JPH06199590A - Device for producing semiconductor single crystal rod - Google Patents
Device for producing semiconductor single crystal rodInfo
- Publication number
- JPH06199590A JPH06199590A JP74593A JP74593A JPH06199590A JP H06199590 A JPH06199590 A JP H06199590A JP 74593 A JP74593 A JP 74593A JP 74593 A JP74593 A JP 74593A JP H06199590 A JPH06199590 A JP H06199590A
- Authority
- JP
- Japan
- Prior art keywords
- single crystal
- heating chamber
- cooling cylinder
- semiconductor single
- crystal ingot
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、チョクラルスキー法に
よる半導体単結晶棒製造装置に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an apparatus for producing a semiconductor single crystal ingot by the Czochralski method.
【0002】[0002]
【従来の技術】各種集積回路の製造に用いられる半導体
単結晶、特にシリコン単結晶の製造には、チョクラルス
キー(以下、CZと略す)法により製造された単結晶棒
が用いられている。2. Description of the Related Art A single crystal rod manufactured by the Czochralski (hereinafter abbreviated as CZ) method is used for manufacturing a semiconductor single crystal used for manufacturing various integrated circuits, particularly a silicon single crystal.
【0003】これまでにもCZ法による単結晶棒の製造
装置は、転位や各種の結晶欠陥等を極力少なくし、ま
た、より低いコストで単結晶棒を製造するために多くの
改良がなされている。Up to now, the apparatus for producing a single crystal ingot by the CZ method has been improved to reduce dislocations and various crystal defects as much as possible and to produce a single crystal ingot at a lower cost. There is.
【0004】その一つに、加熱チャンバ内部に引上げ中
の単結晶棒を取り囲むように冷却筒を設け、引上げ中の
単結晶棒を効率よく冷却することにより引上げ速度を速
くしても転位や結晶欠陥等が生じないような方法および
装置が各種提案されている。この様な冷却筒を設けた引
上げ方法およびその装置としては、例えば特開昭47−
26,388号公報、特公平3−35,279号公報お
よび特開平2−97,481号公報等に開示されている
ものがある。One of them is that a cooling cylinder is provided inside the heating chamber so as to surround the single crystal rod being pulled, and by efficiently cooling the single crystal rod being pulled, dislocations and crystals are increased even if the pulling speed is increased. Various methods and devices have been proposed to prevent defects and the like. An example of the pulling method and its apparatus provided with such a cooling cylinder is disclosed in JP-A-47-
26,388, Japanese Patent Publication No. 3-35,279 and Japanese Patent Application Laid-Open No. 2-97,481.
【0005】特開昭47−26,388号公報の開示技
術では、引上げチャンバ下部分を延長して加熱チャンバ
内部に張り出させ、単結晶棒を取り囲むようにして小円
筒を設け、不活性ガスを該引上げチャンバ上方から吹き
付ける引上げ方法およびその装置が開示されており、こ
れによると、単結晶棒の強制冷却により凝固界面が平滑
化されて各種格子欠陥の低減が図られるとされている。
しかしながら、この公報による方法では、冷却をガスに
よる強制冷却にのみ依存しているため、直径が100m
mを越える結晶の大口径化および減圧操業が普通になっ
た現在では冷却効果が不十分である。In the technique disclosed in Japanese Patent Application Laid-Open No. 47-26388, the lower portion of the pulling chamber is extended to project into the heating chamber, and a small cylinder is provided so as to surround the single crystal rod, and an inert gas is provided. There is disclosed a pulling method and an apparatus for blowing the above from above the pulling chamber. According to this method, the solidification interface is smoothed by the forced cooling of the single crystal ingot to reduce various lattice defects.
However, in the method according to this publication, since the cooling depends only on the forced cooling by the gas, the diameter is 100 m.
The cooling effect is insufficient at present when the diameter of crystals exceeding m and the operation under reduced pressure have become common.
【0006】次に、特公平3−35,279号公報の開
示技術では、引上げ中の単結晶を同軸に囲み、その先端
が融液に近接する先細管状体にて、その構造は熱伝導
率、熱輻射率をそれぞれ特定した3層構造からなる。こ
の方法および装置では、先細管状体が引上げチャンバ入
り口に載置されているだけなので管状体の抜熱が不十分
であり、また、管状体の外面を黒鉛や炭化珪素、窒化珪
素とすることは、中間に断熱層を設けても内面側の加熱
効果を完全に防止することは難しいなどの問題点があ
る。Next, in the technique disclosed in Japanese Patent Publication No. 3-35,279, the structure is a tapered tubular body that coaxially surrounds a single crystal that is being pulled up and the tip of which is close to the melt. , And has a three-layer structure in which the thermal emissivity is specified. In this method and apparatus, heat removal of the tubular body is insufficient because the tapered tubular body is only placed at the entrance of the pulling chamber, and the outer surface of the tubular body is not made of graphite, silicon carbide, or silicon nitride. However, even if a heat insulating layer is provided in the middle, it is difficult to completely prevent the heating effect on the inner surface side.
