JPH06236834A - Manufacture of solid tantalum chip capacitor - Google Patents

Manufacture of solid tantalum chip capacitor

Info

Publication number
JPH06236834A
JPH06236834A JP5023926A JP2392693A JPH06236834A JP H06236834 A JPH06236834 A JP H06236834A JP 5023926 A JP5023926 A JP 5023926A JP 2392693 A JP2392693 A JP 2392693A JP H06236834 A JPH06236834 A JP H06236834A
Authority
JP
Japan
Prior art keywords
resin
mold
capacitor element
anode lead
injection gate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5023926A
Other languages
Japanese (ja)
Other versions
JP3175380B2 (en
Inventor
Masatoshi Tasei
正俊 田制
Kenji Uenishi
謙次 上西
Yasuo Kin
泰男 金
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP02392693A priority Critical patent/JP3175380B2/en
Publication of JPH06236834A publication Critical patent/JPH06236834A/en
Application granted granted Critical
Publication of JP3175380B2 publication Critical patent/JP3175380B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

PURPOSE:To provide a manufacturing method for a solid tantalum chip capacitor having excellent mechanical strength and reliability in a deflection test and the like and also a stabilized mountability when a mounting machine is used. CONSTITUTION:The resin injection gate 32, to be used for injection of resin into the space part formed by the upper mold 30b and the lower mold 30a, is positioned on both sides opposing to the anode lead-out wire 22 of the mold. By having a mold resin outer covering released from the lower mold 31a by pushing up by a releasing pin 33 the part close to the tip on the side of the resin injection gate 32 on the mold resin outer covering formed by injecting resin from the resin injection gate 32, the generation of the defective part such as a recessed part and the like on the outer surface of the mold resin outer covering can be prevented even when there is a defect on the releasing pin 33.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はチップ状タンタル固体電
解コンデンサの製造方法に関するものである。さらに言
えば本発明の特定的な利用分野は、外装樹脂により被覆
されたコンデンサ素子を備え、かつリード線を有しない
チップ状タンタル固体電解コンデンサにおけるモールド
樹脂の成形技術に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a chip-shaped tantalum solid electrolytic capacitor. More specifically, the specific field of use of the present invention relates to a molding resin molding technique for a chip-shaped tantalum solid electrolytic capacitor having a capacitor element covered with an outer resin and having no lead wire.

【0002】[0002]

【従来の技術】近年、電子機器の軽薄短小化と面実装技
術の進展からリード線を有しないチップ状の電子部品が
急増している。チップ状タンタル固体電解コンデンサに
おいても小形大容量化が進展する中でチップ部品自身の
一層の小形化が要求されている。
2. Description of the Related Art In recent years, chip-shaped electronic parts having no lead wire have been rapidly increasing due to the miniaturization of electronic equipment and the progress of surface mounting technology. In the chip-type tantalum solid electrolytic capacitor, further miniaturization of the chip component itself is required as the miniaturization and the large capacity progress.

【0003】従来のチップ状タンタル固体電解コンデン
サは図3に示すように構成されていた。すなわち、この
図3において、1は弁作用金属からなるタンタル金属粉
末を成形焼結した多孔質の陽極体で、この陽極体1より
導出したタンタル線からなる陽極導出線2の一部と陽極
体1の全面に陽極酸化による誘電体性酸化被膜を形成
し、この表面に二酸化マンガンなどの電解質層を形成し
ている。3は陽極導出線2に装着したテフロン板で、こ
のテフロン板3は前記電解質層の形成時に陽極導出線2
へ硝酸マンガンが這い上がって二酸化マンガンが付着す
るのを防止する絶縁板である。また前記電解質層の上に
は浸漬法によりカーボン層および銀塗料層よりなる陰極
層4を順次積層形成することによりコンデンサ素子1a
を構成している。
A conventional chip-shaped tantalum solid electrolytic capacitor is constructed as shown in FIG. That is, in FIG. 3, reference numeral 1 denotes a porous anode body obtained by molding and sintering tantalum metal powder made of a valve metal, and a part of an anode lead wire 2 made of tantalum wire derived from the anode body 1 and the anode body. A dielectric oxide film is formed on the entire surface of No. 1 by anodic oxidation, and an electrolyte layer of manganese dioxide or the like is formed on this surface. Reference numeral 3 is a Teflon plate attached to the anode lead wire 2, and this Teflon plate 3 is used for forming the electrolyte layer.
It is an insulating plate that prevents manganese nitrate from creeping up and adhering manganese dioxide. A capacitor layer 1a is formed by sequentially stacking a cathode layer 4 composed of a carbon layer and a silver coating layer on the electrolyte layer by a dipping method.
Are configured.

