JPH06128740A - Ito sputtering target and manufacture thereof - Google Patents

Ito sputtering target and manufacture thereof

Info

Publication number
JPH06128740A
JPH06128740A JP4306148A JP30614892A JPH06128740A JP H06128740 A JPH06128740 A JP H06128740A JP 4306148 A JP4306148 A JP 4306148A JP 30614892 A JP30614892 A JP 30614892A JP H06128740 A JPH06128740 A JP H06128740A
Authority
JP
Japan
Prior art keywords
target
sputtering target
ito
ito sputtering
granules
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP4306148A
Other languages
Japanese (ja)
Other versions
JP3356470B2 (en
Inventor
Shigeru Kobayashi
茂 小林
Yasuhiro Seto
康博 瀬戸
Hirotoshi Fukumoto
浩敏 福本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsui Mining and Smelting Co Ltd
Original Assignee
Mitsui Mining and Smelting Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsui Mining and Smelting Co Ltd filed Critical Mitsui Mining and Smelting Co Ltd
Priority to JP30614892A priority Critical patent/JP3356470B2/en
Publication of JPH06128740A publication Critical patent/JPH06128740A/en
Application granted granted Critical
Publication of JP3356470B2 publication Critical patent/JP3356470B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Compositions Of Oxide Ceramics (AREA)
  • Physical Vapour Deposition (AREA)

Abstract

PURPOSE:To provide an ITO sputtering target which has high thermal shock resistance that enables its use even at the time of fixing it by clamping, and which enables to prevent the blackening and bristling phenomena from occurring and also to provide the manufacture of the target. CONSTITUTION:A powdery mixture consisting essentially of In2O3 and SnO2 is calcined at >=1300 deg.C, and thereafter is crushed into granules having a particle diameter in the range of 50 to 1000mum. Then a binder is added to the granules and the resulting granules are press-formed and thereafter sintered at >=1300 deg.C to obtain the ITO sputtering target. This ITO sputtering target has the sintered structure obtained by sintering the coagulated particles having an average particle diameter in the range of 50 to 1000mum with each other while forming residual pores in the spaces among the particles.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はITOスパッタリングタ
ーゲット及びその製造方法に関する。
FIELD OF THE INVENTION The present invention relates to an ITO sputtering target and a method for manufacturing the same.

【0002】[0002]

【従来の技術及びその問題点】一般に、In23とSn
2とを主成分とするITO膜は可視光透過率が高いと
同時に電気抵抗が低いことから透明導電膜として広く用
いられている。ITO膜を形成する方法としては、真空
蒸着法やスパッタリング法が用いられているが、特にI
TO焼結体をターゲットとしたスパッタリング法が、プ
ロセス制御の容易さ、得られる膜質の良さ、成膜速度の
速さ等の利点を有することから最も広く適用されてい
る。ITO焼結体ターゲットはバッキングプレートに接
合して用いられ、スパッタ中はバッキングプレートを介
して間接的に冷却される。この冷却速度を上げるため、
接合には、熱的接触の良い低融点半田接合が一般に用い
られる。冷却が十分に行なわれない場合、熱膨張歪等に
より焼結体ターゲットが破壊し易く、また接合に用いた
半田が融けてターゲットがバッキングプレートから剥離
する場合もある。スパッタ中、ITO焼結体ターゲット
表面のエロージョン部が時間の経過とともに黒化し、突
起状の組織が発達してくる現象(林立現象)が知られて
おり、これが成膜速度を低下させ、膜質も劣化させる一
因となっている。そのため、ある程度の時間連続してス
パッタに使用したITOターゲットは表面の突起状組織
を削り落とすクリーニングを行なう必要がある。このク
リーニング作業はスパッタ装置の真空を破って行なうた
め、ITO成膜の能率を著しく悪化させるものである。
2. Description of the Related Art Generally, In 2 O 3 and Sn are used.
The ITO film containing O 2 as a main component is widely used as a transparent conductive film because it has a high visible light transmittance and a low electric resistance. As a method for forming the ITO film, a vacuum vapor deposition method or a sputtering method is used.
The sputtering method using a TO sintered body as a target is most widely applied because it has advantages such as easy process control, good quality of the obtained film, and high film forming rate. The ITO sintered body target is used by being bonded to a backing plate, and is indirectly cooled via the backing plate during sputtering. To increase this cooling rate,
A low melting point solder joint having good thermal contact is generally used for joining. If the cooling is not performed sufficiently, the sintered target may be easily broken due to thermal expansion strain or the like, and the solder used for joining may be melted to separate the target from the backing plate. It is known that during sputtering, the erosion part on the surface of the ITO sintered body becomes black with the passage of time, and a protrusion-like structure develops (forest phenomenon), which reduces the deposition rate and also the film quality. This is one of the causes of deterioration. Therefore, the ITO target used for sputtering continuously for a certain period of time needs to be cleaned by scraping off the projecting texture on the surface. Since this cleaning operation is performed by breaking the vacuum of the sputtering apparatus, the efficiency of ITO film formation is significantly deteriorated.