【0007】さらに、特開平2−97,481号公報の
開示技術では、引上げ中の単結晶を同心に囲む先細冷却
筒にて、冷媒路を設けることにより、冷却筒の冷却効率
を高めている。この方法および装置では、構造が複雑で
高価なため、引上げ条件に応じた種々の長さの冷却筒を
常備することはコストの上昇を招き、また、この様な構
造のものは冷却筒外面にSiOが付着し易く、付着した
SiOが時に落下して結晶の有転位化をもたらす。Further, in the technique disclosed in Japanese Patent Application Laid-Open No. 2-97,481, the cooling efficiency of the cooling cylinder is improved by providing the refrigerant passage with the tapered cooling cylinder concentrically surrounding the single crystal being pulled. . In this method and apparatus, since the structure is complicated and expensive, it is costly to keep the cooling cylinders of various lengths depending on the pulling conditions, and the cost is increased. SiO adheres easily, and the adhered SiO sometimes drops to cause dislocation of crystals.
【0008】[0008]
【発明が解決しようとする課題】上述のように、従来の
半導体単結晶棒製造方法および装置は、種々改良が成さ
れているが、近年の半導体単結晶棒の大口径化やより低
コストでの良品を得るためには、いまだ満足の行く方法
および装置といえるものではない。As described above, various improvements have been made in the conventional method and apparatus for manufacturing a semiconductor single crystal ingot, but in recent years, the diameter of the semiconductor single crystal ingot has been increased and the cost has been reduced. In order to obtain non-defective products, it is still not a satisfactory method and device.
【0009】そこで、本発明は、結晶欠陥の少ない大口
径の半導体単結晶棒を低コストで製造するための半導体
単結晶棒製造装置を提供することを目的とする。Therefore, an object of the present invention is to provide a semiconductor single crystal ingot producing apparatus for producing a large diameter semiconductor single crystal ingot having few crystal defects at low cost.
【0010】[0010]
【課題を解決するための手段】上記諸目的は、半導体融
液が収容されるルツボおよび該ルツボ内の原料半導体を
加熱する加熱ヒータを格納した加熱チャンバ本体と、該
加熱チャンバの開口部を覆う加熱チャンバ天井部および
該加熱チャンバ天井部の中央部分に位置し、引上げられ
た半導体単結晶棒を収納する引上げチャンバ部よりなる
半導体単結晶棒の製造装置において、該加熱チャンバ天
井部と該引上げチャンバ部との接合部位より加熱チャン
バ内部に向かって伸延し、引上げ中の半導体単結晶棒を
取り囲む整流冷却筒を前記加熱チャンバ天井部と一体的
に形成したことを特徴とする半導体単結晶棒製造装置に
より達成される。The above objects are to cover a crucible in which a semiconductor melt is housed and a heating chamber main body containing a heater for heating a raw material semiconductor in the crucible, and an opening of the heating chamber. In a manufacturing apparatus for a semiconductor single crystal ingot, which comprises a heating chamber ceiling and a pulling chamber located in a central portion of the heating chamber ceiling and housing a pulled semiconductor single crystal ingot, the heating chamber ceiling and the pulling chamber An apparatus for producing a semiconductor single crystal rod, characterized in that a rectifying and cooling cylinder extending from the joining portion to the inside of the heating chamber toward the inside of the heating chamber and surrounding the semiconductor single crystal rod being pulled is integrally formed with the ceiling portion of the heating chamber. Achieved by
【0011】本発明は、該整流冷却筒が引上げチャンバ
下部分より加熱チャンバ内部に向かって縮径しているこ
とを特徴とする半導体単結晶棒製造装置である。また、
本発明は、該整流冷却筒が銅、ニッケルおよび銅、ニッ
ケル、チタン、モリブデン、タングステンまたは白金族
元素で被覆された銅またはニッケルよりなる群から選択
された少なくとも一つの素材により形成されていること
を特徴とする半導体単結晶棒製造装置である。さらに、
本発明は、該整流冷却筒内部に嵌合するように、黒鉛、
炭化珪素および表面が炭化珪素で被覆された黒鉛よりな
る群から選択された少なくとも一つの素材により形成さ
れた内部冷却筒をさらに有することを特徴とする半導体
単結晶棒製造装置である。The present invention is the apparatus for producing a semiconductor single crystal ingot, wherein the rectifying and cooling cylinder is reduced in diameter from the lower portion of the pulling chamber toward the inside of the heating chamber. Also,
In the present invention, the rectification cooling cylinder is formed of at least one material selected from the group consisting of copper, nickel and copper, nickel, titanium, molybdenum, tungsten or copper or nickel coated with a platinum group element. And a semiconductor single crystal ingot manufacturing apparatus. further,
The present invention, graphite, so as to fit inside the rectification cooling cylinder,
An apparatus for producing a semiconductor single crystal ingot, further comprising an internal cooling cylinder made of at least one material selected from the group consisting of silicon carbide and graphite whose surface is coated with silicon carbide.
