JPH06104139A - Ceramic chip part - Google Patents

Ceramic chip part

Info

Publication number
JPH06104139A
JPH06104139A JP4251039A JP25103992A JPH06104139A JP H06104139 A JPH06104139 A JP H06104139A JP 4251039 A JP4251039 A JP 4251039A JP 25103992 A JP25103992 A JP 25103992A JP H06104139 A JPH06104139 A JP H06104139A
Authority
JP
Japan
Prior art keywords
ceramic chip
aluminum substrate
ceramic
solder
chip part
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4251039A
Other languages
Japanese (ja)
Inventor
Kazuhide Ishii
一英 石井
Kenichiro Takahashi
健一郎 高橋
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Priority to JP4251039A priority Critical patent/JPH06104139A/en
Publication of JPH06104139A publication Critical patent/JPH06104139A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01GCAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES OR LIGHT-SENSITIVE DEVICES, OF THE ELECTROLYTIC TYPE
    • H01G2/00Details of capacitors not covered by a single one of groups H01G4/00-H01G11/00
    • H01G2/02Mountings
    • H01G2/06Mountings specially adapted for mounting on a printed-circuit support
    • H01G2/065Mountings specially adapted for mounting on a printed-circuit support for surface mounting, e.g. chip capacitors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01FMAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
    • H01F27/00Details of transformers or inductances, in general
    • H01F27/28Coils; Windings; Conductive connections
    • H01F27/29Terminals; Tapping arrangements for signal inductances
    • H01F27/292Surface mounted devices
    • H01F2027/295Surface mounted devices with flexible terminals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/05Insulated conductive substrates, e.g. insulated metal substrate
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/341Surface mounted components
    • H05K3/3421Leaded components

Abstract

PURPOSE:To prevent the occurrence of cracks in a ceramic chip part or solder by forming a soldering lead by bending part of an electrode outwardly thereby giving spring characteristics to the electrode and absorbing mechanical stresses applied to jointed solder by the electrode having the spring characteristics. CONSTITUTION:In a ceramic chip part comprising a construction having a ceramic 1 and metal electrodes 6 covering both the ends of the ceramic 1, part of the electrode 6 is bent outwardly thereby forming a soldering lead 2. Then, if the temperature of an aluminum substrate 5 rises, the aluminum substrate 5 is deformed more than the ceramic chip part because the coefficient of linear expansion of the aluminum substrate 5 is higher than that of the ceramic chip part, so that mechanical stresses are applied to a solder part 3 which joints the ceramic chip part to the aluminum substrate 5 but the mechanical stresses can be absorbed by the deformation of the soldering lead 2, thereby preventing the occurrence of cracks in solder connecting the ceramic chip part to the aluminum substrate.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は種々の電子機器に用いら
れるセラミックチップ部品に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a ceramic chip component used in various electronic devices.

【0002】[0002]

【従来の技術】近年、リードを持たないセラミックチッ
プ部品が広く用いられるようになってきた。
2. Description of the Related Art In recent years, ceramic chip parts having no lead have been widely used.

【0003】以下に、従来のセラミックチップ部品につ
いて図2を参照しながら説明する。図2において1はセ
ラミック、3は半田、4は電気回路を形成している銅
箔、5はアルミ基板、6は電極で、半田3により電極6
をおおうように銅箔4と接合されている。
A conventional ceramic chip component will be described below with reference to FIG. In FIG. 2, 1 is a ceramic, 3 is a solder, 4 is a copper foil forming an electric circuit, 5 is an aluminum substrate, 6 is an electrode, and an electrode 6 is formed by the solder 3.
Is bonded to the copper foil 4 so as to cover.

