JPH0611508Y2 - Ｐｎｐｎスイツチ選別装置 - Google Patents

Ｐｎｐｎスイツチ選別装置

Info

Publication number
JPH0611508Y2
JPH0611508Y2 JP448187U JP448187U JPH0611508Y2 JP H0611508 Y2 JPH0611508 Y2 JP H0611508Y2 JP 448187 U JP448187 U JP 448187U JP 448187 U JP448187 U JP 448187U JP H0611508 Y2 JPH0611508 Y2 JP H0611508Y2
Authority
JP
Japan
Prior art keywords
short
electrode
pnpn switch
selection
switch
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP448187U
Other languages
English (en)
Japanese (ja)
Other versions
JPS63113977U (enrdf_load_stackoverflow
Inventor
稔 兵頭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP448187U priority Critical patent/JPH0611508Y2/ja
Publication of JPS63113977U publication Critical patent/JPS63113977U/ja
Application granted granted Critical
Publication of JPH0611508Y2 publication Critical patent/JPH0611508Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP448187U 1987-01-16 1987-01-16 Ｐｎｐｎスイツチ選別装置 Expired - Lifetime JPH0611508Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP448187U JPH0611508Y2 (ja) 1987-01-16 1987-01-16 Ｐｎｐｎスイツチ選別装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP448187U JPH0611508Y2 (ja) 1987-01-16 1987-01-16 Ｐｎｐｎスイツチ選別装置

Publications (2)

Publication Number Publication Date
JPS63113977U JPS63113977U (enrdf_load_stackoverflow) 1988-07-22
JPH0611508Y2 true JPH0611508Y2 (ja) 1994-03-23

Family

ID=30785182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP448187U Expired - Lifetime JPH0611508Y2 (ja) 1987-01-16 1987-01-16 Ｐｎｐｎスイツチ選別装置

Country Status (1)

Country Link
JP (1) JPH0611508Y2 (enrdf_load_stackoverflow)

Also Published As

Publication number Publication date
JPS63113977U (enrdf_load_stackoverflow) 1988-07-22

Similar Documents

Publication Publication Date Title
US6700384B2 (en) Circuit for detecting leakage in power supply
US4037155A (en) Current-responsive threshold detection circuitry
EP0805487A3 (en) Multielectrode electrostatic chuck with fuses
KR920000166A (ko) 반도체 장치의 보호회로
US4114089A (en) Ground fault detecting apparatus including current-responsive threshold detection circuitry
US4434401A (en) Apparatus for testing semiconductor devices and capacitors
JPH0611508Y2 (ja) Ｐｎｐｎスイツチ選別装置
US4151374A (en) Bus connection detector circuit for bus connection matrix circuit
US3979600A (en) Sense circuit arrangement
JPS6216009B2 (enrdf_load_stackoverflow)
JP2889264B2 (ja) 四端子測定装置
US4088947A (en) Electrical continuity test apparatus having a forward biased diode across the test terminals
JPS6036689B2 (ja) 接地混触検出装置
JP2521486B2 (ja) 集積回路装置の分類方法
JPH0192668A (ja) コンデンサの漏洩電流測定方法
JP6189199B2 (ja) コンタクト検査装置、コンタクト検査方法及び電子部品
JPS62147950A (ja) 素子故障検出回路
JP2001133330A (ja) 半導体モジュールの温度検出装置
JP3986626B2 (ja) 整流器用地絡検出装置
JPH09271140A (ja) 電源回路装置
JPS6318930Y2 (enrdf_load_stackoverflow)
JPS60192344A (ja) 半導体装置のウエハ−検査方法
JPS59119232A (ja) 漏水検知器
JPH04255431A (ja) 充電回路
JPS647336Y2 (enrdf_load_stackoverflow)