【0004】そして、このコンデンサ素子1aの陰極層
4における陽極導出線2と反対側に位置する部分には、
先端部に丸みをもたせた円錐状の陰極導電体層5を形成
し、その後、コンデンサ素子1aおよび陰極導電体層5
を陽極導出線2が片側に引き出されるようにモールド樹
脂6で樹脂成形することにより外装する。そしてモール
ド樹脂6により外装された陰極導電体層5を機械的な研
削等により露出させた後、陽極導出線2の突出部2aを
含むモールド樹脂6の陽極導出線2の引き出し面と、こ
の引き出し面に隣接する周面に陽極金属層7を被覆形成
するとともに、陰極導電体層5の露出部5aを含むモー
ルド樹脂6の陰極側端面およびこの陰極側端面に隣接す
る周面に陰極金属層8を被覆形成していた。
The portion of the cathode layer 4 of the capacitor element 1a located on the opposite side of the anode lead wire 2 is
A conical cathode conductor layer 5 having a rounded tip is formed, and then the capacitor element 1a and the cathode conductor layer 5 are formed.
Is molded with a molding resin 6 so that the anode lead wire 2 is drawn out to one side. Then, after exposing the cathode conductor layer 5 covered with the mold resin 6 by mechanical grinding or the like, the lead surface of the anode lead wire 2 of the mold resin 6 including the protruding portion 2a of the anode lead wire 2 and this lead wire. The peripheral surface adjacent to the surface is coated with the anode metal layer 7, and the cathode metal layer 8 is formed on the cathode side end surface of the mold resin 6 including the exposed portion 5a of the cathode conductor layer 5 and the peripheral surface adjacent to the cathode side end surface. Was coated.

【0005】[0005]

【発明が解決しようとする課題】しかしながら、このよ
うな従来のチップ状タンタル固体電解コンデンサにおい
ては、コンデンサ素子1aおよび陰極導電体層5をモー
ルド樹脂6で外装したモールド樹脂外装体を成形金型か
ら離型させる場合、下金型に設置した離型ピンが問題で
モールド樹脂6の下金型側の略中央部に凹部9または凸
部(図示せず)が発生するという問題点を有していた。
However, in such a conventional chip-shaped tantalum solid electrolytic capacitor as described above, a molding resin outer body in which the capacitor element 1a and the cathode conductor layer 5 are covered with the molding resin 6 is formed from the molding die. In the case of releasing the mold, there is a problem that a mold release pin installed in the lower mold causes a concave portion 9 or a convex portion (not shown) at a substantially central portion of the mold resin 6 on the lower mold side. It was

【0006】すなわち、図4は樹脂成形金型によって樹
脂成形した成形体を示したもので、この樹脂成形法は、
保持部材10に保持された陽極導出線2を成形金型の下
金型と上金型(いずれも図示せず)で水平に固定し、か
つ成形金型の下金型と上金型が閉じたときにできる空間
部にコンデンサ素子1aを装填するとともに、陽極導出
線2の一部が固定されるようにして樹脂成形するもの
で、フィルムランナー11から流れてきた注入樹脂は樹
脂注入ゲート11aから成形金型の空間部内に入り、図
4に示すモールド樹脂6で外装された成形体ができる。
That is, FIG. 4 shows a molded body which is resin-molded by a resin molding die.
The anode lead wire 2 held by the holding member 10 is horizontally fixed by a lower mold and an upper mold of the molding die (neither is shown), and the lower mold and the upper mold of the molding die are closed. The capacitor element 1a is loaded into a space formed when the resin is formed, and resin molding is performed so that a part of the anode lead-out wire 2 is fixed. The resin injected from the film runner 11 is injected from the resin injection gate 11a. A molded body that enters the space of the molding die and is covered with the molding resin 6 shown in FIG. 4 is formed.

【0007】次に、陽極導出線2を保持する成形金型の
下金型と上金型について、図5を用いてさらに詳しく説
明する。
Next, the lower die and the upper die for holding the anode lead wire 2 will be described in more detail with reference to FIG.

