JPH0579954B2 - - Google Patents

Info

Publication number
JPH0579954B2
JPH0579954B2 JP82230882A JP23088282A JPH0579954B2 JP H0579954 B2 JPH0579954 B2 JP H0579954B2 JP 82230882 A JP82230882 A JP 82230882A JP 23088282 A JP23088282 A JP 23088282A JP H0579954 B2 JPH0579954 B2 JP H0579954B2
Authority
JP
Japan
Prior art keywords
circuit
pulse width
waveform shaping
pulse
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP82230882A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59122987A (ja
Inventor
Mitsuhiro Tanaka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP23088282A priority Critical patent/JPS59122987A/ja
Publication of JPS59122987A publication Critical patent/JPS59122987A/ja
Publication of JPH0579954B2 publication Critical patent/JPH0579954B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/17—Circuit arrangements not adapted to a particular type of detector

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Radiation (AREA)
JP23088282A 1982-12-29 1982-12-29 放射線パルス測定回路 Granted JPS59122987A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23088282A JPS59122987A (ja) 1982-12-29 1982-12-29 放射線パルス測定回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23088282A JPS59122987A (ja) 1982-12-29 1982-12-29 放射線パルス測定回路

Publications (2)

Publication Number Publication Date
JPS59122987A JPS59122987A (ja) 1984-07-16
JPH0579954B2 true JPH0579954B2 (enExample) 1993-11-05

Family

ID=16914779

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23088282A Granted JPS59122987A (ja) 1982-12-29 1982-12-29 放射線パルス測定回路

Country Status (1)

Country Link
JP (1) JPS59122987A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2536234Y2 (ja) * 1986-09-11 1997-05-21 株式会社 堀場製作所 シンチレーシヨン検出器
JP4160275B2 (ja) * 2001-05-28 2008-10-01 浜松ホトニクス株式会社 エネルギー測定方法及び測定装置
JP4178232B2 (ja) * 2003-02-28 2008-11-12 独立行政法人放射線医学総合研究所 入射位置検出装置
IT1400679B1 (it) * 2010-07-05 2013-06-28 Dall Oglio Dispositivo per la modificazione di forma e la riduzione della durata degli impulsi di corrente generati da singoli fotoni nei rivelatori di luce di vario tipo quali fotomoltiplicatori.
JP7040156B2 (ja) * 2018-03-15 2022-03-23 富士電機株式会社 放射線測定装置
CN110941007B (zh) * 2018-09-25 2022-02-08 北京超分科技有限公司 核能谱的处理方法和设备

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5329787A (en) * 1976-08-31 1978-03-20 Kagaku Gijutsucho Hoshasen Igaku Sogo Kenkyusho Measuring device for radiation

Also Published As

Publication number Publication date
JPS59122987A (ja) 1984-07-16

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