JPS63302521A - Drier for semiconductor substrate - Google Patents

Drier for semiconductor substrate

Info

Publication number
JPS63302521A
JPS63302521A JP13848387A JP13848387A JPS63302521A JP S63302521 A JPS63302521 A JP S63302521A JP 13848387 A JP13848387 A JP 13848387A JP 13848387 A JP13848387 A JP 13848387A JP S63302521 A JPS63302521 A JP S63302521A
Authority
JP
Japan
Prior art keywords
drying chamber
chamber
semiconductor substrate
vacuum pump
drying
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP13848387A
Other languages
Japanese (ja)
Inventor
Kazuo Shudo
和夫 首藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP13848387A priority Critical patent/JPS63302521A/en
Publication of JPS63302521A publication Critical patent/JPS63302521A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To improve cleanliness in a drying chamber, and to clean and dry a semiconductor substrate by connecting a vacuum pump decompressing the inside of the drying chamber and evaporating and sucking moisture adhering on the semiconductor substrate to the drying chamber. CONSTITUTION:A vacuum pump 8 decompressing the inside of a chamber 1 and evaporating and sucking moisture adhering on a semiconductor substrate 6 is connected to the sealable semiconductor-substrate drying chamber 1. When wafers 6 after washing are dried, the wafers 6 after washing are set to a cassette housing 7 in the chamber at every cassette 5 under the state in which a door 2 for the drying chamber 1 is opened, and the door 2 is closed. Valves 9 and 12 are closed at that time. When the vacuum pump 8 is started under such a state and the valve 9 is opened, the internal pressure of the drying chamber 1 is decompressed to pressure lower than normal pressure from normal pressure while moisture adhering on the wafers 6 and the cassettes 5 is evaporated by decompression because the inside of the drying chamber 1 is evacuated, and the evaporating moisture is sucked by the vacuum pump 8 and discharged to atmospheric air.

Description

【発明の詳細な説明】 〔産業上の利用分骨〕 この発明は、半導体基板の乾燥装置に関するものである
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application] The present invention relates to a drying apparatus for semiconductor substrates.

〔従来の技術〕[Conventional technology]

従来の半導体基板の乾燥装置を第2図について説明する
。同図において、1は乾燥チャンバ、2はその開閉ドア
、3は乾燥チャンバ1内に設置したモータ、4はモータ
3の回転軸3aに取り付けたカセット支持枠、5は支持
枠4にセットされろ半導体ウニへ収納用のカセットで、
これには多数のウェハ6が収納されている。また上記乾
燥チャンバ1には図示しない送風機に接続される送風口
1a及び排気口1bが形成されている。
A conventional semiconductor substrate drying apparatus will be explained with reference to FIG. In the figure, 1 is a drying chamber, 2 is an opening/closing door thereof, 3 is a motor installed in the drying chamber 1, 4 is a cassette support frame attached to the rotating shaft 3a of the motor 3, and 5 is a cassette set in the support frame 4. A cassette for storage in semiconductor sea urchins.
A large number of wafers 6 are stored in this. Further, the drying chamber 1 is formed with an air outlet 1a and an exhaust port 1b which are connected to an air blower (not shown).

