JPH0582497A - Wafer drying machine - Google Patents

Wafer drying machine

Info

Publication number
JPH0582497A
JPH0582497A JP23854191A JP23854191A JPH0582497A JP H0582497 A JPH0582497 A JP H0582497A JP 23854191 A JP23854191 A JP 23854191A JP 23854191 A JP23854191 A JP 23854191A JP H0582497 A JPH0582497 A JP H0582497A
Authority
JP
Japan
Prior art keywords
wafer
turntable
wall
storage chamber
dust
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23854191A
Other languages
Japanese (ja)
Inventor
Akihiko Kanekiyo
明彦 兼清
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Yamaguchi Ltd
Original Assignee
NEC Yamaguchi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Yamaguchi Ltd filed Critical NEC Yamaguchi Ltd
Priority to JP23854191A priority Critical patent/JPH0582497A/en
Publication of JPH0582497A publication Critical patent/JPH0582497A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the induction of a break in other wafer due to a break in one wafer and to prevent the wafers from being contaminated with dust, which is generated by the breaks. CONSTITUTION:A slant face is given to the inner wall of a housing chamber 1a encircling a turntable 3, which has a carrier 4 for wafer housing use mounted thereto and is rotated, an exhaust vent 7a, which is an opening, is provided at the extension part of this slant face, the flow of the air, which is generated by a centrifugal force, is corrected so as to flow from a suction port 8 to the vent 7a along the inner wall and a fragment of a wafer or dust is made to eliminate smoothly through the exhaust vent 7a.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明は、処理後あるいは洗浄後
における半導体基板であるウェーハを回転し、その遠心
力でウェーハ面の液を飛散させ乾燥するウェーハ乾燥機
に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a wafer drier for rotating a wafer, which is a semiconductor substrate after processing or cleaning, and scattering and drying the liquid on the wafer surface by its centrifugal force.

【0002】[0002]

【従来の技術】図2(a)及び(b)は従来の一例を示
すウェーハ乾燥機の断面図及び上面図である。従来、こ
の種のウェーハ乾燥機は、例えば、図2に示すように、
ウェーハ5を複数枚収納するキャリア4を外周囲に取付
けて回転するターンテーブル3と、このターンテーブル
3の周囲を囲み、底面に排気口7を有する収納室1と、
収納室を閉じるとともにその天がい部に吸気口8を有す
る蓋2とで構成されていた。
2. Description of the Related Art FIGS. 2A and 2B are a cross-sectional view and a top view of a conventional wafer dryer. Conventionally, this type of wafer dryer is, for example, as shown in FIG.
A turntable 3 having a carrier 4 for accommodating a plurality of wafers 5 mounted on the outer periphery and rotating, and a storage chamber 1 surrounding the turntable 3 and having an exhaust port 7 on the bottom surface.
It was configured with a lid 2 having an intake port 8 in its ceiling portion while closing the storage chamber.

【0003】また、図面には示していないが、ターンテ
ーブル3に取付けられた回転軸6の他端には回転用のモ
ータが取付けてられている。そしてこのウェーハ乾燥機
は、ターンテーブル3を高速回転することによりウェー
ハ5の表面に付着する水分を遠心力で飛散させ、ウェー
ハ5を乾燥させていた。また、蓋2の吸気口から、ター
ンテーブル3の回転に伴い空気が流入し、乾燥を促進さ
せていた。
Although not shown in the drawing, a rotation motor is attached to the other end of the rotary shaft 6 attached to the turntable 3. The wafer dryer dries the wafer 5 by rotating the turntable 3 at a high speed to scatter water attached to the surface of the wafer 5 by centrifugal force. Further, air is introduced from the intake port of the lid 2 with the rotation of the turntable 3 to promote the drying.

【0004】このようなウェーハ乾燥機は、きわめて短
時間で乾燥出来ることから、半導体装置の製造工程には
多く用いられてきた。
Since such a wafer dryer can be dried in an extremely short time, it has been widely used in the manufacturing process of semiconductor devices.

【0005】[0005]

【発明が解決しようとする課題】上述した従来のウェー
ハ乾燥機では、ターンテーブルが回転中に、キャリア内
に収納されたウェーハが割れ、そのかけらが収納室内部
側壁に衝突し、はねかえり他のウェーハを割ったり、ま
た、割れにより発生する塵埃によるウェーハの汚染が発
生するというような問題があった。
In the conventional wafer dryer described above, while the turntable is rotating, the wafer stored in the carrier is broken, and a fragment thereof collides with the side wall inside the storage chamber, causing another wafer to bounce off. There is a problem that the wafer is contaminated by dust generated by cracking or cracking.

【0006】本発明の目的は、かかる問題を解消すべ
く、ウェーハ割れが生じても、他のウェーハ割れを誘発
したり、汚染したりすることなくウェーハの乾燥を行い
得るウェーハ乾燥機を提供することである。
In order to solve such a problem, an object of the present invention is to provide a wafer dryer capable of drying a wafer without inducing another wafer crack or contaminating even if a wafer crack occurs. That is.

【0007】[0007]

【課題を解決するための手段】本発明のウェーハ乾燥機
は、ウェーハ収納用のキャリアを取付け回転するターン
テーブルと、このターンテーブルの包む収納室とを備え
るウェーハ乾燥機において、前記ターンテーブルの外周
囲に対応する前記収納室の内壁に傾斜面をもたせ、この
傾斜面の延長部に開口が形成されていることを特徴とし
ている。
A wafer dryer according to the present invention comprises a turntable equipped with a carrier for storing wafers and rotating, and a storage chamber enclosed by the turntable. It is characterized in that an inner wall of the storage chamber corresponding to the surroundings has an inclined surface, and an opening is formed in an extension portion of the inclined surface.

