JPH0574614A - Manufacture of ceramic electronic component - Google Patents
Manufacture of ceramic electronic componentInfo
- Publication number
- JPH0574614A JPH0574614A JP3234557A JP23455791A JPH0574614A JP H0574614 A JPH0574614 A JP H0574614A JP 3234557 A JP3234557 A JP 3234557A JP 23455791 A JP23455791 A JP 23455791A JP H0574614 A JPH0574614 A JP H0574614A
- Authority
- JP
- Japan
- Prior art keywords
- plating
- paraffin
- ceramic
- electronic component
- ceramic electronic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Abstract
Description
【0001】[0001]
【産業上の利用分野】本発明はセラミック電子部品の製
造方法、より詳細には無電解Niメッキ法を用いて作製さ
れる正特性サーミスタ等のセラミック電子部品の製造方
法に関する。BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method for manufacturing a ceramic electronic component, and more particularly to a method for manufacturing a ceramic electronic component such as a positive temperature coefficient thermistor manufactured by using an electroless Ni plating method.
【0002】[0002]
【従来の技術及び発明が解決しようとする課題】一般に
正特性サーミスタに使用される電極は良好なオーミック
コンタクトが得られ、また安価な電極が得られるため、
無電解メッキ法によるNi電極が多用されている。2. Description of the Related Art Generally, an electrode used for a positive temperature coefficient thermistor has good ohmic contact and an inexpensive electrode.
Ni electrodes by electroless plating are often used.
【0003】無電解メッキ法によると、Niメッキは半導
体磁器の全面に形成されるため、半導体磁器側面に形成
されたNiメッキを除去する必要がある。通常は研磨によ
り半導体磁器の外周側面を削り取っているが、近年、正
特性サーミスタ素子等の小型化が進むにつれ、素子厚み
も薄くなり、外周側面の研磨の際欠けやクラックを生
じ、歩留まりや信頼性に問題が生じるという課題があっ
た。According to the electroless plating method, since Ni plating is formed on the entire surface of the semiconductor ceramic, it is necessary to remove the Ni plating formed on the side surface of the semiconductor ceramic. Normally, the outer peripheral surface of semiconductor porcelain is shaved off by polishing, but in recent years, as the size of positive temperature coefficient thermistor elements etc. has progressed, the element thickness has become thinner, resulting in chipping and cracking during polishing of the outer peripheral surface. There was a problem that there was a problem with sex.
【0004】また外周側面を研磨しない方法として、Ni
メッキが半導体磁器側面に形成されないように、テープ
や有機材料でマスキングしてからNiメッキを施す方法が
あるが、この方法では、マスク材を除去せずにそのまま
にしておくとNiメッキした後の半導体磁器とNiメッキと
の接着強度を高めるために行う熱処理により、マスク材
が半導体磁器に焼きついてしまう。従って、前記熱処理
の前にマスク材の剥離工程が必要となり、作業時間がか
かるという課題もあった。As a method of not polishing the outer peripheral side surface, Ni
There is a method of applying Ni plating after masking with tape or organic material so that plating is not formed on the side surface of semiconductor porcelain, but with this method, if the mask material is left as it is without removing it, The mask material is burned onto the semiconductor porcelain by the heat treatment performed to increase the adhesive strength between the semiconductor porcelain and the Ni plating. Therefore, there is a problem that a mask material peeling step is required before the heat treatment, which requires a long working time.
【0005】本発明は上記した課題に鑑み発明されたも
のであって、半導体磁器側面にNiメッキを形成すること
なく、また歩留まり及び信頼性の高い正特性サーミスタ
等の素子を製造することができるセラミック電子部品の
製造方法を提供することを目的としている。The present invention has been invented in view of the above problems, and it is possible to manufacture an element such as a positive temperature coefficient thermistor having a high yield and reliability without forming Ni plating on the side surface of a semiconductor ceramic. It is an object to provide a method for manufacturing a ceramic electronic component.
【0006】[0006]
【課題を解決するための手段】上記目的を達成するため
に本発明に係るセラミック電子部品の製造方法は、円柱
状の半導体磁器の側面をパラフィンで被覆して無電解Ni
メッキ法により前記半導体磁器の両平面部にNiメッキ電
極を形成し、この後熱処理を施すことを特徴としてい
る。In order to achieve the above object, a method of manufacturing a ceramic electronic component according to the present invention is a method of coating a side surface of a cylindrical semiconductor ceramic with paraffin to form electroless Ni.
It is characterized in that Ni-plated electrodes are formed on both planes of the semiconductor porcelain by a plating method, and then heat treatment is performed.
