JPH0573796A - Relay scanner device - Google Patents

Relay scanner device

Info

Publication number
JPH0573796A
JPH0573796A JP23175891A JP23175891A JPH0573796A JP H0573796 A JPH0573796 A JP H0573796A JP 23175891 A JP23175891 A JP 23175891A JP 23175891 A JP23175891 A JP 23175891A JP H0573796 A JPH0573796 A JP H0573796A
Authority
JP
Japan
Prior art keywords
relay
contact
voltage
contacts
selectively
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP23175891A
Other languages
Japanese (ja)
Inventor
Tatsu Akai
達 赤井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yokogawa Electric Corp
Original Assignee
Yokogawa Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Electric Corp filed Critical Yokogawa Electric Corp
Priority to JP23175891A priority Critical patent/JPH0573796A/en
Publication of JPH0573796A publication Critical patent/JPH0573796A/en
Pending legal-status Critical Current

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  • Arrangements For Transmission Of Measured Signals (AREA)
  • Selective Calling Equipment (AREA)
  • Interface Circuits In Exchanges (AREA)

Abstract

PURPOSE:To reduce the defective contact due to formation of an insulating film in the contact part of a relay by providing a voltage applying system which selectively applies a prescribed voltage to the contact of each relay. CONSTITUTION:Relays 2, 11, and 12 are selectively turned on/off in accordance with the indication of a CPU 7 by a selector 3. For example, a contact (a) of the relay 2 is turned on when two contacts of the contact (a) are cleaned. A contact (a) of the relay 12 and a contact H of the relay 11 are simultaneously driven at the time of cleaning one contact. A contact (b) of the relay 12 and a contact L of the relay 11 are simultaneously driven at the time of cleaning the other. Thus, a close loop circuit consisting of turned-on contacts, a DC voltage source 9, and a resistance 10 is formed. As the result, a prescribed voltage is selectively applied to contacts of the relay 2 to break down the insulating film formed on the surface of contacts.

Description

【発明の詳細な説明】Detailed Description of the Invention

【0001】[0001]

【産業上の利用分野】本発明はリレースキャナ装置に関
し、更に詳しくは、リレーの接点の接触抵抗の影響の軽
減に関する。
BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a relay scanner device, and more particularly to reducing the influence of contact resistance of relay contacts.

【0002】[0002]

【従来の技術】リレースキャナ装置は、1台の測定器で
多数の測定点の電圧信号を測定する場合等に広く用いら
れている。
2. Description of the Related Art A relay scanner device is widely used for measuring voltage signals at a large number of measuring points with one measuring device.

【0003】図3は従来のリレースキャナ装置の一例の
構成図である。図において、1は多数の測定点CH1〜
CHNに対応して設けられているN組の入力端子であ
り、対応したN個のリレー2の入力端子にそれぞれ接続
されている。これらリレー2の制御端子にはセレクタ3
の対応した出力端子がそれぞれ接続されている。これら
リレー2の出力端子はプリアンプ4の入力端子に共通に
接続されている。該プリアンプ4の出力端子はA/D変
換器5の入力端子に接続されている。該A/D変換器5
の出力端子はフォトカプラ6を介してCPU7の入力端
子に接続されている。そして、CPU7の出力端子の一
部はフォトカプラ8を介してセレクタ3の制御端子に接
続されている。
FIG. 3 is a block diagram of an example of a conventional relay scanner device. In the figure, 1 is a large number of measurement points CH1.
These are N sets of input terminals provided corresponding to CHN, and are connected to the corresponding input terminals of N relays 2. The control terminal of these relays 2 has a selector 3
The corresponding output terminals of are respectively connected. The output terminals of these relays 2 are commonly connected to the input terminals of the preamplifier 4. The output terminal of the preamplifier 4 is connected to the input terminal of the A / D converter 5. The A / D converter 5
The output terminal of is connected to the input terminal of the CPU 7 through the photocoupler 6. A part of the output terminal of the CPU 7 is connected to the control terminal of the selector 3 via the photo coupler 8.