【0012】[0012]
【作用】上述のように構成された本発明の半導体単結晶
棒製造装置は、加熱チャンバ天井部と該引上げチャンバ
部との接合部位より加熱チャンバ内部に向かって伸延
し、引上げ中の半導体単結晶棒を取り囲む整流冷却筒を
前記加熱チャンバ天井部と一体的に形成したことによ
り、整流冷却筒の抜熱が、加熱チャンバ天井部により効
果的に行われるため、引上げ中の半導体単結晶棒を急冷
することができる。そして、該整流冷却筒を、例えば熱
伝導率の高い銅、ニッケルおよび銅またはニッケルまた
は蒸気圧の低いチタン、モリブデン、タングステン、白
金属元素で被覆された銅またはニッケルよりなる群から
選択された少なくとも一つの素材により形成されること
により、チャンバ内部の汚染を防止することができる。In the semiconductor single crystal ingot manufacturing apparatus of the present invention configured as described above, the semiconductor single crystal that is being pulled is extended toward the inside of the heating chamber from the joint between the ceiling of the heating chamber and the pulling chamber. By forming the rectification cooling cylinder surrounding the rod integrally with the heating chamber ceiling, heat removal of the rectification cooling cylinder is effectively performed by the heating chamber ceiling, so that the semiconductor single crystal rod being pulled is rapidly cooled. can do. At least one selected from the group consisting of high thermal conductivity copper, nickel and copper or nickel or low vapor pressure titanium, molybdenum, tungsten, or copper or nickel coated with a white metal element is used for the rectification cooling cylinder. By being formed of one material, it is possible to prevent contamination inside the chamber.
【0013】また、該整流冷却筒内部に輻射率の優れた
黒鉛、炭化珪素および表面が炭化珪素で被覆された黒鉛
よりなる群から選択された少なくとも一つの素材により
形成された内部冷却筒を嵌合させることにより、さらに
効率良く半導体棒を冷却することができる。そして、該
整流冷却筒を加熱チャンバ内部に向かって縮径させるこ
とにより、内部冷却筒の嵌合を容易に行うことができ、
該整流冷却筒が加熱チャンバ内部に向かって縮径されて
いるため、該内部冷却筒との接触面積を多くとることが
でき、しかも縮径されていることにより該整流冷却筒お
よび該内部冷却筒の内外径が熱膨脹により変化しても、
その変化に追従するため前記内部冷却筒と前記整流冷却
筒との熱伝達性は良好に保つことができるので、内部冷
却筒の抜熱も常に効果的に行われる。Further, an inner cooling cylinder made of at least one material selected from the group consisting of graphite having excellent emissivity, silicon carbide and graphite whose surface is coated with silicon carbide is fitted inside the rectification cooling cylinder. By combining them, the semiconductor rod can be cooled more efficiently. Then, by reducing the diameter of the rectification cooling cylinder toward the inside of the heating chamber, the internal cooling cylinder can be easily fitted,
Since the diameter of the straightening cooling cylinder is reduced toward the inside of the heating chamber, the contact area with the internal cooling cylinder can be increased, and the diameter of the straightening cooling cylinder and the internal cooling cylinder are reduced. Even if the inner and outer diameter of changes due to thermal expansion,
Since the change can be followed, the heat transfer between the internal cooling cylinder and the rectification cooling cylinder can be kept good, so that the heat removal of the internal cooling cylinder is always performed effectively.
【0014】[0014]
【実施例】以下、本発明の実施例を図面に基づいて詳細
に説明する。図1は、本発明にかかる単結晶棒の製造装
置の概略の構成図である。Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a schematic configuration diagram of an apparatus for manufacturing a single crystal ingot according to the present invention.
