JPH0580101B2 - - Google Patents
Info
- Publication number
- JPH0580101B2 JPH0580101B2 JP58094665A JP9466583A JPH0580101B2 JP H0580101 B2 JPH0580101 B2 JP H0580101B2 JP 58094665 A JP58094665 A JP 58094665A JP 9466583 A JP9466583 A JP 9466583A JP H0580101 B2 JPH0580101 B2 JP H0580101B2
- Authority
- JP
- Japan
- Prior art keywords
- sample
- field emission
- current
- emission electrode
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000010894 electron beam technology Methods 0.000 claims description 12
- 238000001514 detection method Methods 0.000 claims description 8
- 230000003321 amplification Effects 0.000 claims description 6
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 6
- 230000035945 sensitivity Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 238000004458 analytical method Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/244—Detectors; Associated components or circuits therefor
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Measurement Of Radiation (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58094665A JPS59219844A (ja) | 1983-05-27 | 1983-05-27 | 電子線照射型分析装置の試料電流検出装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58094665A JPS59219844A (ja) | 1983-05-27 | 1983-05-27 | 電子線照射型分析装置の試料電流検出装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59219844A JPS59219844A (ja) | 1984-12-11 |
JPH0580101B2 true JPH0580101B2 (ko) | 1993-11-05 |
Family
ID=14116541
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58094665A Granted JPS59219844A (ja) | 1983-05-27 | 1983-05-27 | 電子線照射型分析装置の試料電流検出装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS59219844A (ko) |
-
1983
- 1983-05-27 JP JP58094665A patent/JPS59219844A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS59219844A (ja) | 1984-12-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Daly | Scintillation type mass spectrometer ion detector | |
US4785182A (en) | Secondary electron detector for use in a gaseous atmosphere | |
US6118125A (en) | Method and a device for planar beam radiography and a radiation detector | |
US4880976A (en) | Secondary electron detector for use in a gaseous atmosphere | |
JPS6334588B2 (ko) | ||
TWI399780B (zh) | 包含場發射陰極之x射線源 | |
US3538328A (en) | Scintillation-type ion detector employing a secondary emitter target surrounding the ion path | |
JP3170680B2 (ja) | 電界磁気レンズ装置及び荷電粒子線装置 | |
JPH0586020B2 (ko) | ||
JP2003536080A (ja) | 放射線検出装置及び方法 | |
US3381132A (en) | Electron detector for selectively detecting secondary electrons and high-energy reflected electrons | |
JPH0580101B2 (ko) | ||
US4595834A (en) | Low parallax error radiation detector | |
US3783281A (en) | Electron microscope | |
JP4146103B2 (ja) | 電界放射型電子銃を備えた電子ビーム装置 | |
JPS5854783Y2 (ja) | 走査電子顕微鏡 | |
WO2024048759A1 (ja) | 検出装置及び放射線特定装置 | |
JPH09189541A (ja) | 浮上すきま測定方法及び装置 | |
JPH057820B2 (ko) | ||
JPH08321275A (ja) | 二次荷電粒子検出装置 | |
JPH05333158A (ja) | 放射線検出装置 | |
JPS5912553A (ja) | 電子線装置 | |
JPS58115383A (ja) | 反射電子検出器 | |
JPH0321002Y2 (ko) | ||
JPH082603Y2 (ja) | X線分析装置 |