JPH06120195A - Chemical reaction apparatus, reaction controlling therefor discarding method chemical and supplying method for chemical - Google Patents

Chemical reaction apparatus, reaction controlling therefor discarding method chemical and supplying method for chemical

Info

Publication number
JPH06120195A
JPH06120195A JP26850092A JP26850092A JPH06120195A JP H06120195 A JPH06120195 A JP H06120195A JP 26850092 A JP26850092 A JP 26850092A JP 26850092 A JP26850092 A JP 26850092A JP H06120195 A JPH06120195 A JP H06120195A
Authority
JP
Japan
Prior art keywords
chemical
reaction
reaction chamber
circulation tank
chemical liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP26850092A
Other languages
Japanese (ja)
Other versions
JP3151957B2 (en
Inventor
Kiyohiro Kawasaki
清弘 川崎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP26850092A priority Critical patent/JP3151957B2/en
Publication of JPH06120195A publication Critical patent/JPH06120195A/en
Application granted granted Critical
Publication of JP3151957B2 publication Critical patent/JP3151957B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Abstract

PURPOSE:To provide a reaction apparatus in which interruption of production does not occur even at the time of discarding and replacing chemicals while preventing a decrease in an etching accuracy. CONSTITUTION:Chemicals circulation tanks 10-1, 10-2 are connected to two reaction chambers 1-1, 1-2 for etching through three-way valves 33-1, 33-2, and connecting states of the tanks 10-1, 10-2 to the chambers 1-1, 1-2 can be suitably switched by the valves 33-1, 33-2. Two sets of the tanks 10-1, 10-2 and the chambers 1-1, 1-2 are prepared, and the connecting states of the tanks 10-1, 10-2 and the chambers 1-1, 1-2 can be switched, thereby reducing a decreasing width of reaction velocity in reaction liquid replacing life period. In the case of, for example, etching reaction, an etching accuracy can be largely improved.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は半導体集積回路、液晶デ
バイスおよびプリント基板等の一主面上に選択的に形成
される薄膜パターンの形成に用いられる化学反応装置に
関連するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chemical reaction apparatus used for forming a thin film pattern selectively formed on one main surface of a semiconductor integrated circuit, a liquid crystal device, a printed circuit board or the like.

【0002】[0002]

【従来の技術】周知のように半導体集積回路、液晶デバ
イスおよび高密度プリント基板等には多数回の薄膜パタ
ーンの形成が必要である。薄膜パターンを形成するため
の手段としては、上記デバイスを構成する基板の一主面
上に所定の膜厚の薄膜をスパッタ、常圧CVD、プラズ
マCVD等の薄膜堆積装置を用いて被着形成した後、感
光性樹脂と適当な露光機を用いた写真食刻によって所望
の感光性樹脂パターンを薄膜上に選択的に形成し、前記
感光性樹脂パターンを食刻時のマスクとして適当な食刻
液または食刻ガスで不要な薄膜を選択的に除去し、さら
に感光性樹脂パターンを適当な手段で除去する、一連の
微細加工プロセスが一般的である。
As is well known, it is necessary to form a thin film pattern many times in a semiconductor integrated circuit, a liquid crystal device, a high density printed circuit board and the like. As a means for forming a thin film pattern, a thin film having a predetermined film thickness is deposited and formed on one main surface of a substrate constituting the device by using a thin film deposition apparatus such as sputtering, atmospheric pressure CVD, and plasma CVD. After that, a desired photosensitive resin pattern is selectively formed on the thin film by photo-etching using a photosensitive resin and a suitable exposure machine, and the photosensitive resin pattern is used as a mask for etching and an appropriate etching solution. Alternatively, a series of microfabrication processes in which an unnecessary thin film is selectively removed by an etching gas and the photosensitive resin pattern is further removed by an appropriate means are general.

【0003】上記微細加工プロセスの中で、写真食刻時
の現像プロセスや食刻プロセスにおいては反応液を基板
上にシャワーまたはスプレー状に吹き付けるようにして
1枚ずつ連続的に処理する製造装置が量産工場では一般
的である。
Among the above-mentioned fine processing processes, in the development process and the etching process at the time of photo-etching, there is a manufacturing apparatus for continuously treating the reaction liquid one by one by showering or spraying the reaction liquid on the substrate. It is common in mass production plants.