【0008】図5は、下金型12aと上金型12bが閉
じて成形金型が陽極導出線2を固定した状態を示したも
のであり、この状態でトランスファー成形法により成形
金型の樹脂注入ゲート11aから樹脂を注入すると、樹
脂成形圧力により溶融した樹脂が成形金型の空間部11
に装填されたコンデンサ素子1aを包み込むようにして
モールド樹脂6により外装された成形体を作製する。こ
のモールド樹脂6による外装、つまりトランスファー成
形が終われば、上金型12bを開放し、その後、下金型
12aから成形体を離型させるために、下金型12aに
設置した離型ピン13で成形体を下方から上方に押し上
げて成形体を下金型12aから離型させる。この場合、
離型ピン13は樹脂成形時には下方の定位置に下がり、
また成形体を離型させるときには上方の定位置に上がる
ものであるが、この離型ピン13が上下に動くのを妨げ
るゴミあるいは溶融樹脂バリが原因で、樹脂成形時に下
方の定位置に下がらずに上方に突出した状態で止まった
とき、そのままの状態で樹脂成形した場合、図3に示す
ように、モールド樹脂6の下方の略中央部に凹部9ある
いは凸部(図示せず)が発生するものであった。
FIG. 5 shows a state in which the lower die 12a and the upper die 12b are closed and the molding die fixes the anode lead wire 2. In this state, the resin of the molding die is formed by the transfer molding method. When the resin is injected from the injection gate 11a, the resin melted by the resin molding pressure causes the space 11 of the molding die.
Then, a molded body which is covered with the molding resin 6 so as to enclose the capacitor element 1a loaded in the above is manufactured. When the exterior of the mold resin 6, that is, the transfer molding is completed, the upper mold 12b is opened, and then the mold release pin 13 installed on the lower mold 12a is used to separate the molded body from the lower mold 12a. The molded body is pushed upward from below to release the molded body from the lower mold 12a. in this case,
The release pin 13 is lowered to a fixed position at the time of resin molding,
Further, when the molded body is released from the mold, it moves up to a fixed position above, but due to dust or molten resin burr that prevents the mold release pin 13 from moving up and down, it does not move down to a fixed position during resin molding. When the resin is molded as it is when it stops while protruding upward, a concave portion 9 or a convex portion (not shown) is formed in the substantially central portion below the molding resin 6 as shown in FIG. It was a thing.

【0009】この凹部9はプリント基板にクリームハン
ダ等でチップ状タンタル固体電解コンデンサを実装した
後、実装評価のプリント基板をたわみ試験した場合、凹
部9によるモールド樹脂6の厚みの薄い部分で樹脂クラ
ックが発生していた。また、この部分に凸部ができると
チップ状タンタル固体電解コンデンサとしては実装機に
よる実装時のマウントが不安定となり、プリント基板に
実装できないという問題が発生していた。
When the chip-shaped tantalum solid electrolytic capacitor is mounted on the printed circuit board with cream solder or the like and then the printed circuit board for mounting evaluation is subjected to a flexure test, resin cracks are generated in the recessed section 9 at the thin portion of the mold resin 6. Was occurring. Further, if a convex portion is formed at this portion, mounting of the chip-shaped tantalum solid electrolytic capacitor by a mounting machine becomes unstable, and there is a problem that it cannot be mounted on a printed circuit board.

【0010】本発明はこのような問題点を解決するもの
で、たわみ試験等における機械強度的な信頼性にも優
れ、かつ実装機による実装性についても安定したものを
得ることができるチップ状タンタル固体電解コンデンサ
の製造方法を提供することを目的とするものである。
The present invention solves such problems, and it is possible to obtain a chip-shaped tantalum which is excellent in reliability of mechanical strength in a flexure test and the like and can be stably mounted by a mounting machine. It is an object of the present invention to provide a method for manufacturing a solid electrolytic capacitor.

【0011】[0011]

