JPH06224364A - Terminal pin - Google Patents

Terminal pin

Info

Publication number
JPH06224364A
JPH06224364A JP1362792A JP1362792A JPH06224364A JP H06224364 A JPH06224364 A JP H06224364A JP 1362792 A JP1362792 A JP 1362792A JP 1362792 A JP1362792 A JP 1362792A JP H06224364 A JPH06224364 A JP H06224364A
Authority
JP
Japan
Prior art keywords
terminal pin
pin
terminal
kovar
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP1362792A
Other languages
Japanese (ja)
Inventor
Hidetoshi Inoue
英俊 井上
Masaki Uchikawa
正樹 内川
Takahiko Suzuki
貴彦 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP1362792A priority Critical patent/JPH06224364A/en
Publication of JPH06224364A publication Critical patent/JPH06224364A/en
Withdrawn legal-status Critical Current

Links

Abstract

PURPOSE:To embody a terminal pin having a large mechanical strength and a small resistivity for use in a substrate of semiconductor package or in a connector, etc. CONSTITUTION:A terminal pin used in a substrate of semiconductor package or in a connector, etc., is constituted by a cylindrical body 17 made of kovar and a core material 18 made of copper provided in the cylindrical body 17.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、半導体パッケージの基
板やコネクタ等に用いられる端子ピンに関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a terminal pin used for a substrate or a connector of a semiconductor package.

【0002】[0002]

【従来の技術】図3は半導体パッケージの全容を示す断
面図である。1はセラミックなどから成る絶縁基板であ
り、多数の端子ピン2が植設されている。この絶縁基板
1上に気密封止用のキャップ3を被せ、キャップ外周3
oと絶縁基板1との間が、ロー材4や溶接によって封止
されている。
2. Description of the Related Art FIG. 3 is a cross-sectional view showing the whole of a semiconductor package. Reference numeral 1 is an insulating substrate made of ceramic or the like, and a large number of terminal pins 2 are implanted therein. The insulating substrate 1 is covered with a cap 3 for hermetic sealing, and the outer circumference 3 of the cap is covered.
A space between the o and the insulating substrate 1 is sealed by the brazing material 4 or welding.

【0003】そして、このキャップ3の中で、絶縁基板
1上に半導体チップ5が搭載され、該半導体チップ5と
絶縁基板1の導体パターン6の間が、バンプ7とリード
8を用いたタブ方式やフリップチップ方式などによっ
て、予めフェイスダウンボンディングされ、半導体チッ
プ5の各端子と絶縁基板1の端子ピン2との間が電気的
に接続されている。
In the cap 3, the semiconductor chip 5 is mounted on the insulating substrate 1, and the space between the semiconductor chip 5 and the conductor pattern 6 of the insulating substrate 1 uses the bumps 7 and the leads 8 in the tab system. Face down bonding is performed in advance by a flip chip method or the like, and each terminal of the semiconductor chip 5 and the terminal pin 2 of the insulating substrate 1 are electrically connected.

【0004】キャップ3の開口9から放熱部材10を挿
入して半導体チップ5の背面にダイボンディングされて
おり、またキャップ3の内周3iと放熱部材10との間
がロー材で封止されている。
A heat radiating member 10 is inserted from the opening 9 of the cap 3 and die-bonded to the back surface of the semiconductor chip 5, and a space between the inner circumference 3i of the cap 3 and the heat radiating member 10 is sealed with a brazing material. There is.

【0005】図4は図3の基板1における端子ピン2の
位置を断面にした図である。端子ピン2の頭部11が基
板1のパッド12にロー付けされている。基板1の内部
は、通常図示のように多数の絶縁層13…を積層してな
り、各絶縁層の表面に形成された導体パターン14、6
の間を、絶縁層13のスルーホールに充填したバイヤ1
5で接続した構成になっている。
FIG. 4 is a sectional view of the position of the terminal pin 2 on the substrate 1 of FIG. The head 11 of the terminal pin 2 is brazed to the pad 12 of the substrate 1. The inside of the substrate 1 is generally formed by laminating a large number of insulating layers 13 as shown in the drawing, and the conductor patterns 14 and 6 formed on the surfaces of the insulating layers
The space between the two is filled with the through hole of the insulating layer 13
It is configured to be connected by 5.