【0004】図4は、このような化学反応装置の概略の
構成図を示す。食刻装置としての構成では、反応(処
理)室1、水洗室2及び乾燥室3が最低限度の構成要素
であり、処理時間が長くなる場合には反応室を2段にし
たり、処理液の水洗室への持ち出し量を低下させるため
に反応室と水洗室との間に液切り室を設ける等の設計的
手法が加味されることは公知であろう。
FIG. 4 shows a schematic block diagram of such a chemical reaction apparatus. In the configuration as an etching device, the reaction (treatment) chamber 1, the water washing chamber 2 and the drying chamber 3 are the minimum constituent elements, and when the treatment time becomes long, the reaction chamber is divided into two stages or the treatment liquid It is known that a designing method such as providing a draining chamber between the reaction chamber and the washing chamber is added to reduce the amount taken out to the washing chamber.

【0005】以下に簡単に装置の構成内容を説明する
と、薬液循環ポンプ4、薬液中のダストまたはパーティ
クルを除去するためのフィルタ5、および流量調整用の
バルブ6よりなる配管系7と、液を噴射するノズル8、
反応室1、反応室底部に設けられた液回収配管9、およ
び薬液循環タンク10とで閉ループを構成して薬液11
を循環使用する構成が代表的である。
To briefly explain the constitutional contents of the apparatus, a chemical liquid circulation pump 4, a filter 5 for removing dust or particles in the chemical liquid, and a piping system 7 including a valve 6 for flow rate adjustment, and a liquid Nozzle 8 to spray
The reaction chamber 1, the liquid recovery pipe 9 provided at the bottom of the reaction chamber, and the chemical liquid circulation tank 10 constitute a closed loop to form the chemical liquid 11.
A typical configuration is one in which the is used in a circulating manner.

【0006】ストップバルブ12を有する配管系13
は、循環タンク10に薬液11を供給するための薬液供
給配管であり、図示はしないが例えば別に設置された供
給タンクからN2 加圧で圧送によって新規な薬液が循環
タンク10に供給される。同じくストップバルブ14を
有する配管系15は使用済の薬液11を外部に廃棄する
ための薬液廃棄配管であり、図示はしないが別に設置さ
れた廃液タンク等に移し替えてから産業廃棄物として処
理する等の手続きがなされる。
A piping system 13 having a stop valve 12
Is a chemical liquid supply pipe for supplying the chemical liquid 11 to the circulation tank 10. For example, although not shown, a new chemical liquid is supplied to the circulation tank 10 by pressure feeding with N 2 pressurization from a separately installed supply tank. Similarly, the pipe system 15 having the stop valve 14 is a chemical liquid waste pipe for discarding the used chemical liquid 11 to the outside, and although not shown, it is transferred to a separately installed waste liquid tank or the like and treated as industrial waste. Etc. are performed.

【0007】水洗室2では基板に付着している薬液を洗
い流すために一般的には適度な純度の純水が必要なの
で、流量調整用バルブ16を有する純水供給配管17が
設けられ、配管の先端には純水を噴射するノズル18が
配置される。19は基板を水洗した処理水の排水管であ
り、微量ではあるが排水中に薬液が含まれるので、通常
ば公害対策のための処理を施されてから工場排水として
廃棄される。
In the washing chamber 2, pure water of an appropriate purity is generally required to wash away the chemical liquid adhering to the substrate, so a pure water supply pipe 17 having a flow rate adjusting valve 16 is provided and A nozzle 18 for injecting pure water is arranged at the tip. Reference numeral 19 denotes a drainage pipe for the treated water obtained by washing the substrate. Since the drainage contains a chemical liquid in the drainage, the drainage pipe 19 is usually treated for pollution control and then discarded as factory drainage.

【0008】乾燥室3では水洗後の濡れた基板を乾燥す
るために、圧力計20と流量調整用バルブ21を有する
ドライエアまたは窒素ガス供給配管22が設けられ、配
管の先端には上記乾燥ガスを基板上にシート状に噴射す
るノズル23が配置される。24は乾燥室3内でノズル
23によって凝集した水を廃棄するための排水管であ
る。このように乾燥したガスを基板に吹き付けて乾燥す
る方式は、別名エアナイフとも呼ばれる。エアナイフ以
外にもIPA等の有機溶剤を用いた置換型乾燥やスピン
乾燥があるが、ここでは説明は省略する。なお、ノズル
18および23は基板上のみならず基板下からも噴射す
るのが効率的であり、かつ一般的である。
In the drying chamber 3, a dry air or nitrogen gas supply pipe 22 having a pressure gauge 20 and a flow rate adjusting valve 21 is provided in order to dry the wet substrate after washing with water, and the dry gas is provided at the tip of the pipe. A nozzle 23 that ejects in a sheet shape is arranged on the substrate. Reference numeral 24 is a drain pipe for discarding the water condensed by the nozzle 23 in the drying chamber 3. The method of blowing the dried gas onto the substrate to dry the substrate is also called as an air knife. Other than the air knife, there are substitution type drying and spin drying using an organic solvent such as IPA, but the description is omitted here. In addition, it is efficient and common to eject the nozzles 18 and 23 not only from above the substrate but also from below the substrate.

