JPH0554631B2 - - Google Patents

Info

Publication number
JPH0554631B2
JPH0554631B2 JP60173040A JP17304085A JPH0554631B2 JP H0554631 B2 JPH0554631 B2 JP H0554631B2 JP 60173040 A JP60173040 A JP 60173040A JP 17304085 A JP17304085 A JP 17304085A JP H0554631 B2 JPH0554631 B2 JP H0554631B2
Authority
JP
Japan
Prior art keywords
bipolar transistor
insulation
circuit
points
switch circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP60173040A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6234075A (ja
Inventor
Tsuneo Yamaha
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP60173040A priority Critical patent/JPS6234075A/ja
Publication of JPS6234075A publication Critical patent/JPS6234075A/ja
Publication of JPH0554631B2 publication Critical patent/JPH0554631B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Relating To Insulation (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP60173040A 1985-08-06 1985-08-06 絶縁試験機 Granted JPS6234075A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60173040A JPS6234075A (ja) 1985-08-06 1985-08-06 絶縁試験機

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60173040A JPS6234075A (ja) 1985-08-06 1985-08-06 絶縁試験機

Publications (2)

Publication Number Publication Date
JPS6234075A JPS6234075A (ja) 1987-02-14
JPH0554631B2 true JPH0554631B2 (enExample) 1993-08-13

Family

ID=15953088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60173040A Granted JPS6234075A (ja) 1985-08-06 1985-08-06 絶縁試験機

Country Status (1)

Country Link
JP (1) JPS6234075A (enExample)

Also Published As

Publication number Publication date
JPS6234075A (ja) 1987-02-14

Similar Documents

Publication Publication Date Title
US5280237A (en) Method for testing semiconductor integrated circuits soldered to boards and use of a transistor tester for this method
US4578637A (en) Continuity/leakage tester for electronic circuits
US5101152A (en) Integrated circuit transfer test device system utilizing lateral transistors
US20160139180A1 (en) Testing semiconductor devices
JPH0554631B2 (enExample)
JP2010230668A (ja) 試験装置およびドライバ回路
US5355082A (en) Automatic transistor checker
JPH0577030B2 (enExample)
CN116754991A (zh) 多元件漏电流测量系统
US3370233A (en) Test apparatus for determining beta and leakage current of an in-circuit or out-of-circuit transistor
US8816708B2 (en) Electronic test system and associated method
JP3332120B2 (ja) 検査回路および検査方法
JPS61126478A (ja) 絶縁試験機
JP4581172B2 (ja) 入力保護装置
KR100506969B1 (ko) 반도체 소자의 리키지 테스트 방법
JP3599988B2 (ja) 電子デバイスへの負荷電流出力回路およびｉｃテスタ
JPS62159061A (ja) 導通／絶縁試験機
JPH06324105A (ja) 半導体試験装置
JP2942590B2 (ja) 配線試験装置
TWM452525U (zh) 通用測試轉接板
JP2691182B2 (ja) 集積回路のラッチアップ測定方法
Lim et al. Implementation of a 32-Channel Low-cost Low Current Measuring Circuit using Analog Devices ADA4530-1 on Automated Test Equipment for Parallel Leakage Current Test on Semiconductor Switch Test Platform Conversion
CN211375012U (zh) 一种输入电流的测试设备及服务器
JP2552753Y2 (ja) 回路基板検査装置のガーディング回路
CN117590075A (zh) 接触阻抗测试方法及系统、接触测试方法、测试治具