【0015】この単結晶棒の製造装置1は、半導体原
料、例えばシリコンを溶融するための部材や結晶化した
シリコンを引き上げる機構などを有しており、シリコン
溶融のための部材は加熱チャンバ本体2aおよび加熱チ
ャンバ天井部2bよりなるチャンバ2内に収容され、こ
の加熱チャンバ本体2aと加熱チャンバ天井部2bは分
離機構20によって分離可能であり、シリコン単結晶を
引き上げる機構は引き上げチャンバ3内外に設けられて
いる。This single crystal ingot manufacturing apparatus 1 has a member for melting semiconductor raw materials such as silicon and a mechanism for pulling out crystallized silicon. The member for melting silicon is the heating chamber body 2a. Also, the heating chamber main body 2a and the heating chamber ceiling 2b are housed in a chamber 2 composed of a heating chamber ceiling 2b, and a mechanism for pulling a silicon single crystal is provided inside and outside the pulling chamber 3. ing.
【0016】加熱チャンバ本体2a内には、溶融してい
るシリコンを収容するルツボ5が設けられ、このルツボ
5は駆動装置(図示せず)の回転軸4によって回転、昇
降自在に支持されている。駆動装置は、シリコン単結晶
棒Sの引き上げに伴う液面低下を補償すべくルツボ5を
液面低下分だけ上昇させ、また、シリコン融液の撹拌を
行なうためにルツボ5を常時所定の回転数で回転させ
る。回転軸4は加熱チャンバ本体2aを貫通している
が、チャンバ内外の気密を保持し、また極めて悪い温度
条件の下での使用となるために、特殊なベアリングで保
持してある。ルツボ5は、従来と同様に石英ルツボ5b
とこれを保護する黒鉛製ルツボ5aとから構成されてい
る。A crucible 5 containing molten silicon is provided in the heating chamber main body 2a, and the crucible 5 is supported by a rotary shaft 4 of a drive unit (not shown) so as to be rotatable and movable up and down. . The drive device raises the crucible 5 by the amount corresponding to the liquid level lowering in order to compensate for the liquid level lowering accompanying the pulling of the silicon single crystal ingot S, and also keeps the crucible 5 at a predetermined rotation speed for stirring the silicon melt. Rotate with. The rotary shaft 4 penetrates the heating chamber main body 2a, but is held by a special bearing in order to maintain airtightness inside and outside the chamber and to be used under extremely bad temperature conditions. The crucible 5 is a quartz crucible 5b as in the conventional case.
And a crucible 5a made of graphite for protecting the same.
【0017】ルツボ5の側壁部分には、シリコンを溶融
させる加熱ヒータ6がその周囲を取り囲むように配置さ
れている。この加熱ヒータ6の外側には、加熱ヒータ6
からの熱が加熱チャンバ本体2aに直接輻射されるのを
防止する断熱部材11がその周囲を取り囲むように設け
られている。なお、加熱ヒータ6と断熱部材11とは支
持台24に取り付けられている。A heater 6 for melting silicon is arranged on the side wall of the crucible 5 so as to surround the periphery thereof. The heater 6 is provided outside the heater 6.
A heat insulating member 11 is provided so as to surround the periphery of the heating chamber main body 2a, which is prevented from being radiated directly to the heating chamber main body 2a. The heater 6 and the heat insulating member 11 are attached to the support base 24.
【0018】引き上げチャンバ3には、ワイヤ巻上機1
0に一端が取り付けられ、引き上げチャンバ3の頂壁を
挿通して垂れ下げられた引き上げワイヤ7が設けられて
おり、この引き上げワイヤ7の下端には、種結晶を保持
するチャック9が取り付けられている。ワイヤ巻上機1
0は種結晶の下端側に徐々に成長するシリコン単結晶棒
Sをその成長速度等にしたがって引き上げ、同時に、ル
ツボ5の回転方向とは反対に常時回転させる。In the lifting chamber 3, the wire hoist 1
No. 0 has one end attached thereto, and a pulling wire 7 penetrating through the top wall of the pulling chamber 3 is provided. At the lower end of the pulling wire 7, a chuck 9 for holding a seed crystal is attached. There is. Wire hoist 1
In 0, the silicon single crystal rod S gradually growing to the lower end side of the seed crystal is pulled up according to its growth rate, and at the same time, the crucible 5 is always rotated in the opposite direction to the rotation direction.