【0009】図5は反応室1の詳細な断面概略図であ
る。被洗浄物である基板50は、紙面に垂直な方向に並
んだ回転ローラー25上を、反応室1の入口側の側壁に
設けられた開口スリット26から反応室1内に入ってい
き、薬液噴射ノズル8の下を一定の速度で通過し、反応
室1の出口側の側壁に設けられた開口スリット27を通
過して水洗室2に入っていく搬送形態が一般的である。
28は反応室1内の薬液ミストを排気するための排気管
であり、29は薬液ミストが大量に装置外に持ち出され
るのを防止するフィルタまたはトラップである。ゲート
バルブ30は薬液ミストを装置外に拡散させないため
と、反応装置近辺の大気(通常、クリーンルームで高価
な空調コストが必要)を大量に吸い込んでしまう損失を
避けるためのもので、基板の通過時のみ開閉するように
なっている。
FIG. 5 is a detailed schematic sectional view of the reaction chamber 1. The substrate 50, which is the object to be cleaned, enters the reaction chamber 1 through the opening slit 26 provided on the side wall on the inlet side of the reaction chamber 1 on the rotating roller 25 arranged in the direction perpendicular to the paper surface, and ejects the chemical solution. In general, the transport mode is such that it passes under the nozzle 8 at a constant speed, passes through an opening slit 27 provided on the side wall on the outlet side of the reaction chamber 1, and enters the washing chamber 2.
28 is an exhaust pipe for exhausting the chemical liquid mist in the reaction chamber 1, and 29 is a filter or trap for preventing a large amount of the chemical liquid mist from being taken out of the apparatus. The gate valve 30 is for preventing the chemical mist from diffusing out of the apparatus and for avoiding the loss of inhaling a large amount of air (usually expensive air conditioning cost in a clean room) near the reaction device. It is designed to open and close only.

【0010】[0010]

【発明が解決しようとする課題】上記した反応装置にお
いては基板の処理は通常、基板の搬送速度を一定にした
時間管理によってなされる。ところが周知のように写真
食刻にしても通常の食刻にしても、基板の処理枚数が増
加していくと、図7に示したように反応速度が低下して
設定された食刻時間では食刻残りを生ずるようになる。
そこで一般的には薬液寿命の初期には多少過食刻気味と
はなるが、薬液寿命の末期においても食刻残りが生じな
いような条件設定を行い、品質管理の面からは早めに薬
液を交換するのが無難な選択であり、薬液の効率的な使
い方という観点では随分と無駄が多いという問題があっ
た。
In the above-mentioned reaction apparatus, the processing of the substrate is usually carried out by controlling the time for which the transport speed of the substrate is constant. However, as is well known, as the number of processed substrates increases, whether the photo etching or the normal etching is performed, the reaction speed decreases as shown in FIG. It will cause unetched residue.
Therefore, in general, it will be slightly over-etched at the beginning of the life of the chemical solution, but conditions are set so that no unetched residue will occur at the end of the life of the chemical solution. It is a safe choice to do, and there is a problem that there is a lot of waste from the viewpoint of efficient use of chemicals.

【0011】厳しい食刻精度を要求される場合には処理
単位毎になんらかの形で、例えば基板1枚を当該ロット
より抜き取って先行処理を行い、処理時間の再設定を行
うこともあるが、通常は1日または1勤務毎に条件設定
を見直すのが量産工場における運用の実体である。しか
しながら処理条件の再設定や見直しは当然所定の評価作
業が終了するまでは生産を中断せざるを得ないし、また
コストダウンの観点から薬液寿命を余りにも長く取ろう
とすると処理時間がどんどん長くなって生産管理の観点
からはリードタイムが変動し、決して好ましいものでは
ない。
When strict etching accuracy is required, the processing time may be reset in some form for each processing unit, for example, one substrate is extracted from the lot and preprocessed. Is the substance of operation in a mass production factory to review the condition setting every day or every work. However, resetting and reviewing the processing conditions must of course interrupt production until the prescribed evaluation work is completed, and from the viewpoint of cost reduction, if the chemical life is too long, the processing time will become longer and longer. From the viewpoint of production control, the lead time fluctuates, which is not preferable.