【0007】半導体磁器側面にNiメッキが形成されるこ
とを容易に阻止するためには、剥離が簡単であるマスク
材の開発が必要である。そこで、本発明者はNiメッキし
た後、半導体磁器とNi電極との接着性を高めるために行
う熱処理工程において、マスク材が同時に除去され、剥
離工程を必要としないようなマスク材について種々検討
した結果、低温で溶融、蒸発するとともに、半導体磁器
に対して無害であるパラフィンが有用であることを知見
し、本発明を完成するに至った。また、パラフィンは5
0℃以上では溶融し、50℃以下では硬化するため、操
作性が良好であるという利点を有している。In order to easily prevent Ni plating from being formed on the side surface of the semiconductor porcelain, it is necessary to develop a mask material that can be easily peeled off. Therefore, the present inventor has variously studied the mask material such that the mask material is removed at the same time in the heat treatment step performed to improve the adhesion between the semiconductor ceramic and the Ni electrode after Ni plating, and the peeling step is not required. As a result, they have found that paraffin, which melts and evaporates at low temperature and is harmless to semiconductor porcelain, is useful, and has completed the present invention. Also, paraffin is 5
Since it melts at 0 ° C or higher and hardens at 50 ° C or lower, it has the advantage of good operability.
【0008】[0008]
【作用】上記した方法によれば、円柱状の半導体磁器の
側面をパラフィンで被覆して無電解Niメッキ法により前
記半導体磁器の両平面部にNiメッキ電極を形成し、この
後熱処理を施すので、Niメッキのマスク材である前記パ
ラフィンにより前記半導体磁器側面に前記Niメッキが形
成されることが容易に回避されるとともに、前記熱処理
工程中に同時に前記パラフィンが蒸発することにより、
前記パラフィンを除去するための特別の工程を必要とせ
ず、歩留まり及び信頼性の高いセラミック電子部品が製
造されることとなる。According to the above-mentioned method, the side surface of the cylindrical semiconductor porcelain is coated with paraffin, the Ni-plated electrodes are formed on both planes of the semiconductor porcelain by the electroless Ni plating method, and then the heat treatment is performed. The Ni plating mask material for the paraffin is easily avoided from forming the Ni plating on the side surface of the semiconductor porcelain, and the paraffin is evaporated at the same time during the heat treatment step.
A ceramic electronic component having high yield and high reliability can be manufactured without requiring a special process for removing the paraffin.
【0009】[0009]
【実施例】以下本発明に係るセラミック電子部品の製造
方法の実施例を説明する。まず半導体磁器の原料とし
て、100 molの(Ba0.9Sr0.1)TiO3に対し、MnO2を0.
05 mol、 TiO2 を1.0 mol、SiO2を1.0 mol、Nb
2O5 を0.1 mol添加して混合し、仮焼した後成形し、
1350℃の温度で2時間本焼成を行い、直径12m
m、厚み0.4mmの円板状の半導体磁器を得た。EXAMPLES Examples of the method for manufacturing a ceramic electronic component according to the present invention will be described below. First, as a raw material for semiconductor porcelain, 100 mol of (Ba 0.9 Sr 0.1 ) TiO 3 was mixed with MnO 2 in an amount of 0.
05 mol, TiO 2 1.0 mol, SiO 2 1.0 mol, Nb
0.1 mol of 2 O 5 was added and mixed, calcined and then molded,
Main firing at a temperature of 1350 ° C for 2 hours, diameter 12m
A disc-shaped semiconductor porcelain having a thickness of m and a thickness of 0.4 mm was obtained.
【0010】この半導体磁器の側面に70℃で溶融した
パラフィンを塗布し、硬化させた後、Niメッキ前処理液
に浸漬する。その後、パラフィンが塗布された半導体磁
器をNiメッキ液に、例えば室温で30分程度、浸漬する
ことによって無電解Niメッキを行い、半導体磁器の両平
面部にNiメッキ電極を形成し、次いで400℃で熱処理
を行い、パラフィンを蒸発させるとともにNiメッキと半
導体磁器との接着強度を強固なものとした。この際、Ni
メッキの厚みは約2μmであった。その後、銀ペースト
を印刷、焼成し、リード線の半田付けを行った。Paraffin melted at 70 ° C. is applied to the side surface of this semiconductor porcelain and hardened, and then immersed in a Ni plating pretreatment liquid. Then, electroless Ni plating is performed by immersing the paraffin-coated semiconductor porcelain in a Ni plating solution for about 30 minutes at room temperature to form Ni-plated electrodes on both planes of the semiconductor porcelain, and then at 400 ° C. In order to evaporate the paraffin, the adhesive strength between the Ni plating and the semiconductor porcelain was strengthened. At this time, Ni
The plating thickness was about 2 μm. Then, a silver paste was printed and fired, and the lead wire was soldered.
【0011】このようにして得られた正特性サーミスタ
の歩留まりと、半導体磁器の外周面を研磨することによ
ってNiメッキを除去する方法で得られた正特性サーミス
タの歩留まりとをそれぞれ100個づつ調査した。その
結果を表1に示す。The yield of the positive temperature coefficient thermistor thus obtained and the yield of the positive temperature coefficient thermistor obtained by the method of removing the Ni plating by polishing the outer peripheral surface of the semiconductor porcelain were investigated 100 each. .. The results are shown in Table 1.