【0008】[0008]

【実施例】次に本発明について図面を参照して説明す
る。
The present invention will be described below with reference to the drawings.

【0009】図1(a)及び(b)は本発明のウェーハ
乾燥機の一実施例を示す断面図及び上面図である。この
ウェーハ乾燥機は、図1に示すように、ウェーハ5を収
納したキャリア4を搭載するターンテーブルに対向する
収納室1aの内壁に傾斜をもたせ、収納室1aの外周囲
に広い開口を有する排気口7aを設けたことである。
1A and 1B are a sectional view and a top view showing an embodiment of a wafer dryer of the present invention. As shown in FIG. 1, this wafer dryer has an exhaust gas having a wide opening around the outer periphery of the storage chamber 1a, in which the inner wall of the storage chamber 1a facing the turntable on which the carrier 4 storing the wafer 5 is mounted is inclined. The mouth 7a is provided.

【0010】このように収納室1aの側面の内壁に傾斜
をもたせ、その傾斜した内壁の延長部に開口を設けれ
ば、遠心力により空気は吸気口8より排気口7aに向っ
て内壁に沿って流れ、渦巻流や乱流を起すことがない。
割れたウェーハの断片やそれに伴う塵埃は円滑に排気口
7aより排出される。
In this way, if the inner wall of the side surface of the storage chamber 1a is inclined and an opening is provided in the extended portion of the inclined inner wall, air is drawn from the intake port 8 toward the exhaust port 7a along the inner wall by centrifugal force. Flow without causing swirl or turbulence.
Fragments of the cracked wafer and the accompanying dust are smoothly discharged from the exhaust port 7a.

【0011】ちなみに実験を行ったところ、ウェーハ割
れによる他のウェーハの割れ及び汚染は著しく減少し、
数百数のウェーハについて実施をしてみたが、皆無に近
かった。
By the way, when an experiment was conducted, cracking and contamination of other wafers due to wafer cracking were significantly reduced,
I tried it on hundreds of wafers, but it was almost empty.

【0012】[0012]

【発明の効果】以上説明したように本発明は、ウェーハ
収納用のキャリアを取付けるターンテーブルを囲む収納
室の内壁に傾斜面をもたせ、その傾斜面の延長部に水平
方向の開口を設け、ターンテーブルの回転により生ずる
遠心力で中心から外方に向って空気の流れ方向を矯正す
ることによって、ウェーハの割れた断片あるいは塵埃を
円滑に排出できるので、本発明によれば、ウェーハの割
れに伴う他のウェーハの割れの誘発あるいは塵埃による
汚染を起すことなくウェーハを乾燥することの出来るウ
ェーハ乾燥機が得られるという効果がある。
As described above, according to the present invention, the inner wall of the storage chamber surrounding the turntable for mounting the carrier for storing the wafer is provided with the inclined surface, and the extension portion of the inclined surface is provided with the horizontal opening to turn the turntable. By correcting the air flow direction from the center to the outside by the centrifugal force generated by the rotation of the table, broken fragments or dust of the wafer can be smoothly discharged. There is an effect that it is possible to obtain a wafer dryer that can dry a wafer without inducing cracking of other wafers or causing contamination by dust.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例を示すウェーハ乾燥機の断面
図及び上面図である。
FIG. 1 is a cross-sectional view and a top view of a wafer dryer showing an embodiment of the present invention.

【図2】従来の一例を示すウェーハ乾燥機の断面図及び
上面図である。
FIG. 2 is a cross-sectional view and a top view of a conventional wafer dryer.

【符号の説明】[Explanation of symbols]

1,1a 収納室 2 蓋 3 ターンテーブル 4 キャリア 5 ウェーハ 6 回転軸 7,7a 排気口 8 吸気口 1,1a Storage chamber 2 Lid 3 Turntable 4 Carrier 5 Wafer 6 Rotating shaft 7,7a Exhaust port 8 Intake port

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 ウェーハ収納用のキャリアを取付け回転
するターンテーブルと、このターンテーブルの包む収納
室とを備えるウェーハ乾燥機において、前記ターンテー
ブルの外周囲に対応する前記収納室の内壁に傾斜面をも
たせ、この傾斜面の延長部に開口が形成されていること
を特徴とするウェーハ乾燥機。
1. A wafer dryer including a turntable for mounting and rotating a carrier for storing wafers and a storage chamber wrapped by the turntable, wherein an inclined surface is formed on an inner wall of the storage chamber corresponding to an outer periphery of the turntable. And an opening is formed in the extension of this inclined surface.
JP23854191A 1991-09-19 1991-09-19 Wafer drying machine Pending JPH0582497A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23854191A JPH0582497A (en) 1991-09-19 1991-09-19 Wafer drying machine

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23854191A JPH0582497A (en) 1991-09-19 1991-09-19 Wafer drying machine

Publications (1)

Publication Number Publication Date
JPH0582497A true JPH0582497A (en) 1993-04-02

Family

ID=17031790

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23854191A Pending JPH0582497A (en) 1991-09-19 1991-09-19 Wafer drying machine

Country Status (1)

Country Link
JP (1) JPH0582497A (en)

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