【0012】加えて当然のことではあるが、図4に示さ
れたような構成では、薬液の廃棄時や供給時には反応装
置としての使用はできず、生産の稼働率を低下させてい
る。使用する薬液が大量の場合には薬液の廃棄や供給に
も長時間を要するようになり、稼働率の低下は無視出来
ないものとなる。
In addition, as a matter of course, in the structure as shown in FIG. 4, the chemical solution cannot be used as a reaction device at the time of discarding or supplying, and the operation rate of production is lowered. When a large amount of chemicals are used, it takes a long time to dispose and supply the chemicals, and the decrease in operating rate cannot be ignored.

【0013】本発明は上述した問題点に鑑みなされたも
ので、食刻精度の低下を防止しながら、薬液の廃棄や交
換時にも生産の中断が伴わない反応装置を提供せんとす
るものである。
The present invention has been made in view of the above problems, and an object of the present invention is to provide a reactor which prevents the deterioration of the etching accuracy and does not interrupt the production even when the chemicals are discarded or replaced. .

【0014】[0014]

【課題を解決するための手段】上記の目的を達成するた
め、本発明においては反応室を2分し、かつ各々の反応
室毎に薬液供給配管と薬液廃棄配管と薬液循環タンクと
薬液循環配管とを備えるとともに、薬液循環配管に切替
バルブを設けて2個の循環タンクのうち古い薬液の入っ
ている循環タンクからの薬液を先に、また新しい薬液の
入っている循環タンクからの薬液を後に基板の処理に使
用する構成としている。
In order to achieve the above object, in the present invention, the reaction chamber is divided into two, and a chemical liquid supply pipe, a chemical liquid waste pipe, a chemical liquid circulation tank, and a chemical liquid circulation pipe are provided for each reaction chamber. In addition to the above, a switching valve is provided in the chemical liquid circulation pipe, and the chemical liquid from the circulation tank containing the old chemical liquid of the two circulation tanks comes first, and the chemical liquid from the circulation tank containing the new chemical liquid comes later. It is configured to be used for processing substrates.

【0015】[0015]

【作用】本発明によれば新、旧2種類の薬液を用いて反
応させるために示したように、第1反応室(旧液)と第
2反応室(新液)との反応を合わせると、薬液交換寿命
期間の反応速度の低下幅が半減し、結果として食刻精度
の向上が図れる。このためには薬液交換の頻度を倍加す
る必要があるが、配管系を適当に切り替えることによっ
て一方の循環タンクで一時的ではあるが、二つの反応室
に同時に薬液を供給することが可能で、生産を中断する
事なく連続生産が容易に実現する。
According to the present invention, when the reaction of the first reaction chamber (old solution) and the reaction of the second reaction chamber (new solution) are combined, as shown for the reaction using two kinds of chemical liquids, new and old. The reduction rate of the reaction rate during the chemical liquid exchange life period is halved, and as a result, the etching accuracy can be improved. For this purpose, it is necessary to double the frequency of chemical exchange, but by appropriately switching the piping system, it is possible to supply chemicals to two reaction chambers simultaneously, although temporarily in one circulation tank. Continuous production is easily realized without interrupting production.

【0016】[0016]

【実施例】図1に本発明の実施例装置の概略構成図を示
す。図4の従来例との差異は、1)反応室を2分したこ
と、2)反応室1−1と反応室1−2に独立して薬液が
供給出来るよう薬液循環配管系にストップバルブ31、
32が付加され、3)薬液回収配管系に切替バルブとし
て三方弁33が付加されたことにある。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS FIG. 1 shows a schematic block diagram of an apparatus according to an embodiment of the present invention. The difference from the conventional example of FIG. 4 is that 1) the reaction chamber is divided into 2 parts, and 2) the stop valve 31 is provided in the chemical liquid circulation piping system so that the chemical liquid can be independently supplied to the reaction chamber 1-1 and the reaction chamber 1-2. ,
32 is added, and 3) a three-way valve 33 is added as a switching valve to the chemical liquid recovery piping system.

【0017】以下の説明では従来例と同一の機能の部位
については同じ番号で呼称し、反応室1−1、1−2に
対応してはハイフォン1、2で区別することとする。
In the following description, the parts having the same functions as those in the conventional example are referred to by the same numbers, and the reaction chambers 1-1 and 1-2 are distinguished by hyphens 1 and 2.

【0018】二つの反応室にそれぞれ循環タンク10、
薬液循環配管7、薬液供給配管13及び薬液廃棄配管1
5を備えているが、本実施例装置における配管システム
の運転形態としては、弁33の設定を操作することによ
り、図2と図3に示した二つの形態が可能であり、ここ
では前者をパラレルモード、後者をクロスモードと定義
する。
A circulation tank 10 is provided in each of the two reaction chambers,
Chemical liquid circulation pipe 7, chemical liquid supply pipe 13, and chemical liquid waste pipe 1
5 is provided, the two operation modes of the piping system in the apparatus of this embodiment can be two modes shown in FIGS. 2 and 3 by operating the setting of the valve 33. The parallel mode is defined as the cross mode.