【0004】[0004]

【発明が解決しようとする課題】しかしながら上記の従
来の構成では、アルミ基板の温度が上昇,下降を繰り返
すような温度ストレスが加わると、線膨張係数の大きな
アルミ基板の変位量は線膨張係数の小さなセラミックチ
ップ部品よりも大きく、セラミックチップ部品およびセ
ラミックチップ部品をアルミ基板に接合している半田に
機械的ストレスが加わり、セラミックチップ部品にクラ
ック8が発生したり半田と銅箔4との境界部にクラック
7が発生して通電不良になるという問題点を有してい
た。
However, in the above-mentioned conventional structure, when the temperature of the aluminum substrate is repeatedly raised and lowered, the displacement of the aluminum substrate having a large linear expansion coefficient is Larger than a small ceramic chip component, mechanical stress is applied to the ceramic chip component and the solder that joins the ceramic chip component to the aluminum substrate, causing cracks 8 in the ceramic chip component or the boundary between the solder and the copper foil 4. There is a problem in that cracks 7 occur in the inner part of the wire, resulting in poor electrical conduction.

【0005】本発明は上記従来の問題点を解決するもの
で、信頼性の高いセラミックチップ部品を提供すること
を目的とする。
The present invention solves the above-mentioned conventional problems, and an object thereof is to provide a highly reliable ceramic chip component.

【0006】[0006]

【課題を解決するための手段】この目的を達成するため
に本発明のセラミックチップ部品は、電極の一部を外側
に折り曲げて半田付けリードを形成し、電極にバネ性を
もたせている。
To achieve this object, in the ceramic chip component of the present invention, a part of the electrode is bent outward to form a soldering lead so that the electrode has a spring property.

【0007】[0007]

【作用】本発明は上記した構成によって、アルミ基板の
温度が上昇,下降を繰り返すような温度ストレスが加わ
ったときに、線膨張係数の大きなアルミ基板と線膨張係
数の小さなセラミックチップ部品との間に生じる応力に
よってセラミックチップ部品およびセラミックチップ部
品をアルミ基板に接合している半田に加わる機械的スト
レスをバネ性を持たせた電極が吸収し、セラミックチッ
プ部品または半田にクラックが発生することを防止する
ことができる。
According to the present invention, with the above-described structure, when a temperature stress such that the temperature of the aluminum substrate repeatedly rises and falls is applied, the aluminum substrate having a large linear expansion coefficient and the ceramic chip component having a small linear expansion coefficient are provided. Prevents generation of cracks in the ceramic chip parts or solder due to absorption of mechanical stress applied to the solder that joins the ceramic chip parts and the ceramic chip parts to the aluminum substrate due to the stress generated on the electrodes. can do.

【0008】[0008]

【実施例】以下本発明の一実施例について、図1を参照
しながら説明する。
DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS An embodiment of the present invention will be described below with reference to FIG.

【0009】図1において1はセラミック、2は電極6
の一部を外側に折り曲げて形成された半田付けリード、
3は半田、4は電気回路を形成している銅箔で、半田3
により銅箔4と接合されている。5はアルミ基板、6は
電極でセラミック1と機械的に強固に接続されている。
In FIG. 1, 1 is a ceramic and 2 is an electrode 6.
, A soldering lead formed by bending a part of the
3 is solder and 4 is copper foil forming an electric circuit.
Is joined to the copper foil 4. Reference numeral 5 is an aluminum substrate, and 6 is an electrode, which is mechanically and firmly connected to the ceramic 1.

【0010】以上のように構成された本実施例のセラミ
ックチップ部品について、以下その動作を説明する。ま
ず、アルミ基板の温度が上昇すると線膨張係数の大きな
アルミ基板は線膨張係数の小さなセラミックチップ部品
よりも変位量が大きく、セラミックチップ部品およびセ
ラミックチップ部品とアルミ基板とを接合している半田
に機械的ストレスが加わるのであるが、半田付けリード
が変形することにより機械的ストレスを吸収し、セラミ
ックチップ部品およびセラミックチップ部品とアルミ基
板とを接合している半田にクラックが発生することを防
止する。
The operation of the ceramic chip component of this embodiment having the above structure will be described below. First, when the temperature of the aluminum substrate rises, the aluminum substrate, which has a large linear expansion coefficient, has a larger displacement than the ceramic chip component, which has a small linear expansion coefficient. Although mechanical stress is applied, deformation of the soldering leads absorbs mechanical stress and prevents cracks from occurring in the ceramic chip components and the solder joining the ceramic chip components and the aluminum substrate. .

