JPH0573182B2 - - Google Patents
Info
- Publication number
- JPH0573182B2 JPH0573182B2 JP62060779A JP6077987A JPH0573182B2 JP H0573182 B2 JPH0573182 B2 JP H0573182B2 JP 62060779 A JP62060779 A JP 62060779A JP 6077987 A JP6077987 A JP 6077987A JP H0573182 B2 JPH0573182 B2 JP H0573182B2
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- board
- probe pin
- pin
- frame
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000523 sample Substances 0.000 claims description 119
- 238000007689 inspection Methods 0.000 claims description 23
- 230000003028 elevating effect Effects 0.000 claims description 13
- 238000012360 testing method Methods 0.000 description 25
- 238000005452 bending Methods 0.000 description 13
- 230000035939 shock Effects 0.000 description 7
- 239000006096 absorbing agent Substances 0.000 description 6
- 239000004020 conductor Substances 0.000 description 6
- 238000001514 detection method Methods 0.000 description 6
- 235000014676 Phragmites communis Nutrition 0.000 description 5
- 230000000630 rising effect Effects 0.000 description 5
- 230000033001 locomotion Effects 0.000 description 4
- 238000013459 approach Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62060779A JPS63225177A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62060779A JPS63225177A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS63225177A JPS63225177A (ja) | 1988-09-20 |
| JPH0573182B2 true JPH0573182B2 (enrdf_load_html_response) | 1993-10-13 |
Family
ID=13152115
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62060779A Granted JPS63225177A (ja) | 1987-03-16 | 1987-03-16 | 両面回路基板検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS63225177A (enrdf_load_html_response) |
-
1987
- 1987-03-16 JP JP62060779A patent/JPS63225177A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS63225177A (ja) | 1988-09-20 |
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