JPH0592751U - Measuring instrument with sub display function - Google Patents

Abstract

(57) [Summary] [Purpose] By adding a sub-display that can display simple signal information to the probe of a measuring instrument that has a main display that can handle complex measurements, To enable quick and easy measurement by only one measurer without looking at the display screen. A probe 2 for introducing a signal from a measured part is provided with a sub-display part 21, and a signal processing part 11 for generating a signal waveform showing a temporal change of a signal input from the probe,
The measuring machine 1 having a main display section 12 for displaying the signal waveform output from the signal processing section has a level detection for detecting the DC level or the peak level of the signal waveform displayed on the main display section 12. By adding the unit 13 and the sub-display signal generation unit 14 that causes the sub-display unit 21 to display the level value detected by the level detection unit, simple signal information can be displayed without looking at the main display screen. It is configured so that only one measurer can perform the measurement quickly and easily.

Description

[Detailed description of the device]

[0001]

[Industrial applications]

 The present invention relates to a measuring instrument with a sub-display function for displaying simple signal information of a measured portion even with a probe.

[0002]

[Prior Art]

 An oscilloscope that displays a temporal change of a signal on a CRT screen is one of the typical measuring instruments having a display section. When using this oscilloscope, the measurer brings the probe into contact with the part to be measured such as a circuit board and confirms the signal waveform at that time from the screen display of the CRT.

In order to quickly perform measurement using an oscilloscope, generally two people share the work, one person sequentially contacts a plurality of measured parts with a probe, and the other one CR at each time point. The signal information of each measured part is read from the T screen display. The signal information to be measured includes analog voltage, presence / absence of oscillation, frequency, duty, H / L (high / low) level, phase difference, pulse width, etc., depending on the type of signal.

[0004]

[Problems to be solved by the device]

 In the case of targeting digital signals, in many cases, among the above-mentioned signal information, simple information such as H / L level and presence / absence of oscillation is measured like a continuity check of a tester to check the circuit. It takes a lot of man-hours to perform such a simple measurement by two workers. However, in order to perform the measurement by one person, it is necessary to look at the CRT screen while bringing the probe into contact with the measuring section, so the work efficiency is poor.

The present invention has improved these points and provided a sub-display unit on the probe of a measuring instrument that has a main display unit that can handle complex measurements, and displays a main display screen for simple signal information. The purpose is to enable quick and easy measurement by only one measurer, without looking at the sub-display information at hand.

[0006]

[Means for Solving the Problems]

 In order to achieve the above object, in the present invention, a probe that introduces a signal of a measured part, a signal processing part that generates a signal waveform showing a temporal change of a signal input from this probe, and an output from this signal processing part. The main display section that displays the signal waveform, the level detection section that detects the DC level or peak level of the signal waveform that is displayed in this main display section, and the level value detected by this level detection section. The first feature is that it is provided with a sub-display signal generation section for converting into a display signal and a sub-display section provided in the probe for displaying according to the sub-display signal.

According to the present invention, a probe for introducing a signal of a part to be measured, a signal processing part for generating a signal waveform showing a temporal change of a signal input from the probe, and an output from the signal processing part. A main display section that displays the signal waveform, a frequency detection section that detects the frequency of the signal waveform displayed on this main display section, and a sub-display that converts the frequency value detected by this frequency detection section into a sub-display signal. A second feature is that it is provided with a display signal generation section and a sub-display section provided on the probe for displaying according to the sub-display signal.

[0008]

[Action]

 According to the first feature of the present invention, the measurer can know the signal level of the measured part from the display of the sub-display provided on the probe, so that the operator can see the main display screen of the measuring instrument each time. There is no need to check the signal level. The display of the signal level by the sub-display unit can display the H / L level of the digital signal as a voltage (V) such as “5” / “0”. When an analog signal is targeted, a more precise level can be displayed as a voltage value (V). For example, "3.4".

According to the second feature of the present invention, the measurer can know the signal frequency of the measured part from the display of the sub-display part provided on the probe, so that the main display screen of the measuring instrument main body can be obtained each time. There is no need to look at the frequency. The frequency (kHz) is displayed on the sub display unit, for example, as "50".

[0010]

【Example】

 Embodiments of the present invention will be described below with reference to the drawings. 1 is a block diagram of a measuring instrument with a sub-display function according to a first embodiment of the present invention. In the figure, 1 is a main body of a measuring instrument such as an oscilloscope, 2 is a probe connected to the main body 1 by a code 3, 4 is a circuit board, and 5 is a circuit component mounted on this board. As an example, the lead terminal portion of the circuit component 5 serves as the measured portion, and the tip of the probe 2 is brought into contact with the lead terminal portion to capture the measurement signal. The probe 2 of the present invention is provided with a sub-display unit 21 using a display element such as an LED, where simple signal information can be viewed. Reference numeral 22 denotes a display control unit that receives a sub-display signal, which will be described later, from the measuring instrument body 1 and controls the display of the sub-display unit 21.