【課題を解決するための手段】上記目的を達成するため
に本発明のチップ状タンタル固体電解コンデンサの製造
方法は、陽極導出線を有するコンデンサ素子と、このコ
ンデンサ素子の陽極導出線を保持する保持部材と、前記
陽極導出線を固定するとともに前記コンデンサ素子が装
填される空間部を形成した上金型および下金型からなる
成形金型と、この成形金型における上金型および下金型
で前記陽極導出線を固定し、前記空間部に樹脂を注入し
て前記コンデンサ素子をモールド樹脂で外装するための
樹脂注入ゲートとを有し、前記樹脂注入ゲートを前記コ
ンデンサ素子が装填される成形金型の陽極導出線と対向
する面側に位置させ、この樹脂注入ゲートより樹脂を注
入して前記コンデンサ素子を内装するモールド樹脂外装
体を作製し、このモールド樹脂外装体における前記樹脂
注入ゲート側の先端近傍部を離型ピンで押し上げて前記
下金型からモールド樹脂外装体を離型させるようにした
ものである。
In order to achieve the above object, a method of manufacturing a chip-shaped tantalum solid electrolytic capacitor according to the present invention comprises a capacitor element having an anode lead wire and a holding element for holding the anode lead wire of the capacitor element. A member, a molding die including an upper die and a lower die for fixing the anode lead wire and forming a space for loading the capacitor element, and an upper die and a lower die in the molding die. And a resin injection gate for fixing the anode lead wire and injecting a resin into the space to coat the capacitor element with a mold resin. The resin injection gate is a molding metal into which the capacitor element is loaded. It is positioned on the side facing the anode lead wire of the mold, and a resin is injected from this resin injection gate to produce a molded resin outer package that houses the capacitor element. Is obtained so as to release the molded resin sheathing body from the lower tool tip vicinity of the resin injection gate side of Rudo resin sheathing body pushes a release pin.

【0012】[0012]

【作用】上記製造方法によれば、コンデンサ素子が装填
される空間部を形成した上金型および下金型からなる成
形金型における上金型および下金型でコンデンサ素子の
陽極導出線を固定し、前記空間部に樹脂を注入して前記
コンデンサ素子をモールド樹脂で外装するための樹脂注
入ゲートを前記コンデンサ素子が装填される成形金型の
陽極導出線と対向する面側に位置させ、この樹脂注入ゲ
ートより樹脂を注入して前記コンデンサ素子を内装する
モールド樹脂外装体を作製し、このモールド樹脂外装体
における前記樹脂注入ゲート側の先端近傍部を離型ピン
で押し上げて前記下金型からモールド樹脂外装体を離型
させるようにしているため、従来のようにモールド樹脂
外装体の下方の略中央部に凹部あるいは凸部の欠陥部分
が発生することはなくなり、そして、万一、離型ピンの
故障によりモールド樹脂外装体における樹脂注入ゲート
側の先端近傍部分に凹部あるいは凸部の欠陥部分が発生
したとしても、このモールド樹脂外装体における先端近
傍部は、コンデンサ素子の陽極導出線と対向する面側に
設けた陰極導電体層の一部を外部に露出させるために削
り取られるため、前記凹部あるいは凸部の欠陥部分はこ
れによって取り除かれることになり、その結果、モール
ド樹脂外装体の外表面は凹部あるいは凸部の欠陥部分が
ないフラットなものを得ることができ、かつモールド樹
脂の肉厚もほぼ均一なものが得られるため、たわみ試験
等における機械強度的な信頼性にも優れ、かつ実装機に
よる実装性についても安定したものを得ることができる
ものである。
According to the above manufacturing method, the anode lead wire of the capacitor element is fixed by the upper mold and the lower mold in the molding die including the upper mold and the lower mold in which the space for loading the capacitor element is formed. Then, a resin injection gate for injecting a resin into the space and covering the capacitor element with a mold resin is located on the surface side facing the anode lead wire of the molding die in which the capacitor element is loaded. A resin is injected from a resin injection gate to produce a molded resin exterior body that houses the capacitor element, and a portion near the tip on the resin injection gate side of the molded resin exterior body is pushed up by a mold release pin to remove it from the lower mold. Since the mold resin outer package is designed to be released from the mold, a defect such as a concave portion or a convex portion does not occur in the lower center of the mold resin outer package as in the conventional case. Even if a defect of the mold release pin causes a defective portion such as a concave portion or a convex portion in the vicinity of the tip on the resin injection gate side of the molded resin exterior body, the vicinity of the tip end of the mold resin exterior body is generated. Is shaved off to expose a part of the cathode conductor layer provided on the surface side of the capacitor element facing the anode lead-out line, so that the defective portion of the concave portion or the convex portion is removed by this. As a result, it is possible to obtain a flat outer surface of the molded resin outer package without a defective portion such as a concave portion or a convex portion, and a substantially uniform thickness of the molded resin. It is possible to obtain a product having excellent mechanical strength reliability and stable mountability by a mounting machine.