【0003】このようなクリーニング作業による能率低
下を軽減するための提案として、特開昭64−3937
3号には、酸素分圧20%以上のAr雰囲気中で前記I
TOターゲットをスパッタし、黒化を回復する方法が示
されている。また、特開平3−207858号公報に
は、ITO焼結体ターゲットの密度を高くする方法が開
示され、これにより前記の黒化現象を減少させることが
できるとしている。特開平3−126655号公報では
密度の高いITO焼結体ターゲットを用いることで耐熱
衝撃性が良くなることが示されている。
As a proposal for reducing the efficiency deterioration due to such cleaning work, Japanese Patent Laid-Open No. 64-3937.
No. 3 shows the above I in an Ar atmosphere with an oxygen partial pressure of 20% or more.
A method of sputtering a TO target to restore blackening is shown. Further, Japanese Patent Laid-Open No. 3-207858 discloses a method of increasing the density of an ITO sintered body target, which makes it possible to reduce the blackening phenomenon. Japanese Patent Laid-Open No. 3-126655 discloses that thermal shock resistance is improved by using an ITO sintered body target having a high density.

【0004】しかしながら、これら従来のITO焼結体
ターゲットは、いずれもバッキングプレートに低融点ハ
ンダにより接合されて一体で使用されるため、ターゲッ
ト輸送時等には、バッキングプレート分の重量増とな
り、輸送コストがよけいにかかるという問題があった。
金属ターゲット等の場合には、ターゲット材単体をバッ
キングプレート上にクランプにより固定して使用される
場合があり、このような場合には輸送時の問題はない
が、このクランプ固定はセラミックであるITOターゲ
ットでは従来行なわれていない。その理由は、ターゲッ
トとバッキングプレートの熱的接触が不良となり、冷却
効率が悪くなり、ターゲット温度が上昇し、熱歪により
ターゲットが破壊してしまうためである。特開平3−1
26655号では、高密度のITO焼結体とすること
で、耐熱衝撃性の高いターゲットが得られることが示さ
れているが、これもクランプ固定でのスパッタに耐え得
る程度には耐熱衝撃性は高くない。
However, since all of these conventional ITO sintered body targets are used integrally by being joined to the backing plate by low melting point solder, the weight of the backing plate increases when the target is transported. There was a problem that it cost too much.
In the case of a metal target or the like, a single target material may be used by fixing it on a backing plate by a clamp. In such a case, there is no problem during transportation, but this clamp fixing is made of ceramic ITO. It has not been performed in the target conventionally. The reason is that the thermal contact between the target and the backing plate becomes poor, the cooling efficiency becomes poor, the target temperature rises, and the target is destroyed by thermal strain. Japanese Patent Laid-Open No. 3-1
In No. 26655, it is shown that a target having high thermal shock resistance can be obtained by using a high-density ITO sintered body, but this also has a thermal shock resistance sufficient to withstand spattering when clamped. not high.

【0005】本発明の目的は、クランプ固定状態での使
用を可能とする高い耐熱衝撃性を有するITOスパッタ
リングターゲット及びその製造方法を提供することにあ
る。
An object of the present invention is to provide an ITO sputtering target having a high thermal shock resistance that enables use in a clamped state and a method for manufacturing the same.

