JPH0598430A - Formation of film by ion plating method - Google Patents

Formation of film by ion plating method

Info

Publication number
JPH0598430A
JPH0598430A JP3256292A JP25629291A JPH0598430A JP H0598430 A JPH0598430 A JP H0598430A JP 3256292 A JP3256292 A JP 3256292A JP 25629291 A JP25629291 A JP 25629291A JP H0598430 A JPH0598430 A JP H0598430A
Authority
JP
Japan
Prior art keywords
film
base material
plating method
ion
ion plating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP3256292A
Other languages
Japanese (ja)
Inventor
Osamu Machida
治 町田
Kintaro Mori
金太郎 森
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koki Holdings Co Ltd
Original Assignee
Hitachi Koki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Koki Co Ltd filed Critical Hitachi Koki Co Ltd
Priority to JP3256292A priority Critical patent/JPH0598430A/en
Publication of JPH0598430A publication Critical patent/JPH0598430A/en
Withdrawn legal-status Critical Current

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Abstract

PURPOSE:To provide the method for forming a film capable of obtaining a film of quality with tight adhesive force under the conditions by which the damage of the film is small in an ion plating method used for the formation of a film such as a ceramic film. CONSTITUTION:The material 5 to be deposited by evaporation is irradiated with an electron beam 6 emitted from an electron gun 1, which is heated and evaporated to form a film on a base metal 10. At this time, film forming is executed while the surface of the base metal 10 is irradiated with hydrogen ion beams 19 by an ion gun 16, by which the film with tight adhesive force is formed.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、イオンプレーティング
法による、良質で付着強度の強い、化合物被膜形成方法
に関するものである。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for forming a compound coating film of good quality and high adhesion strength by an ion plating method.

【0002】[0002]

【従来の技術】切削工具等に用いられる耐摩耗性被膜の
コーティングには、現在CVD(化学蒸着)法、イオンビ
ームスパッタ法およびイオンプレーティング法などが用
いられている。
2. Description of the Related Art At present, a CVD (chemical vapor deposition) method, an ion beam sputtering method, an ion plating method or the like is used for coating an abrasion resistant film used for a cutting tool or the like.

【0003】CVD法は、成膜速度が速く付着強度も強
いが、成膜の際に母材を500〜1000℃まで加熱する必要
があるため、精密加工部品や低融点物質へのコーティン
グは出来ない。また、イオンビームスパッタ法はスパッ
タ現象を利用した成膜法であり、さらに成膜中に母材に
イオンを照射するダイナミックミキシング法を用いるこ
とにより200℃以下で成膜が可能であり、付着強度も強
い被膜を得ることができる。しかしながら、成膜速度が
遅いため、工業的にはあまり利用されていない。 一
方、イオンプレーティング法は成膜時の母材温度が300
〜500℃と比較的低く、成膜速度も速いが、母材へ印加
できるバイアス電位が数百eV程度であるためイオンビー
ムスパッタ法に比べると被膜の付着強度が弱い値とな
る。
The CVD method has a high film-forming rate and a high adhesion strength, but since the base material needs to be heated to 500 to 1000 ° C. at the time of film-forming, it is not possible to coat precision processed parts and low melting point substances. Absent. In addition, the ion beam sputtering method is a film formation method that utilizes the sputtering phenomenon. Furthermore, by using the dynamic mixing method in which the base material is irradiated with ions during film formation, it is possible to form a film at a temperature of 200 ° C or less, and the adhesion strength Can also obtain a strong coating. However, since the film forming speed is slow, it is not used industrially. On the other hand, in the ion plating method, the base material temperature during film formation is 300
Although it is relatively low at ~ 500 ° C and the film formation rate is fast, the adhesion strength of the coating becomes weaker than that of the ion beam sputtering method because the bias potential that can be applied to the base material is about several hundred eV.