【0019】パラレルモードでは、循環タンク10−1
内の薬液11−1が反応室1−1に、また循環タンク1
0−2内の薬液11−2が反応室1−2に供給されるよ
うに薬液循環系のストップバルブ31−1と31−2は
開かれ、同じく32−1と32−2は閉じられ、同時に
薬液回収配管系の切替バルブ33−1と33−2はそれ
ぞれ反応室1−1からの回収液は循環タンク10−1
に、反応室1−2からの回収液はタンク10−2に流れ
るように切り替わっている。
In the parallel mode, the circulation tank 10-1
The chemical solution 11-1 in the reaction chamber 1-1 and the circulation tank 1
The stop valves 31-1 and 31-2 of the chemical circulation system are opened so that the chemical 11-2 in 0-2 is supplied to the reaction chamber 1-2, and the stop valves 32-1 and 32-2 are closed, At the same time, the changeover valves 33-1 and 33-2 of the chemical liquid recovery piping system respectively collect the liquid recovered from the reaction chamber 1-1 into the circulation tank 10-1.
In addition, the recovery liquid from the reaction chamber 1-2 is switched so as to flow to the tank 10-2.

【0020】同様にクロスモードでは、循環タンク10
−1内の薬液11−1が反応室1−2に、また循環タン
ク10−2内の薬液11−2が反応室1−1に供給され
るように薬液循環系のストップバルブ31−1と31−
2は閉じられ、同じく32−1と32−2は開かれ、同
時に薬液回収配管系の切替バルブ33−1と33−2は
それぞれ反応室1−1からの回収液は循環タンク10−
2に、反応室1−2からの回収液は循環タンク10−1
に流れるように切り替わっている。
Similarly, in the cross mode, the circulation tank 10
-1 in the chemical liquid circulation system so that the chemical liquid 11-1 in -1 is supplied to the reaction chamber 1-2 and the chemical liquid 11-2 in the circulation tank 10-2 is supplied to the reaction chamber 1-1. 31-
2 is closed, and likewise, 32-1 and 32-2 are opened, and at the same time, the switching liquids 33-1 and 33-2 of the chemical liquid recovery piping system respectively collect the liquid recovered from the reaction chamber 1-1 into the circulation tank 10-.
2, the recovered liquid from the reaction chamber 1-2 is the circulation tank 10-1.
It switches to flow to.

【0021】本実施例装置の運転の開始時には、当然の
事ではあるが特例として二つの薬液循環タンクには新液
が供給されて稼働が開始される。話を簡単にするため当
初は図2に示したパラレルモードで運転を開始したとす
る。従来の薬液寿命の半期の時点で循環タンク10−1
内の薬液を廃棄して新液を供給した後、図3に示したク
ロスモードで運転を再開する。
At the start of the operation of the apparatus of the present embodiment, as a matter of course, as a special case, a new liquid is supplied to the two chemical liquid circulation tanks to start the operation. To simplify the story, it is assumed that the operation was initially started in the parallel mode shown in FIG. Circulation tank 10-1 at the half-life of conventional chemicals
After discarding the chemical solution inside and supplying a new solution, the operation is restarted in the cross mode shown in FIG.

【0022】この結果、薬液タンク10−2内の古い処
理液11−2は反応室1−1に供給され、循環タンク1
0−1内の新しい処理液11−1は反応室1−2に供給
される。そして次の薬液交換時には循環タンク10−2
内の薬液を廃棄して新液を供給した後、再び図2に示し
たパラレルモードで運転を再開する。
As a result, the old processing liquid 11-2 in the chemical liquid tank 10-2 is supplied to the reaction chamber 1-1, and the circulation tank 1
The new processing liquid 11-1 in 0-1 is supplied to the reaction chamber 1-2. Then, at the time of the next chemical solution exchange, the circulation tank 10-2
After discarding the chemical solution inside and supplying a new solution, the operation is restarted in the parallel mode shown in FIG.

【0023】この結果、循環タンク10−1内の古い処
理液11−1は反応室1−1に供給され循環タンク10
−2内の新しい処理液11−1は反応室1−2に供給さ
れる。
As a result, the old processing liquid 11-1 in the circulation tank 10-1 is supplied to the reaction chamber 1-1 and the circulation tank 10-1.
-2, the new processing liquid 11-1 is supplied to the reaction chamber 1-2.