【0006】[0006]

【問題点を解決するための手段】本発明に係るITOス
パッタリングターゲットは、In23とSnO2とを主
成分とし、その焼結組織が平均径50μm以上1000
μm以下の凝結粒子が互いに焼結されてその間隙に空孔
が残留したものであることを特徴とし、またこのような
本発明ITOスパッタリングターゲットはIn23とS
nO2とを主成分とする粉末混合体を1300℃以上の
温度で焼成した後、これを解砕し、粒径50μm以上1
000μm以下の顆粒とし、これにバインダーを添加
し、プレス成形後、1300℃以上の温度で焼結するこ
とにより得ることを特徴とするものであり、これにより
前記課題を解決したものである。
The ITO sputtering target according to the present invention contains In 2 O 3 and SnO 2 as main components, and has a sintered structure with an average diameter of 50 μm or more and 1000 or more.
It is characterized in that the coagulated particles having a size of less than μm are sintered with each other, and voids remain in the gaps between them, and such an ITO sputtering target of the present invention is made of In 2 O 3 and S
A powder mixture containing nO 2 as a main component is fired at a temperature of 1300 ° C. or higher and then crushed to obtain a particle size of 50 μm or more.
It is characterized in that it is obtained by making granules of 000 μm or less, adding a binder to the granules, press-molding them, and sintering at a temperature of 1300 ° C. or more, which solves the above problems.

【0007】本発明において、顆粒の粒径が50μm以
上のものを使用するのは、これ以下の粒径ではプレス後
焼結を行なったとき、凝結粒子間に十分な空隙が残留し
ない場合があるためで、このような焼結体は満足できる
耐熱破壊性を示さなくなる。逆に顆粒の粒径が1000
μm以下のものに限定するのは、より大きな粒を用いる
と十分な強度を持った焼結体が得られないためである。
好ましい顆粒の粒径は250〜500μmである。
In the present invention, the granules having a particle size of 50 μm or more are used. If the particle size is smaller than this, there are cases where sufficient voids do not remain between the coagulated particles when sintering is performed after pressing. Therefore, such a sintered body does not exhibit a satisfactory thermal fracture resistance. Conversely, the particle size of the granules is 1000
The reason why the grain size is limited to μm or less is that a sintered body having sufficient strength cannot be obtained when larger grains are used.
The preferred particle size of the granules is 250-500 μm.

【0008】また、本発明における焼結温度を1300
℃以上とするのは、これ以下び温度では焼結が十分に進
まず、焼結体の強度が弱くなるためである。好ましくい
焼結温度は1400℃以上とする。なお、焼成、焼結は
大気中、不活性雰囲気中、酸化雰囲気中の加圧、減圧、
いずれの雰囲気においても達成できる。
The sintering temperature in the present invention is 1300.
The reason why the temperature is not less than ° C is that the sintering does not proceed sufficiently at a temperature below this and the temperature of the sintered body becomes weak. A preferable sintering temperature is 1400 ° C. or higher. Note that firing and sintering are performed in the atmosphere, in an inert atmosphere, under pressure in an oxidizing atmosphere, under pressure,
It can be achieved in any atmosphere.

【0009】[0009]

【作用】本発明方法により得られた焼結体は平均粒径5
0μm以上1000μm以下の凝結粒子が互いに焼結さ
れてその間隙に空孔が残留したものとなるため、この空
孔が局所的な加熱等による熱歪を緩和し、全体のターゲ
ットの破壊を防止することにより耐熱破壊性が著しく向
上するようになる。従って、本発明に係るスパッタリン
グターゲットはクランプ固定状態でスパッタが可能とな
る。また、輸送コストが低減され、さらにバッキングプ
レートに低融点半田により接合しないため冷却効率が低
下しスパッタリングターゲットが高温となることにより
黒化現象及び林立現象が防止される。
The sintered body obtained by the method of the present invention has an average particle size of 5
Since the coagulated particles of 0 μm or more and 1000 μm or less are sintered with each other and voids remain in the gaps, these voids alleviate thermal strain due to local heating and the like, and prevent the destruction of the entire target. As a result, the thermal fracture resistance is remarkably improved. Therefore, the sputtering target according to the present invention can perform sputtering in a clamped state. Further, the transportation cost is reduced, and since the backing plate is not joined to the backing plate by the low melting point solder, the cooling efficiency is lowered and the sputtering target becomes high temperature, thereby preventing the blackening phenomenon and the foresting phenomenon.

