JPH0583877B2 - - Google Patents

Info

Publication number
JPH0583877B2
JPH0583877B2 JP59004560A JP456084A JPH0583877B2 JP H0583877 B2 JPH0583877 B2 JP H0583877B2 JP 59004560 A JP59004560 A JP 59004560A JP 456084 A JP456084 A JP 456084A JP H0583877 B2 JPH0583877 B2 JP H0583877B2
Authority
JP
Japan
Prior art keywords
circuit
gate
circuit block
input
terminal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP59004560A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60148138A (ja
Inventor
Akira Taki
Kazutoshi Shimizume
Hiroyoshi Tanaka
Kyohiko Sato
Akira Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sony Corp
Original Assignee
Sony Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Corp filed Critical Sony Corp
Priority to JP59004560A priority Critical patent/JPS60148138A/ja
Publication of JPS60148138A publication Critical patent/JPS60148138A/ja
Publication of JPH0583877B2 publication Critical patent/JPH0583877B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P74/00—

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP59004560A 1984-01-13 1984-01-13 テスト機能を有する集積回路 Granted JPS60148138A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59004560A JPS60148138A (ja) 1984-01-13 1984-01-13 テスト機能を有する集積回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59004560A JPS60148138A (ja) 1984-01-13 1984-01-13 テスト機能を有する集積回路

Publications (2)

Publication Number Publication Date
JPS60148138A JPS60148138A (ja) 1985-08-05
JPH0583877B2 true JPH0583877B2 (OSRAM) 1993-11-29

Family

ID=11587425

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59004560A Granted JPS60148138A (ja) 1984-01-13 1984-01-13 テスト機能を有する集積回路

Country Status (1)

Country Link
JP (1) JPS60148138A (OSRAM)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4754215A (en) * 1985-11-06 1988-06-28 Nec Corporation Self-diagnosable integrated circuit device capable of testing sequential circuit elements
GB2185990B (en) * 1986-02-05 1990-01-24 Unilever Plc Margarine fat
JPS6348854A (ja) * 1986-08-19 1988-03-01 Toshiba Corp システムｌｓｉ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5537924A (en) * 1978-09-11 1980-03-17 Nec Corp Integrated circuit

Also Published As

Publication number Publication date
JPS60148138A (ja) 1985-08-05

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term