【0024】このような運転形態を繰り返して実施する
ことにより、図6に示したように古い薬液と新しい薬液
とを用いて常に古い薬液から反応させるために反応速度
の低下幅は従来と比べて半減する。すなわち時間管理の
運用では食刻精度が向上していることと等価である。
By repeatedly performing such an operation mode, as shown in FIG. 6, the old chemical solution is always used to react with the old chemical solution and the old chemical solution is always reacted. Halve. That is, it is equivalent to the improvement of the etching accuracy in the time management operation.

【0025】薬液の交換時は、例えば循環タンク10−
1内の薬液を廃棄して新液を供給するのであれば、循環
系のストップバルブ31−2、32−2を開いて反応室
1−1と反応室1−2に循環タンク10−2から同時に
薬液を供給し、かつ薬液回収配管の切替バルブ33−1
を切り替えて反応室1−1からの回収薬液を循環タンク
10−2に流すようにしておけば循環タンク10−1は
反応に寄与する配管系から独立するので、薬液廃棄バル
ブ14−1を開けて循環タンク10−1内の薬液を排出
した後、薬液廃棄バルブ14−1を閉じ、薬液供給バル
ブ12−1を開いて新液を供給し、所定量が循環タンク
10−1内に充填された後に薬液供給バルブ12−1を
閉じれば良いことは容易に理解されよう。薬液の補充後
は再び循環系と薬液回収系配管のバルブを切り替えて薬
液補充前の運転モードに戻せば良い。
When exchanging the chemical liquid, for example, the circulation tank 10-
If the chemical solution in 1 is to be discarded and a new solution is to be supplied, the stop valves 31-2 and 32-2 of the circulation system are opened to the reaction chamber 1-1 and the reaction chamber 1-2 from the circulation tank 10-2. Switching valve 33-1 for supplying chemicals at the same time and for collecting chemicals
If the chemical solution recovered from the reaction chamber 1-1 is made to flow to the circulation tank 10-2 by switching the above, the circulation tank 10-1 is independent of the piping system that contributes to the reaction, so the chemical solution disposal valve 14-1 is opened. After discharging the chemical liquid in the circulation tank 10-1, the chemical liquid disposal valve 14-1 is closed, the chemical liquid supply valve 12-1 is opened to supply a new liquid, and a predetermined amount is filled in the circulation tank 10-1. It will be easily understood that the chemical liquid supply valve 12-1 may be closed after the operation. After replenishing the chemical liquid, the valves of the circulation system and the chemical liquid recovery system pipe may be switched again to return to the operation mode before the chemical liquid replenishment.

【0026】本発明の薬液交換方法をまとめると、薬液
の使用量は従来と変わらず、薬液の交換が従来の薬液寿
命の半期毎に従来の半分の薬液を二つの循環タンクに交
互に供給する事であり、薬液交換の頻度は倍加するが、
上記したように薬液交換に伴う反応装置の生産停止は回
避されているので何等の支障も無い。
Summarizing the chemical solution exchange method of the present invention, the amount of the chemical solution used is the same as that of the conventional one, and the half of the conventional chemical solution is alternately supplied to the two circulation tanks every six months of the conventional chemical solution life. That is, the frequency of exchanging chemicals doubles,
As described above, since the production stop of the reaction device due to the chemical solution exchange is avoided, there is no problem.

【0027】[0027]

【発明の効果】以上述べたように、本発明による化学反
応装置では従来の化学反応装置に比べて反応液の交換寿
命期間内における反応速度の低下幅が半減し、例えば食
刻反応であれば食刻精度の向上は著しいものがある。加
えて反応液の廃棄時や供給時にも反応装置を連続的に稼
働させることが出来る等の優れた効果が得られる。また
薬液の有効利用の観点からも、食刻精度の向上で従来の
ように早めに交換する必要もなくなり、省資源の推進も
達成されている。
As described above, in the chemical reaction apparatus according to the present invention, the decrease rate of the reaction rate within the exchange life of the reaction solution is reduced by half as compared with the conventional chemical reaction apparatus. There is a remarkable improvement in the etching accuracy. In addition, it is possible to obtain an excellent effect that the reaction device can be continuously operated even when the reaction liquid is discarded or supplied. Also, from the viewpoint of effective use of the chemical liquid, it is not necessary to replace the liquid as early as in the past due to the improvement of the etching accuracy, and the promotion of resource saving has been achieved.