【0013】[0013]

【実施例】以下、本発明の実施例について図面を参照し
ながら説明する。図1は本発明の一実施例における製造
方法により得られたチップ状タンタル固体電解コンデン
サを示したもので、図1において、21は弁作用金属か
らなるタンタル金属粉末を成形焼結した多孔質の陽極体
で、この陽極体21より導出したタンタル線からなる陽
極導出線22の一部と陽極体21の全面に陽極酸化によ
る誘電体性酸化被膜を形成し、この表面に二酸化マンガ
ンなどの電解質層を形成している。23は陽極導出線2
2に装着したテフロン板で、このテフロン板22は前記
電解質層の形成時に陽極導出線22へ硝酸マンガンが這
い上がって二酸化マンガンが付着するのを防止する絶縁
板である。
Embodiments of the present invention will be described below with reference to the drawings. FIG. 1 shows a chip-shaped tantalum solid electrolytic capacitor obtained by a manufacturing method according to an embodiment of the present invention. In FIG. 1, reference numeral 21 is a porous tantalum metal powder formed by molding and sintering tantalum metal powder made of valve metal. In the anode body, a dielectric oxide film by anodic oxidation is formed on a part of the anode lead wire 22 formed of the tantalum wire led from the anode body 21 and the entire surface of the anode body 21, and an electrolyte layer such as manganese dioxide is formed on this surface. Is formed. 23 is an anode lead wire 2
The Teflon plate 22 is attached to No. 2, and this Teflon plate 22 is an insulating plate that prevents manganese nitrate from crawling up and adhering to manganese dioxide to the anode lead wire 22 when the electrolyte layer is formed.

【0014】また前記電解質層の上には浸漬法によりカ
ーボン層および銀塗料層よりなる陰極層24を順次積層
形成することによりコンデンサ素子21aを構成してい
る。そして、このコンデンサ素子21aの陰極層24に
おける陽極導出線22と反対側に位置する部分には、先
端部に丸みをもたせた円錐状の陰極導電体層25を形成
し、その後、コンデンサ素子21aおよび陰極導電体層
25を陽極導出線22が片側に引き出されるようにモー
ルド樹脂26で樹脂成形することにより外装している。
そしてこのモールド樹脂26により外装された陰極導電
体層25を機械的な研削等によってモールド樹脂26を
分厚く削り取ることにより露出させた後、陽極導出線2
2の突出分22aを含むモールド樹脂26の陽極導出線
22の引き出し面と、この引き出し面に隣接する周面に
陽極金属層27を被覆形成するとともに、陰極導電体層
25の露出部25aを含むモールド樹脂26の陰極側端
面およびこの陰極側端面に隣接する周面に陰極金属層2
8を被覆形成している。
Further, a capacitor element 21a is formed by sequentially forming a cathode layer 24 composed of a carbon layer and a silver coating layer on the electrolyte layer by a dipping method. Then, a conical cathode conductor layer 25 having a rounded tip is formed on a portion of the capacitor element 21a located on the side opposite to the anode lead wire 22 in the cathode layer 24, and thereafter, the capacitor element 21a and the cathode conductor layer 25 are formed. The cathode conductor layer 25 is packaged by molding with a molding resin 26 so that the anode lead wire 22 is drawn out to one side.
Then, the cathode conductor layer 25 that is covered with the mold resin 26 is exposed by shaving the mold resin 26 thickly by mechanical grinding or the like, and then exposing the anode lead wire 2.
The lead-out surface of the anode lead wire 22 of the mold resin 26 including the two protrusions 22a and the peripheral surface adjacent to the lead-out surface are covered with the anode metal layer 27, and the exposed portion 25a of the cathode conductor layer 25 is included. The cathode metal layer 2 is formed on the cathode-side end surface of the mold resin 26 and the peripheral surface adjacent to the cathode-side end surface.
8 is coated.

【0015】図2は、図1に示すチップ状タンタル固体
電解コンデンサを製造するための樹脂成形工程で用いる
トランスファー成形法の成形金型を示したものである。
図2において、保持部材29に保持された陽極導出線2
2を成形金型の下金型30aと上金型30bで水平に固
定してモールド成形する場合、成形金型の下金型30a
と上金型30bが閉じたときにできる空間部31に樹脂
注入ゲート32から樹脂を注入することにより、空間部
31内に装填されたコンデンサ素子21aを包み込むよ
うにしてモールド樹脂26により外装されたモールド樹
脂外装体を成形する。
FIG. 2 shows a molding die of a transfer molding method used in a resin molding process for manufacturing the chip-shaped tantalum solid electrolytic capacitor shown in FIG.
In FIG. 2, the anode lead wire 2 held by the holding member 29.
When 2 is fixed horizontally by the lower mold 30a and the upper mold 30b of the molding mold and molded, the lower mold 30a of the molding mold is used.
By injecting resin from the resin injection gate 32 into the space 31 formed when the upper mold 30b is closed, the capacitor element 21a loaded in the space 31 is wrapped with the molding resin 26. Mold the resin exterior body.