【0006】ところで、図示のようなピングリッドアレ
イ型の端子ピンを有する半導体装置、特にピンピッチが
0.4mm〜1.0mmと狭いものについては、端子ピ
ン2としてニッケル(Ni)製のものが用いられてい
る。
By the way, in the case of a semiconductor device having pin grid array type terminal pins as shown in the figure, especially for a narrow pin pitch of 0.4 mm to 1.0 mm, the terminal pin 2 made of nickel (Ni) is used. Has been.

【0007】[0007]

【発明が解決しようとする課題】導電率の上では、Ni
よりも銅(Cu)がすぐれているが、Cuは機械的強度
が弱く変形しやすいため、端子ピンとしては適しない。
そこで従来から、Ni製の端子ピンが用いられて来た
が、最近のような半導体装置などの高密度化にともな
い、端子ピンのピッチが狭くなり、その結果端子ピン外
径も微細化してきている。
In terms of conductivity, Ni is
Although copper (Cu) is superior to Cu, Cu is not suitable as a terminal pin because it has low mechanical strength and is easily deformed.
Therefore, Ni-made terminal pins have been used conventionally, but with the recent increase in the density of semiconductor devices and the like, the pitch of the terminal pins has become narrower, and as a result, the outer diameter of the terminal pins has become smaller. There is.

【0008】このように端子ピンが微細化すると、Ni
製でも強度が不十分で、変形しやすいということが問題
化してきており、強度が大きく、しかも抵抗率の小さな
端子ピンが求められている。
If the terminal pins are miniaturized in this way, Ni
It has become a problem that the strength is insufficient even when manufactured and it is easily deformed, and a terminal pin having high strength and low resistivity is demanded.

【0009】本発明の技術的課題は、このような問題に
着目し、機械的強度が大きく、しかも抵抗率の小さな端
子ピンを実現することにある。
A technical problem of the present invention is to realize a terminal pin having a large mechanical strength and a low resistivity by paying attention to such a problem.

【0010】[0010]

【課題を解決するための手段】図1は本発明による端子
ピンの基本原理を説明する断面図である。請求項1の発
明は、半導体パッケージの基板やコネクタ等に用いられ
る端子ピンにおいて、該端子ピン16が、コバールから
なる筒状体17と、該筒状体17の中に設けられた銅か
らなる芯材18を有しているものである。
FIG. 1 is a sectional view for explaining the basic principle of a terminal pin according to the present invention. According to the invention of claim 1, in a terminal pin used for a substrate or a connector of a semiconductor package, the terminal pin 16 is composed of a cylindrical body 17 made of Kovar and copper provided in the cylindrical body 17. It has a core material 18.

【0011】[0011]

【作用】このように本発明の場合は、コバールからなる
筒状体17の中にCu製の芯材18を挿通した構成にな
っている。そして、CuはNiより抵抗率は低いが、前
記のように強度が弱い。これに対し、コバールは、抵抗
率はNiより高いが、強度が強い。
As described above, in the case of the present invention, the core member 18 made of Cu is inserted into the cylindrical body 17 made of Kovar. Although Cu has a lower resistivity than Ni, it has a lower strength as described above. On the other hand, Kovar has a higher resistivity than Ni, but is stronger.

【0012】したがって、本発明によれば、電気的な導
通は内側のCu製芯材18で保障し、機械的な強度は外
側のコバール17で保障することにより、端子ピン全体
として、導電性にすぐれかつ機械的強度も大きな端子ピ
ンを実現できる。しかも、外側が強度の強いコバールな
ため、取扱いに際して損傷しにくい。内側のCuは酸化
しやすいのに対し、外側のコバールは、化学的にも安定
なため、耐久性にもすぐれている。
Therefore, according to the present invention, the electrical continuity is ensured by the inner Cu core 18 and the mechanical strength is ensured by the outer kovar 17, so that the terminal pin as a whole becomes conductive. A terminal pin with excellent mechanical strength can be realized. Moreover, since the outside is a strong kovar, it is not easily damaged during handling. Cu on the inside is easily oxidized, while Kovar on the outside is chemically stable and therefore has excellent durability.