【0019】チャンバ2内部は、引き上げチャンバ3に
設けられたガス導入口12からアルゴンガスが導入さ
れ、内部を流通し、単結晶棒引上げ中は大気圧もしくは
大気圧より数Torr程度の低い圧力に保たれて、ガス
流出口13から排出される。このようにアルゴンガスを
流通させるのは、シリコンの溶融に伴ってチャンバ内部
に発生するSiOがチャンバ内部の各種部材に付着し、
これのシリコン融液上への落下によるシリコン融液内の
汚染や結晶の有転位化を防止し、かつアルゴンガスによ
り引上げ中のシリコン単結晶棒を冷却するためである。Argon gas is introduced into the interior of the chamber 2 from a gas inlet 12 provided in the pulling chamber 3 and flows through the interior of the chamber 2. At the atmospheric pressure or a pressure lower than the atmospheric pressure by several Torr during pulling of the single crystal rod. It is kept and discharged from the gas outlet 13. In order to circulate the argon gas in this way, SiO generated inside the chamber due to melting of silicon adheres to various members inside the chamber,
This is to prevent the contamination of the silicon melt and the formation of dislocations in the crystal due to the dropping onto the silicon melt, and to cool the silicon single crystal ingot being pulled by the argon gas.
【0020】加熱チャンバ本体2aおよび加熱チャンバ
天井部2bは、ステンレスにより形成されており、冷却
管が通り水冷されている。そして、加熱チャンバ天井部
2bには引上げチャンバ3下部分より加熱チャンバ本体
2a内部に向かって、単結晶棒を取り囲むように加熱チ
ャンバ2bと一体構造を成し、引上げチャンバ3下部分
より加熱チャンバ本体2a内部に向かって縮径している
整流冷却筒30が設けられている。この整流冷却筒30
は、熱伝導性の良い銅、ニッケルおよび銅、ニッケルま
たは蒸気圧の低いチタン、モリブデン、タングステン、
白金族元素等の金属で被覆された銅またはニッケル等の
素材により形成されており、好ましくは熱伝導性の優れ
た銅にニッケルメッキを施したもので形成することによ
り、以下に説明する黒鉛製の内部冷却筒25を嵌合させ
た場合に黒鉛と反応することなく、また、ニッケルは銅
に比べるとその蒸気圧が低いので、高温となるチャンバ
2内部にあってもチャンバ2内を汚染することがない。The heating chamber body 2a and the heating chamber ceiling portion 2b are made of stainless steel, and are cooled by water through a cooling pipe. Further, the heating chamber ceiling 2b is integrally formed with the heating chamber 2b so as to surround the single crystal ingot from the lower part of the pulling chamber 3 toward the inside of the heating chamber main body 2a. A rectifying / cooling cylinder 30 having a diameter reduced toward the inside of 2a is provided. This straightening cooling cylinder 30
Is a material with good thermal conductivity such as copper, nickel and copper, nickel or titanium, molybdenum, tungsten with low vapor pressure,
It is formed of a material such as copper or nickel coated with a metal such as a platinum group element, and is preferably made of graphite having excellent thermal conductivity and plated with nickel. Does not react with graphite when the internal cooling cylinder 25 is fitted, and since nickel has a lower vapor pressure than copper, it contaminates the interior of the chamber 2 even if it is at a high temperature. Never.
【0021】そして、この整流冷却筒は、水冷されてい
る加熱チャンバ天井部と一体構造となっているので十分
な抜熱が成されており、以下に説明する内部冷却筒25
および内部冷却筒25の内側を引上げ中の単結晶棒Sに
沿って流通しているアルゴンガスの昇温を抑制すること
ができる。また、整流冷却筒30の素材は上述のように
ニッケルメッキ等が施されていることにより、整流冷却
筒の外側部分は、チャンバ内部の輻射熱が反射されるた
め整流冷却筒自体の昇温も少なくてすむ。Since this rectifying cooling cylinder has an integral structure with the ceiling portion of the heating chamber which is water-cooled, sufficient heat is removed, and the internal cooling cylinder 25 described below is used.