上記のように構成された従来の半導体基板乾燥装置にお
いて、半導体ウェハ6を乾燥する場合は、カセッl−5
内に収納されたウェハ6をカセット5ごと洗浄工程にお
いて、洗浄液により洗浄したものを、ドア2を開いて乾
燥チャンバ1内のカセット支持枠4にセットシ、ドア2
を閉める。その後、モータ3を起動すると共に図示しな
い送風機を起動して乾燥チャンバ1内に清浄な乾燥用エ
ア〜を送風する。従って、モータ3が回転することによ
り、これを一体のカセット支持枠4及びこれにセットさ
れたカセット56回転されるため、ウェハ6に付着した
水分は遠心力により振り切られると同時に、送風される
エアーによってウェハ6ば乾燥されることになる。また
、ウェハ6の乾燥に供すしたエアーは排気口1bからチ
ャンバ1外へ排出される。
In the conventional semiconductor substrate drying apparatus configured as described above, when drying the semiconductor wafer 6, the cassette l-5
In the cleaning process, the wafers 6 stored in the drying chamber 5 are cleaned with a cleaning liquid in the cleaning process, and the wafers 6 are set in the cassette support frame 4 in the drying chamber 1 by opening the door 2.
close. Thereafter, the motor 3 is started and a blower (not shown) is started to blow clean drying air into the drying chamber 1. Therefore, as the motor 3 rotates, the integrated cassette support frame 4 and the cassette 56 set therein are rotated, so that the moisture adhering to the wafer 6 is shaken off by centrifugal force, and at the same time, the blown air The wafer 6 is then dried. Further, the air used for drying the wafer 6 is discharged to the outside of the chamber 1 from the exhaust port 1b.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上記のような従来の半導体基板乾燥装置では、乾燥チャ
ンバ1内にモータ3が設置されているため、モータ3の
駆動に伴い回転部等から発生する摩耗微粒、その他の塵
埃が洗浄ウェハ6に付着され、ウェハ6の洗浄度を低下
させてしまうほか、ウェハ6に付着した塵埃がウェハ上
に形成される素子に重大な悪影響を及ぼす問題があった
In the conventional semiconductor substrate drying apparatus as described above, since the motor 3 is installed in the drying chamber 1, abrasion particles and other dust generated from rotating parts etc. as the motor 3 is driven adhere to the cleaned wafer 6. In addition to reducing the degree of cleaning of the wafer 6, there is a problem in that the dust adhering to the wafer 6 has a serious adverse effect on the elements formed on the wafer.

この発明は、上記のような問題点を解決するためになさ
れたもので、乾燥チャンバ内のクリーン度を向上させ、
半導体基板の清浄乾燥を可能にした半導体基板の乾燥装
置を提供することを目的とする。
This invention was made to solve the above problems, and improves the cleanliness inside the drying chamber.
An object of the present invention is to provide a semiconductor substrate drying device that enables clean drying of semiconductor substrates.

〔問題点を解決するための手段〕[Means for solving problems]

この発明に係る半導体基板の乾燥装置は、乾燥チャンバ
に、その内部を減圧して半導体基板の付着水分を蒸発吸
引する真空ポンプを設けたものである。
In the semiconductor substrate drying apparatus according to the present invention, a drying chamber is provided with a vacuum pump that reduces the pressure inside the drying chamber and evaporates and suctions moisture adhering to the semiconductor substrate.

〔作用〕[Effect]

この発明においては、真空ポンプが駆動されろと、密閉
状態にある乾燥チャンバ内が減圧され、これに伴い半導
体基板等に付着している水分は蒸発シ、ホンプの吸引作
用によってチャンバ外へ排出される。従って、この発明
によれば従来のように外部からエアーを供給したり、或
いはモータのような塵埃発生源がチャンバ内にないため
、チャンバ内を常にクリーンにでき、半導体基板の清浄
乾燥が可能になる。
In this invention, when the vacuum pump is driven, the pressure inside the sealed drying chamber is reduced, and as a result, moisture adhering to semiconductor substrates, etc. is evaporated and discharged outside the chamber by the suction action of the pump. Ru. Therefore, according to this invention, there is no need to supply air from the outside or a dust source such as a motor in the chamber as in the past, so the inside of the chamber can always be kept clean, making it possible to clean and dry semiconductor substrates. Become.

〔実施例〕〔Example〕

以下、この発明の一実施例を第1図について説明する。 An embodiment of the present invention will be described below with reference to FIG.

第1図において、1は乾燥チャンバ、2はその開閉ドア
であり、7は乾燥チャンバ1内に設置したカセット支持
枠である。カセット支持枠7には、半導体ウェハ6を多
段に収納したカ七ン1−5がセットされるようになって
いる。
In FIG. 1, 1 is a drying chamber, 2 is its opening/closing door, and 7 is a cassette support frame installed in the drying chamber 1. In the cassette support frame 7, a cassette 1-5 containing semiconductor wafers 6 in multiple stages is set.