【0013】[0013]

【実施例】次に本発明による端子ピンが実際上どのよう
に具体化されるかを実施例で説明する。図2は、本発明
の端子ピンを、集積回路からなる半導体装置のパッケー
ジに実施した例を、図4に対応して示す断面図である。
EXAMPLES Next, practical examples of how the terminal pin according to the present invention is embodied will be described. FIG. 2 is a sectional view showing an example in which the terminal pin of the present invention is applied to a package of a semiconductor device composed of an integrated circuit, corresponding to FIG.

【0014】端子ピン16は、コバール(Ni,Co,
Feの合金)からなる筒状体17の中にCu製芯材18
が充填された構造になっており、外径が拡大された頭部
19が、基板1側のパッド12にロー付けされている。
このとき、内部のCuの部分18もロー材を介してパッ
ド12と接続していることが肝要である。また、半導体
装置をプリント基板などに実装したとき、端子ピン16
の先端のCu製芯材18がプリント基板側と接続するよ
うに、端子ピン先端でCu製芯材18が露出しているこ
とが肝要である。
The terminal pin 16 is made of Kovar (Ni, Co,
Cu core material 18 in a tubular body 17 made of Fe alloy)
The head 19 having an enlarged outer diameter is brazed to the pad 12 on the substrate 1 side.
At this time, it is important that the Cu portion 18 inside is also connected to the pad 12 via the brazing material. In addition, when the semiconductor device is mounted on a printed circuit board or the like, the terminal pin 16
It is essential that the Cu core material 18 is exposed at the terminal pin tips so that the Cu core material 18 at the tip of is connected to the printed circuit board side.

【0015】図2の実施例において、コバールからなる
筒状体17の外径を0.1mm、Cu製芯材18の外径
を0.06mm、全長を1mmとした場合、端子ピン全
体としての抵抗率は4.67(μΩcm)、ピン抵抗は
59.5μΩであり、同じ外寸のNi製の端子ピンの抵
抗率6.8(μΩcm)、ピン抵抗85.6μΩに比べ
ると、導電率が確実に改善されていることが認められ
る。
In the embodiment of FIG. 2, when the outer diameter of the cylindrical body 17 made of Kovar is 0.1 mm, the outer diameter of the Cu core material 18 is 0.06 mm, and the total length is 1 mm, the entire terminal pin is obtained. The resistivity is 4.67 (μΩcm), the pin resistance is 59.5 μΩ, and the conductivity is higher than the resistivity 6.8 (μΩcm) and the pin resistance 85.6 μΩ of the terminal pin made of Ni with the same outer dimensions. It is confirmed that the improvement has been made.

【0016】また、前記と同じ寸法の端子ピンにつき、
ピン曲がり強度とピン引張り強度を測定したところ、表
1、表2に示すような実測値が得られた。ピン曲がり強
度は、該端子ピンの中間位置に荷重を加えた場合に曲が
り始めたときの荷重で現される。
Also, for the terminal pin of the same size as described above,
When the pin bending strength and the pin tensile strength were measured, the measured values shown in Tables 1 and 2 were obtained. The pin bending strength is expressed by the load when the bending starts when a load is applied to the intermediate position of the terminal pin.

【0017】[0017]

【表1】 [Table 1]

【0018】[0018]

【表2】 [Table 2]

【0019】表1、表2から明らかなように、従来のN
i製の端子ピンに比べ、Cuとコバールから成る本発明
の端子ピンは、ピン曲がり強度、ピン引張り強度とも
に、確実に改善されている。このように、機械的強度も
従来のNi製の端子ピンに比べて向上しており、端子ピ
ンの微細化に十分に対応できる。
As is clear from Tables 1 and 2, the conventional N
Compared with the terminal pin made of i, the terminal pin of the present invention made of Cu and Kovar is surely improved in both the pin bending strength and the pin tensile strength. As described above, the mechanical strength is also improved as compared with the conventional Ni-made terminal pin, and it is possible to sufficiently cope with the miniaturization of the terminal pin.