【0004】上記の様な付着強度を改善するために、従
来真空容器にイオン銃を取り付け、導入ガスイオンを成
膜中に直接母材ホルダに数keV〜数十keVの加速電圧で照
射する方法が用いられている。しかしながら、炭化物や
酸化物被膜成膜時には、イオン銃のフィラメントの寿命
や汚染の問題から安定した炭素イオン、酸素イオンの照
射は難しく、前記方法は主に窒化物被膜作成時にのみ使
われている。
In order to improve the adhesion strength as described above, a conventional method is to attach an ion gun to a vacuum container and irradiate introduced gas ions directly to a base material holder during film formation with an acceleration voltage of several keV to several tens keV. Is used. However, when forming a carbide or oxide film, it is difficult to irradiate stable carbon ions and oxygen ions due to problems of the life of the filament of the ion gun and contamination, and the above method is mainly used only when forming a nitride film.

【0005】[0005]

【発明が解決しようとする課題】このようにイオンプレ
ーティング法によって付着強度の強い化合物被膜を形成
する方法においては、成膜中に被膜に高いエネルギーを
付与するための手段が必要となる。
Thus, in the method of forming a compound film having a high adhesion strength by the ion plating method, means for applying high energy to the film during film formation is required.

【0006】そこで本発明の目的は、比較的安定して供
給可能な水素イオンを成膜中に母材へ照射し、付着強度
の強い化合物被膜を形成できるイオンプレーティング法
を用いた被膜形成方法を提供することにある。
Therefore, an object of the present invention is to provide a film forming method using an ion plating method capable of forming a compound film having high adhesion strength by irradiating a base material with hydrogen ions which can be supplied relatively stably during film formation. To provide.

【0007】[0007]

【課題を解決するための手段】上記の目的を達成するた
めに、本発明による水素イオンを用いたイオンプレーテ
ィング法による被膜形成方法は、真空容器に設けたイオ
ン銃により成膜中に母材に直接水素イオンを照射し、母
材と被膜との界面でのミキシングおよび被膜中の反応の
促進を行なうことを特徴としている。
In order to achieve the above object, a method of forming a film by an ion plating method using hydrogen ions according to the present invention is a base material during film formation by an ion gun provided in a vacuum container. It is characterized in that it is directly irradiated with hydrogen ions to promote mixing at the interface between the base material and the coating and reaction in the coating.

【0008】[0008]

【作用】このように構成された本発明の方法において
は、イオン銃から放出された水素イオンビームが成膜中
の母材に照射されることによって、成膜初期には母材と
被膜の界面において、双方の原子と衝突することにより
ミキシング作用を起こし、また成膜中期以後は、蒸着物
質と導入ガスにエネルギーを付与することにより双方の
反応を促進する。水素イオンは質量が小さいため、スパ
ッタリングや被膜へ与える損傷が少なく、良質で付着強
度の強い化合物被膜が得られる。
In the method of the present invention thus constructed, the hydrogen ion beam emitted from the ion gun irradiates the base material during film formation, so that the interface between the base material and the coating film is initially formed. In the above, a mixing action is caused by colliding with both atoms, and after the middle stage of film formation, energy is applied to the vapor deposition material and the introduced gas to promote both reactions. Since hydrogen ions have a small mass, there is little damage given to the sputtering or the coating, and a high-quality compound coating having high adhesion strength can be obtained.

【0009】[0009]