【0004】このような構成において、CPU7はフォ
トカプラ8を介してセレクタ3にどの入力端子1に対応
したリレー2を選択的にオンにするかの指示を与える。
選択されたリレー2がオンになると、対応する入力端子
1に入力されている電圧信号がプリアンプ4に加えられ
てA/D変換器5が変換可能な電圧レベルになるように
増幅される。A/D変換器5に入力された電圧信号はデ
ィジタルデータに変換され、フォトカプラ6を介してC
PU7に取り込まれて必要なディジタル処理が行われ
る。
In such a configuration, the CPU 7 gives an instruction via the photocoupler 8 to the selector 3 which input terminal 1 corresponds to which relay 2 to selectively turn on.
When the selected relay 2 is turned on, the voltage signal input to the corresponding input terminal 1 is applied to the preamplifier 4 and amplified so that the voltage level can be converted by the A / D converter 5. The voltage signal input to the A / D converter 5 is converted into digital data and is converted to C via the photo coupler 6.
It is taken into PU7 and required digital processing is performed.

【0005】[0005]

【発明が解決しようとする課題】しかし、このような従
来のリレースキャナ装置では、リレー2の接点の表面に
緑青が発生したり不純物が付着して絶縁被膜が形成され
て接触抵抗が大きくなると、電圧信号の電圧レベルが低
い場合には安定した測定が行えなくなるという問題があ
る。
However, in such a conventional relay scanner device, if patina is generated on the surface of the contact of the relay 2 or impurities adhere to form an insulating film, the contact resistance increases. There is a problem that stable measurement cannot be performed when the voltage level of the voltage signal is low.

【0006】本発明はこのような問題点に鑑みてなされ
たものであり、その目的は、リレーの接点部分に絶縁被
膜が形成されることによる接触不良を改善できるリレー
スキャナ装置を提供することにある。
The present invention has been made in view of the above problems, and an object thereof is to provide a relay scanner device capable of improving contact failure due to formation of an insulating coating on a contact portion of a relay. is there.

【0007】[0007]

【課題を解決するための手段】本発明に係るリレースキ
ャナ装置は、複数の測定信号をそれぞれリレーを介して
選択的に出力するリレースキャナ装置において、各リレ
ーの入力側に接点の表面に形成される絶縁被膜を電気的
に破壊するための電圧を選択的に印加する電圧印加系統
を設けたことを特徴とする。
SUMMARY OF THE INVENTION A relay scanner device according to the present invention is a relay scanner device which selectively outputs a plurality of measurement signals via relays, and is formed on the surface of a contact on the input side of each relay. It is characterized in that a voltage application system for selectively applying a voltage for electrically destroying the insulating coating is provided.

【0008】[0008]

【作用】絶縁被膜が形成された接点に電圧印加系統を介
して電圧を印加することにより絶縁被膜は破壊されて接
点の接触抵抗は小さくなり、電圧レベルが低い電圧信号
でも安定した測定が行える。
By applying a voltage to the contact having the insulating coating through the voltage applying system, the insulating coating is destroyed and the contact resistance of the contact is reduced, and stable measurement can be performed even with a voltage signal having a low voltage level.

【0009】[0009]

【実施例】以下、図面を参照して、本発明の実施例を詳
細に説明する。図1は本発明の一実施例の構成図であ
り、図3と同一のものには同一の参照番号を付けてそれ
らの説明は省略する。図1において、9は直流電圧源で
あり、負極性端子は抵抗10を介してリレー11の接点
H,Lの一端に接続され、正極性端子はリレー12の複
数の接点a〜2nの一端に接続されている。リレー11
の接点Hの他端はプリアンプ4の一方の入力端子に接続
され、リレー11の接点Lの他端はプリアンプ4の他方
の入力端子に接続されている。リレー12の接点a〜2
nの他端は対応したリレー2の接点a〜nの入力側に接
続されている。これら各リレー11,12もリレー2と
同様にCPU7の指示に従ってセレクタ3により選択的
にオン,オフ駆動される。
Embodiments of the present invention will now be described in detail with reference to the drawings. FIG. 1 is a block diagram of an embodiment of the present invention. The same parts as those in FIG. 3 are designated by the same reference numerals and their description will be omitted. In FIG. 1, reference numeral 9 denotes a DC voltage source, a negative terminal is connected to one end of contacts H and L of a relay 11 via a resistor 10, and a positive terminal is connected to one end of a plurality of contacts a to 2n of a relay 12. It is connected. Relay 11
The other end of the contact H is connected to one input terminal of the preamplifier 4, and the other end of the contact L of the relay 11 is connected to the other input terminal of the preamplifier 4. Contact points a to 2 of relay 12
The other end of n is connected to the input side of the contacts a to n of the corresponding relay 2. Similarly to the relay 2, these relays 11 and 12 are selectively turned on and off by the selector 3 according to the instruction of the CPU 7.