【0010】[0010]

【効果】以上のような本発明によれば以下のような効果
を有する。 (1)バッキングプレートと一体で輸送する必要がない
ため、ターゲット材正味重量のみとなり、輸送コストが
低減される。 (2)分割ターゲットの場合、分割品の一部のみを交換
することが容易である。 (3)ターゲット交換が容易になり、大パワーを投入し
てもターゲットの破壊が起りにくい。 (4)黒化現象及び林立現象が殆ど見られなくなる。こ
れはスパッタ中にターゲットが従来より冷却されにくい
ため、従来より高温となるためと推測される。これによ
り、ターゲットのクリーニング必要回数が減少あるいは
ゼロとなり、成膜効率が著しく向上する。 (5)従来は、ターゲットとバッキングプレートが一体
であったために、冷却水圧によりバッキングプレートが
変形すると、その歪が直接ターゲット材に伝わり、ター
ゲットの破壊が起りやすかったが、本発明ではクランプ
固定が可能であるため、バッキングプレートとターゲッ
トが完全に密着されず、バッキングプレートの変形がタ
ーゲットに伝わる度合いが少なくなり、破壊も起りにく
くなる。 (6)バッキングプレートとターゲットのハンダ付けが
不要となるため、ボンディング時のターゲット割れやボ
ンディング不良あるいはスパッタリング時の過熱による
ボンディング不良に起因するターゲットのバッキングプ
レートからの脱落が防止される。 (7)従来は、使用後のITOターゲットは低融点ハン
ダの付着により汚染されているため、ターゲット原料と
してのリサイクル利用が困難であったが、クランプ固定
でスパッタ可能となることによりハンダ付着がなくな
り、リサイクル利用が容易となる。
According to the present invention as described above, the following effects are obtained. (1) Since it is not necessary to transport the backing plate integrally with the backing plate, only the net weight of the target material is used, and the transportation cost is reduced. (2) In the case of a split target, it is easy to replace only a part of the split product. (3) The target can be easily replaced, and the target is less likely to be destroyed even when a large amount of power is applied. (4) Blackening phenomenon and forest standing phenomenon are hardly seen. It is presumed that this is because the target is less likely to be cooled than during the sputtering during the sputtering, and thus the temperature becomes higher than the conventional temperature. As a result, the number of times the target needs to be cleaned is reduced or reduced to zero, and the film forming efficiency is significantly improved. (5) In the past, since the target and the backing plate were integrated, when the backing plate was deformed by the cooling water pressure, the strain was directly transmitted to the target material and the target was easily broken. Since it is possible, the backing plate and the target are not completely adhered to each other, the deformation of the backing plate is less likely to be transmitted to the target, and the damage is less likely to occur. (6) Since it is not necessary to solder the backing plate and the target, it is possible to prevent the target from falling off the backing plate due to cracking of the target during bonding, defective bonding, or defective bonding due to overheating during sputtering. (7) Conventionally, it was difficult to reuse the ITO target after use as a target raw material because the ITO target was contaminated by the adhesion of low melting point solder. It becomes easy to recycle.

【0011】以下に実施例を示す。Examples will be shown below.

【実施例】In23粉末とSnO2粉末を混合して、1
450℃で焼成した後、分級して250〜500μmの
顆粒のみを得た。これにバインダーを混合し、1.5to
n/cm2の圧力でプレス成形した後、1450℃で焼結を
行ない、ITO焼結体を得た。この焼結体はその焼結組
織が平均粒径約300μmの凝結粒子が互いに焼結し、
その間隙に空孔が残留したものであった。この焼結体を
127.0mm×279.4mm×4mmtのサイズに
加工後、バッキングプレート上にクランプ固定し、スパ
ッタリングを行なったところ、表1に示されるように
3.38w/cm2までの投入電力に対して割れが発生
しなかった。また、ターゲットのエロージョン部表面は
やや黒化したものの、林立現象はまったく見られなかっ
た。
EXAMPLES In 2 O 3 powder and SnO 2 powder were mixed to obtain 1
After baking at 450 ° C., classification was performed to obtain only granules of 250 to 500 μm. Binder is mixed with this, 1.5to
After press molding at a pressure of n / cm 2 , sintering was performed at 1450 ° C. to obtain an ITO sintered body. This sintered body has a sintered structure in which coagulated particles having an average particle size of about 300 μm are sintered together,
Voids remained in the gap. After processing this sintered body into a size of 127.0 mm × 279.4 mm × 4 mmt, it was clamped and fixed on a backing plate and sputtering was performed, and as shown in Table 1, input up to 3.38 w / cm 2 No cracks were generated against the electric power. Moreover, although the surface of the erosion part of the target was slightly blackened, no foresting phenomenon was observed.

