JPH0567165A - Coverage rate measuring system for logic circuit - Google Patents

Abstract

PURPOSE:To check the detailed operation range in a logic circuit by measuring the frequency in passage of an accessed address. CONSTITUTION:When the coverage rate is measured at the time of generating a simulation model of the logic circuit and executing the simulation, a coverage rate measurement object setting part 1 sets the measurement object of the coverage rate, and a measurement object condition setting part 2 sets the coverage rate measurement condition of the measurement object. A coverage rate measurement memory adding part 3 adds a coverage rate measuring memory into the logic simulation model, and a connection changing part 4 changes the connection in accordance with addition of the coverage rate measuring memory. A condition discriminating part 5 discriminates the condition at the time of executing the simulation; and in the case of success of the condition, a passage frequency setting part 6 sets the frequency in passage as the measurement result to the coverage rate measuring memory, and a coverage rate editing and display part 7 displays the measurement result.

Description

Detailed Description of the Invention

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a method of measuring a coverage rate when creating a simulation model of a logic circuit and executing the simulation.

[0002]

2. Description of the Related Art Conventionally, when simulating a logic circuit, one of the evaluations as to whether or not the logic circuit has been performed as designed is the degree of whether all the target circuits have been traced (verified), that is, the coverage. The rate is being measured.

When such a coverage ratio is measured, if a determination condition is satisfied during execution of the simulation, "1" is written in the address indicated by the access address of the access address storage register in the additional memory for coverage measurement. I was out.

[0004]

In the above-mentioned conventional coverage measurement method for logic circuits, when the determination condition is satisfied, "1" is written in the additional memory for coverage measurement. The number of passages was not measured. Therefore, there is a drawback that the detailed operation range in the logic circuit cannot be checked.

[0005]

SUMMARY OF THE INVENTION The present invention is a method of measuring a coverage rate when creating a simulation model of a logic circuit and executing a simulation, and first means for setting a measurement target of the coverage rate, Second means for setting the coverage measurement condition of the measurement target, third means for adding a coverage measurement memory in the logic simulation model, and connection change by adding the coverage measurement memory A fourth means, a fifth means for making a condition judgment at the time of executing the simulation, and a fifth means for setting a number of passages as a measurement result in the coverage measuring memory when the fifth means judges that the condition is satisfied. 6 means and 7th means for displaying the measurement result by the 6th means.

[0006]

Embodiments of the present invention will now be described with reference to the drawings.

FIG. 1 is a block diagram showing the configuration of an embodiment of the present invention. In the figure, the coverage measurement target setting unit 1 inputs a target for which the coverage measurement is performed in the circuit description. The measurement target condition setting unit 2 sets a register that stores an address accessed by the coverage ratio measurement target. Further, condition setting is performed when the address of the access address storage register cannot be recognized as a true access address unless a predetermined condition is satisfied. The coverage percentage measurement memory addition unit 3 is a memory for storing the coverage percentage measurement result, and adds the memory to the circuit. The connection changing unit 4 connects the register group set by the measurement target condition setting unit 2 and the coverage measuring memory added by the coverage measuring memory adding unit 3. As described above, a simulation model capable of measuring the coverage rate is created. Next, as the processing of the simulation execution unit,
The condition determination unit 5 determines whether or not the condition set by the measurement target condition setting unit 2 is satisfied during the simulation of the simulation model. When the condition is satisfied, the passing count setting unit 6 which is the measurement result checks which address is accessed when the condition is satisfied, and sets a value obtained by adding “1” to the value in the same address of the coverage measurement memory. After the simulation is completed, the coverage percentage edit display unit 7 displays “0” as the edited output of the measurement result in the additional memory for coverage percentage measurement.
Count the number of non-addresses and output the coverage.
The value in the memory indicates the number of operations.

Next, the processing of this embodiment will be described.

FIG. 2 is a diagram showing an image of coverage rate measurement according to the present invention.

First, the coverage measurement target setting unit 1 sets a coverage measurement target 11 in the circuit description. The measurement target condition setting unit 2 also sets an access address to be a coverage measurement target in the access address storage register 12. Then, a condition value is set in the condition register 13 when the address of the access address storage register 12 cannot be recognized as a true access address unless a predetermined condition is satisfied. The coverage rate measurement memory addition unit 3 adds a coverage rate measurement additional memory 14 for storing the coverage rate measurement result in the circuit. Due to the addition of the memory, the connection changing unit 4 includes the access address storage register 12 and the condition register 13 set by the measurement target condition setting unit 2 and the additional memory 14 for coverage ratio measurement added by the coverage ratio measurement memory addition unit 3. Make a connection. As described above, a simulation model capable of measuring the coverage rate is created. Next, as the processing of the simulation execution unit, the condition determination unit 5 determines that the measurement target condition setting unit 2 is executing during the simulation execution of the simulation model.
It is determined whether or not the condition value of the condition register 13 set in step 1 is satisfied. Then, the measurement result setting unit 6 obtains the address of the access address storage register 12 when the condition is satisfied, and adds “1” to the value in the same address of the additional memory 14 for coverage measurement (all initial values are 0). Write the specified value. After the simulation is completed, the coverage percentage edit display unit 7 counts the number of addresses that are not “0” and outputs the coverage percentage as an edited output of the measurement result in the additional memory for coverage percentage measurement 14. Further, since the value in the additional memory 14 for coverage measurement indicates the number of operations, it is possible to obtain an address having a large number of operations.

[0011]

As described above, according to the present invention, the memory for measuring the coverage rate is added to the logic simulation model, and the number of passages which is the measurement result is written when the condition is satisfied during the execution of the simulation. The effect is that the detailed operation range of can be checked.

[Brief description of drawings]

FIG. 1 is a block diagram showing an embodiment of the present invention.

FIG. 2 is a diagram showing an image of processing in the present embodiment.

[Explanation of symbols]

 1 Coverage rate measurement target setting section 2 Measurement target condition setting section 3 Coverage rate measurement memory addition section 4 Connection changing section 5 Condition determination section 6 Pass count setting section 7 Coverage rate edit display section 11 Coverage rate measurement target 12 Access address storage register 13 Condition register

Claims (1)

[Claims] 1. A coverage ratio measuring method for creating a simulation model of a logic circuit and executing a simulation, comprising: first means for setting a measurement target of the coverage ratio; and coverage ratio measurement conditions for the measurement target. Setting means, a third means for adding a coverage measuring memory in the logic simulation model, a fourth means for changing the connection by adding the coverage measuring memory, and the simulation. Fifth means for performing condition determination at the time of execution,
When the fifth means determines that the condition is satisfied, the number of passages which is the measurement result is set in the coverage ratio measurement memory.
And a seventh means for displaying the measurement result obtained by the sixth means.