【0016】そしてこの成形後は上金型30bは上方に
上がり、モールド成形する前の状態となり待機した状態
となる。この待機状態のときに下金型30aに設置した
離型ピン33を下方から上方、すなわち矢印Y方向に動
かすことにより、モールド樹脂成形体を下方から上方に
押し上げてモールド樹脂外装体を成形金型の下金型30
aから離型させる。
After this molding, the upper die 30b is raised upward, and is in a state before being molded and is in a standby state. In this standby state, the mold release pin 33 installed in the lower mold 30a is moved from below to above, that is, in the direction of the arrow Y, thereby pushing up the mold resin molded body from below to above the mold resin exterior body. Lower mold 30
Release from a.

【0017】この場合、前記樹脂注入ゲート32は、コ
ンデンサ素子21aが装填される成形金型の陽極導出線
22と対向する面側に位置させ、かつこの樹脂注入ゲー
ト32は樹脂が流れてくるフィルムランナー34と連通
している。また前記離型ピン33はモールド樹脂外装体
における前記樹脂注入ゲート32側の先端近傍部、すな
わちコンデンサ素子21aにおける陰極導電体層25と
対応する部分を押し上げるように、下金型30aに設置
している。
In this case, the resin injection gate 32 is located on the surface side of the molding die on which the capacitor element 21a is mounted, which faces the anode lead wire 22, and the resin injection gate 32 is a film through which the resin flows. It communicates with the runner 34. Further, the release pin 33 is installed in the lower mold 30a so as to push up a portion in the vicinity of the tip on the resin injection gate 32 side in the molded resin outer package, that is, a portion corresponding to the cathode conductor layer 25 in the capacitor element 21a. There is.

【0018】上記したように、樹脂注入ゲート32より
樹脂を注入して作製したコンデンサ素子21aを内装す
るモールド樹脂外装体における前記樹脂注入ゲート32
側の先端近傍部を離型ピン33で押し上げて前記下金型
30aからモールド樹脂外装体を離型させるようにして
いるため、従来のようにモールド樹脂外装体の下方の略
中央部に凹部あるいは凸部の欠陥部分が発生することは
なくなる。
As described above, the resin injection gate 32 in the molded resin exterior body containing the capacitor element 21a produced by injecting the resin from the resin injection gate 32.
Since the mold resin outer package is released from the lower mold 30a by pushing up the part near the tip on the side with the mold release pin 33, as in the conventional case, a recess or a recess is formed in the approximate center below the mold resin package. The defective portion of the convex portion does not occur.

【0019】また、万一、離型ピン33が何らかのトラ
ブルにより、樹脂成形時に下方の定位置に下がらずに上
方に突出した状態で止まったときは、そのままの状態で
樹脂成形した場合、モールド樹脂外装体における樹脂注
入ゲート32側の先端近傍部に凹部あるいは凸部の欠陥
部分が発生することになるが、この先端近傍部はコンデ
ンサ素子21aにおける陰極導電体層25と対応する部
分であり、かつこの先端近傍部は、陰極導電体層25の
一部を外部に露出させるために機械域な研削等により削
り取られるため、前記凹部あるいは凸部の欠陥部分はこ
れによって取り除かれることになる。その結果、モール
ド樹脂外装体の外表面は凹部あるいは凸部の欠陥部分が
ないフラットなものを得ることができる。また、これに
よりモールド樹脂の肉厚もほぼ均一なものが得られるた
め、たわみ試験等における機械強度的な信頼性にも優
れ、かつ実装機による実装性についても安定したものを
得ることができる。
In addition, if the release pin 33 stops due to some trouble in a state where it does not drop to a fixed lower position and protrudes upward during resin molding, when the resin is molded as it is, the mold resin A defective portion such as a concave portion or a convex portion will be generated in the vicinity of the tip on the resin injection gate 32 side in the outer package, and this vicinity of the tip is a portion corresponding to the cathode conductor layer 25 in the capacitor element 21a, and Since the portion near the tip is scraped off by mechanical grinding or the like to expose a part of the cathode conductor layer 25 to the outside, the defective portion of the concave portion or the convex portion is removed by this. As a result, the outer surface of the molded resin outer package can be flat with no defective portions such as concave portions or convex portions. Further, as a result, a mold resin having a substantially uniform wall thickness can be obtained, so that it is possible to obtain a resin having excellent mechanical strength reliability in a bending test and the like, and stable mountability by a mounting machine.