【0012】[0012]

【比較例】実施例と同様にして原料粉末を1450℃で
焼成した後、これを解砕し、50μm以下の粒子とした
ものを使用して、以下は実施例と同様にしてITO焼結
体を得た。この焼結体を実施例と同様にしてバッキング
プレート上にクランプ固定し、スパッタリングを行なっ
たところ、表1に示すように1.97w/cm2までの
投入電力に対して割れが発生しなかったが、これ以上の
投入電力では割れが発生した。
COMPARATIVE EXAMPLE A raw material powder was fired at 1450 ° C. in the same manner as in the example, and then crushed to obtain particles of 50 μm or less. Got When this sintered body was clamped on a backing plate and sputtered in the same manner as in Example, as shown in Table 1, no cracks were generated even when the applied power was up to 1.97 w / cm 2 . However, cracking occurred with more input power.

【0013】[0013]

【表1】 [Table 1]

【0014】表1より、本発明によるITOターゲット
は格段の耐熱破壊性を示すことがわかる。
From Table 1, it can be seen that the ITO target according to the present invention exhibits remarkably high thermal fracture resistance.

Claims (2)

【特許請求の範囲】[Claims] 【請求項1】 In23とSnO2とを主成分とするI
TOスパッタリングターゲット焼結体において、その焼
結組織が平均径50μm以上1000μm以下の凝結粒
子が互いに焼結されてその間隙に空孔が残留したもので
あることを特徴とするITOスパッタリングターゲッ
ト。
1. I containing In 2 O 3 and SnO 2 as main components
An ITO sputtering target, characterized in that in a TO sputtering target sintered body, coagulated particles having an average diameter of 50 μm or more and 1000 μm or less are sintered together, and voids remain in the gaps.
【請求項2】 In23とSnO2とを主成分とする粉
末混合体を1300℃以上の温度で焼成した後、これを
解砕し、粒径50μm以上1000μm以下の顆粒と
し、これにバインダーを添加し、プレス成形後、130
0℃以上の温度で焼結することを特徴とするITOスパ
ッタリングターゲットの製造方法。
2. A powder mixture containing In 2 O 3 and SnO 2 as main components is fired at a temperature of 1300 ° C. or higher and then crushed to obtain granules having a particle size of 50 μm or more and 1000 μm or less. After adding a binder and press molding,
A method for manufacturing an ITO sputtering target, comprising sintering at a temperature of 0 ° C. or higher.
JP30614892A 1992-10-19 1992-10-19 Manufacturing method of ITO sputtering target Expired - Fee Related JP3356470B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP30614892A JP3356470B2 (en) 1992-10-19 1992-10-19 Manufacturing method of ITO sputtering target

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP30614892A JP3356470B2 (en) 1992-10-19 1992-10-19 Manufacturing method of ITO sputtering target

Publications (2)

Publication Number Publication Date
JPH06128740A true JPH06128740A (en) 1994-05-10
JP3356470B2 JP3356470B2 (en) 2002-12-16

Family

ID=17953635

Family Applications (1)

Application Number Title Priority Date Filing Date
JP30614892A Expired - Fee Related JP3356470B2 (en) 1992-10-19 1992-10-19 Manufacturing method of ITO sputtering target

Country Status (1)

Country Link
JP (1) JP3356470B2 (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012144793A (en) * 2011-01-13 2012-08-02 Sumitomo Heavy Ind Ltd Target, and film forming device with the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012144793A (en) * 2011-01-13 2012-08-02 Sumitomo Heavy Ind Ltd Target, and film forming device with the same

Also Published As

Publication number Publication date
JP3356470B2 (en) 2002-12-16

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