【0028】なお、実施例としてシャワーまたはスプレ
ー状に反応液を基板に噴射する枚葉処理の反応装置を取
り上げたが、複数枚の基板を適当な収納容器、例えばカ
セット等に収納したまま反応漕内で同時に処理するよう
なバッチ処理形態であっても本発明の有効性は損なわれ
るものでないことを補足しておく。
As an example, the single-wafer processing reaction apparatus for spraying the reaction liquid onto the substrates in the form of a shower or a spray was taken up. However, the reaction tank with a plurality of substrates stored in an appropriate storage container such as a cassette is used. It should be added that the effectiveness of the present invention is not impaired even in the batch processing mode in which the processing is performed simultaneously in the inside.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の化学反応装置の実施例の構成図FIG. 1 is a configuration diagram of an embodiment of a chemical reaction device of the present invention.

【図2】同実施例装置をパラレルモードで運転する時の
構成図
FIG. 2 is a configuration diagram when the apparatus of the embodiment is operated in parallel mode.

【図3】同実施例装置をクロスモードで運転する時の概
略構成図
FIG. 3 is a schematic configuration diagram when the apparatus of the embodiment is operated in a cross mode.

【図4】従来の化学反応装置の概略構成図FIG. 4 is a schematic configuration diagram of a conventional chemical reaction device.

【図5】反応室の詳細な構成図FIG. 5: Detailed configuration diagram of the reaction chamber

【図6】本実施例装置の反応速度と処理時間との関係図FIG. 6 is a diagram showing the relationship between the reaction rate and processing time of the apparatus of this embodiment.

【図7】従来例における化学反応装置の反応速度と処理
時間との関係図
FIG. 7 is a diagram showing the relationship between the reaction rate and the processing time of the conventional chemical reaction device.

【符号の説明】[Explanation of symbols]

1 反応室 2 水洗室 3 乾燥室 4 循環ポンプ 5 フィルタ 6、16、21 流量調整バルブ 8、18、23 薬液、純水、エア用ノズル 9 薬液回収配管 10 薬液薬液タンク 13 薬液供給配管 15 薬液廃棄配管 17 純水供給配管 22 乾燥ガス供給配管 25 搬送ローラー 31、32 薬液切り換え用ストップバルブ 33 回収薬液切り換えバルブ 1 Reaction Chamber 2 Rinsing Room 3 Drying Room 4 Circulation Pump 5 Filters 6, 16, 21 Flow Control Valves 8, 18, 23 Nozzles for Chemicals, Pure Water, Air 9 Chemicals Recovery Pipe 10 Chemicals Supply Pipe 13 Chemicals Supply Pipe 15 Chemicals Waste Pipe 17 Pure water supply pipe 22 Dry gas supply pipe 25 Conveyor rollers 31, 32 Stop valve for switching chemical liquid 33 Recovery chemical liquid switching valve

───────────────────────────────────────────────────── フロントページの続き (51)Int.Cl.5 識別記号 庁内整理番号 FI 技術表示箇所 H01L 21/027 21/31 C ─────────────────────────────────────────────────── ─── Continuation of the front page (51) Int.Cl. 5 Identification code Office reference number FI technical display location H01L 21/027 21/31 C

Claims (4)

