置11と対向して、基板加熱用の第1ヒー
タ12が設けられている。加熱・冷却室10の図中左側
部には第1ゲートG1が設けられ、この第1ゲートG1
の外部には、基板1を加熱・冷却室10内に挿入するた
めのロボット等が設けられている。また、この加熱・冷
却室10には、真空引きするための排気系31及び室内
を大気圧にするための導入系33が接続されている。
An embodiment of the present invention will be described below with reference to the drawings. The drawing shows a schematic structure of a film forming apparatus according to an embodiment of the present invention. The film forming apparatus mainly comprises a heating / cooling chamber 10 for heating and cooling the substrate 1 and a reaction chamber for forming a film on the surface of the substrate. Substrate 1 is transferred between them by a substrate cart 2. In the heating / cooling chamber 10, a substrate mounting / demounting for mounting / dismounting the substrate 1 to / from the substrate cart 2 is performed.
A detaching device 11 is provided, and the upper surface of the substrate attaching and detaching device 11 is a mounting table on which the substrate 1 is placed. A first heater 12 for heating the substrate is provided above the heating / cooling chamber 10 so as to face the substrate mounting / demounting device 11. A first gate G1 is provided on the left side of the heating / cooling chamber 10 in the figure.
A robot or the like for inserting the substrate 1 into the heating / cooling chamber 10 is provided outside the device. Further, to the heating / cooling chamber 10, an exhaust system 31 for evacuating and an introducing system 33 for making the chamber atmospheric pressure are connected.

前記加熱・冷却室10の図中右側には、第2ゲートG2
を介して、例えばプラズマCVDを行うための反応室2
0が設けられ、この反応室20内には、放電を行わせる
ための対向電極21及び該対向電極21と対向して第2
ヒータ22が設けられている。また、反応室20内に
は、基板1の冷却時に基板カート2が待機し、前記第2
ヒータ22により所定の温度に保持されるように構成さ
れている。さらに、この反応室20には、前記同様の排
気系32が接続され、また前記対向電極源21には高周
波電源34が接続されている。
On the right side of the heating / cooling chamber 10 in the figure, a second gate G2 is provided.
Reaction chamber 2 for performing, for example, plasma CVD through
0 is provided in the reaction chamber 20, and a counter electrode 21 for causing discharge and a second electrode facing the counter electrode 21 are provided.
A heater 22 is provided. Also, in the reaction chamber 20, the substrate cart 2 stands by when the substrate 1 is cooled,
The heater 22 is configured to maintain a predetermined temperature. Further, an exhaust system 32 similar to the above is connected to the reaction chamber 20, and a high frequency power source 34 is connected to the counter electrode source 21.

次に動作について説明する。Next, the operation will be described.

まず、基板1が加熱・冷却室10内に挿入されていない
状態では、基板カート2は図中二点鎖線で示すように、
反応室20内で待機しており、第2ヒータ22により所
定の温度に保持されている。そして成膜を行う場合は、
第1ゲートG1が開かれ、基板1がロボット等により基
板取り付け・取り外し装置11の上面、即ち載置台上に
置かれる。この状態で第1ゲートG1が閉じられ、排気
系31により真空引きが行われる。加熱・冷却室10内
が所望の真空圧になれば、反応室20との間の第2ゲー
トG2が開となり、反応室20内に待機していた基板カ
ート2が前記載置台の上方に搬送され、第2ゲートG2
は閉じられる。
First, in a state where the substrate 1 is not inserted into the heating / cooling chamber 10, the substrate cart 2 is, as indicated by a chain double-dashed line in the figure,
It stands by in the reaction chamber 20 and is maintained at a predetermined temperature by the second heater 22. And when forming a film,
The first gate G1 is opened, and the substrate 1 is placed on the upper surface of the substrate attaching / detaching device 11, that is, on the mounting table by a robot or the like. In this state, the first gate G1 is closed and the exhaust system 31 evacuates. When the heating / cooling chamber 10 has a desired vacuum pressure, the second gate G2 with the reaction chamber 20 is opened, and the substrate cart 2 waiting in the reaction chamber 20 is transferred to above the mounting table. And the second gate G2
Is closed.