【0020】図2は半導体装置に実施した例であるが、
本発明は、ピンピッチの狭い装置であれば、例えばコネ
クタなどにも有効である。
FIG. 2 shows an example implemented in a semiconductor device.
The present invention is effective for, for example, a connector as long as the device has a narrow pin pitch.

【0021】[0021]

【発明の効果】以上のように本発明によれば、コバール
からなる筒状体17の中にCu製の芯材18を挿通した
構造になっているため、電気的な導通は内部のCu製芯
材18で確保し、該Cu製芯材18を覆っているコバー
ル製の筒状体17で機械的な強度を確保することができ
る。そのため、導電率も機械的強度も従来のNi製の端
子ピンに比べて確実に改善でき、電子部品の端子ピンピ
ッチの微細化に充分対応できる。
As described above, according to the present invention, since the Cu core material 18 is inserted into the cylindrical body 17 made of Kovar, the electrical continuity is ensured by the internal Cu material. The mechanical strength can be ensured by the core material 18, and the mechanical strength can be ensured by the Kovar tubular body 17 covering the Cu core material 18. Therefore, the electrical conductivity and the mechanical strength can be surely improved as compared with the conventional Ni-made terminal pins, and the terminal pin pitch of electronic parts can be sufficiently miniaturized.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明による端子ピンの基本原理を説明する断
面図である。
FIG. 1 is a cross-sectional view illustrating the basic principle of a terminal pin according to the present invention.

【図2】本発明の端子ピンの実施例を示す断面図であ
る。
FIG. 2 is a sectional view showing an embodiment of a terminal pin of the present invention.

【図3】半導体パッケージの全容を示す断面図である。FIG. 3 is a cross-sectional view showing the whole of a semiconductor package.

【図4】従来の端子ピン構造を示す断面図である。FIG. 4 is a sectional view showing a conventional terminal pin structure.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 半導体パッケージの基板やコネクタ等に
用いられる端子ピンにおいて、 該端子ピンが、コバールからなる筒状体(17)と、該筒状
体(17)の中に設けられた銅からなる芯材(18)を有してい
ることを特徴とする端子ピン。
1. A terminal pin used for a substrate of a semiconductor package, a connector, etc., wherein the terminal pin is composed of a cylindrical body (17) made of Kovar and copper provided in the cylindrical body (17). A terminal pin having a core material (18)
JP1362792A 1992-01-29 1992-01-29 Terminal pin Withdrawn JPH06224364A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1362792A JPH06224364A (en) 1992-01-29 1992-01-29 Terminal pin

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1362792A JPH06224364A (en) 1992-01-29 1992-01-29 Terminal pin

Publications (1)

Publication Number Publication Date
JPH06224364A true JPH06224364A (en) 1994-08-12

Family

ID=11838479

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1362792A Withdrawn JPH06224364A (en) 1992-01-29 1992-01-29 Terminal pin

Country Status (1)

Country Link
JP (1) JPH06224364A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011018568A (en) * 2009-07-09 2011-01-27 Sumitomo Wiring Syst Ltd Male terminal fitting
CN109195329A (en) * 2018-11-01 2019-01-11 郑州云海信息技术有限公司 A kind of pcb board and its DIP device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011018568A (en) * 2009-07-09 2011-01-27 Sumitomo Wiring Syst Ltd Male terminal fitting
CN109195329A (en) * 2018-11-01 2019-01-11 郑州云海信息技术有限公司 A kind of pcb board and its DIP device

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Legal Events

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A300 Withdrawal of application because of no request for examination

Free format text: JAPANESE INTERMEDIATE CODE: A300

Effective date: 19990408