【0020】なお、上記実施例においては、樹脂成形を
行う場合、トランスファー成形法で樹脂成形したものを
説明したが、液晶ポリマー,PPS樹脂などの熱可塑性
樹脂を用いた射出成形法で樹脂成形してもよいものであ
る。
In the above embodiments, when resin molding is performed, the resin molding is performed by the transfer molding method. However, the resin molding is performed by an injection molding method using a thermoplastic resin such as liquid crystal polymer and PPS resin. It's okay.

【0021】[0021]

【発明の効果】以上のように本発明の製造方法によれ
ば、コンデンサ素子が装填される空間部を形成した上金
型および下金型からなる成形金型における上金型および
下金型でコンデンサ素子の陽極導出線を圧接固定し、前
記空間部に樹脂を注入して前記コンデンサ素子をモール
ド樹脂で外装するための樹脂注入ゲートを前記コンデン
サ素子が装填される成形金型の陽極導出線と対向する面
側に位置させ、この樹脂注入ゲートより樹脂を注入して
前記コンデンサ素子を内装するモールド樹脂外装体を作
製し、このモールド樹脂外装体における前記樹脂注入ゲ
ート側の先端近傍部を離型ピンで押し上げて前記下金型
からモールド樹脂外装体を離型させるようにしているた
め、従来のようにモールド樹脂外装体の下方の略中央部
に凹部あるいは凸部の欠陥部分が発生することはなくな
り、そして、万一、離型ピンの故障によりモールド樹脂
外装体における樹脂注入ゲート側の先端近傍部に凹部あ
るいは凸部の欠陥部分が発生したとしても、このモール
ド樹脂外装体における先端近傍部は、コンデンサ素子の
陽極導出線と対向する面側に設けた陰極導電体層の一部
を外部に露出させるために削り取られるため、前記凹部
あるいは凸部の欠陥部分はこれによって取り除かれるこ
とになり、その結果、モールド樹脂外装体の外表面は凹
部あるいは凸部の欠陥部分がないフラットなものを得る
ことができ、かつモールド樹脂の肉厚もほぼ均一なもの
が得られるため、たわみ試験等における機械強度的な信
頼性にも優れ、かつ実装機による実装性についても安定
したものを得ることができるものである。
As described above, according to the manufacturing method of the present invention, the upper mold and the lower mold in the molding mold including the upper mold and the lower mold in which the space for loading the capacitor element is formed. A resin injection gate for fixing the anode lead-out wire of the capacitor element under pressure, and injecting resin into the space to coat the capacitor element with a mold resin, and an anode lead-out wire of a molding die in which the capacitor element is loaded. Positioned on the opposite surface side, a resin is injected from this resin injection gate to produce a molded resin exterior body that houses the capacitor element, and the vicinity of the tip of the molded resin exterior body on the resin injection gate side is released. Since the mold resin outer package is released from the lower mold by pushing it up with a pin, a concave or convex portion is formed in the lower center of the mold resin outer package as in the conventional case. No defective portion is generated, and even if a defect of the mold release pin causes a defective portion such as a concave portion or a convex portion in the vicinity of the tip on the resin injection gate side of the mold resin outer package, this mold resin Since the vicinity of the tip of the outer package is scraped off to expose a part of the cathode conductor layer provided on the surface side facing the anode lead wire of the capacitor element to the outside, the defective portion of the concave portion or the convex portion is As a result, it is possible to obtain a flat outer surface of the molding resin outer package without any defective portion such as a concave portion or a convex portion, and to obtain a molding resin having a substantially uniform thickness. Therefore, it is possible to obtain a product having excellent mechanical strength reliability in a flexure test and the like, and stable mountability by a mounting machine. .

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例における製造方法により得ら
れたチップ状タンタル固体電解コンデンサの断面図
FIG. 1 is a cross-sectional view of a chip-shaped tantalum solid electrolytic capacitor obtained by a manufacturing method according to an embodiment of the present invention.

【図2】同タンタル固体電解コンデンサを製造するため
の樹脂成形金型を示す部分断面図
FIG. 2 is a partial cross-sectional view showing a resin molding die for manufacturing the same tantalum solid electrolytic capacitor.

【図3】従来の製造方法により得られたチップ状タンタ
ル固体電解コンデンサの断面図
FIG. 3 is a cross-sectional view of a chip-shaped tantalum solid electrolytic capacitor obtained by a conventional manufacturing method.