【0012】[0012]
【表1】 [Table 1]
【0013】従来のセラミック電子部品の全面にNiメ
ッキした後外周側面を研磨する方法においては研磨によ
り欠けやクラックが発生し、耐圧不良が生じ、歩留まり
は91%であった。一方本実施例によるセラミック電子
部品の製造方法においては欠けやクラックが発生せず、
歩留まりは100%となり著しい効果が得られた。In the conventional method in which the entire surface of the ceramic electronic component is plated with Ni and then the outer peripheral side surface is polished, chips and cracks are generated by polishing, a withstand voltage defect occurs, and the yield is 91%. On the other hand, in the method for manufacturing a ceramic electronic component according to this example, no chipping or cracking occurred,
The yield was 100%, and a remarkable effect was obtained.
【0014】なお、上記実施例において、半導体磁器の
側面にパラフィンを塗布し、硬化させた後、Niメッキ前
処理液に浸漬する方法について説明しているが、Ni前処
理液に浸漬した後にパラフィンを塗布しても同様の効果
が得られる。また、半導体磁器にNiメッキ電極を形成
し、熱処理を施してパラフィンを蒸発させた場合につい
て説明しているが、半導体磁器にNiメッキ電極を形成し
た後、銀ペーストの焼成と同時にパラフィンを蒸発さ
せ、Niメッキと半導体磁器との接着強度を強固なものと
してもよい。さらに、無電解Niメッキを行う際、Niメッ
キ液に室温で30分程度浸漬する場合について説明して
いるが、Niメッキの厚さやNiメッキ液の温度により含浸
時間を変化させることが望しい。In the above embodiments, the method of applying paraffin to the side surface of the semiconductor porcelain and curing it and immersing it in the Ni plating pretreatment liquid is explained. The same effect can be obtained by applying. Also, the case where a Ni-plated electrode is formed on a semiconductor porcelain and heat treatment is applied to evaporate the paraffin is explained.However, after the Ni-plated electrode is formed on the semiconductor porcelain, the paraffin is evaporated at the same time as the firing of the silver paste. The adhesion strength between the Ni plating and the semiconductor porcelain may be strong. Furthermore, when performing electroless Ni plating, the case of immersing in a Ni plating solution at room temperature for about 30 minutes has been described, but it is desirable to change the impregnation time depending on the thickness of the Ni plating and the temperature of the Ni plating solution.
【0015】[0015]
【発明の効果】以上詳述したように本発明に係るセラミ
ック電子部品の製造方法にあっては、円柱状の半導体磁
器の側面をパラフィンで被覆して無電解Niメッキ法によ
り前記半導体磁器の両平面部にNiメッキ電極を形成し、
この後熱処理を施すので、Niメッキのマスク材である前
記パラフィンにより前記半導体磁器側面に前記Niメッキ
が形成されることを容易に回避することができるととも
に、前記熱処理工程中に同時に前記パラフィンが蒸発す
ることにより、前記パラフィンを除去するための特別の
工程を必要とせず、歩留まり及び信頼性の高いセラミッ
ク電子部品を製造することができる。As described above in detail, in the method for manufacturing a ceramic electronic component according to the present invention, the side surface of a cylindrical semiconductor ceramic is coated with paraffin and both sides of the semiconductor ceramic are electrolessly plated by electroless Ni plating. Form a Ni-plated electrode on the flat surface,
Since heat treatment is performed after this, it is possible to easily avoid the formation of the Ni plating on the side surface of the semiconductor porcelain by the paraffin that is the Ni plating mask material, and at the same time, the paraffin is evaporated during the heat treatment process. By doing so, it is possible to manufacture a ceramic electronic component with high yield and reliability without requiring a special process for removing the paraffin.
Claims (1)
で被覆して無電解Niメッキ法により前記半導体磁器の両
平面部にNiメッキ電極を形成し、この後熱処理を施すこ
とを特徴とするセラミック電子部品の製造方法。1. A ceramic which is characterized in that the side surface of a cylindrical semiconductor ceramic is coated with paraffin, Ni plated electrodes are formed on both planes of the semiconductor ceramic by electroless Ni plating, and then heat treatment is performed. Manufacturing method of electronic parts.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3234557A JPH0574614A (en) | 1991-09-13 | 1991-09-13 | Manufacture of ceramic electronic component |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3234557A JPH0574614A (en) | 1991-09-13 | 1991-09-13 | Manufacture of ceramic electronic component |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0574614A true JPH0574614A (en) | 1993-03-26 |
Family
ID=16972891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3234557A Pending JPH0574614A (en) | 1991-09-13 | 1991-09-13 | Manufacture of ceramic electronic component |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0574614A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009515367A (en) * | 2005-11-09 | 2009-04-09 | 謝 清雄 | Manufacturing method of surface mount type precision resistor |
-
1991
- 1991-09-13 JP JP3234557A patent/JPH0574614A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009515367A (en) * | 2005-11-09 | 2009-04-09 | 謝 清雄 | Manufacturing method of surface mount type precision resistor |
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