Also, it is possible to suppress the temperature rise of the argon gas flowing along the single crystal rod S that is being pulled inside the inner cooling cylinder 25. Further, since the material of the rectification cooling cylinder 30 is nickel-plated as described above, the radiant heat inside the chamber is reflected at the outer portion of the rectification cooling cylinder, so that the temperature rise of the rectification cooling cylinder itself is small. End
【0022】また、この整流冷却筒30の長さは、単結
晶棒Sの結晶径以上で、シリコン融液界面より300〜
100mm程度とすることが望ましい。この長さが結晶
径より短い場合には結晶棒Sからの輻射熱を十分抜熱す
ることができず、一方融液界面に100mmより近い場
合には、溶解する前の原料シリコン塊をルツボ5内に入
れたときにかさ高くなっている原料シリコン塊に接触
し、原料シリコンを汚染したりチャンバ天井部2bが締
まらなくなったりして不都合が生じるからである。 さ
らに、整流冷却筒30内部には、ルツボ5の融液界面に
向けて伸延する取り外し自在の黒鉛製の内部冷却筒25
が縮径された整流冷却筒30に嵌合している。この内部
冷却筒25は、整流冷却筒30によって加熱ヒータ6お
よびシリコン融液等からの輻射熱が遮断され、引上げ中
の単結晶棒Sの急冷を可能としている。Further, the length of the rectification cooling cylinder 30 is equal to or larger than the crystal diameter of the single crystal rod S and is 300 to 300 mm from the silicon melt interface.
It is desirable to set it to about 100 mm. If this length is shorter than the crystal diameter, the radiant heat from the crystal rod S cannot be sufficiently removed, while if it is closer to the melt interface than 100 mm, the raw silicon mass before melting is placed in the crucible 5. This is because the bulk of the raw material silicon comes into contact with the bulk of the raw material silicon when it is put in, and the raw material silicon is contaminated, or the chamber ceiling portion 2b is not tightened, which causes a problem. Further, inside the rectifying cooling cylinder 30, a removable internal cooling cylinder 25 made of graphite that extends toward the melt interface of the crucible 5 is provided.
Is fitted in the rectified cooling cylinder 30 whose diameter is reduced. The internal cooling cylinder 25 is shielded from the radiant heat from the heater 6 and the silicon melt by the rectification cooling cylinder 30 so that the single crystal rod S being pulled can be rapidly cooled.
【0023】この内部冷却筒25は、取り外しが自由に
行えるため、様々な長さや肉厚の内部冷却筒25を取り
揃え、適宜交換することにより、引上げ中の単結晶棒の
急冷域を変化させることができ所望の品質のシリコン単
結晶を得ることが可能となる。すなわち、内部冷却筒2
5を融液界面近くまで長くした場合には、引き上げ中の
シリコン単結晶棒Sを引上げ直後より急冷することがで
き単結晶棒トップ側の品質のシリコン単結晶が得られ、
内部冷却筒25を短くし、融液界面からの距離を多くと
った場合には、引上げ直後は徐冷されることになり、単
結晶棒ボトム側の品質のシリコン単結晶が得られる。Since the internal cooling cylinder 25 can be freely removed, it is possible to change the quenching region of the single crystal rod during pulling by collecting the internal cooling cylinders 25 of various lengths and thicknesses and exchanging them appropriately. It is possible to obtain a silicon single crystal of desired quality. That is, the internal cooling cylinder 2
When 5 is extended to near the melt interface, the silicon single crystal ingot S being pulled can be rapidly cooled immediately after being pulled, and a silicon single crystal of the quality of the top of the single crystal ingot can be obtained.
When the internal cooling cylinder 25 is shortened and the distance from the melt interface is increased, the internal cooling cylinder 25 is gradually cooled immediately after pulling, so that a silicon single crystal having the quality of the bottom of the single crystal rod can be obtained.
【0024】また、この内部冷却筒25の素材となる黒
鉛は、融液界面近くに設置してSiOが付着しても融液
内に落下することなく融液の汚染や結晶の有転位化を生
ずることがない。Further, the graphite used as the material of the internal cooling cylinder 25 is installed near the melt interface and does not fall into the melt even if SiO adheres to it, thereby preventing contamination of the melt and dislocation of crystals. It never happens.
【0025】以上のように構成された本発明による半導
体単結晶棒製造装置を用いてシリコン単結晶を製造した
結果を整流冷却筒30のみを用いた場合と、整流冷却筒
内部に、内部冷却筒25を嵌合させて製造した場合につ
いて表1に示す。また、比較のために、本発明に係る整
流冷却筒のない半導体単結晶棒製造装置を用いてシリコ
ン単結晶棒を製造した場合および整流冷却筒に代わり単
に黒鉛製の冷却筒を加熱チャンバ天井部2bからぶら下
げてシリコン単結晶棒を製造した場合について同じく表
1に示す。なお、このときのルツボは16インチ直径の
ものを使用し、製造した単結晶棒は呼び径6インチのも
のである。The results of manufacturing a silicon single crystal using the semiconductor single crystal ingot manufacturing apparatus according to the present invention having the above-described structure are shown in the case where only the rectification cooling cylinder 30 is used, and the inside cooling cylinder is provided inside the rectification cooling cylinder. Table 1 shows the case of manufacturing by fitting 25. For comparison, when a silicon single crystal ingot is manufactured by using the semiconductor single crystal ingot manufacturing apparatus without a rectification cooling tube according to the present invention, and instead of the rectification cooling tube, a graphite cooling tube is simply used as a heating chamber ceiling part. Table 1 also shows the case where a silicon single crystal ingot was manufactured by hanging it from 2b. The crucible used at this time had a diameter of 16 inches, and the manufactured single crystal rod had a nominal diameter of 6 inches.