また、8は上記乾燥チャンバ1にバルブ9を介して接続
した真空ポンプで、その排気側には排気管10を介して
大気に開放されている。11は清浄空気又は窒素ガス(
N2)等をチャンバ1内に導入するため、チャンバ1に
接続した気体導入管で、この導入管11の途中にはバル
ブ12が設けられている。
A vacuum pump 8 is connected to the drying chamber 1 through a valve 9, and its exhaust side is open to the atmosphere through an exhaust pipe 10. 11 is clean air or nitrogen gas (
In order to introduce N2), etc. into the chamber 1, a gas introduction pipe is connected to the chamber 1, and a valve 12 is provided in the middle of this introduction pipe 11.

次に、上記のように構成された本実施例の乾燥装置の動
作について説明する。
Next, the operation of the drying apparatus of this embodiment configured as described above will be explained.

洗浄後のウェハ6を乾燥する場合は、乾燥チャンバ1の
ドア2を開いた状態で、洗浄後のウェハ6をカセット5
ごとチャンバ内のカセット支持枠7にセットし、ドア2
を閉じる。この時バルブ9及び12は閉成されている。
When drying the cleaned wafer 6, the cleaned wafer 6 is placed in the cassette 5 with the door 2 of the drying chamber 1 open.
Place the entire cassette on the cassette support frame 7 in the chamber, and close the door 2.
Close. At this time, valves 9 and 12 are closed.

かかる状態で真空ポンプ8を起動し、バルブ9を開くと
乾燥チャンバ1内は真空引きされるため、その内部圧力
は常圧(780torr)からそれ以下に減圧されると
共に、減圧によってウェハ6及びカセット5に付着して
いる水分が蒸発し、この蒸発水分は真空ポンプ8により
吸引され大気へ排出される。これによりウェハ6はクリ
ーンな雰囲気で乾燥されることになる。
In this state, when the vacuum pump 8 is started and the valve 9 is opened, the inside of the drying chamber 1 is evacuated, so that the internal pressure is reduced from normal pressure (780 torr) to below, and the wafers 6 and cassettes are The water adhering to 5 evaporates, and this evaporated water is sucked by vacuum pump 8 and discharged to the atmosphere. As a result, the wafer 6 is dried in a clean atmosphere.

また、乾燥終了後のウェハ6をチャンバ1から取出す場
合は、バルブ9を閉め、且つバルブ12を開いて窒素ガ
スあるいは清浄空気を導入管11からチャンバ1内に導
入し、チャンバ1内を常圧にする。この状態でドア2を
開き、カセッl−5を取出せば良い。
In addition, when taking out the wafer 6 from the chamber 1 after drying, close the valve 9 and open the valve 12 to introduce nitrogen gas or clean air into the chamber 1 from the introduction pipe 11 to maintain the inside of the chamber 1 at normal pressure. Make it. In this state, open the door 2 and take out the cassette 1-5.

なお、減圧乾燥後にチャンバ1内を常圧に戻す手段とし
ては、上記実施例に示す方式のものに限定されない。
Note that the means for returning the inside of the chamber 1 to normal pressure after drying under reduced pressure is not limited to the method shown in the above embodiment.

〔発明の効果〕〔Effect of the invention〕

以上のように、この発明によ尤ば密閉可能な半導体基板
乾燥用チャンバに真空ポンプを接続し、この真空ポンプ
を起動してチャンバ内を減圧することにより、チャンバ
内の洗浄後の半導体基板を乾燥させるようにしたもので
あるから、チャンバ内のクリーン度を向上でき、半導体
基板を清?′p乾燥できる効果がある。
As described above, according to the present invention, a vacuum pump is connected to a sealable semiconductor substrate drying chamber, and the vacuum pump is started to reduce the pressure inside the chamber, thereby drying the semiconductor substrate inside the chamber after cleaning. Since it is designed to dry, it can improve the cleanliness inside the chamber and keep the semiconductor substrate clean. It has a drying effect.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明に係る半導体基板乾燥装置の一例を示
す概略断面図、第2図は従来の半導体基板乾燥装置の概
略断面図である。 1・・乾燥チャンバ、2 ・ドア、5−・カセット、6
 半導体ウェハ、7・カセット支持枠、8・真空ポンプ
、9.12−・バルブ。 なお、図中同一符号は同−又は相当部分を示す。
FIG. 1 is a schematic sectional view showing an example of a semiconductor substrate drying apparatus according to the present invention, and FIG. 2 is a schematic sectional view of a conventional semiconductor substrate drying apparatus. 1.Drying chamber, 2.Door, 5-.Cassette, 6
Semiconductor wafer, 7. Cassette support frame, 8. Vacuum pump, 9.12-.Valve. Note that the same reference numerals in the figures indicate the same or equivalent parts.