【0010】図2は図1の動作を説明するタイミングチ
ャートである。図1の動作は、リレー2を選択的にオ
ン,オフ駆動して入力端子1に入力されている電圧信号
を測定する測定モードと、リレー11,12の各接点を
選択的にオン,オフ駆動してリレー2の接点a〜nの入
力側に電圧を印加することによりリレー2の接点a〜n
のクリーニングを行うリレー接点クリーニングモードに
分けられる。
FIG. 2 is a timing chart for explaining the operation of FIG. The operation of FIG. 1 is a measurement mode in which the relay 2 is selectively turned on and off to measure the voltage signal input to the input terminal 1, and the contacts of the relays 11 and 12 are selectively turned on and off. Then, by applying a voltage to the input side of the contacts a to n of the relay 2, the contacts a to n of the relay 2 are applied.
It is divided into relay contact cleaning mode for cleaning.

【0011】すなわち、測定モードでは、リレー2の接
点a〜nは図2(A)〜(C)のようにいずれか1組が
選択的にオン駆動されるが、リレー11,12の各接点
は図2(D)〜(K)のようにその間全てオフに保たれ
る。
That is, in the measurement mode, any one of the contacts a to n of the relay 2 is selectively turned on as shown in FIGS. 2A to 2C, but each contact of the relays 11 and 12 is driven. Are all kept off during that time, as shown in FIGS.

【0012】一方、リレー接点クリーニングモードで
は、各リレー2,11,12のいずれかの接点が同時に
選択的にオン駆動される。例えばリレー2の接点aの2
個の接点のクリーニングにあたっては、図2(A)のよ
うに接点aがその期間オン駆動され、さらに一方の接点
のクリーニングにあたっては図2(D)のようにリレー
12の接点aと図2(J)のようにリレー11の接点H
とが同時に駆動され、他方の接点のクリーニングにあた
っては図2(E)のようにリレー12の接点bと図2
(K)のようにリレー11の接点Lとが同時に駆動され
る。
On the other hand, in the relay contact cleaning mode, one of the contacts of the relays 2, 11 and 12 is selectively turned on at the same time. For example, 2 of contact a of relay 2
When cleaning one contact, the contact a is driven on during that period as shown in FIG. 2A, and when cleaning one contact, as shown in FIG. Contact H of relay 11 as shown in J)
Are driven at the same time, and when cleaning the other contact, as shown in FIG.
As in (K), the contact L of the relay 11 is driven at the same time.

【0013】これら3個のリレー2,11,12の該当
する接点を同時に選択的にオン駆動することにより、こ
れらオン駆動された接点と直流電圧源9と抵抗10によ
る閉ループ回路が形成されてリレー2の接点に接点の表
面に形成される絶縁被膜を電気的に破壊するための電圧
が選択的に印加され、接点の表面に形成されている絶縁
被膜は破壊される。なお、印加する電圧は数Vあればよ
く、印加時間は100ms程度でよい。これ以上の電圧
でより長い時間印加すると、接点にカーボンが析出して
不具合を生じる恐れがある。
By selectively turning on the corresponding contacts of these three relays 2, 11 and 12 simultaneously, a closed loop circuit is formed by these ON-driven contacts, the DC voltage source 9 and the resistor 10. A voltage for electrically destroying the insulating coating formed on the surface of the contact is selectively applied to the second contact, and the insulating coating formed on the surface of the contact is destroyed. The voltage to be applied may be several V, and the application time may be about 100 ms. If a voltage higher than this is applied for a longer period of time, carbon may be deposited on the contacts to cause a problem.

