JPH0558592B2 - - Google Patents

Info

Publication number
JPH0558592B2
JPH0558592B2 JP60186295A JP18629585A JPH0558592B2 JP H0558592 B2 JPH0558592 B2 JP H0558592B2 JP 60186295 A JP60186295 A JP 60186295A JP 18629585 A JP18629585 A JP 18629585A JP H0558592 B2 JPH0558592 B2 JP H0558592B2
Authority
JP
Japan
Prior art keywords
laser
probe
power
laser power
sensor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60186295A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6246581A (ja
Inventor
Hajime Fukao
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP60186295A priority Critical patent/JPS6246581A/ja
Publication of JPS6246581A publication Critical patent/JPS6246581A/ja
Publication of JPH0558592B2 publication Critical patent/JPH0558592B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof

Landscapes

  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Laser Surgery Devices (AREA)
  • Radiation-Therapy Devices (AREA)
  • Semiconductor Lasers (AREA)
JP60186295A 1985-08-24 1985-08-24 レ−ザ照射装置 Granted JPS6246581A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60186295A JPS6246581A (ja) 1985-08-24 1985-08-24 レ−ザ照射装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60186295A JPS6246581A (ja) 1985-08-24 1985-08-24 レ−ザ照射装置

Publications (2)

Publication Number Publication Date
JPS6246581A JPS6246581A (ja) 1987-02-28
JPH0558592B2 true JPH0558592B2 (US07714131-20100511-C00024.png) 1993-08-26

Family

ID=16185814

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60186295A Granted JPS6246581A (ja) 1985-08-24 1985-08-24 レ−ザ照射装置

Country Status (1)

Country Link
JP (1) JPS6246581A (US07714131-20100511-C00024.png)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01171573A (ja) * 1987-12-28 1989-07-06 Matsushita Electric Ind Co Ltd モニター付レーザー医療装置
JP2009153614A (ja) * 2007-12-25 2009-07-16 Panasonic Electric Works Co Ltd 光照射装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5894140U (ja) * 1981-12-17 1983-06-25 ソニー株式会社 半導体レ−ザ光量低下表示装置

Also Published As

Publication number Publication date
JPS6246581A (ja) 1987-02-28

Similar Documents

Publication Publication Date Title
US5254992A (en) Low power electronic measuring system
EP0075912A2 (en) Laser surgical equipment
US4244213A (en) Retorque measuring apparatus
US20020011938A1 (en) Laser parking guide
US5103750A (en) Sewing machine with bobbin thread monitor
JPH0558592B2 (US07714131-20100511-C00024.png)
JP2597598B2 (ja) レーザ加工機におけるノズルチェック装置
JP2000121410A (ja) 液面レベル検出装置
JP2006088306A (ja) 回転式工具
JP2597597B2 (ja) レーザ加工機におけるセンサ出力サンプリング方法
JP2501081B2 (ja) 基準平面設定装置
KR100416639B1 (ko) 컨테이너 셀가이드의 측정시스템 및 검사방법
JP2837554B2 (ja) レーザ加工装置
JPS5818155A (ja) 水分計
KR0140354Y1 (ko) 워크면에 대한 스폿건의 각도 검출장치
JPH07161783A (ja) 半導体測定装置及びその測定状態設定方法
JP3787028B2 (ja) 変位測定装置
JPH0530147Y2 (US07714131-20100511-C00024.png)
KR200144344Y1 (ko) 파이프 내부검사장치의 레이저다이오드 출력 제어회로
JPS6491011A (en) Apparatus for measuring distance between vehicles
JP3153125B2 (ja) 計測装置
JPS63163205A (ja) 数値制御工作機械における工具自動計測装置
JP2579798Y2 (ja) 環境計測装置
JPH0547352B2 (US07714131-20100511-C00024.png)
CA2130788A1 (en) Vehicle ride height measurement apparatus and method