JPH0572056B2 - - Google Patents

Info

Publication number
JPH0572056B2
JPH0572056B2 JP59063842A JP6384284A JPH0572056B2 JP H0572056 B2 JPH0572056 B2 JP H0572056B2 JP 59063842 A JP59063842 A JP 59063842A JP 6384284 A JP6384284 A JP 6384284A JP H0572056 B2 JPH0572056 B2 JP H0572056B2
Authority
JP
Japan
Prior art keywords
mass
ion
fragment
sample
standard sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP59063842A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60207050A (ja
Inventor
Katsuaki Shirato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to JP59063842A priority Critical patent/JPS60207050A/ja
Publication of JPS60207050A publication Critical patent/JPS60207050A/ja
Publication of JPH0572056B2 publication Critical patent/JPH0572056B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/022—Circuit arrangements, e.g. for generating deviation currents or voltages ; Components associated with high voltage supply

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP59063842A 1984-03-31 1984-03-31 マスフラグメントグラフイ用装置 Granted JPS60207050A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59063842A JPS60207050A (ja) 1984-03-31 1984-03-31 マスフラグメントグラフイ用装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59063842A JPS60207050A (ja) 1984-03-31 1984-03-31 マスフラグメントグラフイ用装置

Publications (2)

Publication Number Publication Date
JPS60207050A JPS60207050A (ja) 1985-10-18
JPH0572056B2 true JPH0572056B2 (enrdf_load_stackoverflow) 1993-10-08

Family

ID=13240987

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59063842A Granted JPS60207050A (ja) 1984-03-31 1984-03-31 マスフラグメントグラフイ用装置

Country Status (1)

Country Link
JP (1) JPS60207050A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108061776B (zh) * 2016-11-08 2020-08-28 中国科学院大连化学物理研究所 一种用于液相色谱-质谱的代谢组学数据峰匹配方法

Also Published As

Publication number Publication date
JPS60207050A (ja) 1985-10-18

Similar Documents

Publication Publication Date Title
US10473620B2 (en) Analysis of isomers in TIMS-Q-q-TOF mass spectrometers
US4472631A (en) Combination of time resolution and mass dispersive techniques in mass spectrometry
US4633083A (en) Chemical analysis by time dispersive ion spectrometry
JP3091866B2 (ja) 質量分光法における時間圧縮クロマトグラフィー
US6369382B1 (en) Mass spectrometry and mass spectroscope
CN112798696B (zh) 质谱方法
US6573492B2 (en) Mass spectrometric analysis method and apparatus using the method
JP4365286B2 (ja) 質量分析方法及び質量分析システム
JP3683749B2 (ja) 質量分析方法
EP0395616B1 (en) Method for enhanced ion spectra generation and detection in ion mobility spectrometry
GB2602769A (en) Analysis of Isomers in TIMS-Q-q-TOF mass spectrometers
JP2008008801A (ja) 質量分析システム
JPH0572056B2 (enrdf_load_stackoverflow)
US6787762B2 (en) Time dispersive spectrometer using digital switching means
JP3055142B2 (ja) 質量分析方法
JP2002157971A (ja) 質量分析計及び質量分析方法
JP3220996B2 (ja) クロマトグラフ／質量分析装置
JPH0381660A (ja) 質量分析計を用いた選択イオン検出方法
JPH10185873A (ja) 質量分析装置
JP2799102B2 (ja) Ｌｃ／ａｐｉ質量分析装置
JPH0696725A (ja) 質量分析方法及び装置
JPH08111203A (ja) 高分解能質量分析計
JPS61116654A (ja) マスクロマトグラフイ装置
JPH07296767A (ja) 四重極型質量分析計
JPS62168329A (ja) 開裂イオン測定方法

Legal Events

Date Code Title Description
LAPS Cancellation because of no payment of annual fees