次に基板取り付け・取り外し装置11により、基板1が
前記基板カート2に取り付けられる。即ち、昇降シリン
ダ等により基板取り付け・取り外し装置11が上昇する
とともに、この装置11が回転し、その係止部11a等
により基板カート2側の爪(図示せず)を所定の位置に
移動させ、基板1をこの基板カート2の爪で保持するよ
うにする。この状態で第1ヒータ12がオンされて昇温
される。このとき、基板カート2は反応室20内で予め
所定の温度に保持されているため、従来に比較し、所望
の温度に到達する時間は著しく早くなる。
Next, the substrate 1 is attached to the substrate cart 2 by the substrate attaching / detaching device 11. That is, the board mounting / demounting device 11 is lifted by the lifting cylinder and the like, and the device 11 is rotated to move the claw (not shown) on the board cart 2 side to a predetermined position by the locking portion 11a thereof. The board 1 is held by the claws of the board cart 2. In this state, the first heater 12 is turned on to raise the temperature. At this time, since the substrate cart 2 is held at a predetermined temperature in the reaction chamber 20 in advance, the time required to reach the desired temperature becomes significantly shorter than in the conventional case.

基板1が所望の温度になれば、第1ヒータ12がオフさ
れ、第2ゲートG2が開となって基板1の装着された基
板カート2が反応室20内に搬送される。この後、第2
ゲートG2を閉として、従来同様のプラズマCVD等の
成膜動作が行われる。
When the substrate 1 reaches a desired temperature, the first heater 12 is turned off, the second gate G2 is opened, and the substrate cart 2 on which the substrate 1 is mounted is transferred into the reaction chamber 20. After this, the second
With the gate G2 closed, a film forming operation such as the conventional plasma CVD is performed.

前記成膜動作が完了すると、第2ゲートG2が開とな
り、基板1が装着された基板カート2が加熱・冷却室1
0に搬送される。そして基板取り付け・取り外し装置1
1により基板カート2から基板1が取り外され、基板1
は載置台上に載置されるとともに、前記基板カート2は
反応室20内へ搬送される。そして第2ゲートG2を閉
とし、この加熱・冷却室10内にNをリークして大気
圧にし、基板1が冷却された後、ロボット等により外部
に取り出される。
When the film forming operation is completed, the second gate G2 is opened and the substrate cart 2 on which the substrate 1 is mounted is heated / cooled in the heating / cooling chamber 1
Transported to 0. And board mounting / removing device 1
The substrate 1 is removed from the substrate cart 2 by 1.
Is placed on a placing table, and the substrate cart 2 is transported into the reaction chamber 20. Then, the second gate G2 is closed, N 2 is leaked into the heating / cooling chamber 10 to reach atmospheric pressure, and the substrate 1 is cooled and then taken out by a robot or the like.

このように本実施例では、反応完了後に基板1を冷却す
る際、基板1のみを冷却するので、冷却時間は従来に比
較して著しく短縮され、しかもこのとき、基板カート2
は反応室20内で所定の温度に加熱されるので、熱のロ
スがなく、次の基板加熱時における加熱時間が短縮され
ることとなる。
As described above, in this embodiment, when the substrate 1 is cooled after completion of the reaction, only the substrate 1 is cooled, so that the cooling time is remarkably shortened as compared with the conventional case, and at this time, the substrate cart 2 is used.
Is heated to a predetermined temperature in the reaction chamber 20, there is no heat loss, and the heating time for the next substrate heating is shortened.

〔考案の効果〕[Effect of device]

以上のように、この考案によれば、基板の加熱,冷却を
行うための加熱・冷却室と、前記基板表面に膜形成を行
うための反応室とを備えた成膜装置において、前記反応
室内に基板カートを待機させてこれを所定の温度に保持
するとともに、前記加熱・冷却室に、前記基板カートに
基板を脱着するための基板脱着機構を設け、基板加熱時
は、基板を前記所定の温度に加熱された基板カートに装
着して加熱し、反応終了後の基板冷却時は、前記基板カ
ートから基板を取り外して基板のみを冷却するようにし
たので、基板冷却時の冷却時間が短縮され、基板の取り
出しが早くでき、また加熱時には、熱のロスが少ないの
で基板及び基板カートの昇温が早くなり、熱及び時間の
ロスをなくして処理能力,生産性を向上できる効果があ
る。
As described above, according to the present invention, in the film forming apparatus including the heating / cooling chamber for heating and cooling the substrate and the reaction chamber for forming a film on the substrate surface, the reaction chamber The substrate cart is kept in a standby state and kept at a predetermined temperature, and a substrate attaching / detaching mechanism for attaching / detaching the substrate to / from the substrate cart is provided in the heating / cooling chamber. It is mounted on a substrate cart heated to a temperature and heated, and when the substrate is cooled after the reaction is completed, the substrate is removed from the substrate cart and only the substrate is cooled, so the cooling time for cooling the substrate is shortened. The substrate can be taken out quickly, and the heat loss is small at the time of heating, so that the temperature of the substrate and the substrate cart can be raised quickly, and there is an effect that the loss of heat and time can be eliminated and the processing capacity and the productivity can be improved.