A signal processing unit 11 for generating a signal waveform showing a temporal change of a measurement signal input from the probe 2 and a signal waveform output from the signal processing unit 11 are provided in the measuring instrument body 1. A main display unit 12 (generally a CRT) for displaying, a level detection unit 13 for detecting a DC level or a peak level of a signal waveform displayed on the main display unit 12, and a level detected by the level detection unit 13. And a sub-display signal generation unit 14 that converts the value of the sub-display signal into a sub-display signal.

The signal processing unit 11 and the main display unit 12 are existing parts in the measuring machine body 1, whereas the level detecting unit 13 and the sub display signal generating unit 14 are parts added in the present invention. The main display unit 12 two-dimensionally displays the signal waveform input from the signal processing unit 11. Usually, the horizontal axis is time and the vertical axis is voltage. Therefore, detailed signal information such as signal level, frequency, phase difference, and duty can be obtained from this display.

On the other hand, the sub-display signal output from the sub-display signal generator 14 has only simple signal information. Here, an example is given of a sub-display signal that detects the measurement signal level (DC level or peak level) input from the probe 2 and displays the value on the sub-display unit 21 of the probe 2. When the sub-display unit 21 has a 7-segment LED array (for example, a 3-digit array including one decimal place), the display control unit 22 serves as an LED driver for driving these. In this case, the sub-display signal is serially transferred from the sub-display signal generation unit 14, and the display control unit 22 receives the sub-display signal to selectively drive each segment of the sub-display unit 21. The number of core wires is small.

In the case of using the measuring device configured as described above, when the measurer brings the probe 2 into contact with the part to be measured, for example, the lead of the circuit component 5, the signal level detected at that time is provided in the probe 2. Since it can be seen on the sub display 21 (close to the part to be measured and within the same field of view), the signal level can be confirmed without looking at the waveform display on the main display 12 at a distance. . Therefore, only one measurer can change the measured part one after another, and the working efficiency is improved. When a 3-digit LED is used, the sub display unit 21 displays the H / L level of the digital signal as a voltage such as "5.0" / "0.0" when a 3-digit LED is used. Alternatively, it is also displayed as "H" / "L". When an analog signal is targeted, it is possible to display a more precise level as a voltage value. In this case, the voltage (V) is displayed as in "3.4".

FIG. 2 is a configuration diagram showing a measuring instrument with a sub-display function according to a second embodiment of the present invention. In this embodiment, the frequency information of the signal information of the measured portion is displayed on the sub display portion 21. Therefore, the level detection unit 13 in the configuration of FIG. 1 is replaced with the frequency detection unit 15 in FIG. The frequency detecting unit 15 has a function of detecting the frequency of the input signal, and inputs the detected frequency information to the sub display signal generating unit 14.

The frequency display by the sub display unit 21 can be performed as “50.0” (unit is, for example, kHz). In this way, the measurer can know the signal frequency of the measured part from the display of the sub display part 21 at hand, and therefore, it is not necessary to check the frequency by looking at the far main display screen each time.

[0017]

[Effect of the device]

 As described above, according to the present invention, since the sub-display unit that can display simple signal information is provided on the probe of the measuring instrument that has the main display unit that can handle complicated measurement, Has an advantage that only one measurer can measure quickly and easily without looking at the main display screen.

[Brief description of drawings]

FIG. 1 is a configuration diagram of a measuring instrument with a sub-display function according to a first embodiment of the present invention.

FIG. 2 is a configuration diagram of a measuring instrument with a sub display function according to a second embodiment of the present invention.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 ... Measuring device main body, 2 ... Probe, 3 ... Code, 4 ... Circuit board, 5 ... Circuit part, 11 ... Signal processing part, 12 ... Display part, 13 ... Level detection part, 14 ... Sub-display signal generation part, 1
5 ... Frequency detection part, 21 ... Sub-display part, 22 ... Display control part.

Claims (2)

[Scope of utility model registration request] 1. A probe for introducing a signal from a part to be measured, a signal processing part for generating a signal waveform showing a temporal change of a signal input from the probe, and a signal waveform output from the signal processing part are displayed. Main display section, a level detection section for detecting the DC level or peak level of the signal waveform displayed on the main display section, and a sub-display section for converting the level value detected by the level detection section into a sub-display signal. A measuring instrument with a sub-display function, comprising: a display signal generating section; and a sub-display section provided on the probe for displaying according to the sub-display signal. 2. A probe for introducing a signal from a measured part, a signal processing part for generating a signal waveform showing a temporal change of a signal input from this probe, and a signal waveform output from this signal processing part are displayed. Main display section, a frequency detection section that detects the frequency of the signal waveform displayed on this main display section, and a sub-display signal generation section that converts the frequency value detected by this frequency detection section into a sub-display signal. And a sub-display unit provided on the probe for displaying according to the sub-display signal.