【0014】また、絶縁被膜の破壊にあたっては、リレ
ー11の接点H,Lを交互に切り換えるとともにリレー
2の接点組の接点も個別にオン駆動しているので、入力
端子1に接続される測定信号源系統やプリアンプ4以降
の測定系統に直流電圧源9の出力電圧が悪影響を与える
ことはない。
When the insulating film is broken, the contacts H and L of the relay 11 are alternately switched and the contacts of the contact set of the relay 2 are also individually turned on, so that the measurement signal connected to the input terminal 1 is measured. The output voltage of the DC voltage source 9 does not adversely affect the source system and the measurement system after the preamplifier 4.

【0015】[0015]

【発明の効果】以上詳細に説明した本発明に基づくリレ
ースキャナ装置によれば、次のような効果が得られる。
According to the relay scanner device according to the present invention described in detail above, the following effects can be obtained.

【0016】必要に応じて入力端子を選択するリレーの
接点の入力側に絶縁被膜を破壊するための電圧を選択的
に印加することにより接触抵抗を小さくでき、電圧レベ
ルが低い電圧信号でも安定した測定が行える。
The contact resistance can be reduced by selectively applying a voltage for destroying the insulating film to the input side of the contact of the relay that selects the input terminal as required, and stable even with a voltage signal having a low voltage level. Can measure.

【0017】なお、リレーの接点クリーニングにあたっ
て、絶縁被膜を破壊するための電圧が測定信号源系統や
測定系統に悪影響を与えることはない。
In cleaning the contact of the relay, the voltage for destroying the insulating film does not adversely affect the measurement signal source system and the measurement system.

【図面の簡単な説明】[Brief description of drawings]

【図1】本発明の一実施例の構成図である。FIG. 1 is a configuration diagram of an embodiment of the present invention.

【図2】図1の動作を説明するタイミングチャートであ
る。
FIG. 2 is a timing chart illustrating the operation of FIG.

【図3】従来の装置の構成図である。FIG. 3 is a configuration diagram of a conventional device.

【符号の説明】[Explanation of symbols]

1 入力端子 2,11,12 リレー 3 セレクタ 4 プリアンプ 5 A/D変換器 6,8 フォトカプラ 7 CPU 9 直流電圧源 10 抵抗 1 Input terminal 2,11,12 Relay 3 Selector 4 Preamplifier 5 A / D converter 6,8 Photocoupler 7 CPU 9 DC voltage source 10 Resistance

Claims (1)

【特許請求の範囲】[Claims] 【請求項1】 複数の測定信号をそれぞれリレーを介し
て選択的に出力するリレースキャナ装置において、 各リレーの入力側に接点の表面に形成される絶縁被膜を
電気的に破壊するための電圧を選択的に印加する電圧印
加系統を設けたことを特徴とするリレースキャナ装置。
1. In a relay scanner device for selectively outputting a plurality of measurement signals via relays, a voltage for electrically destroying an insulating film formed on a surface of a contact is provided on an input side of each relay. A relay scanner device comprising a voltage application system for selectively applying the voltage.
JP23175891A 1991-09-11 1991-09-11 Relay scanner device Pending JPH0573796A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP23175891A JPH0573796A (en) 1991-09-11 1991-09-11 Relay scanner device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP23175891A JPH0573796A (en) 1991-09-11 1991-09-11 Relay scanner device

Publications (1)

Publication Number Publication Date
JPH0573796A true JPH0573796A (en) 1993-03-26

Family

ID=16928574

Family Applications (1)

Application Number Title Priority Date Filing Date
JP23175891A Pending JPH0573796A (en) 1991-09-11 1991-09-11 Relay scanner device

Country Status (1)

Country Link
JP (1) JPH0573796A (en)

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