【特許請求の範囲】[Claims] 【請求項1】薬液循環用のポンプとタンクとをそれぞれ
に有する第1と第2の反応室と、各薬液循環タンクに薬
液供給配管と薬液廃棄配管とを備え、前記タンク中の新
旧2種類の薬液のうち古い薬液を第1の反応室で、新し
い薬液を第2の反応室で使用するように薬液循環系に切
り換えバルブを有する化学反応装置。
1. A first and a second reaction chamber each having a pump and a tank for circulating a chemical solution, a chemical solution supply pipe and a chemical liquid discarding pipe in each chemical circulation tank, and two types of old and new in the tank. A chemical reaction device having a switching valve in the chemical liquid circulation system so that the old chemical liquid of the chemical liquid of 1 is used in the first reaction chamber and the new chemical liquid is used in the second reaction chamber.
【請求項2】薬液循環用のポンプとタンクとをそれぞれ
に有する第1と第2の反応室と、薬液循環タンクに薬液
供給配管と薬液廃棄配管とを備えた化学反応装置におい
て、薬液寿命の半期毎に一方の薬液循環タンク内の薬液
の廃棄と新規補充を行うと共に、古い薬液を第1の反応
室で、新しい薬液を第2の反応室で使用するように薬液
循環系のバルブを切り換える反応制御方法。
2. A chemical reaction device comprising first and second reaction chambers each having a pump and a tank for circulating a chemical liquid, and a chemical liquid supply pipe and a chemical liquid waste pipe in the chemical liquid circulation tank. Discontinue and newly replenish the chemical in one chemical circulation tank every six months, and switch the chemical circulation valve so that the old chemical is used in the first reaction chamber and the new chemical is used in the second reaction chamber. Reaction control method.
【請求項3】第1の薬液循環タンク内の薬液を排出する
にあたり、第2の循環タンクから第2の反応室に薬液を
供給し第2の循環タンクに回収しながら、第2の循環タ
ンクから第1の反応室にも薬液を供給し、かつ第1の反
応室内の反応後の薬液を第2の循環タンクに回収するこ
とを特徴とする薬液廃棄方法。
3. The second circulation tank while discharging the chemical in the first chemical circulation tank while supplying the chemical from the second circulation tank to the second reaction chamber and collecting the chemical in the second circulation tank. To the first reaction chamber, and collects the reacted chemical liquid in the first reaction chamber into the second circulation tank.
【請求項4】第1の薬液循環タンク内に新規に薬液を供
給するにあたり、第2の循環タンクから第2の反応室に
薬液を供給し第2の循環タンクに回収しながら、第2の
循環タンクから第1の反応室にも薬液を供給し、かつ第
1の反応室内の反応後の薬液を第2の循環タンクに回収
することを特徴とする薬液供給方法。
4. When supplying a new chemical solution into the first chemical solution circulation tank, while supplying the chemical solution from the second circulation tank to the second reaction chamber and collecting the second chemical solution into the second circulation tank, A chemical solution supply method characterized in that the chemical solution is supplied from the circulation tank also to the first reaction chamber, and the chemical solution after the reaction in the first reaction chamber is recovered in the second circulation tank.
JP26850092A 1992-10-07 1992-10-07 Chemical reaction apparatus and its reaction control method, chemical liquid disposal method, and chemical liquid supply method Expired - Fee Related JP3151957B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26850092A JP3151957B2 (en) 1992-10-07 1992-10-07 Chemical reaction apparatus and its reaction control method, chemical liquid disposal method, and chemical liquid supply method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26850092A JP3151957B2 (en) 1992-10-07 1992-10-07 Chemical reaction apparatus and its reaction control method, chemical liquid disposal method, and chemical liquid supply method

Publications (2)

Publication Number Publication Date
JPH06120195A true JPH06120195A (en) 1994-04-28
JP3151957B2 JP3151957B2 (en) 2001-04-03

Family

ID=17459366

Family Applications (1)

Application Number Title Priority Date Filing Date
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Country Status (1)

Country Link
JP (1) JP3151957B2 (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10177982A (en) * 1996-12-18 1998-06-30 Dainippon Screen Mfg Co Ltd Substrate processing device
JP2008034593A (en) * 2006-07-28 2008-02-14 Tokyo Electron Ltd Chemical treatment device, chemical supply method, and chemical supply program
JP2008135464A (en) * 2006-11-27 2008-06-12 Matsushita Electric Works Ltd Processing apparatus for wiring board and processing method employing it
KR101308398B1 (en) * 2006-08-31 2013-09-16 주식회사 케이씨텍 Device for collecting chemical and method to collect chemical thereof
JP2013254556A (en) * 2008-09-24 2013-12-19 Hoya Corp Method for manufacturing glass substrate for magnetic disk
CN115971145A (en) * 2022-12-28 2023-04-18 无锡亚电智能装备有限公司 Graphite boat cleaning equipment and cleaning method

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10177982A (en) * 1996-12-18 1998-06-30 Dainippon Screen Mfg Co Ltd Substrate processing device
JP2008034593A (en) * 2006-07-28 2008-02-14 Tokyo Electron Ltd Chemical treatment device, chemical supply method, and chemical supply program
JP4739142B2 (en) * 2006-07-28 2011-08-03 東京エレクトロン株式会社 Chemical processing apparatus, chemical supply method, and chemical supply program
KR101308398B1 (en) * 2006-08-31 2013-09-16 주식회사 케이씨텍 Device for collecting chemical and method to collect chemical thereof
JP2008135464A (en) * 2006-11-27 2008-06-12 Matsushita Electric Works Ltd Processing apparatus for wiring board and processing method employing it
JP2013254556A (en) * 2008-09-24 2013-12-19 Hoya Corp Method for manufacturing glass substrate for magnetic disk
CN115971145A (en) * 2022-12-28 2023-04-18 无锡亚电智能装备有限公司 Graphite boat cleaning equipment and cleaning method
CN115971145B (en) * 2022-12-28 2023-10-03 无锡亚电智能装备有限公司 Graphite boat cleaning equipment and cleaning method

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