【実施例】本発明の実施例を図1で説明する。真空容器
12内にはホロカソード電子銃1、金属を蒸発させるた
めのルツボ2、イオン化した蒸発粒子および導入ガスが
加速して入射するように直流負あるいは高周波のバイア
ス電位が印加された母材ホルダ3および水素イオンを母
材に照射するためのイオン銃16が設置されている。ま
た蒸発粒子および導入ガスのイオン化率が低い場合には
イオン化電極18を設置する。化合物被膜を形成するに
は、被膜中への不純物混入を減らすために真空容器12
内を10~4Pa台まで排気し、その後カソード13から流量
4〜20sccmのアルゴンガスを電子銃1に導入する。また
ガス導入口4から数十sccmの窒素、炭化水素、酸素など
の反応ガスを真空容器12内に導入する。
Embodiment An embodiment of the present invention will be described with reference to FIG. A hollow cathode electron gun 1, a crucible 2 for evaporating a metal, a base material holder 3 to which a DC negative or high frequency bias potential is applied so that ionized vaporized particles and an introduced gas are accelerated and incident in the vacuum container 12. Further, an ion gun 16 for irradiating the base material with hydrogen ions is installed. If the ionization rate of the vaporized particles and the introduced gas is low, the ionization electrode 18 is installed. In order to form a compound film, the vacuum container 12 is used to reduce the inclusion of impurities in the film.
The inside is exhausted to the level of 10 to 4 Pa, and then the flow rate from the cathode 13
Argon gas of 4 to 20 sccm is introduced into the electron gun 1. Further, a reaction gas such as nitrogen, hydrocarbon, oxygen or the like having a volume of several tens of sccm is introduced into the vacuum container 12 through the gas introduction port 4.

【0010】一方、真空容器12に取り付けられたイオ
ン銃16に、ガス導入口17から水素ガスを4〜10sccm
導入し、10〜100keVの加速電圧によって水素イオンを母
材に照射する。
On the other hand, the ion gun 16 attached to the vacuum container 12 is supplied with hydrogen gas from the gas inlet 17 at 4 to 10 sccm.
It is introduced and the base metal is irradiated with hydrogen ions at an acceleration voltage of 10 to 100 keV.

【0011】ルツボには蒸発物質5を設置しておき、電
子ビーム6は電磁石7によって軌道を制御され蒸発物質
5に照射される。電子ビーム6を照射された蒸発物質5
は加熱されて蒸発し、途中でイオン化しながら上方の母
材10上に堆積する。一方、ガス導入口4から導入され
た導入ガスも同様に電子ビーム6またはイオン化電極1
8によってイオン化され加速され母材10に達し、蒸発
物質5と反応して化合物被膜を形成する。この時イオン
銃16から放出された水素イオン19も母材10に達
し、蒸発物質、導入ガス原子と衝突し、ミキシングある
いは反応の促進を行なう。
The evaporation material 5 is installed in the crucible, and the orbit of the electron beam 6 is controlled by the electromagnet 7 to irradiate the evaporation material 5. Evaporated substance 5 irradiated with electron beam 6
Is heated and evaporated, and is deposited on the upper base material 10 while being ionized on the way. On the other hand, the introduction gas introduced from the gas introduction port 4 is also similarly subjected to the electron beam 6 or the ionization electrode 1
It is ionized by 8 and accelerated to reach the base material 10 and reacts with the vaporized substance 5 to form a compound film. At this time, the hydrogen ions 19 emitted from the ion gun 16 also reach the base material 10 and collide with the vaporized substances and introduced gas atoms to promote mixing or reaction.

【0012】このように、化合物被膜を成膜する際に、
水素イオン照射を併用したイオンプレーティング法を用
いることにより良質で付着強度の強い化合物被膜が得ら
れる。 なお、排気口8にオリフィスバルブを設け、直
流電源15に検知器を設置して、前記オリフィスバルブ
と検知器をプログラマブルコントローラへ接続すると、
電子ビーム6がグロー放電からアーク放電へ移行する時
点を検知器で感知し、この信号をプログラマブルコント
ローラへ送って、図示しないフィラメント電源を切断す
ると共にオリフィスバルブを調節して排気を行ようにな
るので、電子ビーム6がグロー放電からアーク放電へ移
行する際の急激な電流増加を抑制し、電子ビーム6を安
定化させることが可能となる。
As described above, when the compound film is formed,
By using the ion plating method in which hydrogen ion irradiation is also used, a high-quality compound film having high adhesion strength can be obtained. If an orifice valve is provided at the exhaust port 8 and a detector is installed at the DC power supply 15 and the orifice valve and the detector are connected to a programmable controller,
The detector senses the time when the electron beam 6 shifts from glow discharge to arc discharge, and sends this signal to the programmable controller to turn off the filament power supply (not shown) and adjust the orifice valve to exhaust gas. Therefore, it becomes possible to stabilize the electron beam 6 by suppressing a rapid increase in current when the electron beam 6 shifts from glow discharge to arc discharge.