【0026】[0026]
【表1】 [Table 1]
【0027】表1からわかるように、本発明の半導体単
結晶棒製造装置により製造したシリコン単結晶棒は無転
位単結晶引き上げ率が高く、かつ引上げ速度を速くする
ことが可能である。As can be seen from Table 1, the silicon single crystal ingot produced by the semiconductor single crystal ingot producing apparatus of the present invention has a high dislocation-free single crystal pulling rate and a high pulling rate.
【0028】[0028]
【発明の効果】以上説明したように、本発明の半導体単
結晶棒製造装置は、金属製の整流冷却筒を水冷された加
熱チャンバ天井部と一体構造としたことにより、整流冷
却筒自体の抜熱に優れ、内部を流通するアルゴンガスの
昇温を抑制すると同時に、原料半導体融液からの輻射熱
を反射することができるため、単結晶棒をより急冷する
ことができる。さらに内部に取り外し自在の黒鉛製の内
部冷却筒を嵌合させることにより原料融液直上から引上
げ中の単結晶棒を急冷することが可能である。そして、
この黒鉛製の内部冷却筒は取り外しが自在であるため、
各種の長さ、形状のものを常備しても大きなコスト上昇
を招くことなく、所望の品質の半導体単結晶棒を製造す
ることができる。As described above, in the semiconductor single crystal ingot manufacturing apparatus of the present invention, the metal rectification cooling cylinder is integrated with the water-cooled heating chamber ceiling so that the rectification cooling cylinder itself can be removed. It is excellent in heat and can suppress the temperature rise of the argon gas flowing inside, and at the same time can reflect the radiant heat from the raw material semiconductor melt, so that the single crystal rod can be cooled more rapidly. Furthermore, it is possible to rapidly cool the single crystal rod being pulled from directly above the raw material melt by fitting a removable graphite internal cooling cylinder inside. And
Since this graphite internal cooling tube is removable,
It is possible to manufacture a semiconductor single crystal ingot of desired quality without incurring a large cost increase, even if those having various lengths and shapes are always provided.
【図1】 本発明による半導体単結晶棒製造装置を説明
するための図面である。FIG. 1 is a view for explaining a semiconductor single crystal ingot manufacturing apparatus according to the present invention.
1…半導体単結晶棒製造装置、 2…チャン
バ、2a…加熱チャンバ本体、 2b…
加熱チャンバ天井部、3…引上げチャンバ、
4…回転軸、5…ルツボ、
5a…黒鉛ルツボ、5b…石英ルツボ、
6…加熱ヒータ、7…ワイヤ、
9…チャック、10…ワイ
ヤ巻上機、 11…断熱材、12…
ガス導入口、 13…ガス排出
口、20…分離機構、 25…
整流冷却筒、30…内部冷却筒。DESCRIPTION OF SYMBOLS 1 ... Semiconductor single crystal rod manufacturing apparatus, 2 ... Chamber, 2a ... Heating chamber main body, 2b ...
Heating chamber ceiling part, 3 ... pulling chamber,
4 ... Rotary axis, 5 ... Crucible,
5a ... Graphite crucible, 5b ... Quartz crucible,
6 ... Heater, 7 ... Wire,
9 ... Chuck, 10 ... Wire hoist, 11 ... Insulation material, 12 ...
Gas inlet port, 13 ... Gas outlet port, 20 ... Separation mechanism, 25 ...
Rectifying cooling cylinder, 30 ... Internal cooling cylinder.