【0011】[0011]

【発明の効果】以上のように本発明は、アルミ基板のよ
うにセラミックと著しく線膨張係数の異なる基板にセラ
ミックチップ部品を実装する場合に、基板に熱ストレス
が加わってセラミックチップ部品または半田にクラック
が発生して通電不良になるという問題を解消できるもの
である。さらに基板に曲げ応力が加わった時にも半田付
けリードがその応力を吸収し、セラミックチップ部品に
クラックが入ることを防止する。
As described above, according to the present invention, when a ceramic chip component is mounted on a substrate such as an aluminum substrate having a coefficient of linear expansion significantly different from that of ceramic, thermal stress is applied to the substrate to cause the ceramic chip component or the solder to be soldered. It is possible to solve the problem that the cracks are generated and the current flow becomes defective. Further, even when a bending stress is applied to the substrate, the soldering lead absorbs the stress and prevents the ceramic chip component from cracking.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例におけるセラミックチップ部
品とアルミ基板との接合状態を示す図
FIG. 1 is a diagram showing a joined state of a ceramic chip component and an aluminum substrate in an embodiment of the present invention.

【図2】従来のセラミックチップ部品とアルミ基板との
接合状態を示す図
FIG. 2 is a diagram showing a joined state of a conventional ceramic chip component and an aluminum substrate.

【符号の説明】[Explanation of symbols]

1 セラミック 2 半田付けリード 3 半田 4 銅箔 5 アルミ基板 6 電極 7 半田クラック 8 セラミックチップ部品に入ったクラック 1 Ceramic 2 Soldering Lead 3 Solder 4 Copper Foil 5 Aluminum Substrate 6 Electrode 7 Solder Crack 8 Crack in Ceramic Chip Component

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】セラミックとその両端に金属の電極をかぶ
せた構造からなるセラミックチップ部品において、電極
の一部を外側に折り曲げて半田付けリードを形成するこ
とを特徴とするセラミックチップ部品。
1. A ceramic chip component having a structure in which a ceramic and a metal electrode are placed on both ends of the ceramic, wherein a part of the electrode is bent outward to form a soldering lead.
JP4251039A 1992-09-21 1992-09-21 Ceramic chip part Pending JPH06104139A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4251039A JPH06104139A (en) 1992-09-21 1992-09-21 Ceramic chip part

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4251039A JPH06104139A (en) 1992-09-21 1992-09-21 Ceramic chip part

Publications (1)

Publication Number Publication Date
JPH06104139A true JPH06104139A (en) 1994-04-15

Family

ID=17216709

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4251039A Pending JPH06104139A (en) 1992-09-21 1992-09-21 Ceramic chip part

Country Status (1)

Country Link
JP (1) JPH06104139A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0929087A3 (en) * 1998-01-07 2003-03-12 TDK Corporation Ceramic capacitor
JP2012227472A (en) * 2011-04-22 2012-11-15 Mitsubishi Electric Corp Electronic component mounting structure

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5094433U (en) * 1973-12-29 1975-08-08
JPH0439916A (en) * 1990-06-05 1992-02-10 Marcon Electron Co Ltd Laminated ceramic capacitor

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5094433U (en) * 1973-12-29 1975-08-08
JPH0439916A (en) * 1990-06-05 1992-02-10 Marcon Electron Co Ltd Laminated ceramic capacitor

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0929087A3 (en) * 1998-01-07 2003-03-12 TDK Corporation Ceramic capacitor
JP2012227472A (en) * 2011-04-22 2012-11-15 Mitsubishi Electric Corp Electronic component mounting structure

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