JPH0582809A - High-voltage semiconductor rectifying element - Google Patents
High-voltage semiconductor rectifying elementInfo
- Publication number
- JPH0582809A JPH0582809A JP24219291A JP24219291A JPH0582809A JP H0582809 A JPH0582809 A JP H0582809A JP 24219291 A JP24219291 A JP 24219291A JP 24219291 A JP24219291 A JP 24219291A JP H0582809 A JPH0582809 A JP H0582809A
- Authority
- JP
- Japan
- Prior art keywords
- solder
- voltage semiconductor
- semiconductor rectifying
- laminated body
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明は、複数個の半導体整流片
をろう材を介して直列接続した柱状積層体の両端に接続
導線を固着した高圧半導体整流素子に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a high-voltage semiconductor rectifying device in which connecting conductors are fixed to both ends of a columnar laminated body in which a plurality of semiconductor rectifying pieces are connected in series via a brazing material.
【0002】[0002]
【従来の技術】例えばピーク逆電圧20kVの交流を整流す
るために用いる高圧半導体整流素子は、1枚のダイオー
ド基板では必要な耐圧が得られないため、複数個のダイ
オードチップをろう材を介して直列接続したものを用い
る。このような半導体素子は、例えばPN接合を形成し
たウエーハの両面にNiめっきを施したのち、Pb/Sn2元
はんだ板を介して積重ね、加熱してろう付けしたのち、
賽の目状に切断して柱状積層体とし、その積層体の両端
に接続導線を固着し、積層体の側面を表面を接合被覆樹
脂 (JCR)で覆い、接続導線の大部分を露出させて樹脂封
止することによって製造される。2. Description of the Related Art For example, a high-voltage semiconductor rectifying device used for rectifying an alternating current having a peak reverse voltage of 20 kV cannot obtain a required withstand voltage with a single diode substrate. Use those connected in series. Such a semiconductor element is, for example, Ni-plated on both sides of a wafer with a PN junction formed, then stacked through Pb / Sn binary solder plates, heated and brazed,
Cut into diced pieces to form a columnar laminated body, fix the connecting conductors to both ends of the laminated body, cover the side surface of the laminated body with the joint coating resin (JCR), expose most of the connecting conductors, and seal with resin. Manufactured by stopping.
【0003】[0003]
【発明が解決しようとする課題】上記のような方法で製
造した従来の高圧半導体整流素子の、例えば平均順電流
5mAの素子は、順方向過電流耐量試験において望ましい
1.5 A以上の耐量が得にくいという問題があった。A conventional high-voltage semiconductor rectifying device manufactured by the above method, for example, a device having an average forward current of 5 mA is desirable in a forward overcurrent withstand test.
There is a problem that it is difficult to obtain a withstand capacity of 1.5 A or more.
【0004】本発明の目的は、上記の問題を解決し、充
分な順方向過電流耐量を持った高圧半導体整流素子を提
供することにある。An object of the present invention is to solve the above problems and to provide a high voltage semiconductor rectifying device having a sufficient forward overcurrent withstand capability.
【0005】[0005]
【課題を解決するための手段】上記の目的を達成するた
めに、本発明は、複数個の半導体整流片をろう材を介し
て直列接続した柱状積層体の両端にそれぞれ接続導体を
固着した高圧半導体整流素子において、ろう材がAuを含
有したはんだであるものとする。そして。Auの含有量が
0.8 重量%以上であることが有効である。また柱状積層
体がその側面を表面保護樹脂で被覆され、さらに接続導
線の大部分を露出させて樹脂封止されたことが有効であ
る。In order to achieve the above object, the present invention provides a high voltage system in which a plurality of semiconductor rectifying pieces are connected in series via a brazing material and a connecting conductor is fixed to each end of the columnar laminated body. In the semiconductor rectifier, the brazing material is a solder containing Au. And. Au content is
It is effective that the content is 0.8% by weight or more. Further, it is effective that the side surface of the columnar laminated body is covered with a surface protective resin, and most of the connecting conductors are exposed and resin-sealed.
【0006】[0006]
【作用】順方向過電流による素子の劣化は、過電流によ
る急激な温度上昇によりろう材が急激に膨脹し、その応
力により半導体整流片に亀裂が入るためである。図2
は、温度上昇の際に膨脹するろう材のもとの寸法に対す
る線膨脹率の一例を示すもので、線21はPb90%、Sn10%
のはんだであり、線22はAuを添加してPb89.1%、Au1.0
%の組成を有するはんだである。1.0 %のAuを添加する
ことによりはんだの固相線温度が約35°下がる。そのた
め線22に示すようにより低い温度で溶解しはじめ、線21
にくらべて膨脹がゆるやかにおこる。その結果、半導体
整流片に与える影響が弱く、順方向過電流耐量が向上す
る。The deterioration of the element due to the forward overcurrent is because the brazing material expands rapidly due to the rapid temperature rise due to the overcurrent, and the stress causes a crack in the semiconductor rectifying piece. Figure 2
Shows an example of the linear expansion coefficient with respect to the original size of the brazing filler metal that expands when the temperature rises. Line 21 is Pb 90%, Sn 10%
This is the solder of wire 22 with Au added Pb89.1%, Au1.0
% Solder. Addition of 1.0% Au lowers the solidus temperature of the solder by about 35 °. Therefore, it begins to melt at a lower temperature, as shown by line 22,
Swelling occurs more slowly than As a result, the influence on the semiconductor rectifying piece is weak, and the forward overcurrent withstand capability is improved.