【図面の簡単な説明】[Brief description of drawings]

図面は本考案の一実施例による成膜装置の概略断面構成
図である。 1…基板、2…基板カート、10…加熱・冷却室、11
…基板取り付け・取り外し装置、12…第1ヒータ、2
0…反応室。
The drawing is a schematic cross-sectional configuration diagram of a film forming apparatus according to an embodiment of the present invention. 1 ... Substrate, 2 ... Substrate cart, 10 ... Heating / cooling chamber, 11
... Board mounting / demounting device, 12 ... First heater, 2
0 ... Reaction chamber.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 【請求項1】基板の加熱,冷却を行うための加熱・冷却
室と、前記基板表面に膜形成を行うための反応室と、こ
の反応室内で所定の温度に保持されるとともに、前記基
板をこの反応室と前記加熱・冷却室間で搬送するための
基板カートと、前記加熱・冷却室に設けられ、前記基板
カートに基板を脱着するための基板脱着機構とを備え、
基板加熱時は、外部から前記加熱・冷却室に挿入された
基板を、前記反応室内で所定の温度に加熱された基板カ
ートに装着して、該基板カートとともに加熱し、基板冷
却時は、前記反応室から前記基板カートにより搬送され
てきた基板を、該基板カートから取り外し、基板のみを
冷却するようにしたことを特徴とする成膜装置。
1. A heating / cooling chamber for heating and cooling a substrate, a reaction chamber for forming a film on the surface of the substrate, a predetermined temperature in the reaction chamber, and the substrate A substrate cart for carrying between the reaction chamber and the heating / cooling chamber, and a substrate attaching / detaching mechanism provided in the heating / cooling chamber for attaching / detaching the substrate to / from the substrate cart,
When the substrate is heated, the substrate inserted into the heating / cooling chamber from the outside is mounted on the substrate cart heated to a predetermined temperature in the reaction chamber and heated together with the substrate cart. A film forming apparatus, wherein a substrate transferred from the reaction chamber by the substrate cart is removed from the substrate cart and only the substrate is cooled.
JP663988U 1988-01-20 1988-01-20 Film forming equipment Expired - Lifetime JPH0624999Y2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP663988U JPH0624999Y2 (en) 1988-01-20 1988-01-20 Film forming equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP663988U JPH0624999Y2 (en) 1988-01-20 1988-01-20 Film forming equipment

Publications (2)

Publication Number Publication Date
JPH01110429U JPH01110429U (en) 1989-07-26
JPH0624999Y2 true JPH0624999Y2 (en) 1994-06-29

Family

ID=31210979

Family Applications (1)

Application Number Title Priority Date Filing Date
JP663988U Expired - Lifetime JPH0624999Y2 (en) 1988-01-20 1988-01-20 Film forming equipment

Country Status (1)

Country Link
JP (1) JPH0624999Y2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5190802B2 (en) * 2009-02-25 2013-04-24 株式会社島津製作所 In-line film forming equipment

Also Published As

Publication number Publication date
JPH01110429U (en) 1989-07-26

Similar Documents

Publication Publication Date Title
KR100854142B1 (en) Load lock apparatus and substrate processing system and processing method
US5661913A (en) Vacuum processing apparatus and operating method therefor
JPH03166373A (en) In-line cvd device
JPS6212129A (en) Plasma-processing apparatus
JPH0624999Y2 (en) Film forming equipment
JP3869499B2 (en) Substrate processing method
JPH07142408A (en) Substrate processing system
JPS60113428A (en) Manufacturing equipment of semiconductor
JPH07102372A (en) Vacuum treatment of material and device therefor
JP3844608B2 (en) Vacuum deposition system
JPH0521867Y2 (en)
USRE39776E1 (en) Vacuum processing apparatus and operating method with wafers, substrates and/or semiconductors
JP4503713B2 (en) Substrate cooling method for vacuum film formation
JPS63177426A (en) Vapor growth method and apparatus
JPH03191063A (en) Continuous type sputtering device
JPH0610680Y2 (en) Transport mechanism for in-line type film deposition equipment
JPS63297567A (en) Plasma cvd apparatus
JPS5918195A (en) Thin film growth device in extremely high vacuum
JPH01248521A (en) Low-temperature dry etching device
JP2508687Y2 (en) Heat treatment furnace
JPH0448626A (en) Dry etching apparatus
JP3933734B2 (en) Deposition equipment
JPH1025570A (en) Thin film treating device
JPH03153027A (en) Method and apparatus for etching
JP2000012649A (en) Semiconductor manufacture