【図4】同タンタル固体電解コンデンサの樹脂成形体を
示す斜視図
FIG. 4 is a perspective view showing a resin molded body of the tantalum solid electrolytic capacitor.

【図5】同タンタル固体電解コンデンサを製造するため
の樹脂成形金型を示す部分断面図
FIG. 5 is a partial sectional view showing a resin molding die for manufacturing the tantalum solid electrolytic capacitor.

【符号の説明】[Explanation of symbols]

21a コンデンサ素子 22 陽極導出線 25 陰極導電体層 26 モールド樹脂 29 保持部材 30a 下金型 30b 上金型 31 空間部 32 樹脂注入ゲート 33 離型ピン 21a Capacitor element 22 Anode lead wire 25 Cathode conductor layer 26 Mold resin 29 Holding member 30a Lower mold 30b Upper mold 31 Space part 32 Resin injection gate 33 Release pin

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 陽極導出線を有するコンデンサ素子と、
このコンデンサ素子の陽極導出線を保持する保持部材
と、前記陽極導出線を固定するとともに前記コンデンサ
素子が装填される空間部を形成した上金型および下金型
からなる成形金型と、この成形金型における上金型およ
び下金型で前記陽極導出線を固定し、前記空間部に樹脂
を注入して前記コンデンサ素子をモールド樹脂で外装す
るための樹脂注入ゲートとを有し、前記樹脂注入ゲート
を前記コンデンサ素子が装填される成形金型の陽極導出
線と対向する面側に位置させ、この樹脂注入ゲートより
樹脂を注入して前記コンデンサ素子を内装するモールド
樹脂外装体を作製し、このモールド樹脂外装体における
前記樹脂注入ゲート側の先端近傍部を離型ピンで押し上
げて前記下金型からモールド樹脂外装体を離型させるチ
ップ状タンタル固体電解コンデンサの製造方法。
1. A capacitor element having an anode lead wire,
A holding member for holding the anode lead-out wire of the capacitor element, a mold for fixing the anode lead-out wire, and an upper mold and a lower mold for forming a space for loading the capacitor element, and the molding die. A resin injection gate for fixing the anode lead wire with an upper mold and a lower mold in a mold and injecting a resin into the space to coat the capacitor element with a mold resin; The gate is located on the surface side of the molding die on which the capacitor element is mounted, which faces the anode lead wire, and a resin is injected from the resin injection gate to produce a molded resin outer package for incorporating the capacitor element. A chip-shaped tantalum solid for releasing the mold resin outer package from the lower mold by pushing up the vicinity of the tip on the resin injection gate side of the mold resin outer package with a release pin. Method for producing a solution capacitor.
JP02392693A 1993-02-12 1993-02-12 Manufacturing method of chip-shaped tantalum solid electrolytic capacitor Expired - Fee Related JP3175380B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP02392693A JP3175380B2 (en) 1993-02-12 1993-02-12 Manufacturing method of chip-shaped tantalum solid electrolytic capacitor

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP02392693A JP3175380B2 (en) 1993-02-12 1993-02-12 Manufacturing method of chip-shaped tantalum solid electrolytic capacitor

Publications (2)

Publication Number Publication Date
JPH06236834A true JPH06236834A (en) 1994-08-23
JP3175380B2 JP3175380B2 (en) 2001-06-11

Family

ID=12124139

Family Applications (1)

Application Number Title Priority Date Filing Date
JP02392693A Expired - Fee Related JP3175380B2 (en) 1993-02-12 1993-02-12 Manufacturing method of chip-shaped tantalum solid electrolytic capacitor

Country Status (1)

Country Link
JP (1) JP3175380B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015032654A (en) * 2013-08-01 2015-02-16 日本合成化工株式会社 Resin sealing method of electronic component, and resin sealed electronic component formed by sealing electronic component with resin sealing method
JP2017017122A (en) * 2015-06-30 2017-01-19 パナソニックIpマネジメント株式会社 Electrolytic capacitor and manufacturing method for the same

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2015032654A (en) * 2013-08-01 2015-02-16 日本合成化工株式会社 Resin sealing method of electronic component, and resin sealed electronic component formed by sealing electronic component with resin sealing method
JP2017017122A (en) * 2015-06-30 2017-01-19 パナソニックIpマネジメント株式会社 Electrolytic capacitor and manufacturing method for the same

Also Published As

Publication number Publication date
JP3175380B2 (en) 2001-06-11

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