【0007】[0007]
【実施例】図1は本発明の一実施例の高圧半導体整流素
子を示し、厚さ約280 μmのpn接合を形成したダイオ
ードチップ (半導体整流片) 1を厚さ45μmのはんだ2
を介して直列接続した柱状積層体10の両端に頭部31を有
するリード3をはんだ4によりろう付けしたものであ
る。さらに、柱状積層体の側面に、ポリイミド樹脂など
のJCR5で被覆し、エポキシ樹脂などの注型樹脂6で
封止した構造を有する。この素子のはんだ2にPb/Sn/
Au3元はんだを用いた。図3は、その3元はんだとして
Pb90%、Sn10%の2元はんだにAuを0.1 重量%、0.5 重
量%、1.0 重量%および2.0 重量%添加したものを用い
たときに、でき上がった整流素子の順方向過電流耐量を
示す。2図から明らかなように、Au含有量0.8 %以上に
おいて順方向過電流耐量が向上しており、1.5 A以上の
耐量が得られている。1 shows a high-voltage semiconductor rectifying device according to an embodiment of the present invention, in which a diode chip (semiconductor rectifying piece) 1 having a pn junction with a thickness of about 280 μm is attached to a solder 2 with a thickness of 45 μm.
Leads 3 having head portions 31 are brazed with solder 4 at both ends of a columnar laminated body 10 which is connected in series via the. Further, it has a structure in which the side surface of the columnar laminated body is covered with JCR 5 such as a polyimide resin and sealed with a casting resin 6 such as an epoxy resin. Pb / Sn / on the solder 2 of this element
Au ternary solder was used. Figure 3 shows the three-dimensional solder
The forward overcurrent withstand capability of the completed rectifying element is shown when using 0.1% by weight, 0.5% by weight, 1.0% by weight and 2.0% by weight of Au in a binary solder of 90% Pb and 10% Sn. As is clear from FIG. 2, the forward overcurrent withstand capability is improved when the Au content is 0.8% or more, and the withstand capability of 1.5 A or more is obtained.
【0008】[0008]
【発明の効果】本発明によれば、直列接続する半導体整
流片間のろう材としてAuを含有して固相線の低下したは
んだを用いることにより、過電流によるはんだの膨脹が
ゆるやかになって、半導体整流片に加わる応力が弱ま
り、整流片に亀裂が入ることが防止され、順方向過電流
耐量が向上した高圧半導体整流素子が得られる。According to the present invention, by using a solder containing Au as a brazing material between semiconductor rectifying pieces connected in series and having a reduced solidus, the expansion of the solder due to an overcurrent is moderated. A stress applied to the semiconductor rectifying piece is weakened, cracks are prevented from being formed in the rectifying piece, and a high-voltage semiconductor rectifying element with improved forward overcurrent withstand capability can be obtained.
【図1】本発明の一実施例の高圧半導体整流素子の断面
図FIG. 1 is a cross-sectional view of a high voltage semiconductor rectifier according to an embodiment of the present invention.
【図2】Au含有の影響を示す線膨脹率と温度との関係線
図FIG. 2 is a diagram showing the relationship between the coefficient of linear expansion and the temperature, which shows the effect of Au content.
【図3】本発明の効果を示す順方向過電流耐量とはんだ
中のAu含有量との関係線図FIG. 3 is a diagram showing the relationship between forward overcurrent withstand capability and Au content in solder showing the effect of the present invention.
1 ダイオードチップ 2 はんだ 3 リード 5 JCR 6 注型樹脂 10 柱状積層体 1 Diode Chip 2 Solder 3 Lead 5 JCR 6 Cast Resin 10 Columnar Stack
Claims (3)
列接続した柱状積層体の両端にそれぞれ接続導体を固着
したものにおいて、ろう材が金を含有したはんだである
ことを特徴とする高圧半導体整流素子。1. A columnar laminated body in which a plurality of semiconductor rectifying pieces are connected in series via a brazing material, and connecting conductors are fixed to both ends thereof, wherein the brazing material is a solder containing gold. High voltage semiconductor rectifier.
1記載の高圧半導体整流素子。2. The high-voltage semiconductor rectifier according to claim 1, wherein the content of gold is 0.8% by weight or more.
覆され、さらに接続導線の大部分を露出させて樹脂封止
された請求項1記載の高圧半導体整流素子。3. The high-voltage semiconductor rectifying device according to claim 1, wherein the columnar laminated body is covered on its side surface with a surface protective resin, and is further resin-sealed by exposing most of the connecting conductors.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03242192A JP3133108B2 (en) | 1991-09-24 | 1991-09-24 | High voltage semiconductor rectifier |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP03242192A JP3133108B2 (en) | 1991-09-24 | 1991-09-24 | High voltage semiconductor rectifier |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0582809A true JPH0582809A (en) | 1993-04-02 |
JP3133108B2 JP3133108B2 (en) | 2001-02-05 |
Family
ID=17085662
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP03242192A Expired - Fee Related JP3133108B2 (en) | 1991-09-24 | 1991-09-24 | High voltage semiconductor rectifier |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP3133108B2 (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07105144A (en) * | 1993-07-27 | 1995-04-21 | Internatl Business Mach Corp <Ibm> | Stacking of circuited polymer dielectric panel |
-
1991
- 1991-09-24 JP JP03242192A patent/JP3133108B2/en not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH07105144A (en) * | 1993-07-27 | 1995-04-21 | Internatl Business Mach Corp <Ibm> | Stacking of circuited polymer dielectric panel |
Also Published As
Publication number | Publication date |
---|---|
JP3133108B2 (en) | 2001-02-05 |
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