───────────────────────────────────────────────────── フロントページの続き (72)発明者 大久保 正道 山口県光市大字島田3434番地 ニッテツ電 子株式会社内 (72)発明者 江阪 久雄 千葉県富津市新富20−1 新日本製鐵株式 会社技術開発本部内 ─────────────────────────────────────────────────── ─── Continuation of the front page (72) Masamichi Okubo 3434 Shimada, Higashi, Yamaguchi Prefecture, Nittatsu Electric Co., Ltd. Within the development headquarters
Claims (4)
ルツボ内の原料半導体を加熱する加熱ヒータを格納した
加熱チャンバ本体と、該加熱チャンバの開口部を覆う加
熱チャンバ天井部および該加熱チャンバ天井部の中央部
分に位置し、引上げられた半導体単結晶棒を収納する引
上げチャンバ部よりなる半導体単結晶棒の製造装置にお
いて、該加熱チャンバ天井部と該引上げチャンバ部との
接合部位より加熱チャンバ内部に向かって伸延し、引上
げ中の半導体単結晶棒を取り囲む整流冷却筒を前記加熱
チャンバ天井部と一体的に形成したことを特徴とする半
導体単結晶棒製造装置。1. A heating chamber main body containing a crucible containing a semiconductor melt and a heater for heating a raw material semiconductor in the crucible, a heating chamber ceiling covering an opening of the heating chamber, and a heating chamber ceiling. In a manufacturing apparatus for a semiconductor single crystal ingot, which is located in a central portion of the heating chamber and has a pulling chamber for accommodating a pulled up semiconductor single crystal ingot, in a heating chamber inside from a joint portion between the heating chamber ceiling and the pulling chamber. 1. A semiconductor single crystal ingot manufacturing apparatus, characterized in that a rectifying and cooling cylinder that extends toward the front and surrounds the semiconductor single crystal ingot being pulled is integrally formed with the ceiling portion of the heating chamber.
加熱チャンバ内部に向かって縮径していることを特徴と
する請求項1に記載の半導体単結晶棒製造装置。2. The semiconductor single crystal ingot manufacturing apparatus according to claim 1, wherein at least a part of the rectifying and cooling cylinder has a diameter reduced toward the inside of the heating chamber.
ニッケル、チタン、モリブデン、タングステンまたは白
金族元素で被覆された銅またはニッケルよりなる群から
選択された少なくとも一つの素材により形成されている
ことを特徴とする請求項1〜2のいずれか一つに記載の
半導体単結晶棒製造装置。3. The straightening cooling cylinder is made of copper, nickel and copper,
It is formed of at least one material selected from the group consisting of copper or nickel coated with nickel, titanium, molybdenum, tungsten, or a platinum group element, according to any one of claims 1 to 2. The semiconductor single crystal ingot manufacturing apparatus described.
筒からさらに前記加熱チャンバ内に向かって伸延する黒
鉛、炭化珪素および表面が炭化珪素で被覆された黒鉛よ
りなる群から選択された少なくとも一つの素材により形
成された内部冷却筒をさらに有することを特徴とする請
求項1〜3のいずれかに記載の半導体単結晶棒製造装
置。4. A graphite selected from the group consisting of graphite fitted inside the rectifying cooling cylinder and extending from the rectifying cooling cylinder further into the heating chamber, silicon carbide and graphite whose surface is coated with silicon carbide. The semiconductor single crystal rod manufacturing apparatus according to claim 1, further comprising an internal cooling cylinder formed of at least one material.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP00074593A JP3203341B2 (en) | 1993-01-06 | 1993-01-06 | Semiconductor single crystal rod manufacturing equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP00074593A JP3203341B2 (en) | 1993-01-06 | 1993-01-06 | Semiconductor single crystal rod manufacturing equipment |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH06199590A true JPH06199590A (en) | 1994-07-19 |
JP3203341B2 JP3203341B2 (en) | 2001-08-27 |
Family
ID=11482241
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Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP00074593A Expired - Lifetime JP3203341B2 (en) | 1993-01-06 | 1993-01-06 | Semiconductor single crystal rod manufacturing equipment |
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JP (1) | JP3203341B2 (en) |
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WO2001057293A1 (en) * | 2000-01-31 | 2001-08-09 | Shin-Etsu Handotai Co., Ltd. | Single crystal growing device and production method of single crystal using the device and single crystal |
JP2002068887A (en) * | 2000-08-31 | 2002-03-08 | Shin Etsu Handotai Co Ltd | Production device for semiconductor single crystal and method of producing semiconductor single crystal using the same |
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1993
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JP2002068887A (en) * | 2000-08-31 | 2002-03-08 | Shin Etsu Handotai Co Ltd | Production device for semiconductor single crystal and method of producing semiconductor single crystal using the same |
JP2002115973A (en) * | 2000-10-05 | 2002-04-19 | Mitsubishi Material Quartz Kk | Carbon electrode for arc melting, and its retaining device |
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