【0013】[0013]

【発明の効果】本発明によれば、イオンプレーティング
法において化合物被膜を形成する際に、真空容器に取り
付けられたイオン銃により成膜中に母材に水素イオンを
照射することによって良質で付着強度の強い化合物被膜
を成膜することができる。従って、今まで難しかった精
密加工部品や低融点物質への化合物被膜の被覆が可能と
なり、広範囲にわたる消耗部品の寿命および性能向上と
いう効果を奏する。
According to the present invention, when a compound coating film is formed by the ion plating method, the base material is irradiated with hydrogen ions during the film formation by an ion gun attached to a vacuum container, so that the base material adheres with high quality. A strong compound film can be formed. Therefore, it becomes possible to coat a precision coating component or a low melting point substance with a compound coating, which has been difficult until now, and it is possible to improve the life and performance of a wide range of consumable components.

【図面の簡単な説明】[Brief description of drawings]

【図1】 本発明の一実施例を示す縦断面図である。FIG. 1 is a vertical sectional view showing an embodiment of the present invention.

【符号の説明】[Explanation of symbols]

1はホロカソード電子銃、2はルツボ、3は母材ホル
ダ、4は反応ガス導入口、5は蒸着物質、6は電子ビー
ム、7は電磁石、8は排気口、9はシャッタ、10は母
材、11はバイアス電源、12は真空容器、13はカソ
ード、14はガイシ、15は直流電源、16はイオン
銃、17はガス導入口、18はイオン化電極、19は水
素イオンビームである。
1 is a hollow cathode electron gun, 2 is a crucible, 3 is a base material holder, 4 is a reaction gas introducing port, 5 is a vapor deposition material, 6 is an electron beam, 7 is an electromagnet, 8 is an exhaust port, 9 is a shutter, 10 is a base material. , 11 is a bias power supply, 12 is a vacuum container, 13 is a cathode, 14 is a insulator, 15 is a direct current power supply, 16 is an ion gun, 17 is a gas inlet, 18 is an ionization electrode, and 19 is a hydrogen ion beam.

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 真空容器内に、被膜の蒸発源となる金属
を載置するための所定の正電位が印加されるルツボと、
金属を溶融するための電子ビームを放出する電子銃と、
前記ルツボに対し、負電位または高周波を印加し得る母
材ホルダ上に蒸発物質と導入ガスをイオン化手段により
イオン化し、化合物被膜を形成するイオンプレーティン
グ法において、真空容器にイオン銃を設け、化合物被膜
成膜中に水素イオンを母材に照射することを特徴とした
イオンプレーティング法による被膜形成方法。
1. A crucible to which a predetermined positive potential for mounting a metal serving as an evaporation source of a coating is applied in a vacuum container,
An electron gun that emits an electron beam for melting metal,
In the ion plating method in which the evaporation material and the introduced gas are ionized by the ionization means on the base material holder capable of applying a negative potential or a high frequency to the crucible, and a compound coating is formed, an ion gun is provided in the vacuum container, A method for forming a film by an ion plating method, which comprises irradiating a base material with hydrogen ions during film formation.
JP3256292A 1991-10-03 1991-10-03 Formation of film by ion plating method Withdrawn JPH0598430A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3256292A JPH0598430A (en) 1991-10-03 1991-10-03 Formation of film by ion plating method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3256292A JPH0598430A (en) 1991-10-03 1991-10-03 Formation of film by ion plating method

Publications (1)

Publication Number Publication Date
JPH0598430A true JPH0598430A (en) 1993-04-20

Family

ID=17290636

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3256292A Withdrawn JPH0598430A (en) 1991-10-03 1991-10-03 Formation of film by ion plating method

Country Status (1)

Country Link
JP (1) JPH0598430A (en)

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Effective date: 19990107