Claims (1)

【特許請求の範囲】[Claims] 密閉可能な半導体基板乾燥用チャンバに、その内部を減
圧して半導体基板の付着水分を蒸発吸引する真空ポンプ
を接続したことを特徴とする半導体基板の乾燥装置。
1. A semiconductor substrate drying apparatus, characterized in that a vacuum pump is connected to a sealable semiconductor substrate drying chamber to reduce the pressure inside the chamber and evaporate and suction moisture adhering to the semiconductor substrate.
JP13848387A 1987-06-02 1987-06-02 Drier for semiconductor substrate Pending JPS63302521A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP13848387A JPS63302521A (en) 1987-06-02 1987-06-02 Drier for semiconductor substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP13848387A JPS63302521A (en) 1987-06-02 1987-06-02 Drier for semiconductor substrate

Publications (1)

Publication Number Publication Date
JPS63302521A true JPS63302521A (en) 1988-12-09

Family

ID=15223138

Family Applications (1)

Application Number Title Priority Date Filing Date
JP13848387A Pending JPS63302521A (en) 1987-06-02 1987-06-02 Drier for semiconductor substrate

Country Status (1)

Country Link
JP (1) JPS63302521A (en)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0336729A (en) * 1989-07-03 1991-02-18 Hanami Kagaku Kk Drying method and device therefor
WO1992020984A1 (en) * 1991-05-24 1992-11-26 Nikku Industry Co., Ltd. Vacuum drying apparatus
US5293697A (en) * 1991-12-26 1994-03-15 Nikku Industry Co., Ltd. Vacuum drying apparatus
EP0924487A3 (en) * 1997-12-19 1999-07-07 Wacker-Chemie GmbH Vacuum drying of semiconductor material
US6261007B1 (en) * 1998-07-29 2001-07-17 Tokyo Electron Limited Substrate process method and substrate process apparatus
JP2009507678A (en) * 2005-09-12 2009-02-26 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッド Apparatus and method for venting a lens mold part
JP2018048792A (en) * 2016-09-23 2018-03-29 東京エレクトロン株式会社 Decompression drying system and decompression drying method

Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0336729A (en) * 1989-07-03 1991-02-18 Hanami Kagaku Kk Drying method and device therefor
WO1992020984A1 (en) * 1991-05-24 1992-11-26 Nikku Industry Co., Ltd. Vacuum drying apparatus
US5377425A (en) * 1991-05-24 1995-01-03 Nikku Industry Co., Ltd. Vacuum drying apparatus
US5293697A (en) * 1991-12-26 1994-03-15 Nikku Industry Co., Ltd. Vacuum drying apparatus
EP0924487A3 (en) * 1997-12-19 1999-07-07 Wacker-Chemie GmbH Vacuum drying of semiconductor material
US6170171B1 (en) 1997-12-19 2001-01-09 Wacker-Chemie Gmbh Vacuum drying of semiconductor fragments
US6261007B1 (en) * 1998-07-29 2001-07-17 Tokyo Electron Limited Substrate process method and substrate process apparatus
US6443641B2 (en) 1998-07-29 2002-09-03 Tokyo Electron Limited Substrate process method and substrate process apparatus
JP2009507678A (en) * 2005-09-12 2009-02-26 ジョンソン・アンド・ジョンソン・ビジョン・ケア・インコーポレイテッド Apparatus and method for venting a lens mold part
JP2018048792A (en) * 2016-09-23 2018-03-29 東京エレクトロン株式会社 Decompression drying system and decompression drying method

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